Online Anomaly Detection Based On Reservoir Sampling and LOF for IoT devices
The growing number of IoT devices and their use to monitor the operation of
machines and equipment increases interest in anomaly detection algorithms
running on devices. However, the difficulty is the limitations of the available
computational and memory resources on the devices. In the case of
microcontrollers (MCUs), these are single megabytes of program and several
hundred kilobytes of working memory. Consequently, algorithms must be
appropriately matched to the capabilities of the devices. In the paper, we
analyse the processing pipeline for anomaly detection and implementation of the
Local Outliner Factor (LOF) algorithm on a MCU. We also show that it is
possible to train such an algorithm directly on the device, which gives great
potential to use the solution in real devices.