A Deep-Learning-Aided Pipeline for Efficient Post-Silicon Tuning
In post-silicon validation, tuning is to find the values for the tuning
knobs, potentially as a function of process parameters and/or known operating
conditions. In this sense, an more efficient tuning requires identifying the
most critical tuning knobs and process parameters in terms of a given
figure-of-merit for a Device Under Test (DUT). This is often manually conducted
by experienced experts. However, with increasingly complex chips, manual
inspection on a large amount of raw variables has become more challenging. In
this work, we leverage neural networks to efficiently select the most relevant
variables and present a corresponding deep-learning-aided pipeline for
efficient tuning.