Few-shot incremental learning in the context of solar cell quality inspection
In industry, Deep Neural Networks have shown high defect detection rates
surpassing other more traditional manual feature engineering based proposals.
This has been achieved mainly through supervised training where a great amount
of data is required in order to learn good classification models. However, such
amount of data is sometimes hard to obtain in industrial scenarios, as few
defective pieces are produced normally. In addition, certain kinds of defects
are very rare and usually just appear from time to time, which makes the
generation of a proper dataset for training a classification model even harder.
Moreover, the lack of available data limits the adaptation of inspection models
to new defect types that appear in production as it might require a model
retraining in order to incorporate the detects and detect them. In this work,
we have explored the technique of weight imprinting in the context of solar
cell quality inspection where we have trained a network on three base defect
classes, and then we have incorporated new defect classes using few samples.
The results have shown that this technique allows the network to extend its
knowledge with regard to defect classes with few samples, which can be
interesting for industrial practitioners.