A Neural Network Based Novel Test Selector
Machine learning (ML) has been used to accelerate the progress of functional
coverage in simulation-based verification. A supervised ML algorithm, as a
prevalent option in the previous work, is used to bias the test generation or
filter the generated tests. However, for missing coverage events, these
algorithms lack the positive examples to learn from in the training phase.
Therefore, the tests generated or filtered by the algorithms cannot effectively
fill the coverage holes. This is more severe when verifying large-scale design
because the coverage space is larger and the functionalities are more complex.
This paper presents a configurable framework of test selection based on neural
networks (NN), which can achieve a similar coverage gain as random simulation
with far less simulation effort under three configurations of the framework.
Moreover, the performance of the framework is not limited by the number of
coverage events being hit. A commercial signal processing unit is used in the
experiment to demonstrate the effectiveness of the framework. Compared to the
random simulation, NNBNTS can reduce up to 53.74% of simulation time to reach
99% coverage level.