Bayesian Active Learning for Scanning Probe Microscopy: from Gaussian Processes to Hypothesis Learning
Recent progress in machine learning methods, and the emerging availability of
programmable interfaces for scanning probe microscopes (SPMs), have propelled
automated and autonomous microscopies to the forefront of attention of the
scientific community. However, enabling automated microscopy requires the
development of task-specific machine learning methods, understanding the
interplay between physics discovery and machine learning, and fully defined
discovery workflows. This, in turn, requires balancing the physical intuition
and prior knowledge of the domain scientist with rewards that define
experimental goals and machine learning algorithms that can translate these to
specific experimental protocols. Here, we discuss the basic principles of
Bayesian active learning and illustrate its applications for SPM. We progress
from the Gaussian Process as a simple data-driven method and Bayesian inference
for physical models as an extension of physics-based functional fits to more
complex deep kernel learning methods, structured Gaussian Processes, and
hypothesis learning. These frameworks allow for the use of prior data, the
discovery of specific functionalities as encoded in spectral data, and
exploration of physical laws manifesting during the experiment. The discussed
framework can be universally applied to all techniques combining imaging and
spectroscopy, SPM methods, nanoindentation, electron microscopy and
spectroscopy, and chemical imaging methods, and can be particularly impactful
for destructive or irreversible measurements.