Magni, Simone and Milani, Marziale (2010) Creation of Controlled Defects Inside Colloidal Crystal Arrays with a Focused Ion Beam. Nanoscale Research Letters, 5 (7). pp. 1182-1189.
Official URL: http://www.ncbi.nlm.nih.gov/pmc/articles/PMC289403...
In this work the reliability of the focused-ion-beam (FIB) patterning on polystyrene (PS) colloidal crystals at different scales is determined. Ordered arrays of PS spheres (465Â nm) are successfully modified by selectively removing a single sphere. The water-vapor assisted FIB milling is crucial to obtain this result. Furthermore, isolated PS spheres are FIB drilled with or without chemically enhanced milling aiming at the exploration of the limits of such a technique. These controlled defects created using the FIB-assisted techniques may be helpful in preparing mockups of photonic crystals, sensors or as colloidal masks for diverse lithographic processes.
|Subjects:||Physical Science > Nanophysics|
Physical Science > Nano objects
Material Science > Nanochemistry
Material Science > Nanostructured materials
|Divisions:||Faculty of Engineering, Science and Mathematics > School of Physics|
Faculty of Engineering, Science and Mathematics > School of Chemistry
|Deposited On:||30 Sep 2010 09:22|
|Last Modified:||30 Sep 2010 09:22|
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