Efficient and accurate defect level modeling in monolayer MoS<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si120.svg" display="inline" id="d1e521"><mml:msub><mml:mrow /><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:math> via GW+DFT with open boundary conditions
Solid-state electronics