Characterization of Negative-Bias Temperature Instability of Ge MOSFETs With &lt;inline-formula&gt; &lt;tex-math notation="TeX"&gt;${\rm GeO}_{2}/{\rm Al}_{2}{\rm O}_{3}$ &lt;/tex-math&gt;&lt;/inline-formula&gt; Stack
I.E.E.E. transactions on electron devices/IEEE transactions on electron devices