BACKGROUND

At least some computer memory devices contain memory cells (such as transistors) that store bits of data. Examples of such memory devices include dynamic random access memory (DRAM) modules. It is possible for the hardware components of memory cells of a memory device to fail. This can result in errors in data stored in the memory cells. At least some memory devices (such as error-correcting code (ECC) memory devices) can store additional data (such as ECC bits) that can be used to detect, and in some cases correct, errors in stored data.

At least some memory device manufacturers use test equipment to write test patterns to memory cells of memory devices to test whether the memory devices are functioning properly before distributing them.

