BACKGROUND

1. Field of the Disclosure

The disclosure relates to a device for testing semiconductor devices and a method for operating the same.

2. Description of the Related Art

Reliability is important for semiconductor devices. To ensure safety and reliability, various tests may be performed on semiconductor devices under different temperatures, currents and voltages. In general, the buck circuit test and the boost circuit test are commonly used for testing semiconductor devices. In addition, the aging test can be performed to ensure the reliability of semiconductor devices during long-term operation. Furthermore, the switching safe operating area (SSOA) test can be performed to ensure the ability of semiconductor devices to withstand voltage and current stress during the switching process.

To perform various tests on a semiconductor device, many separate testing circuits might be used, which would increase the time, cost and complexity of testing the semiconductor device. Hence, it is desirable to provide a testing circuit and method to efficiently perform various tests on a semiconductor device.

SUMMARY

In some embodiments, a testing circuit includes a first circuit and a second circuit. The first circuit has a first capacitor and a second capacitor. The first circuit is configured to transfer at least a portion of a first voltage across the first capacitor to the second capacitor. The second circuit has the first capacitor and the second capacitor. The second circuit is configured to transfer at least a portion of a second voltage across the second capacitor to the first capacitor

In some embodiments, a method for testing a first transistor and a second transistor includes performing a boost circuit test for the first transistor during a first time period by transferring at least a portion of a first voltage of a first capacitor to a second capacitor; and performing a buck circuit test for the second transistor during a second time period by transferring at least a portion of a second voltage of the second capacitor to the first capacitor.

