BACKGROUND

Field

This invention relates to culture plate analysis, and more particularly to software for reviewing and analyzing culture plate images.

Description of the Related Art

Methods and systems for locating and selecting a colony of microorganisms are known. For example, methods for identifying microorganisms using mass spectrometry, in particular MALDI-TOF-MS (Matrix Assisted Laser Desorption and Ionization Time-of-Flight Mass Spectrometry) and the related systems for performing such methods are known. Such systems and methods are described, for example, in WO2013/147610 to Botma et al., the disclosure of which is incorporated by reference herein. Botma et al., teaches a method for locating and selecting a colony of microorganisms by obtaining an initial image of a culture dish, having a researcher or analyst manually select a colony of mircoorganisms in the initial image. The system then captures a second image of the culture dish from a position below a device for picking up a microorganism sample from the culture dish. The initial image and the second image are then compared to determine which colony was selected.

SUMMARY

Aspects of the invention include systems, devices, and methods for selecting colony locations on a culture plate image.

One embodiment is a system for selecting colony locations on a culture plate image. The system includes a computer system. The computer system includes a user interface configured to display a culture plate image and a selection tool and a processor. The processor is configured to determine a location of the selection tool on the culture plate image, determine a location of a potential source of error on the culture plate image, compare the location of the selection tool to the location of the potential source of error; and determine an error when the location of the selection tool overlays the location of the potential source of error.

Another embodiment is a method for selecting colony locations on a culture plate image. The method includes determining a location of a selection tool on the culture plate image, determining a location of a potential source of error on the culture plate image, comparing the location of the selection tool to the location of the potential source of error, and determining an error when the location of the selection tool overlays the location of the potential source of error.

