FIELD

The technical field generally relates to X-ray apparatus. More particularly, it relates to a mounting system for such apparatus and to a sample holder for holding a sample in the X-ray apparatus.

BACKGROUND

X-ray powder diffraction is a technique commonly used for determining qualitative and quantitative phase data of a sample, and involves directing an incoming X-ray beam onto a polycrystalline material and recording the diffracted X-ray beam for analysis. In order to conduct an X-ray diffraction experiment, the sample to be analyzed is generally placed on a sample holder which is receivable in part of the X-ray diffractometer. The design of the sample holder is important both for ease of use and for obtaining analytical results of good quality. While many types of sample holders are known, existing sample holders typically exhibit certain shortcomings. For example, reducing background noise at very low reflection angles (e.g., 0°<θ<3°) is often challenging. Existing sample holders also tend to significantly contribute to the observed background intensity added to the diffracted peaks of interest, which may be due to scattering of the X-rays caused by the sample holder material near or directly in contact with the sample. There still exist many challenges in terms of sample holders for X-ray diffractometers.

When assessing structural or mechanical properties of the sample, the sample is typically required to be placed at an appropriate height with respect to a center of rotation of a goniometer of the instrument, or with respect with an X-ray source and/or a detector. When a user has to work with multiple attachments or external devices to perform different kinds of measurements, the position of the sample can be altered from one attachment or external device to another, as a consequence of disparity between the manufacturing and assembly tolerances from one manufacturer to another. Furthermore, each attachment or external device typically has different mechanical fixturing. As a result, adjusting the position and aligning the sample can be time-consuming. Challenges still exist in the field of mounting systems for X-ray diffraction apparatuses.

SUMMARY

In some embodiments, a mounting system for an X-ray diffraction apparatus is provided. The mounting system has a rotation axis, and includes: a mounting bracket rotatably mountable onto the X-ray diffraction apparatus, the mounting bracket being rotatable about the rotation axis and including an abutment structure defining a reference position with respect to the rotation axis; an attachment module adjustably mountable onto the mounting bracket at an attaching position, the attaching position being adjustable along one direction normal to the reference position, the attachment module including an attaching element engageable with the abutment structure for abutting the mounting bracket proximate to the reference position; and a biasing assembly mounted onto one of the mounting bracket and the attachment module for interlocking the mounting bracket with the attachment module, such that the mounting bracket is blocked along a plane substantially parallel to the rotation axis, thereby allowing the attaching position to be aligned with the rotation axis along said one direction normal to the reference position.

In some embodiments, the system includes an adjustment mount operatively connected to the attachment module for adjusting the attaching position of the attachment module.

In some embodiments, the adjustment mount has a bottom portion and comprises a micrometer screw mechanically connected with said bottom portion.

In some embodiments, the abutment structure includes: a first abutment element having a vertically-extending portion; and a second abutment element having a horizontally-extending portion.

In some embodiments, the attaching element is matably engageable with at least one of the first and second abutment elements.

In some embodiments, the first abutment element includes a notch and the attaching element includes a recess engageable with the notch.

In some embodiments, the notch is dove-tailed.

In some embodiments, the notch includes a machined inner portion.

In some embodiments, the attaching element includes a snap-lock mechanism cooperating with the mounting bracket.

In some embodiments, the system includes a sample holder mounted onto the attachment module.

In some embodiments, the system includes a non-ambient stage mounted onto the attachment module.

In some embodiments, the biasing mechanism is a lever rotatably mounted onto the mounting bracket.

In some embodiments, the rotation axis passes through a center of rotation of a goniometer.

In some embodiments, a method for mounting a mounting system onto an X-ray diffraction apparatus is provided. The method includes steps of defining a mounting position; providing a mounting bracket proximate the mounting position; rotatably mounting the mounting bracket to the X-ray diffraction apparatus; and affixing the mounting bracket to the X-ray diffraction apparatus.

In some embodiments, the method includes a step of defining a reference position.

In some embodiments, the method includes a step of determining a position of a rotation axis of a goniometer.

In some embodiments, the step of affixing the mounting bracket to the X-ray diffraction apparatus includes mechanically rigidly connecting the mounting bracket with the X-ray diffraction apparatus.

In some embodiments, the method includes steps of providing an attachment module engageable with the mounting bracket; engaging the attachment module with the mounting bracket; interlocking the attachment module and the mounting bracket; and adjusting an attaching position of the attachment module with respect with the reference position.

In some embodiments, a method for aligning an attachment module with a mounting bracket having an abutment structure and being mounted onto an X-ray diffraction apparatus is provided. The method includes steps of mounting a first attachment module having an attaching element onto the mounting bracket; abutting the attaching element to the abutment structure proximate a reference position; interlocking the first attachment module to the mounting bracket; and adjusting an attaching position of the first attachment module with respect with the reference position.

In some embodiments, the interlocking step includes engaging a biasing mechanism with the attaching element or the mounting bracket.

In some embodiments, the method includes steps of unlocking the first attachment module from the mounting bracket; detaching the first attachment module from the mounting bracket; replacing the first attachment module onto the mounting bracket; interlocking the first attachment module to the mounting bracket; and verifying the attaching position of the first attachment module.

In some embodiments, the method includes steps of detaching the first attachment module from the mounting bracket; mounting a second attachment module onto the mounting bracket; abutting the second attachment module to the abutment structure proximate the reference position; interlocking the second attachment module to the mounting bracket; and adjusting an attaching position of the first attachment module with respect with the reference position.

In some embodiments, the interlocking the second attachment module to the mounting bracket step includes engaging a biasing mechanism with the at least one attaching element or the mounting bracket.

In some embodiments, the method includes steps of unlocking the second attachment module from the mounting bracket; detaching the second attachment module from the mounting bracket; replacing the second attachment module onto the mounting bracket; interlocking the second attachment module to the mounting bracket; and verifying the attaching position of the second attachment module.

In some embodiments, there is provided a sample holder and a method of carrying out X-ray diffraction measurements on a sample to be analyzed.

In some embodiments, a sample holder for an X-ray diffraction apparatus is provided. The sample holder includes: an insert including an upper surface and a sample space for holding a sample; and an insert housing, including: a first surface having an outer edge and an inner edge; a second surface opposite to the first surface; a sidewall connecting the first surface to the second surface and forming an opening there between, the opening being adapted to removably receive the insert therein; and a retention assembly for retaining the insert in the opening, the retention assembly including: flange members provided on the first surface and extending above the opening; and a biasing assembly for biasing at least part of the upper surface of the insert against the flange members such that the upper surface of the insert is flush with the first surface, the flange members being positioned with respect to one another so as to define an unobstructed channel extending from a first portion of the outer edge to a second opposed portion of the outer edge.

In some embodiments, the sample space includes a depression defined in the upper surface of the insert.

In some embodiments, the depression has a depth between about 2 mm and 10 mm.

In some embodiments, the sample space is located substantially at the center of the insert.

In some embodiments, the insert housing has an annular shape and the insert has a cylindrical shape.

In some embodiments, the flange members and the upper surface are engaged along at least 50% of the perimeter of the upper surface of the insert, or at three or more widely spaced points of the perimeter of the upper surface of the insert.

In some embodiments, the flange members have a thickness of at least about 1 mm.

In some embodiments, the insert housing is made of metal. In some embodiments, the insert housing is made of plastic, ceramic or a single crystal semiconductor.

In some embodiments, the metal includes at least one of steel, brass and aluminum.

In some embodiments, the channel is defined along a projection path of an incoming X-ray beam from the X-ray diffraction apparatus and a reflection X-ray beam reflected off the sample.

In some embodiments, the flange members are positioned with respect to one another so as to define a second channel extending from a third portion of the outer edge to a fourth portion of the outer edge and through the sample space, such that the upper surface of the insert is flush with the first surface along the second channel.

In some embodiments, an anti-scatter baffle is receivable along the second channel. In some embodiments, an anti-scatter baffle is mountable on top of the flange members, and runs along the length or diameter of the sample holder and of the sample space, above the sample space.

In some embodiments, the anti-scatter baffle is positionable above the upper surface of the insert, for example at a height lower than a height of the second channel.

In some embodiments, an insert housing of a sample holder for an X-ray diffraction apparatus is provided. The insert housing includes: a first surface having an outer edge and an inner edge; a second surface opposite to the first surface; a sidewall connecting the first surface to the second surface and forming an opening there between, the opening being adapted to removably receive an insert therein, the insert including an upper surface and a sample space for holding a sample; and a retention assembly for retaining the insert in the opening, the retention assembly including: flange members provided on the first surface and extending above the opening, the flange members being positioned so as to define a channel extending from a first portion of the outer edge of the first surface to a second opposed portion of the outer edge of the first surface and through the sample space; and a biasing assembly for biasing at least part of the upper surface of the insert against the flange members such that the upper surface of the insert is flush with the first surface at least along the channel.

In some embodiments, an insert is provided which is insertable in a sample holder of an X-ray diffraction apparatus, and includes: an upper surface made of amorphous PVC; and a sample space defined in the upper surface, for holding a sample. In some embodiments, the amorphous polymer is amorphous PVC.

In some embodiments, the insert is made of an amorphous material. In other embodiments, the insert is made of ceramic, a semiconductor material, a metal or a polymer. In some embodiments, the insert is made of a crystalline (polycrystalline or single crystalline) material having an X-ray diffraction signal which does not interfere with the X-ray diffraction signal of the sample to be analyzed. In some embodiments, the insert is made of a single crystalline material which is oriented to avoid background diffraction peaks in directions of interest for the sample.

In some embodiments, an insert insertable in a sample holder of an X-ray diffraction apparatus is provided. The insert includes: an upper surface; a sample space defined in the upper surface, for holding a sample; and a standard reference space defined in the upper surface, for holding a standard reference substance.

In some embodiments, a sample holder for an X-ray diffraction apparatus is provided. The sample holder comprises: an insert comprising an upper surface and a sample space for holding a sample; and an insert housing, comprising: a sidewall defining an opening, the sidewall having a top surface having an outer edge and an inner edge, and a bottom surface opposite the top surface, the opening being adapted to removably receive the insert therein; and a retention assembly for retaining the insert in the opening, the retention assembly comprising: flange members provided on the top surface and extending above the opening; and a biasing assembly for biasing at least part of the upper surface of the insert against the flange members such that the upper surface of the insert is flush with the top surface, the flange members being positioned with respect to one another so as to define an unobstructed channel extending from a first portion of the outer edge to a second opposed portion of the outer edge.

In some embodiments, the sample space comprises a depression defined in the upper surface of the insert.

In some embodiments, the depression has a depth between about 2 mm and 10 mm.

In some embodiments, the sample space is located substantially at the center of the insert.

In some embodiments, the upper surface of the insert has a substantially annular shape.

In some embodiments, the sample space has a substantially circular shape.

In some embodiments, the insert housing has a substantially annular shape and the insert has a substantially cylindrical shape.

In some embodiments, the flange members and the upper surface are engaged along at least 50% of the perimeter of the upper surface of the insert.

In some embodiments, the flange members have a thickness of at least about 1 mm.

In some embodiments, the flange members are substantially flat.

In some embodiments, the flange members have a plate construction.

In some embodiments, the flange members have a substantially annular sector shape.

In some embodiments, the flange members have outer and inner curved edges and side edges, each side edge being substantially parallel with respect to a side edge of an adjacent flange member to define part of the channel.

In some embodiments, each of the flange members comprises an overhang portion configured for abutting against the upper surface of the insert.

In some embodiments, the insert housing is made of metal.

In some embodiments, the metal comprises at least one of steel, brass and aluminum.

In some embodiments, the channel is defined along a projection path of an incoming X-ray beam from the X-ray diffraction apparatus and a reflection X-ray beam reflected off the sample.

In some embodiments, the flange members are positioned with respect to one another so as to define a second channel extending from a third portion of the outer edge to a fourth portion of the outer edge and through the sample space, such that the upper surface of the insert is flush with the top surface along the second channel.

In some embodiments, the second channel is configured to receive an anti-scatter baffle therealong.

In some embodiments, the anti-scatter baffle is positionable above the upper surface of the insert at a height lower than a depth of the second channel.

In some embodiments, there is provided an insert housing of a sample holder for an X-ray diffraction apparatus. The insert housing comprises: a sidewall defining an opening, the sidewall having a top surface having an outer edge and an inner edge, and a bottom surface opposite the top surface, the opening being adapted to removably receive an insert therein, the insert comprising an upper surface and a sample space for holding a sample; and a retention assembly for retaining the insert in the opening, the retention assembly comprising: flange members provided on the top surface and extending above the opening, the flange members being positioned so as to define a channel extending from a first portion of the outer edge of the top surface to a second opposed portion of the outer edge of the top surface and through the sample space; and a biasing assembly for biasing at least part of the upper surface of the insert against the flange members such that the upper surface of the insert is flush with the top surface at least along the channel.

In some embodiments, the insert housing has a substantially annular shape.

In some embodiments, the flange members and the upper surface are engagable along at least 50% of the perimeter of the upper surface of the insert.

In some embodiments, the flange members have a thickness of at least about 1 mm.

In some embodiments, the flange members are substantially flat.

In some embodiments, the flange members have a plate construction.

In some embodiments, the flange members have a substantially annular sector shape.

In some embodiments, the flange members have outer and inner curved edges and side edges, each side edge being substantially parallel with respect to a side edge of an adjacent flange member to define part of the channel.

In some embodiments, each of the flange members comprises an overhang portion configured for abutting against the upper surface of the insert.

In some embodiments, the insert housing is made of metal.

In some embodiments, the metal comprises at least one of steel, brass and aluminum.

In some embodiments, the flange members are positioned with respect to one another so as to define a second channel extending from a third portion of the outer edge to a fourth portion of the outer edge and through the sample space, such that the upper surface of the insert is flush with the top surface along the second channel.

In some embodiments, the second channel is configured to receive an anti-scatter baffle therealong.

In some embodiments, the anti-scatter baffle is positionable above the upper surface of the insert at a height lower than a depth of the second channel.

In some embodiments, an insert insertable in a sample holder of an X-ray diffraction apparatus is provided. The insert comprises: an upper surface made of amorphous PVC; and a sample space defined in the upper surface, for holding a sample.

In some embodiments, an insert insertable in a sample holder of an X-ray diffraction apparatus is provided. The insert comprises: an upper surface; a sample space defined in the upper surface, for holding a sample; and a standard reference space defined in the upper surface, for holding a standard reference substance.

In some embodiments, the standard reference space is a protuberance which is flush with the upper surface and in which the standard reference substance is embedded.

Other features will be better understood upon reading of embodiments thereof with reference to the appended drawings.

