CROSS-REFERENCE TO RELATED PATENT APPLICATION

This application claims the benefit of priority to Taiwan Patent Application No. 109123884, filed on Jul. 15, 2020. The entire content of the above identified application is incorporated herein by reference.

Some references, which may include patents, patent applications and various publications, may be cited and discussed in the description of this disclosure. The citation and/or discussion of such references is provided merely to clarify the description of the present disclosure and is not an admission that any such reference is “prior art” to the disclosure described herein. All references cited and discussed in this specification are incorporated herein by reference in their entireties and to the same extent as if each reference was individually incorporated by reference.

FIELD OF THE DISCLOSURE

The present disclosure relates to an electrically conductive probe, and more particularly to a probe card device and a fence-like probe thereof.

BACKGROUND OF THE DISCLOSURE

A conventional electrically conductive probe has a straight-shaped stroke segment that is bent by being applied with a force so as to provide a stroke. Two opposite ends of the conventional electrically conductive probe are arranged in a direction defined by virtually extending the straight-shaped stroke segment. Due to the structural design of the conventional electrically conductive probe, a space transformer arranged between a circuit board and conventional electrically conductive probes needs to have complex and compact circuits design for transmitting signals between the circuit board and the conventional electrically conductive probes.

SUMMARY OF THE DISCLOSURE

In response to the above-referenced technical inadequacies, the present disclosure provides a probe card device and a fence-like probe thereof to effectively improve on the issues associated with conventional electrically conductive probes.

In one aspect, the present disclosure provides a probe card device, which includes a first guiding board unit, a second guiding board unit, and a plurality of fence-like probes. The first guiding board unit and the second guiding board unit are spaced apart from each other. The fence-like probes pass through the first guiding board unit and the second guiding board unit. Each of the fence-like probes includes a stroke segment, a fan-out segment, and a testing segment. The stroke segment is in an elongated shape defining a longitudinal direction. The stroke segment has two end portions respectively corresponding in position to the first guiding board unit and the second guiding board unit, and the stroke segment has a plurality of penetrating slots arranged along a fan-out direction perpendicular to the longitudinal direction. The fan-out segment is connected to one of the two end portions of the stroke segment. The fan-out segment has a fixing point arranged away from the stroke segment. The testing segment is connected to the other one of the two end portions of the stroke segment. The testing segment protrudes from the second guiding board unit and has an abutting point arranged away from the stroke segment. The fixing point is spaced apart from the abutting point in the fan-out direction by a fan-out distance. In any two of the fence-like probes adjacent to each other, a distance between the two fixing points is larger than a distance between the two abutting points. The first guiding board unit and the second guiding board unit are not staggered with each other, and the stroke segment of each of the fence-like probes is deformable by being applied with a force to store an elastic force.

In another aspect, the present disclosure provides a fence-like probe of a probe card device. The fence-like probe includes a stroke segment, a fan-out segment, and a testing segment. The stroke segment is in an elongated shape defining a longitudinal direction. The stroke segment has two end portions, and the stroke segment has a plurality of penetrating slots arranged along a fan-out direction perpendicular to the longitudinal direction, so that the stroke segment is deformable by being applied with a force to store an elastic force. The fan-out segment is connected to one of the two end portions of the stroke segment. The fan-out segment has a fixing point arranged away from the stroke segment. The testing segment is connected to the other one of the two end portions of the stroke segment. The testing segment has an abutting point arranged away from the stroke segment. The fixing point is spaced apart from the abutting point in the fan-out direction by a fan-out distance.

Therefore, by the structural design of each of the fence-like probes of the present disclosure (e.g., the fixing point and the abutting point are spaced apart from each other by the fan-out distance), the distance between any two of the fixing points of the fence-like probes can be extended, so that the manufacturing cost and efficiency of the probe card device can be effectively improved (e.g., the space transformer can be manufactured more easily; or, the probe card device can be formed without any space transformer).

Specifically, by the structural design of each of the fence-like probes in the present disclosure (e.g., the stroke segment is formed with the penetrating slots arranged along the fan-out direction), the first guiding board unit and the second guiding board unit are not staggered with each other, thereby reducing the length of each of the fence-like probes.

These and other aspects of the present disclosure will become apparent from the following description of the embodiment taken in conjunction with the following drawings and their captions, although variations and modifications therein may be affected without departing from the spirit and scope of the novel concepts of the disclosure.

