CROSS-BASELINE TO RELATED APPLICATION

The present application is based on, and claims priority from, China Application Serial Number CN202010152161.8, filed Mar. 6, 2020, the disclosure of which is hereby incorporated by baseline herein.

TECHNICAL FIELD

Technical Field

The present disclosure relates to an X-ray imaging method and system, and in particular it relates to a method and system for measuring the thickness, weight, and absorbed dose of an object by using X-rays.

BACKGROUND

In general, the current radiation dose measurement of objects requires the use of special and expensive dose measurement equipment, such as ion chamber, radiation dosimeter and proportional counter. This expensive dose-measurement equipment is installed on X-ray equipment or computed tomography scanner to measure the radiation dose will increase costs.

In addition, if a thermoluminescent dosimeter (TLD) is used for measurement, the immediate dose may not be obtained due to its principle. In addition, there are other ways to estimate radiation dose, such as applying the Monte Carlo simulation. However, it is quite time-consuming to calculate the dose and thickness of an object by the Monte Carlo simulation requiring a high-end computer.

SUMMARY

The present disclosure provides an X-ray imaging method. The X-ray imaging method includes the following steps: (a) performing a first object imaging process to obtain a first object intensity signal by detecting a plurality of X-rays passing through a first object; (b) performing a baseline imaging process to obtain a baseline intensity signal by detecting the X-rays when the first object is not in a FOV; and (c) obtaining the first thickness of the first object based on the first object intensity signal, the baseline intensity signal, and a first attenuation coefficient of the first object.

The present disclosure provides an X-ray imaging method. The X-ray imaging method includes the following steps: (a) performing a first object imaging process to obtain a first object intensity signal by detecting a plurality of X-rays passing through a first object; (b) performing a baseline imaging process to obtain a baseline intensity signal by detecting the X-rays when the first object is not in a FOV; (c) performing a second object imaging process to obtain a second object intensity signal by detecting the X-rays passing through a second object; (d) obtaining a sample intensity signal based on the first object intensity signal and the second object intensity signal, wherein the first object is a carrier, and the second object comprises a sample and the carrier; and (e) obtaining a sample thickness based on the sample intensity signal, the baseline intensity signal and a sample attenuation coefficient.

The present disclosure provides an X-ray imaging system. The X-ray imaging system includes an X-ray source, a detector and a processor. The X-ray source is configured to perform a first object imaging process so that a plurality of X-rays pass through a first object placed in a field of view (FOV) and perform a baseline imaging process as the first object is not in the FOV. The detector is configured to obtain a baseline intensity signal in the baseline imaging process and obtain a first object intensity signal in the first object imaging process. And, the processor is coupled to the detector. The processor is configured to operate instructions, comprising: calculating a first thickness of the first object based on the first object intensity signal, the baseline intensity signal, and a first attenuation coefficient of the first object.

