TECHNICAL FIELD

The present disclosure relates to instrumental analysis systems and methods and in particular embodiments to cryogenic analysis assemblies and methods. In particular embodiments, the present disclosure relates to systems, assemblies, and/or methods that include the use of analytical attachments to instrumental analysis systems, cryogenic assemblies and/or cryostats

BACKGROUND

Instrumental analysis has been used for decades upon decades, and during this time, scientists and laboratory personnel alike continue to demand more and more accuracy from their systems, instruments, and/or methods. The slightest change in alignment between analytical instrument attachments and a sample to be analyzed can require countless hours of additional research and/or lead to poor data which almost always amounts to poor conclusions.

For example, with cryogenic analysis systems such as cryogenic assemblies, researchers utilize analytical attachments to investigate samples in their frozen state. Many cryogenic researchers use analytical attachments such as optical microscopy to study single molecules. This is achieved by using a microscope objective to focus and/or collect light from a sample which is held at cryogenic temperatures. Microscope objectives are precisely manufactured chains of lenses which are conventionally designed for room-temperature use.

High light collection efficiency also requires the objective to have a very small working distance between its tip and a sample. Researchers have historically traded off objective performance for longer working distances to allow the objective to be mounted outside of the cryostat.

The present disclosure provides cryogenic assemblies and methods, embodiments of which overcome one or more of the shortcomings of the prior art.

SUMMARY OF THE DISCLOSURE

Instrumental analysis systems are provided that can include: an analytical attachment axially aligned with a sample upon a sample stage; structure supporting both the attachment and the sample stage; and at least one band affixed to the analytical attachment and symmetrically about the axis of the attachment.

Methods for analyzing samples are provided. The methods can include: providing at least one band supported by a structure; firmly affixing an analytical attachment to the band, and axially aligning the attachment with a sample; and providing a temperature gradient between the band and the sample while maintaining axial alignment of the objective and the sample.

