CROSS REFERENCE TO RELATED APPLICATIONS

This application is a U.S. National Stage of PCT/KR2018/008340 filed in the Korean language on Jul. 24, 2018, which application claims the priority benefit of Korean Patent Application No. 10-2017-0094362 filed on Jul. 25, 2017 in the Korean Intellectual Property Office, the disclosure of which is incorporated herein by reference.

TECHNICAL FIELD

The present invention relates to an elasticity measurement apparatus. More particularly, the present invention relates to an elasticity measurement apparatus capable of detecting an elasticity of an elastic body such as human skin.

BACKGROUND ART

In a device for measuring an elasticity of a soft material such as rubber or skin, it may be important to contact the measuring device with a test object with a constant force in order to increase the measurement accuracy and reproducibility. However, a conventional elasticity measuring device has a disadvantage in that measurement accuracy and reproducibility are poor because there is no mechanism for contacting the measuring device with the test object.

DISCLOSURE OF THE INVENTION

Problems to be Solved

An object of the present invention provides an elasticity measurement apparatus capable of measuring an elasticity of a material such as skin or rubber easily and precisely.

Means to Solve the Problems

According to example embodiments, an elasticity measurement apparatus includes a lower layer structure having a first opening and a second opening, first and second deformable membranes covering the first and second openings to define first and second chamber and deformable upwardly and downwardly by pressure within the first and second chambers respectively, a support layer structure on the lower layer structure to protrude so as to make contact with an elastic body and configured to support the first and second deformable membranes such that the first and second deformable membranes are spaced apart from the elastic body, a driving portion configured to apply pressure within the first and second chambers to deform the first and second deformable membranes, and first and second deformation detecting portions configured to detect deformations of first and second deformable membranes. When the pressure within the first and second chambers is increased from a first pressure to a second pressure, the first deformable membrane is deformed with contacting the elastic body, while the second deformable membrane is deformed without contacting the elastic body.

In example embodiments, the first deformable membrane may include a protrusion having a predetermined height from a surface thereof, and when the pressure within the first chamber is increased from the first pressure to the second pressure, the protrusion may be in contact with the elastic body.

In this case, when the pressure in the first and second chambers is increased from the first pressure to the second pressure, the first and second deformable membranes may be deformed by same displacements.

In example embodiments, the first and second openings may have same areas.

In example embodiments, an area of the first opening may be greater than an area of the second opening.

In this case, when the pressure within the first and second chambers is increased from the first pressure to the second pressure, the first deformable membrane may be deformed by a first displacement and the second deformable membrane may be deformed by a second displacement less than the first displacement.

In example embodiments, the first and second openings may be connected to each other through a connection passage.

In example embodiments, the driving portion may include a heater configured to increase temperature within the first and second chambers, a hydraulic supply configured to supply a fluid into the first and second chambers to increase pressure therein, a piezoelectric actuator including a piezoelectric material in the first and second deformable membranes and configured to deform the first and second deformable membranes, or an electromagnetic actuator including a magnetic material or a coil and configured to deform the first and second deformable membranes.

In example embodiments, the first and second deformation detecting portions may include a piezoresistance detector configured to detect a change in resistance of an electrode pattern by the deformations of the first and second deformable membranes or a capacitance detect configured to detect a change in capacitance.

In example embodiments, the support layer structure may include a plurality of the columns which are arranged along circumferences of the first and second deformable membranes.

In example embodiments, the elasticity measurement apparatus may further include a contact sensor arranged on the support layer structure and configured to detect a contact condition with the elastic body.

According to example embodiments, an elasticity measurement apparatus includes a chamber layer structure having a first chamber and a second chamber connected to each other by a connection passage, first and second deformable membranes on a lower layer structure to constitute sidewalls of the first and second chambers and deformable upwardly and downwardly by pressure within the first and second chambers respectively, a driving portion configured to apply pressure within the first and second chambers to deform the first and second deformable membranes, and first and second deformation detecting portions configured to detect deformations of first and second deformable membranes. When the pressure within the first and second chambers is increased from a first pressure to a second pressure, the first deformable membrane may be deformed with contacting an elastic body, while the second deformable membrane may be deformed without contacting the elastic body.

In example embodiments, the first deformable membrane may include a protrusion having a predetermined height from a surface thereof, and when the pressure within the first chamber is increased from the first pressure to the second pressure, the protrusion may be in contact with the elastic body.

In this case, when the pressure in the first and second chambers is increased from the first pressure to the second pressure, the first and second deformable membranes may be deformed by same displacements.

In example embodiments, the first and second deformable membranes may have same areas.

In example embodiments, an area of the first deformable membrane may be greater than an area of the second deformable membrane.

In example embodiments, the driving portion may include a heater configured to increase temperature within the first and second chambers.

In example embodiments, the first and second deformation detecting portions may include a piezoresistance detector configured to detect a change in resistance of an electrode pattern by the deformations of the first and second deformable membranes or a capacitance detect configured to detect a change in capacitance.

In example embodiments, the elasticity measurement apparatus may further comprising a support layer structure on the chamber layer structure to protrude so as to make contact with the elastic body and configured to support the first and second deformable membranes such that the first and second deformable membranes are spaced apart from the elastic body.

In example embodiments, the support layer structure may include a plurality of the columns which are arranged along circumferences of the first and second deformable membranes.

In example embodiments, the elasticity measurement apparatus may further include a contact sensor arranged on the support layer structure and configured to detect temperature or humidity property through contact with the elastic body.

Effects of the Invention

According to example embodiments, in an elasticity measurement apparatus, a first deformable membrane may be deformed with contacting an elastic body and a second deformable membrane may be deformed without contacting the elastic body, and thus, an elasticity of the elastic body may be detected from deformation of the first deformable membrane and an inner pressure within a chamber may be detected from deformation of the second deformable membrane.

Through this, it may be possible to check and adjust whether or not the first deformable membrane is in contact with the elastic body with a constant force, and if it does not contact with a constant force, this may be corrected by using a deformation value specified through the second deformable membrane. Thus, a constant contact load may be applied between the elasticity measurement apparatus and the material. In addition, since a contact pressure between the elastic body and the elasticity measurement apparatus device is measured based on the deformation of the second deformable membrane and is set as a reference value for the elasticity, although only the first deformable membrane contacts the elastic body, there may an advantage that measures the elasticity at the contact point accurately.

Furthermore, by adjusting a height of a support layer structure and pressures within first and second chambers, it may be possible to adjust measurement sensitivity of the elasticity measurement apparatus, and a contact sensor may be further provided in the support layer structure to detect temperature and humidity properties of the elastic body.

However, the effect of the invention may not be limited thereto, and may be expanded without being deviated from the concept and the scope of the present invention.

