TECHNICAL FIELD

The disclosure relates to techniques for verifying structural integrity of materials.

BACKGROUND

Many materials are useful when their mechanical properties remain intact, but less useful when damaged, such as when cracked. Thus, detection of whether these materials are damaged is important. As one example, ceramic body plating is used to protect soldiers, police officers, and other security personnel from projectiles. Ceramic body plating may be useful when undamaged, but may be replaced after being damaged, e.g., after cracking.

X-ray scanning, including X-ray radiography and X-ray computed tomography (CT scanning) may be used to detect cracks or other defects in materials. However, such techniques may utilize large and heavy scanners, which may not be easily portable. Further, X-ray scanning and X-ray CT scanning may be relatively expensive, relatively slow, or both.

SUMMARY

In some examples, the disclosure describes an armor piece that includes a tested material; a plurality of electrical contacts distributed about and electrically connected to the tested material; and a non-volatile memory (NVM) device. The NVM device may be hardened against exposure to x-ray radiation.

In some examples, the disclosure describes a measurement system that includes an armor piece and a controller. The armor piece may include a tested material; a plurality of electrical contacts distributed about and electrically connected to the tested material; and a NVM device. The NVM device may be hardened against exposure to x-ray radiation, and the NVM device is configured to store data comprising control voltage values associated with the tested material. The controller may be configured to cause an electrical signal to be applied to a pair of drive electrical contacts from the plurality of electrical contacts; cause a measured voltage to be determined using a measurement electrical contact from the plurality of electrical contacts; retrieve a control voltage value from the NVM device; and determine whether the tested material includes a crack or other defect based on the measured voltage and the control voltage.

In some examples, the disclosure describes a method that includes attaching a plurality of electrical contacts to a tested material. An armor piece may include the tested material. The method also may include attaching a NVM device to the tested material. The NVM device may be hardened against exposure to X-ray radiation. The method further may include writing a plurality of control voltage values to the NVM device.

In some examples, the disclosure describes a method that includes retrieving a plurality of control voltage values from a NVM device attached to an armor piece including a tested material. The method also may include causing the tested material to be exposed to X-ray radiation. The method further may include writing the plurality of control voltage values to the NVM device.

The techniques described herein may provide one or more advantages. For example, using a measurement system in which a NVM device is attached to the tested material may allow control voltage values associated with the tested material to be kept with the tested material. Further, as the NVM device may be hardened against exposure to X-ray radiation, the tested material also may be tested using X-ray radiography or X-ray computed tomography testing while reducing a likelihood that control voltage values stored by the NVM device suffer errors due to exposure to X-ray radiation. This may facilitate use of measurement systems described herein, which may offer improved portability and cost compared to an X-ray radiography or X-ray computed tomography system, while offering sufficient accuracy and detail to enable detection of cracks or other defects in a tested material being used in the field.

The details of one or more examples are set forth in the accompanying drawings and the description below. Other features, objects, and advantages will be apparent from the description and drawings, and from the claims.

