BACKGROUND OF THE INVENTION

1. Field of the Invention

The invention relates to a chip, and in particular, to a semiconductor chip.

2. Description of Related Art

In a current electronic device, when a chip in the electronic device is cracked, the cracking often affects a signal or voltage transmission in the chip, thereby causing a circuit block in the chip to be completely disabled.

SUMMARY OF THE INVENTION

The invention provides a chip, which may effectively prevent a circuit block from being completely disabled due to cracking.

The chip of the invention includes a circuit block. The circuit block includes a first transistor and a second transistor. The first transistor is divided into a plurality of first sub-transistors connected in parallel. The second transistor is divided into a plurality of second sub-transistors connected in parallel. The first sub-transistors and the second sub-transistors are disposed in a first row and a second row of the circuit block in a staggered manner. The first transistors disposed in the first row and the second row respectively receive a first input signal through different signal lines. The second transistors disposed in the first row and the second row respectively receive a second input signal through different signal lines.

The chip of the invention includes a circuit block, a power trace, and a power supply circuit. The power trace is divided into a first power trace and a second power trace connected in series. The power trace is coupled to the circuit block. The power supply circuit is divided into a first power supply circuit and a second power supply circuit. The power supply circuit is coupled to the power trace. The power supply circuit provides a first voltage to the circuit block through the power trace. Two ends of the first power trace are respectively coupled to the first power supply circuit and the second power supply circuit. Two ends of the second power trace are respectively coupled to the first power supply circuit and the second power supply circuit.

Based on the above, the first transistor and the second transistor are disposed in the first row and the second row of the circuit block in a staggered manner, and receive the input signal through different signal lines, so that when a crack occurs on the chip, complete disability of the circuit block may be effectively avoided.

