CROSS REFERENCE TO RELATED APPLICATIONS

This application is a U.S. National Phase of International Patent Application No. PCT/JP2019/024232 filed on Jun. 19, 2019, which claims priority benefit of Japanese Patent Application No. JP 2018-144862 filed in the Japan Patent Office on Aug. 1, 2018. Each of the above-referenced applications is hereby incorporated herein by reference in its entirety.

TECHNICAL FIELD

The present disclosure relates to a measurement device used for digital holography.

BACKGROUND ART

In digital holography, for example, light emitted from a light source and light reflected by a measurement target are caused to interfere with each other, and interference fringes generated by interference between these kinds of light are detected, thereby making it possible to obtain information about a three-dimensional shape of the measurement target. For example, PTL 1 discloses a technology for removing a background light component included in detected light in a case where interference fringes are detected with use of pre-detected background light.

CITATION LIST

Patent Literature

PTL 1: Japanese Unexamined Patent Application Publication No. H11-194011

SUMMARY OF THE INVENTION

In digital holography, high measurement accuracy is desired, and a further improvement in measurement accuracy is expected.

It is desirable to provide a measurement device that makes it possible to enhance measurement accuracy.

A measurement device according to an embodiment of the present disclosure includes a pixel and a processor. The pixel includes a light receiver, a plurality of storage sections, and an electric charge supplying section. The light receiver is configured to generate received-light electric charge by performing photoelectric conversion on the basis of light. The plurality of storage sections is configured to store the received-light electric charge. The plurality of storage sections includes a first storage section and a second storage section. The electric charge supplying section is configured to selectively supply the received-light electric charge generated by the light receiver to the plurality of storage sections. The processor is configured to generate a first detection value on the basis of an electric charge amount of the received-light electric charge stored in the first storage section, is configured to generate a second detection value on the basis of an electric charge amount of the received-light electric charge stored in the second storage section, and is configured to generate a first pixel value on the basis of a difference between the first detection value and the second detection value.

In the measurement device according to the embodiment of the present disclosure, the pixel includes the light receiver, the plurality of storage sections, and the electric charge supplying section. In the light receiver, the received-light electric charge is generated by performing photoelectric conversion on the basis of light. The received-light electric charge generated by the light receiver is selectively supplied to the plurality of storage sections by the electric charge supplying section. In the processor, the first detection value is generated on the basis of the electric charge amount of the received-light electric charge stored in the first storage section of the plurality of storage sections, and the second detection value is generated on the basis of the electric charge amount of the received-light electric charge stored in the second storage section. The first pixel value is then generated on the basis of a difference between the first detection value and the second detection value.

According to the measurement device according to the embodiment of the present disclosure, the first detection value is generated on the basis of the electric charge amount of the received-light electric charge stored in the first storage section, the second detection value is generated on the basis of the electric charge amount of the received-light electric charge stored in the second storage section, and the first pixel value is then generated on the basis of a difference between the first detection value and the second detection value, which makes it possible to enhance measurement accuracy. It is to be noted that effects described here are not necessarily limitative, and any of effects described in the present disclosure may be provided.

