INCORPORATION BY REFERENCE

The disclosure of the following priority application is herein incorporated by reference: Japanese Patent Application No. 2019-234813 filed Dec. 25, 2019

TECHNICAL FIELD

The present invention relates to a direct sample introduction device and a method for cooling a sample introduction probe

BACKGROUND ART

In a mass spectrometer, other than a method for introducing a sample to be analyzed which has passed through a preliminary analyzer such as a gas chromatograph, a direct sample introduction method (direct introduction probe method or direct exposure probe method) in which a sample to be analyzed is introduced directly into an ion source without passing through the preliminary analyzer is also utilized. In the direct sample introduction method, a probe with a solid or liquid sample to be analyzed inserted in or coated at the tip is introduced into the mass spectrometer, and the probe is heated to vaporize the sample to be analyzed (See Patent Literature 1).

CITATION LIST

Patent Literature

Patent Literature 1: Japanese Laid-Open Patent Publication No. 2009-264950

SUMMARY OF INVENTION

Technical Problem

In the direct sample introduction method, a probe is heated to around 500° C. in order to vaporize a sample. Therefore, in order to take out the probe used for introducing the sample from a direct sample introducing device or a mass spectrometer, it is necessary to wait for the temperature of the probe to drop to around room temperature for safety. Therefore, because of a waiting time required for cooling the probe during the analysis of a plurality of samples, it is difficult to sufficiently improve the analysis throughput.

Solution to Problem

According to the first aspect, a direct sample introduction device includes: a pre-evacuating chamber that has an internal space extending in a first direction through which a sample introduction probe extends in the first direction; a first ventilation unit that is allowed to be opened and closed, with a first end thereof being connected to the pre-evacuating chamber; and a second ventilation unit a first end of which is connected to the pre-evacuating chamber and a second end of which is connected to a low pressure source.

According to the second aspect, a method of cooling a sample introduction probe includes: arranging a sample introduction probe in the pre-evacuating chamber having an internal space extending in a first direction; supplying gas to an inside of the pre-evacuating chamber through a first ventilation unit a first end of which is connected to the pre-evacuating chamber; and evacuating gas of the inside of the pre-evacuating chamber through a second ventilation unit a first end of which is connected to the pre-evacuating chamber.

Advantageous Effects of Invention

According to the present invention, the heated sample introduction probe can be cooled in a short time, and the waiting time for taking out the sample introduction probe can be shortened.

