The present invention relates to an electrostatic discharge protection structure.
It is well known that semiconductor Integrated Circuits (ICs) may be damaged by Electro-Static Discharge (ESD). Four different causes are identified to be responsible for the ESD phenomenon. The first cause, due to the human body, results from electrostatic stress exerted on an IC when a human carrying electrostatic charges touches the lead pins of the IC. The second cause, due to handling by a machine, results from electrostatic discharge that occurs when a machine carrying electrostatic charges comes into contact with the lead pins of an IC. The third cause, due to charged devices, results from the ESD current spike generated when an IC's lead pins carrying electrostatic charges are grounded during the handling of the IC. TheTrial day dawns for Steubenville: editorial

View full sizeLong before the trial was to begin, Steubenville became the site of protests involving the case. This is a Jan. 5 rally at the Jefferson County Courthouse.Associated Press file

On Wednesday, in Jefferson County Juvenile Court, the gavel drops on a sexual-assault trial that has drawn worldwide attention for what it says about small-town insularity, the link between partying and sexual violence among young people and how social media can turn up the volume -- for good and ill.

It features two sophomore starters of a storied football team and the 16-year-old survivor of a alleged rape that went viral and triggered international outrage. Social media were used to incite civil disobedience and witnesses escaped prosecution even though they admitted shooting photographs or