Abstract Noisy labeled data represent a rich source of information that often are easily accessible and cheap to obtain, but label noise might also have many negative consequences if not accounted for. How to fully utilize noisy labels has been studied extensively within the framework of standard supervised machine learning over a period of several decades. However, very little research has been conducted on solving the challenge posed by noisy labels in non-standard settings. This includes situations where only a fraction of the samples are labeled (semi-supervised) and each high-dimensional sample is associated with multiple labels. In this work, we present a novel semi-supervised and multi-label dimensionality reduction method that effectively utilizes information from both noisy multi-labels and unlabeled data. With the proposed Noisy multi-label semi-supervised dimensionality reduction (NMLSDR) method, the noisy multi-labels are denoised and unlabeled data are labeled simultaneously via a specially designed label propagation algorithm. NMLSDR then learns a projection matrix for reducing the dimensionality by maximizing the dependence between the enlarged and denoised multi-label space and the features in the projected space. Extensive experiments on synthetic data, benchmark datasets, as well as a real-world case study, demonstrate the effectiveness of the proposed algorithm and show that it outperforms state-of-the-art multi-label feature extraction algorithms.
@cite_77 , a supervised method for doing DR based on dependence maximization @cite_62 called Multi-label dimensionality reduction via dependence maximization (MDDM) was introduced. MDDM attempts to maximize the feature-label dependence using the Hilbert-Schmidt independence criterion and was originally formulated in two different ways. MDDMp is based on orthonormal projection directions, whereas MDDMf makes the projected features orthonormal. showed that MDDMp can be formulated using least squares and added a PCA term to the cost function in a new method called Multi-label feature extraction via maximizing feature variance and feature-label dependence simultaneously (MVMD) @cite_25 .
@cite_77 @cite_62 @cite_25
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Multilabel learning deals with data associated with multiple labels simultaneously. Like other data mining and machine learning tasks, multilabel learning also suffers from the curse of dimensionality. Dimensionality reduction has been studied for many years, however, multilabel dimensionality reduction remains almost untouched. In this article, we propose a multilabel dimensionality reduction method, MDDM, with two kinds of projection strategies, attempting to project the original data into a lower-dimensional feature space maximizing the dependence between the original feature description and the associated class labels. Based on the Hilbert-Schmidt Independence Criterion, we derive a eigen-decomposition problem which enables the dimensionality reduction process to be efficient. Experiments validate the performance of MDDM. We propose an independence criterion based on the eigenspectrum of covariance operators in reproducing kernel Hilbert spaces (RKHSs), consisting of an empirical estimate of the Hilbert-Schmidt norm of the cross-covariance operator (we term this a Hilbert-Schmidt Independence Criterion, or HSIC). This approach has several advantages, compared with previous kernel-based independence criteria. First, the empirical estimate is simpler than any other kernel dependence test, and requires no user-defined regularisation. Second, there is a clearly defined population quantity which the empirical estimate approaches in the large sample limit, with exponential convergence guaranteed between the two: this ensures that independence tests based on HSIC do not suffer from slow learning rates. Finally, we show in the context of independent component analysis (ICA) that the performance of HSIC is competitive with that of previously published kernel-based criteria, and of other recently published ICA methods. We derive a least-squares formulation for MDDMp technique.A novel multi-label feature extraction algorithm is proposed.Our algorithm maximizes both feature variance and feature-label dependence.Experiments show that our algorithm is a competitive candidate. Dimensionality reduction is an important pre-processing procedure for multi-label classification to mitigate the possible effect of dimensionality curse, which is divided into feature extraction and selection. Principal component analysis (PCA) and multi-label dimensionality reduction via dependence maximization (MDDM) represent two mainstream feature extraction techniques for unsupervised and supervised paradigms. They produce many small and a few large positive eigenvalues respectively, which could deteriorate the classification performance due to an improper number of projection directions. It has been proved that PCA proposed primarily via maximizing feature variance is associated with a least-squares formulation. In this paper, we prove that MDDM with orthonormal projection directions also falls into the least-squares framework, which originally maximizes Hilbert-Schmidt independence criterion (HSIC). Then we propose a novel multi-label feature extraction method to integrate two least-squares formulae through a linear combination, which maximizes both feature variance and feature-label dependence simultaneously and thus results in a proper number of positive eigenvalues. Experimental results on eight data sets show that our proposed method can achieve a better performance, compared with other seven state-of-the-art multi-label feature extraction algorithms.