Novel method for increasing accuracy of projection moire contouring of large surfaces.
Projection moire is a high resolution, non contact, full field method for measuring out of plane displacements. Here, we develop a novel model for projection moire system and derive a universal formula expressing the relation between phase variation and out of plane displacement. In order to eliminate the error caused by mismatching of pixels and changing of sensitivity coefficient, an iterative algorithm is presented which expands measurements to the magnitude of depth of field. Computer simulations and actual experiments prove the validity of the proposed method.
Optics express