The effect of the thermal reduction on the kinetics of low temperature 4He sorption and the structural characteristics of graphene oxide
The kinetics of the sorption and the subsequent desorption of 4He by the starting graphite oxide (GtO) and the thermally reduced graphene oxide samples (TRGO, Treduction 200, 300, 500, 700 and 900 degC) have been investigated in the temperature interval 1.5 20 K. The effect of the annealing temperature on the structural characteristics of the samples was examined by the x ray diffraction (XRD) technique. On lowering the temperature from 20 to 11 12 K, the time of 4He sorption increased for all the samples, which is typically observed under the condition of thermally activated diffusion. Below 5 K the characteristic times of 4He sorption by the GtO and TRGO 200 samples were only weakly dependent on temperature, suggesting the dominance of the tunnel mechanism. In the same region (T 5 K) the characteristic times of the TRGOs reduced at higher temperatures (300, 500, 700 and 900 degC) were growing with lowering temperature, presumably due to the defects generated in the carbon planes on removing the oxygen f.