Reliability of Raman measurements of thermal conductivity of single layer graphene due to selective electron phonon coupling: A first principles study
Ajit K. Vallabhaneni,1,2 Dhruv Singh,3 Hua Bao,4 Jayathi Murthy,5,2 and Xiulin Ruan1,2, 1School of Mechanical Engineering Purdue, University, West Lafayette, Indiana 47907, USA 2BIRCK Nanotechnology Center, Purdue University West Lafayette, Indiana 47907, USA 3Process Technology Modeling, Intel Corporation, Hillsboro, Oregon 97124, USA 4University of Michigan Shanghai Jiao Tong University Joint Institute, Shanghai Jiao Tong University, Shanghai, China 5Department of Mechanical Engineering, University of Texas at Austin, Austin, Texas 78712, USA (Received 3 May 2015; revised manuscript received 20 January 2016; published 28 March 2016)