MEASUREMENT SYSTEM FOR INPUT BIAS –OFFSET CURRENTS OF AN OPERATIONAL AMPLIFIER
A very simple microprocessor (µP) -based dedicated instrument is designed here.' The Overall system design consists of both hardware and software designs. This set-up yields the exact values of input bias and input off-set currents on the µP display panel, one after the other, when the operational amplifier (OP- AMP) under test is connected across the test terminals.
Microprocessor Based Instrument for Resistance and Diode Testing
The component tester reported in this paper is a microprocessor based instrument. It is used for evaluating resistances in the range of 100–10M Ohms divided equally over five automatically selected ranges. It has also got the capability of testing silicon diodes for their usefulness. The diode can be connected in any particular fashion. The hardware circuit is IC based and includes resistance detector, relay drivers, buffer, constant current source, diode tester, analog to digital converter and Intel 8085 based programmable microprocessor kit.
Instrumentation: Emphasis on field: Microprocessor-based systems spawn built-in test gear
Discusses the need for more effective instruments to handle increasingly complex microprocessor-based data-processing equipment in the field. Manufacturers of equipment are under constant pressure to offer more serviceable products, because higher service costs are taking bigger bites out of profit margins for both manufacturers and users. As a result, instrument makers are churning out an array of such gear, using a variety of different techniques for troubleshooting.