Fast Full-Wave Solution for Analysis of Circular-to-Rectangular-Waveguide Multiport Junction
Fast full-wave solution for accurate analysis of circular-to-rectangular-waveguide multiport junction is presented. The solution is based on the mode-matching method. The new solution scheme is proposed and verified
Rectangular waveguide diplexers with a circular waveguide common port
Design of rectangular waveguide diplexers with a circular waveguide common port is presented. Ridged H- and E-plane circular-to-rectangular-waveguide T-junctions are proposed as an optimum diplexing manifold. Full-wave optimization is used in the diplexer design. Ka-band H- and E-plane rectangular waveguide diplexers with a circular waveguide common port are designed. Measured results are in good agreement with computed results. The sensitivity of the diplexer performance with respect to the manufacturing tolerance is examined through tolerance analysis.
Testing digital circuits using a Mixed-Signal Automatic Test Equipment
This paper presents the results of parametric testing of digital ICs using a dedicated Mixed Signal Automatic Testing Equipment. Due to the prohibitive price of the ATE equipment and dedicated Device Interface Board (DIB) for digital Integrated Circuits (ICs), a DIB for analog circuits was used to perform the testing. Despite the challenges presented by the experiments, the results prove to be accurate for the performed tests, according to the data sheet of the digital ICs and production test data provided by the manufacturer.