Single Event Effects Characterization of Maxwell 7846B DAC
Heavy ion test results indicate that the Maxwell 7846B 16 Bit DAC is susceptible to SET and SEU in the form of stable level changes at the device output.
Compendia of radiation test results of integrated circuits
Single event effects (SEE), total ionizing dose (TID) and radiation reliability data taken for existing space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.
Improvements in resolution and dynamic range for FGMOS dosimetry
The dynamic range and resolution of dosimeters based on floating-gate transistors with electronic readout can be significantly improved by simple changes in the readout process and an increase in the number of memory cells used. The new procedure is illustrated using 8-Mbit UVPROMs from ST Microelectronics.