Neutron and X-ray experiments at high temperature
2014 Advanced technologies, like for instance aerospace or nuclear engineering require the most exhaustive information on the behaviour of materials used at very high temperature such as ceramics, refractory alloys or molten metals. Among high temperature techniques, X-rays and more recently neutron scattering have appeared as powerful tools to get information, mainly structural, on these materials in their working conditions. High temperature devices (above 2 000 K) developed for that purpose, based on various heating techniques (induction, imaging furnaces, lasers, gas-flame heaters and principally Joule heated devices) are reviewed. Some crucial points are particularly emphasized such as : 2014 the determination of the real temperature (thermocouples and optical pyrometry) in the scattering zone hardly accessible partly due to the unavoidable thermal gradients, 2014 the chemical reactivity of the sample with its surrounding, i.e. atmosphere and sample holder. Neutrons, mainly because of their low absorption by matter, allow the work on real bulky materials and give a greater freedom in the conception of high temperature scattering devices compared to X-rays. At the present time thermal neutron high flux reactors offering a wide range of neutron wavelengths are available, and a new generation of more and more efficient multidetectors has emerged in the last decade; the data acquisition and consequently the high temperature exposure time have been notably reduced, opening a way for precise and reliable experiments in the 3 000 K range. This very high temperature domain already studied by a few other techniques can also be investigated by neutron scattering. Revue Phys. Appl. 19 (1984) 649-662 SEPTEMBRE 1984, PAGE (*) The author’s personal work has been done at the ILL (HFR Grenoble). Now with the Equipe de Physico-Chimie Moleculaire, CENG-DRF, 85X, 38041 Grenoble Cedex, France. REVUE DE PHYSIQUE APPLIQUEE. T. I9, N° 9, SEPTEMBRE 1984 45 Article published online by EDP Sciences and available at http://dx.doi.org/10.1051/rphysap:01984001909064900
Sample environments and techniques combined with small angle X-ray scattering.
The number of synchrotron radiation-based Small Angle X-ray Scattering beamlines has increased considerably over the last decade. With the high X-ray flux and collimation of these beamlines it not only has become possible to perform time-resolved experiments on time scales down to the millisecond/frame range, but also it allows experimenters to utilise new sample environments and use simultaneous several experimental techniques on one sample. An overview of recent developments in this field is given.
Photoreflectance characterization of vanadium-doped GaAs layers grown by metalorganic vapor phase epitaxy
Abstract We characterized the vanadium-doped (GaAs:V) layers grown on GaAs substrate by metalorganic vapor phase epitaxy. The conductivity of the samples is checked by the Hall effect measurements, and it is n type with electrons concentration ranging from 2×10 13 to 2×10 17  cm −3 . We used the photoreflectance technique (PR) to study the effect of vanadium doping on the optical properties of GaAs. Our experimental results show that the built-in electric field F and the broadening parameter Γ 0 increase with V-doping concentration. Furthermore, the temperature dependence of the built-in electric field and the broadening parameter of GaAs:V samples have been investigated by PR. It has been observed that these parameters increase with increasing temperature. The decrease of the built-in electric field with decreasing temperature is due to the photovoltage effect.We characterized the vanadium-doped GaAs (GaAs:V) layers grown on GaAs substrate by metalorganic vapor phase epitaxy.