Structual and Dielectric Properties of Pb(Zr0.53Ti0.47)O3 Thin Films Grown on LaNiO3 Buffered Si Substrates
Ferroelectric Pb(Zr0.53Ti0.47)O3 thin films with thickness of around 800 nm were prepared on LaNiO3 (LNO) buffered SiO2/Si substrates by sol-gel method. The LNO buffer layer serves as the bottom electrode and the template for growing PZT thin films with preferred orientation. The (110)-textured PZT thin films can be obtained on 250 nm-thick LNO buffered SiO2/Si substrates. Upon using the LNO buffer layer, the annealing temperature of the PZT films is lowered to 600degC. Our results indicate that PZT thin films prepared on LNO buffered Si substrates have good structural and dielectric properties for sensor and actuator applications.
Combined annealing temperature and thickness effects on properties of PbZr0.53Ti0.47O3 films on LaNiO3/Si substrate by sol–gel process
Abstract PbZr 0.53 Ti 0.47 O 3 (PZT) films with different thickness were deposited on LaNiO 3 -coated Si substrate by modified sol–gel process. The thickness effect on structure and properties of PZT films annealed at different temperature have been investigated. Single perovskite-phase PZT films with preferred [1 0 0] orientation and denser columnar structure were obtained, when annealed at a lower temperature of 600 °C, whereas a higher annealing temperature of 700 °C resulted in [1 1 0] preferred orientation and porous structure. The dielectric and ferroelectric properties of PZT films annealed at different temperature were evaluated systemically as a function of thickness, and the dielectric and ferroelectric properties of PZT films were found to greatly depend on both thickness and annealing temperature.
SR topography of plastically deformed Fe-Si bicrystals - observation in situ and post mortem
SR reflection topography was applied to study the interaction of slip dislocations with the grain boundaries in Fe-4at%Si bicrystals deformed by compression. Three experimental settings with either a white or monochromatic beam were used and the corresponding orientation contrast analysed. Dislocation transmission through the grain boundary was observed in bicrystals with favourable geometry of the slip systems.