Chosen diagnostic methods of photovoltaic modules
Solar modules under ordinary working condition are exposed to amount of degradation factors which deteriorate their properties. The most important degradation of PV modules during operation are optical, electrical and thermal degradation. The result of these factors is performance degradation of the modules, or even can caused their fault. It is important to find the cause of the fault and its timely removal. The choice of convenient diagnostic method can reduce financial losses and increases safety of photovoltaic power plant. The example of tests performed on PV modules by using infrared (IR) thermography and, potential induced degradation (PID) are presented in this paper.
PHOTOVOLTAIC POWER PLANT AT THE INSTITUTE OF POWER AND APPLIED ELECTRICAL ENGINEERING
The contribution deals with the current state of the photovoltaic power plant installed at Slovak University of Technology in Bratislava. The power plant with an installed power of 20 kW peak has been operated since August 2012. The purpose of this experimental power plant is to enable in-operation state modelling for researchers and students, which cannot be conducted in profit-oriented commercial power plants.
OPTICAL PROPERTIES OF RE-CRYSTALLIZED POLYCRYSTALLINE SILICON THIN FILMS FROM a-Si FILMS DEPOSITED BY ELECTRON BEAM EVAPORATION
This paper deals with the structural and optical properties of the polycrystalline silicon films initially deposited in amorphous state by electron beam evaporation technology on a Corning glass and consequently thermally re-crystallized from solid phase. The re-crystallization process was “in situ” monitored by X-ray diffraction using an evacuated high temperature chamber at temperatures from 590 ◦ C to 650 ◦ C. Optical properties of the films carried out from the optical spectrophotometry recorded in a visible range of electromagnetic spectra were then confronted with the micro-structure parameters of the films. Relationships between the crystalline/amorphous composition, crystallite size, optical band-gaps and spectral extinction coefficients are clearly demonstrated. K e y w o r d s: optical properties, a-Si thin films, annealing