Performance degradation simulation of electronic product for reliability analysis
To study analysis method of performance degradation during long term operation based on function simulation, accelerated degradation test was carried out on the power supply module directly, and the test data was used for reliability analysis. As the same time, accelerated degradation test was carried out on the key components in power supply circuit. The test data was injected into the functional simulation model of power supply to simulate performance degradation and analyze reliability. Finally the results of the two kinds of analysis were compared to demonstrate the effectiveness of the proposed simulation method. Comparison shows that average life span of power supply is 281560 hours based on accelerated degradation test while 357290 hours based on degradation simulation. Since only considering degradation of the key components, the result of simulation method is of partial optimism. But the deviation is in a reasonable range, which proved that the method is effective.
Reliability Assessment of Electronic Parts Based on Cumulative Degradation by SSADT
In order to assess the storage reliability of electronic parts of new ammunition quickly,the method of step-stress accelerated degradation testing(SSADT) was put forward.First the scheme of electronic parts by SSADT was expatiated.Then the basic hypothesis of reliability assessment of electronic parts based on cumulative degradation by SSADT was brought forward.The train of thought and method of the reliability assessment method was analyzed particularly.The method achieved storage reliability assessment of ammunition electronic parts under the condition of "zero failure".
BS Model for Degradation Failure of Electronic Product
The failure of some electronic products is defined in terms of a specified level of degradation. Life tests can only provide degradation measurements over time. In such cases, it is difficult to assess reliability with traditional reliability model. The degradtation of electronic product is similar to the fatigue of materials. Metallized fdm pulse capacitor is used as an example to research the application of BS model for reliability of electronic product in this paper. BS model for the capacitor is derived from the process of failure. Compared with other models, such as Weibull model, BS model is better for assessing reliability of metallized film pulse capacitor. From this example, we believe BS model could be used for degradation failure of electronic product.