Kinematic error modeling and analysis of the loading device based on multi-body theory and stream of variation theory
Because of some reasons such as machining error and assembly clearance, the loading device will produce kinematic error during movement. While kinematic error will have a great significance on the position accuracy of the loading device. For the above reasons, firstly, the topological structure of the loading device was described based on lower body arrays. The kinematic error matrices of adjacent parts in the loading device were obtained by multi-body system kinematic theory and homogeneous translation matrix (HTM). Then an improved error modeling method was put forward, which combined multi-body system theory with stream of variation theory. And the kinematic error model of the loading device was set up with this method. Numerical results could clearly display the error transformation and propagation among components. Finally, the effect of every kinematic error on final deviation was analyzed, and error sources of a greater effect on the final deviation were obtained. This method can provide a theoretical basis to improve the accuracy of the loading device.
Error Analysis of Three-axis Turntable Aimed at Assembling Based on Multi-system Kinematics Theory
The assembling error of three-axis turntable is unavoidable during assembling process,which is one of the primary system error sources.The terminal error expression of the turntable was deduced by the theories of multi-system kinematics error and homogeneous translation in consideration of the assembling errors' effect.The influences of all error items on the precisions of orientation and location for the turntable were compared by the simulated results.The kinematics law of the turntable with error was explored.The above mentioned researches lay the foundations for error allocation,error probability design and error separation.
General expression for the density effect for the ionization loss of charged particles
The equations for the density-effect correction $\ensuremath{\delta}(X)$ for the ionization loss as given in a previous paper have been extended to the case where $\ensuremath{\delta}({X}_{0})\ensuremath{\equiv}{\ensuremath{\delta}}_{0}g0$. Here ${X}_{0}$ is the lower limit of the range ${X}_{0}lXl{X}_{1}$, where a particularly simple expression for $\ensuremath{\delta}(X)$ applies; $X={log}_{10}(\frac{p}{{m}_{0}c})$, where $p$ is the momentum and ${m}_{0}$ is the mass of the incident particle. The case ${\ensuremath{\delta}}_{0}g0$ applies directly to the calculation of $\ensuremath{\delta}(X)$ for conductors (metals).