Engineering the Alcator C-Mod MSE diagnostic: Solutions to reactor-relevant diagnostic challenges
Deploying precise optical diagnostics in harsh reactor environments poses significant engineering challenges including limited access, large forces, time-varying systematic errors, reflections, low signal-to-background levels and a need for in-situ calibration. Fielding a polarization-based Motional Stark Effect (MSE) diagnostic on Alcator C-Mod has proven to be difficult due to similar challenges, which has led to the development of solutions that enable polarization angle measurements with an accuracy of 0.2 degrees.
Robotic calibration of the motional Stark effect diagnostic on Alcator C-Mod.
The capability to calibrate diagnostics, such as the Motional Stark Effect (MSE) diagnostic, without using plasma or beam-into-gas discharges will become increasingly important on next step fusion facilities due to machine availability and operational constraints. A robotic calibration system consisting of a motorized three-axis positioning system and a polarization light source capable of generating arbitrary polarization states with a linear polarization angle accuracy of <0.05° has been constructed and has been used to calibrate the MSE diagnostic deployed on Alcator C-Mod. The polarization response of the complex diagnostic is shown to be fully captured using a Fourier expansion of the detector signals in terms of even harmonics of the input polarization angle. The system's high precision robotic control of position and orientation allow it to be used also to calibrate the geometry of the instrument's view. Combined with careful measurements of the narrow bandpass spectral filters, this system fully calibrates the diagnostic without any plasma discharges. The system's high repeatability, flexibility, and speed has been exploited to quantify several systematics in the MSE diagnostic response, providing a more complete understanding of the diagnostic performance.
Selective etching of InP in NaF solution
Abstract The crossing porous structure of InP has been obtained by electrochemical etching in NaF solutions. The behavior of the periodic oscillation occurs at different potential ranges for the different concentrations of solutions, and it will disappear with the concentration of the solution decreased. The scanning electron microscope (SEM) image shows that the pores have two directions on the surface and are perpendicular to each other. The two directions are assigned to [0 1 1] and [ 0 1 ¯ 1 ], respectively. The SEM image of the cross-section also shows that the two directions are assigned to [1 1 1]B and [ 1 1 ¯ 1 ¯ ]B. Both are due to the selective etching of F− ions. The crossing porous structure of InP is a very promising feature for the three-dimensional structure of III–V compound semiconductors for photonic band gap materials.