Synthesis of meso-tetra-(2-chloro-4-sulfophenyl) prophyrin and spectrophotometric determination of trace amounts of cadmium
Synthesis of a new high sensitive water soluble chromogenic reagent meso-tetra-(2-chloro-4-sulfophenyl) prophyrin and the conditions for the reaction of this reagent with cadmium (I) were studied. The apparent molar absorption coefficient at 434 nm is 5.20×105 L·mol−1·cm−1. The method has been applied to the determination of 5.0×10−9 (content by weight) Cadmium (I) in honey.
Spectrophotometric and analogue derivative spectrophotometric determination of ultramicro amounts of cadmium with cationic porphyrins.
alpha,beta,gamma,delta-Tetrakis(1-methylpyridinium-3-yl)porphine [T(3-MPy)P] and alpha,beta,gamma,delta-tetrakis(1-methylpyridinium-4-yl)porphine [T(4-MPy)P] have been found to react rapidly with cadmium to give coloured complexes in weakly alkaline media at room temperature. Simple and practical methods for the determination of cadmium at ng/ml levels by conventional and analogue derivative spectrophotometry have been proposed. The analogue method gives higher sensitivity. T(3-MPy)P gives higher sensitivity than T(4-MPy)P. The interference of various foreign cations and anions has also been examined and in many cases eliminated or reduced. Adsorption of the porphyrins and their cadmium complexes onto the glassware, which is usually observed under the conditions of reaction and causes significant errors in the determination, can be suppressed almost completely by addition of fairly large amounts of a salt such as sodium chloride.
“ PARTIALLY-ACTIVATED ” FLUX RESIDUE IMPACTS ON ELECTRONIC ASSEMBLY RELIABILITIES
The reliabilities of the flux residue of electronic assemblies and semiconductor packages are attracting more and more attention with the adoption of no-clean fluxes by majority of the industry. In recent years, the concern of “partiallyactivated” flux residue and their influence on reliability have been significantly raised due to the miniaturization along with high density design trend, selective soldering process adoption, and the expanded use of pallets in wave soldering process. When flux residue becomes trapped under low stand-off devices, pallets or unsoldered areas (e.g. selective process), it may contain unevaporated solvent, “live” activators and metal complex intermediates with different chemical composition and concentration levels depending on the thermal profiles. These partially-activated residues can directly impact the corrosion, surface insulation and electrochemical migration of the final assembly. In this study, a few application tests were developed internally to understand this issue. Two traditional liquid flux and two newly developed fluxes were selected to build up the basic models. The preliminary results also provide a scientific approach to design highly reliable products with the goal to minimize the reliability risk for the complex PCB designs and assembly processes.