Corrosion resistance consolidation of a diaphragm type vacuum sensor
This paper describes the corrosion resistance consolidation of a diaphragm type vacuum sensor using a high corrosion resistance material. Initially, we had fabricated a vacuum sensor using a Ru based thin film amorphous alloy, whose high corrosion resistance was confirmed in wet tests. In the high corrosion gas tests, however, the sensor resists NF<inf>3</inf> and COF<inf>2</inf> gases but does not resist ClF<inf>3</inf> gas. Therefore, we searched for new Ni based amorphous alloys which can also resist ClF<inf>3</inf> using a combinatorial search based on a MEMS process. We were able to fabricate new sensors using Ni<inf>56</inf>Nb<inf>33</inf>Ti<inf>11</inf> and Ni<inf>49</inf>Nb<inf>35</inf>Ti<inf>16</inf> amorphous alloys which were shown to resist all three mentioned gases.
Combinatorial Arc Plasma Deposition of Thin Films
In this paper, we introduce a new combinatorial thin film deposition process that uses arc plasma [combinatorial arc plasma deposition (CAPD)]. The major goal of CAPD in this study is to search for new compositions of amorphous thin film alloys. CAPD uses three cathodic arc plasma guns and the guns shoot the pulse like plasma one by one at a specific time interval. The plasma from each gun is guided onto a substrate by a magnetic field at a specific area on the substrate so as to deposit a compositionally-graded thin film. The deposited thin film is separated into 1,089 samples (the size of each is 1 ×1 mm2) by a trench grid on the substrate. The samples together are called the thin film library and all samples are numbered by the 5-bit row and column marks in the grid. To prove CAPD, a thin film library of a Pd–Cu–Si alloy system was deposited. The composition and non crystallinity of 180 samples were evaluated using energy-dispersive X-ray fluorescence spectrometer (EDX) and imaging-plate X-ray diffractometer (IP-XRD), respectively. Both measurements were performed without detaching the samples from the library. Analysis of 180 samples showed a graded composition, and some of the samples were shown to be amorphous.
Misdiagnosis of OEIS complex as omphalocele in autosite of epigastric heteropagus: a case report and literature review
Heteropagus twins are characterized by an incomplete component (parasite) that is normally smaller and dependent on the relatively complete host (autosite). Epigastric heteropagus refers to the attachment between the parasite and autosite to be in the epigastric region of the autosite. The associated abnormality in the autosite determined the clinical outcome. If the autosite is not associated with an omphalocele, but an OEIS complex (an acronym for omphalocele, exstrophy of the bladder, imperforate anus and spinal defects), the prenatal management is completely different because the prognosis of an OEIS complex is usually poorer than an omphalocele. Herein is reported an autosite associated with an OEIS complex, which was misdiagnosed as an omphalocele prenatally, and analyze similar published cases.