Use of thermal sieve to allow optical testing of cryogenic optical systems.
Full aperture testing of large cryogenic optical systems has been impractical due to the difficulty of operating a large collimator at cryogenic temperatures. The Thermal Sieve solves this problem by acting as a thermal barrier between an ambient temperature collimator and the cryogenic system under test. The Thermal Sieve uses a set of thermally controlled baffles with array of holes that are lined up to pass the light from the collimator without degrading the wavefront, while attenuating the thermal background by nearly 4 orders of magnitude. This paper provides the theory behind the Thermal Sieve system, evaluates the optimization for its optical and thermal performance, and presents the design and analysis for a specific system.
Cryogenic performance of the JWST primary mirror segment engineering development unit
The JWST (James Webb Space Telescope) primary mirror consists of 18 hexagonal mirror segments each approximately 1.5 meters point to point. The mirror segments are constructed from a lightweight beryllium substrate with both a radius-of-curvature actuation system and a six degree-of-freedom hexapod actuation system. The manufacturing process for each individual mirror assembly takes approximately six years due to limitations dealing with the number of segments and manufacturing & test facilities. In order to catch any manufacturing or technology roadblocks, as well as to streamline specific processes, an Engineering Development Unit (EDU) was built to lead the mirror manufacturing flow. This development unit has all of the same requirements as the flight units and is actually considered to be one of the flight spare mirrors. The EDU was manufactured with a lead time of approximately six months over the other mirrors to assure adequate time to optimize each step in the manufacturing process. Manufacturing and tests occurred at six locations across the U.S. with multiple trips between each. The EDU recently completed this arduous process with the final cryogenic performance test of the mirror assembly taking place at Marshall Space Flight Center's (MSFC) X-Ray & Cryogenic Facility (XRCF). Testing included survivability tests to 25 Kelvin, hexapod & radius-of-curvature actuation systems testing, and cryogenic figure & prescription testing. Presented here is a summary of the tests performed along with the results of that testing.
Photoreflectance characterization of vanadium-doped GaAs layers grown by metalorganic vapor phase epitaxy
Abstract We characterized the vanadium-doped (GaAs:V) layers grown on GaAs substrate by metalorganic vapor phase epitaxy. The conductivity of the samples is checked by the Hall effect measurements, and it is n type with electrons concentration ranging from 2×10 13 to 2×10 17  cm −3 . We used the photoreflectance technique (PR) to study the effect of vanadium doping on the optical properties of GaAs. Our experimental results show that the built-in electric field F and the broadening parameter Γ 0 increase with V-doping concentration. Furthermore, the temperature dependence of the built-in electric field and the broadening parameter of GaAs:V samples have been investigated by PR. It has been observed that these parameters increase with increasing temperature. The decrease of the built-in electric field with decreasing temperature is due to the photovoltage effect.We characterized the vanadium-doped GaAs (GaAs:V) layers grown on GaAs substrate by metalorganic vapor phase epitaxy.