Mean Time to Achieve a Failure-Free Requirement under Provisions of Spare and Repair
This paper obtains an expression for the mean test-time to achieve a failure-free requirement under the provisions of spare and repair.
Mean Time to Achieve a Failure-Free Requirement
A common reliability test procedure is to test until a given, consecutive, failure-free time has passed. This paper gives expressions for the mean time to test completion, for both elapsed and operating time, for general probability distributions. The situations in which the test is monitored periodically and the repair time is not zero are considered. The standard deviation of completion time is also discussed. The special case in which the time-to-failure distribution is exponential is treated in some detail.
12.2: Enhanced Electron Emission of the Cone‐Shaped Emitters with Carbon Nanostructures
We developed novel cone‐shaped emitters with individual carbon nanotips using the resist‐assisted patterning process. The novel cone‐shaped nanotip emitters were arranged in an array with many nano emitters in pre‐patterned diameters of 3 μm. The cone‐shaped nanotip emitters consist of a number of carbon‐based nanostructures such as nanotubes and/or nanofibers with silicon and nitrogen elements at the periphery of each element. The cone‐shaped nano‐emitters strongly adhered to the substrate due to the large area bottom contact which is covered with diffused silicon elements. The growth mechanism and enhanced electron emission of cone‐shaped nanotip emitters was discussed.