Influence of polishing on cast clasp properties.
During the polishing of clasps, two possible changes that could affect their properties are thinning of the clasp and work hardening of the alloy. Two distinctly different clasp pattern forms were selected and 20 samples of each were cast. They were then divided into two groups, polished and unpolished, in an effort to determine the total influence of the polishing procedure on clasp behavior. The results indicate that polishing produces a slightly more flexible clasp. Any influence resulting from possible work hardening is offset by the reduction of clasp thickness. Effects of width/thickness ratios and magnitude of deflections on finishing and polishing techniques may also alter clasp flexibility in the polished clasp.
Stress-relaxation testing. Part III: Influence of wire alloys, gauges, and lengths on clasp behavior.
Commonly used, commercially available dental wires have been evaluated and ranked through stress-relaxation testing to given the clinician a basis for determining their use as retentive clasp arms. Clinical laboratory principles relative to the use of wire clasp arms have been discussed. Clinical experience with the cobalt-chrome-nickel wire retentive clasp arms used in the infrabulge approach over the last 8 years has been rewarding. These wire clasps have been every bit as effective as the cast bar clasps and have proven to be superior in terms of adjustability and resistance to fracture. The relation of active clasp length to retention and permanent deformation is a crucial one and should be a component of every philosophy of design and construction of removable partial dentures.
AN ANALYSIS OF POLYMERIC THICK-FILM RESISTORS AS PRESSURE SENSORS
Abstract The strain-sensing characteristics of thick-film polymer-based resistors printed and cured on 96% alumina are presented. Two layout configurations have been analysed: planar and sandwich. Various strain-gauge characteristics have been studied, including the mechanical and temperature-dependent properties of the polymeric films. It has been shown that the planar polymer resistors exhibit low sensitivity, comparable to that of metal-foil gauges, whereas the MRM (metal-resistor-metal) configurations exhibit similar characteristics to those of cermet thick-film MRM gauges. It has also been observed that the mechanical properties of the polymeric films are significantly poorer than those of cermet-based gauges. This degradation in performance is attributed to the epoxy/pseudo-plastic structure of the polymeric thick-film resistor layer.