Magnetic probe factor with consideration of probe tilt for near-field measurement
This paper presents a frequency and space dependent analytical model of near-field magnetic probe factor with probe tilt angle for measuring electromagnetic emissions. The principle and derivation of the probe factor are elucidated. The vector-network-analyzer (VNA) measurement of the probe factor is also introduced. The correlation between the measured and calculated probe factors is finally demonstrated.
Electric Probe Measurements on Microstrip
The aim of the experimental investigation reported here is to measure the electric field of microstrip using a field probe. To establish the accuracy of these measurements, the probe is first calibrated against a known field which is obtained by analyzing a wire suspended axially in a rectangular metal tube. Measurements on a simple wire over ground plane circuit indicate that unshielded structures are basically unsuitable for accurate probe calibration. Finally, the theoretical results predicted by a numerical analysis program for microstrip, published recently, are verified by comparing these with the actual field distribution determined experimentally.
Circuit-Internal Characterization of MMICs using Two-Dimensional Electro-Optic Field Mapping in Combination with Microwave CAD Techniques
For the first time, distributions of microwave signals in an MMIC are measured by electro-optic field mapping techniques and compared with results of microwave CAD. In good agreement, the results show clear variations of the potential inside the MMIC. Moreover, the electro-optic measurement results reveal a pronounced nonlinear behaviour, of the circuit under saturation conditions. Thus, the combination of measurement and simulation provides the possibility of a circuit-intemal performance analysis of an MMIC. The results can be used as a basis for improvements of the design layout.