Effects of silicon content on properties of gas-atomized Fe-Si-Cr powders
Fe-Si soft magnetic composites, SMC have some advantages such as excellent dc current superimposed permeability and low core loss over ferrite and Fe-Si bulk cores.
Study on the preparation and magnetic properties of Fe-Si-Cr soft magnetic composite with silicone resin
The Fe-Si-Cr soft magnetic composite was prepared by modified powder and compounded silicone resin via coating, pressing and annealing. The effect of modifier(KH550) and silicone resin content for magnetic properties was studied. The modified powder and composite were characterized by x-ray diffraction(XRD), Fourier transform infrared spectroscopy(FT-IR), Scanning electron microscopy(SEM) with energy dispersive analyzer(EDX). The surface of particles was successfully modified by modifier(KH550) and coated with a uniform silicone insulating layer. The modified and coated powders were pressed into toroidal samples that were wound 20 turns with copper wire to measure DC, AC magnetic properties. The results indicated that modifier and silicone resin hindered the movement of the domain walls, leading to magnetization difficulty. However, the insulating layer increased material resistivity, thus dropped magnetic loss and improved quality factor.
Electron Metallography of a Non‐Classical Order—Disorder Transition
Transmission electron metallography has been used to resolve the microstructural changes which occur during the D03⇄L20 transition in an Fe26.5at%Al alloy. The micrographs show evidence for a) long-range-order fluctuations near the critical temperature, b) local lowering of a critical temperature in the neighborhood of domain boundaries, and c) absence of a stable two-phase field separating the D03 and L20 phases. From these results it is concluded that the subject transition is not a classical (nucleation and growth) phase change. 
 
 
 
Transmissions-Elektronenmetallographie wurde zur Auflosung mikrostruktureller Anderungen, die wahrend des D03⇄L20−Ubergangs in einer Fe26,5At%Al-Legierung auftreten, verwendet. Die Mikrographien zeigen a) Fernordnungsfluktuationen in der Nahe der kritischen Temperatur, b) lokale Erniedrigung einer kritischen Temperatur in der Nachbarschaft von Domanengrenzen und c) die Abwesenheit eines stabilen Zwei-Phasenfeldes, das die D03− und L20−Phasen trennt. Aus diesen Ergebnissen wird geschlossen, das der untersuchte Ubergang keine klassische (Keimbildungs- und Wachstums-) Phasenanderung ist.