Excess low frequency noises in some electronic materials and components
We devised burst noise eliminating equipment and characterized the 1/f and burst noise in some electronic materials, components, electric contacts and bipolar transistors. The burst-eliminated noise spectrum is the 1/f type. The noise intensity is proportional to the square of the current and to the fifth power of the contact resistance. This contact resistance dependence of the noise is analyzed with the constriction resistance of the contact surface material. The measured results are also shown in the amplitude and phase fluctuations in the transistor collector current. They are also of 1/f type and correlate each other. On the other hand, we did not find this correlation in another transistor with burst noise. Hence, the 1/f fluctuation is considered to be due to diffusion or mobility fluctuation and the burst noise is not due to the diffusion process in the solid.
1/f Noise in Metal Contacts and Granular Resistors
To measure the current noise in metal contacts and granular resistors, we arranged a noise measuring system with a switched-capacitor filter. The samples are crossbar contacts and grphite thick-film resistors. All noise spectra are the 1/f type. The noise of crossbar contacts and thick-film resistors increases in proportion to the fifth and third power of the resistance, respectively. A model for the noise of metal contacts and granular resistors is proposed. It is based on the spontaneous fluctuation of temperature of the small Conducting spots between metal surfaces and granular boundaries, respectively. The results of the analysis are qualitatively in agreement with those of measurement.
Long term response stability of a well-type ionization chamber used in calibration of high dose rate brachytherapy sources
Well-type ionization chamber is often used to measure strength of brachytherapy sources. This study aims to check long term response stability of High Dose Rate (HDR)-1000 Plus well-type ionization chamber in terms of reference air kerma rate (RAKR) of a reference 137Cs brachytherapy source and recommend an optimum frequency of recalibration. An HDR-1000 Plus well-type ionization chamber, a reference 137Cs brachytherapy source (CDCSJ5), and a MAX-4000 electrometer were used in this study. The HDR-1000 Plus well-type chamber was calibrated in terms of reference air kerma rate by the Standards Laboratory of the International Atomic Energy Agency (IAEA), Vienna. The response of the chamber was verified at regular intervals over a period of eight years using the reference 137Cs source. All required correction factors were applied in the calculation of the RAKR of the 137Cs source. This study reveals that the response of the HDR-1000 Plus well-type chamber was well within ±0.5% for about three years after calibration/recalibration. However, it shows deviations larger than ±0.5% after three years of calibration/recalibration and the maximum variation in response of the chamber during an eight year period was 1.71%. The optimum frequency of recalibration of a high dose rate well-type chamber should be three years.