Optical Investigations of Film Formation and Removal on Gold Anodes in Acidic Oxalate Solutions
RECENT investigations of the oxidation of oxalate ions in acidic solutions using gold anodes have provided electrochemical evidence for the formation of a film on this anode during steady-state electrolysis at potentials well below that for Au2O3 formation, 1.36 V normal hydrogen electrode1. The determination of the nature of the film on gold at potentials below 1.36 V using electrochemical techniques has introduced uncertainties as to whether the film is a ‘three dimensional’ oxide film or a ‘two dimensional’ chemisorbed oxygen film. Some investigators2–5 using charging curves as their basis conclude that the formation of an oxide occurs only above 1.36 V, the formation of a chemisorbed oxygen film being the process occurring below this potential. The formation of this chemisorbed oxygen film begins at potentials as low as 1 15 V (ref. 6). Other work, however, also based on electrochemical evidence, indicates that the formation of an oxide film does occur below 1.36 V (ref. 7).
Optical Measurements on Thin Films of Condensed Gases at Low Temperatures
A determination of the refractive indices of thin films of oxygen, nitrogen, carbon dioxide, water, argon, neon, and krypton condensed at 4.2°K was made. These were obtained for the 5461 A line of Hg with an ellipsometer. Similar measurements were also made on films of these gases condensed after passage through a microwave discharge. With the exception of N2 and Kr, measurable differences in refractive indices were observed between films condensed from discharged and undischarged gases.
Description of roughness profiles by separating the random and periodic components
Abstract The probability that it is not possible to obtain a significant description of roughness profiles composed of random and periodic components by using statistical methods is discussed. It is shown that the random and periodic components can be separated by using the frequency spectrum and the autocorrelation function of the profile. The physical significance of the separate components is discussed and it is shown that it is possible to describe a long crested surface by a single profile using these components The method of separating the random and periodic components allows a parametrical description of the roughness profile to be given. It is then possible to use these parameters to calculate a synthetic signal sign with the same basic properties as the measured profile.