NDE of microstructured materials by x-ray diffraction and refraction topography
For the purpose of micro structural characterization X-ray topography reveals the spatially resolved scattering of materials and small components. It combines the advantages of radiographic imaging and the analytical information of wide and small angle X-ray scattering like phase distribution, texture, micro cracks, interfaces and pores. Scanning techniques at selected scattering conditions permit the topographic characterization of any crystalline or amorphous solid or liquid. Topographic methods and applications for the purposes of research, quality control and damage evaluation are presented.
Researches on Structural Factor Involvement in Oral Tribology
This study is focused on two ceramic materials, D.SING (Ivoclar) and VM13 (emphasis the VITA TN), frequently used in restorative dentistry practice and it comes to complete a full set of results obtained by the authors over several years of research on oral tribology with main influence on oral health. In this way there are involved more specific structural aspects of dental restorative ceramic materials quality as is shown in [1].
Microstructural Characterization of Ceramic Materials by Small Angle Neutron Scattering Techniques.
The use of small angle neutron scattering (SANS) techniques for ceramic materials is discussed. Two areas are emphasized: 1) diffraction for microstructural phenomena of less than 100 nm, and 2) beam broadening for microstructural phenomena greater than 90 nm.