Structual and Dielectric Properties of Pb(Zr0.53Ti0.47)O3 Thin Films Grown on LaNiO3 Buffered Si Substrates
Ferroelectric Pb(Zr0.53Ti0.47)O3 thin films with thickness of around 800 nm were prepared on LaNiO3 (LNO) buffered SiO2/Si substrates by sol-gel method. The LNO buffer layer serves as the bottom electrode and the template for growing PZT thin films with preferred orientation. The (110)-textured PZT thin films can be obtained on 250 nm-thick LNO buffered SiO2/Si substrates. Upon using the LNO buffer layer, the annealing temperature of the PZT films is lowered to 600degC. Our results indicate that PZT thin films prepared on LNO buffered Si substrates have good structural and dielectric properties for sensor and actuator applications.
Growth of biaxially oriented conductive LaNiO3 buffer layers on textured Ni tapes for high-Tc-coated conductors
Abstract Electrically conductive LaNiO 3 buffer layers have been grown on textured nickel tapes by sputter deposition in a reducing atmosphere. These conductive buffered Ni tapes can be employed as long flexible substrates for biaxially aligned high-temperature superconductors, and can electrically stabilize the superconductor during transient loss of superconductivity. Deposition temperatures of about 400°C result in epitaxial growth of LaNiO 3 films, while higher deposition temperatures may cause the formation of La 2 NiO 4 films. X-ray θ –2 θ , θ , and φ scans reveal that the LaNiO 3 films have good out-of-plane and in-plane orientations of 5° and 9–10°, respectively. Subsequent oxygen anneals at 750°C and 850°C change neither the biaxial orientations of the film nor cause any cracks or other surface defects. The resistivity of the LaNiO 3 films can be further reduced by increasing the annealing temperature and oxygen pressure during post-annealing. Highly textured YBa 2 Cu 3 O 7 (YBCO) films were grown on the LaNiO 3 -buffered Ni by pulsed laser deposition (PLD).
The measuriment of ferromagnets magnetic characteristics using Labview software
The digital method of measurement and registration of dynamic loops hysteresis family of magneto-soft materials where, along with known analogues from electro-technical steel, magnetic materials with considerably smaller specific magnetic losses such as amorphous alloys on the basis of iron, is offered. Tests of magnetic properties of materials are carried out on the base of the hardware-software measuring complex in which along with the standard established electric equipment and USB oscillograph for realization of a digital method, the software for the personal computer developed in the environment of visual programming of Borland Delphi 7.0, connected through the ActieveX technology with the Labview 7.0 environment, is applied. The software allows carrying out input of basic data concerning geometry of prototypes of cores from magnetic materials and numbers of rounds of the magnetizing and measuring windings located on their surface. Experimental data on voltage at measuring winding terminals are processed by means of the virtual integrator in a Labview package. The developed software provides the possibility of saving the obtained hysteresis loop in the form of a text file, and creation of the hysteresis loops family on the virtual oscillograph screen.