Apollo 16 Geochemical X-ray Fluorescence Experiment: Preliminary Report
The lunar surface was mapped with respect to magnesium, aluminum, and silicon as aluminum/ silicon and magnesium/ silicon intensity ratios along the projected ground tracks swept out by the orbiting Apollo 16 spacecraft. The results confirm the observations made during the Apollo 15 flight and provide new data for a number of features not covered before. The data are consistent with the idea that the moon has a widespread differentiated crust (the highlands). The aluminum/ silicon and magnesium/ silicon concentration ratios correspond to those for anorthositic gabbros through gabbroic anorthosites or feldspathic basalts. The x-ray results suggest the occurrence of this premare crust or material similar to it at the Descartes landing site.
Chemical Mapping of Planetary Surfaces
Two instruments, the gamma-ray spectrometer and the X-ray fluorescence spectrometer, are uniquely suited to the chemical mapping of planetary surfaces from orbit. Through their detection of characteristic line spectra they measure the concentrations of a suite of elements in each area overflown. Multielement chemical maps derived from these remote measurements are used in the construction of evolutionary models of planetary bodies and of the solar system as a whole. The NaI(T1) gamma-ray spectrometer and a gas proportional X-ray spectrometer were flown over 20 percent of the lunar surface during the Apollo 15 and 16 missions. These instruments measured chemical differences across the boundaries of known lunar provinces and revealed several new features of lunar-surface composition. Advanced spectrometers which are under development for future missions are able to educe much more information in a given time span than the Apollo instruments. They may be used in possible future missions such as Lunar Polar Orbiter, a Mars orbiter, a Mercury orbiter, outer planet satellite missions, rendezvous with asteroids and cometary nuclei, and surface-penetrating planetary probes.
Changes in Quartz During Heating and the Possible Effects on Si Production
In Si and FeSi production, the main Si source is SiO2, in the form of quartz. Reactions with SiO2 generate SiO gas that further reacts with SiC to Si. During heating, quartz will transform to other SiO2 modifications with cristobalite as the stable high-temperature phase. Transformation to cristobalite is a slow process. Its rate has been investigated for several industrial quartz sources and has been shown to vary considerably among the different quartz types. Other differences in behavior during heating between these quartz sources, such as softening temperature and volume expansion, have also been studied. The quartz-cristobalite ratio will affect the rate of reactions involving SiO2. The industrial consequences and other implications of the observed difference between quartz types are discussed. Initial studies of industrial quartz were published by Ringdalen et al. In the current work, a new experimental method has been developed, and an investigation of several new quartz sources has confirmed the earlier observed large variation between different sources. The repeatability of the data has been studied and the effect of gas atmosphere investigated. The results from the earlier work are included as a basis for the discussion.