A Three-Dimensional Model for the Surface Texture in Surface Grinding, Part 2: Grinding Wheel Surface Texture Model
In order to produce ground parts that have desirable surface properties, it is necessary to understand the evolution of these characteristics through the surface generation mechanisms involved in the grinding process. Since the geometry of the wheel surface, in part, determines the final workpiece geometry, the influence of the 3-D structure of a wheel surface on the final workpiece geometry is studied. In this work, a wheel surface model is developed that can be integrated with a surface grinding process model for simulating workpiece surface texture. The simulations utilizing the integrated model are used to study the workpiece surface roughness as a function of the frequency characteristics of the wheel surface. The 2-D Fourier forward and inverse transforms are employed to study and model the 3-D surface structure. In particular, the effect of specific frequency components in the wheel surface on the ground surface are analyzed. It is shown that workpiece surfaces resulting from wheel surfaces with dominant low frequency components have higher roughness, and that the low frequency components indicate a clustering of abrasive grains on the wheel surface. @DOI: 10.1115/1.1391428#
Conditioning and monitoring of grinding wheels
Abstract The preparation of grinding tools is the most important enabling factor in the grinding process. It influences the material removal rate, the grinding forces, the surface quality as well as the material properties of the subsurface zone, and is the key issue for subsequent wear of grinding tools. The evolving and conventional conditioning technologies are reviewed based on technical and commercial aspects. Terms in the field of conditioning are defined. Strong emphasis today is put on the description and monitoring of the abrasive layer. For optimization of the dressing process, prediction of the grinding wheel topography and the ground surface are emerging scientific topics.
Unidirectional hexagonal rare-earth disilicide nanowires on vicinal Si(100)-2×1
Rare-earth disilicide nanowires grown on vicinal Si(100) with a miscut of 2–2.5° toward the [110] azimuth at 600 °C were studied by scanning tunneling microscopy and compared with those grown on flat Si(001). In contrast to rare-earth disilicide nanowires grown on flat Si(100) surfaces, the nanowires grow unidirectionally along the [01̄1] direction of the vicinal Si(100) surface. Rare-earth disilicide nanowires form bundles composed of single nanowire units on both flat and vicinal surfaces. Yet, on the vicinal surface, the bundle width is comparable to the width of the terrace. The average nanowire length on the vicinal substrate is longer than that on the flat substrate. Scanning tunneling spectroscopy shows that the rare-earth disilicide nanowires have metallic properties.