ESD events of cabled GMR sensors
ESD damage from cable discharge events (CDEs) of magnetoresistive sensors is a major problem in manufacturing of magnetic tape and hard disk drives. CDEs initiated by contact to the cable pads used to connect to external electronics represent one source. This paper addresses CDEs from other points of contact, including capacitive coupling to metal objects contacting the cable. In order for capacitively coupled ESD events to damage the sensor the capacitive coupling of the two sensor leads to the external object being discharge must be different.
A study of Cable discharge events and other short time pulses of cabled MR sensors
Sensors used in the storage industry are primarily damaged once a cable has been bonded to the head. This paper focuses on short time pulses, such as, cable discharge events (CDEs) and square wave pulses (SWPs) for MR devices with and without diode protection. Pspice models of CDE events are performed and compared with data. Measurements and Pspice models of short time SW pulses are also done which include the effects of cables and fixture capacitance and inductance.
Representation of systems disturbed by wide band noise
In this paper, a method of handling and working with wide band noise is developed. We represent wide band noise as a distributed delay of white noise and use it to reduce a nonlinear system disturbed by wide band noise to a nonlinear system disturbed by white noise. An application of this reduction to a nonlinear filtering problem under a wide band noise disturbance is discussed.