Computer simulation of the space charge dominated beam dynamics for external injection into the JINR Phasotron
A project of increasing the beam intensity of the 660 MeV JINR proton Phasotron up to 50 µA by an external injection of the H − beam with energy of 5 MeV is now under design. Computer simulation of the space charge dominated beam dynamics in Phasotron is reported. As follows from the simulation, the capture efficiency does not change too much when the beam space charge is taken into account.
Numerical simulation of space charge effects in the sector cyclotron
To study the effects of space charge in cyclotrons and synchrocyclotrons the code PHASCOL is developed. A method of large (macro)particles is realized in this code. The complete equations of motion of the charged particle in electromagnetic field of accelerator are integrated taking into account the three-dimensional self-electric field of beam. Two methods were used for the calculation of the beam field: the particle-to-particle method and the particle-in-cell one. The results of calculations which illustrate space-charge effects on the parameters of beam in the process of acceleration are given. Both methods have shown a similar influence of space charge on the beam.
AN ANALYSIS OF POLYMERIC THICK-FILM RESISTORS AS PRESSURE SENSORS
Abstract The strain-sensing characteristics of thick-film polymer-based resistors printed and cured on 96% alumina are presented. Two layout configurations have been analysed: planar and sandwich. Various strain-gauge characteristics have been studied, including the mechanical and temperature-dependent properties of the polymeric films. It has been shown that the planar polymer resistors exhibit low sensitivity, comparable to that of metal-foil gauges, whereas the MRM (metal-resistor-metal) configurations exhibit similar characteristics to those of cermet thick-film MRM gauges. It has also been observed that the mechanical properties of the polymeric films are significantly poorer than those of cermet-based gauges. This degradation in performance is attributed to the epoxy/pseudo-plastic structure of the polymeric thick-film resistor layer.