Research on imaging detection of RF leakage on the surface of spacecraft
The determination and locating of leakage point is very important to shielding effect evaluation and solving EMC problem of spacecraft. A RF leakage detection method by near field scanning imaging is presented. The electromagnetic field distribution on the surface of spacecraft can be deduced from one on the plane at some distance to the surface of spacecraft with the convolution relation between electromagnetic field distributions on two parallel planes. The imaging of RF leakage point can be obtained by the method. The effect to imaging of measurement parameters is evaluated by simulation.
Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems
A new in-house developed three-dimensional scanning system for measuring electromagnetic fields close to devices and systems is presented. The scanning system is able to perform translations along a three-dimensional Cartesian grid with arbitrary grid size so that any electromagnetic field component can be measured with high accuracy and detail. A near-field scan of an AT motherboard and of a telecom subsystem is described to illustrate the performance of the scanning system. The measurements show that the scanning, system is an excellent diagnostic tool for the detection of EMC problems in an early stage of product development.
Near Field Measurements to Predict the Electromagnetic Emission of Integrated Circuits
Employing electromagnetic emission measurements early in the design process is more and more essential as the high clock speeds of integrated circuits (ICs) lead to increased challenges in meeting the electromagnetic compatibility (EMC) requirements. Due to the shrinking time to market the characterization of the electromagnetic emission during the design cycle according to the chip level standards is often not feasible as special EMC test boards have to be designed, which often takes a long time. Therefore simple measurement techniques that can be applied using every evaluation or demo board are more and more required to give the designers first hints about the electromagnetic emission of an IC. In this paper a simple measurement technique to determine the radiated electromagnetic emissions of ICs is presented. This method is based on the measurement of the near electric and magnetic field components that are emitted out of the surface of an IC package. An advantage of this measurement technique is that it can be used without the need to build a special EMC test board.