Single Event Effects Characterization of Maxwell 7846B DAC
Heavy ion test results indicate that the Maxwell 7846B 16 Bit DAC is susceptible to SET and SEU in the form of stable level changes at the device output.
Compendia of radiation test results of integrated circuits
Single event effects (SEE), total ionizing dose (TID) and radiation reliability data taken for existing space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.
Hardness assurance and testing techniques for high resolution (12- to 16-bit) analog-to-digital converters
This paper discusses hardness assurance and testing techniques to test and evaluate total dose radiation degradation of high resolution A/D converters. A 16-bit converter with internal calibration is compared with older designs (12-/14-bit) that use more conventional architectures. The results show that measurements of dc parameters and static linearity at major code transitions should be adequate for hardness assurance testing with considerable cost savings compared to full dynamic or all-codes testing. The failure level of CMOS and BiCMOS converters depends on dose rate in a complicated way that is not adequately addressed by high-temperature annealing. Tests at low dose rates - below 0.01 rad(Si)/s - are recommended for space applications of these technologies.