Design of mid-IR microstructured fiber light source based on dysprosium doped chalcogenide glass
The paper deals with the design of a medium infrared (Mid-IR) light source based on a microstructured fiber made of dysprosium doped chalcogenide glass, Dy3+:Ga5Ge20Sb10S65. It is constituted by the cascade of a laser cavity and an optical amplifier which could be fabricated in the same microstructured fiber. In order to obtain realistic results, the simulation is performed by taking into account the spectroscopic parameters directly measured on preliminary samples of Dy3+:Ga5Ge20Sb10S65 glasses. The main objective is to investigate the feasibility of optical beam emission close to 4.4 μm wavelength. An output power of 547.3 mW with an input pump power of 3 W is calculated for an optical fiber about 1.5 m long and with a dopant concentration close to 6 × 1025 ions/m3. This result indicates that the designed source configuration is feasible for medium infrared light generation and it could find application in optical free propagation link, optical remote sensing and biomedicine.
Modelling of chalcogenide glass fibre lasers for MIR generation
The presentation gives an account of recent developments in the modelling of chalcogenide glass based lanthanide doped fibre lasers for the mid-infra-red (MIR) wavelength range. The particular lanthanide elements considered include dysprosium, praseodymium and terbium. Both classical 3 level lasing systems and cascade lasing systems are considered, and their properties compared. Steady state and pulsed operation of the lasers is considered and the possible application as a seed pump for supercontinuum generation is discussed. Several aspects of numerical methods used specifically for the modelling of MIR fibre lasers are also considered.
Testing digital circuits using a Mixed-Signal Automatic Test Equipment
This paper presents the results of parametric testing of digital ICs using a dedicated Mixed Signal Automatic Testing Equipment. Due to the prohibitive price of the ATE equipment and dedicated Device Interface Board (DIB) for digital Integrated Circuits (ICs), a DIB for analog circuits was used to perform the testing. Despite the challenges presented by the experiments, the results prove to be accurate for the performed tests, according to the data sheet of the digital ICs and production test data provided by the manufacturer.