Spin Coated YSZ Thin Films on Silicon Substrate
Yttria Stabilized Zirconia (YSZ) thin films (<10 μm) were fabricated by spin coating technique on silicon (Si). Parameters such as concentration ratio of YSZ powder to solvent were varied accordingly. The effects of these variations were investigated and discussed. Using X-ray Diffraction and Raman Spectroscopy, the crystal structure of the samples were determined. The 8-YSZ thin films have cubic fluorite structure. The X- ray diffraction patterns were in agreement with the samples' Raman spectra. Pores were evident on single coated substrates but were minimized using higher YSZ concentration. Index Terms—Yttria Stabilized Zirconia,YSZ, spin-coating, thin film ——————————  ——————————
YSZ thin films deposited by e-beam technique
Abstract YSZ thin films were grown evaporating cubic and tetragonal phase ZrO 2 stabilized by 8 wt.% of Y 2 O 3 (8% of YSZ) ceramic powders by using e-beam deposition technique. Operating technical parameters that influence thin film properties were studied. The influence of substrate crystalline structure on growth of deposited YSZ thin film was analyzed there. The YSZ thin films (1.5–2 μm of thickness) were deposited on three different types of substrates: Al 2 O 3 , optical quartz (SiO 2 ), and Alloy 600 (Fe–Ni–Cr). The dependence of substrate temperature, electron gun power, and phase of ceramic powder on thin film structure and surface morphology was investigated by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The substrate temperature was changed in the range of 20–600° C (during the YSZ thin film deposition) and its influence on the crystallinity of deposited YSZ thin films was analyzed. It was found that electron gun power and substrate temperature has the influence on the crystallite size, and texture of YSZ thin films. Also, the substrate has no influence on the crystal orientation. The crystallite size varied between 20 and 40 nm and increased linearly changing the substrate temperature. The crystal phase of evaporated YSZ powder has the influence on the structure of the deposited YSZ thin films.
Neutron-diffraction study of Zr(Ca,Y)O/sub 2-x/: Evidence of differing mechanisms for internal and external distortions
We have deduced from measurements of the neutron elastic cross section that below the order-disorder transition in Zr(Ca)O/sub 2-x/ and Zr(Y)O/sub 2-x/ the oxygen atoms are shifted from their fluorite positions. We find quantitative agreement with experiment for a model containing a rearrangement (internal shear deformation with amplitude 0.23 A) of the oxygen sublattice. The (110) internal shear deformation is the same (in symmetry and magnitude) for Zr(Ca)O/sub 2-x/ and Zr(Y)O/sub 2-x/, however, only Zr(Y)0/sub 2-x/ exhibits an external distortion. These observations are consistent with the fact that the internal rearrangement is an inhomogeneous deformation and does not require the presence of an external strain. A successful test of Cooper's search criterion leads us to an internal rearrangement mode corresponding to a q = (0,0,2..pi../a) longitudinal phonon, and points to the dominance of cation-anion interactions in determining the nature of the lattice internal rearrangement.