TRIZ APPLICATION IN DEVICE & MANUFACTURING ELECTROSTATIC DISCHARGE CONTROL
A credit card pager having a casing surrounding a substrate and electronic circuitry mounted on the substrate. An information connection including at least one molded waveguide having a core with a photonic device mounted at one end and a second end of the core being positioned on the substrate to be accessible exterior of the casing so as to communicate optical information signals therethrough.
Emerging needs for test handler CDM ESD controls
Testing of IC (integrated circuit) components is a key activity in IC component manufacturing to ensure components shipped out meet product data sheet and quality specifications. In order to achieve high productivity levels, the ATE (automated test equipment) is coupled to an automated handler. However, the use of the handler also introduces issues, such as ESD (electro-static discharge). As most traditional ESD controls are typically HBM (human body model) ESD, they do not effectively address handler ESD issues, which are predominantly charged device model (CDM). This paper details the difference in both ESD models; the assessment techniques, including advanced techniques such as EMI (electromagnetic interference) ESD detection and provide yield enhancing solutions for ESD prevention in handlers.
Test methodologies for detecting ESD events in automated processing equipment
ESD events cause device damage and equipment malfunctions in automated processing equipment. This paper surveys the problems caused by static charge in automated processing equipment. It looks at a number of test methods that detect those charges and the ESD events that occur in this equipment. It also provides examples of using these techniques to solve factory problems.