A matched expansion probe card for high temperature LSI testing
This paper describes the fabrication process and mechanical properties of a novel probe card were described. To match the thermal expansion between the probe card and a silicon wafer in wafer-level burn-in test, a Pyrex glass substrate with feedthrough connections was used to support the probes. To make the slantwise probe contactors, spray coating was used to form a uniform photoresist film on a deeply-wet-etched silicon wafer. The fabricated probe card has 13185 p/sup +/ silicon probe contactors at a pitch of 150 /spl mu/m on an area of 44.0 mm /spl times/ 45.7 mm. The rigidity of the probes is approximately 91.45 N/m. The planarity of the probe tips is within /spl plusmn/ 1 /spl mu/m from the base level.
New probe microstructure for full-wafer, contact-probe cards
We have developed a microstructure probe that features a pyramidal contact point and a cantilever structure. This probe is suitable for wafer-level burn-in (WLBI) testing, function testing, and circuit-board O/S testing. It has a simple beam lead (only 400-600 /spl mu/m long and 50-100 /spl mu/m wide) and can withstand over one million probings. The per-probe contact force is approximately 0.3 g, making the probe suitable for WLBI testing, which requires low contact force. The simple structure and small dimensions of this probe give it excellent high-frequency characteristics. Function testing of a probe card mated to SDRAM was successfully done at 100 MHz. A wafer-scale probe card can be made by splitting the card into several parts and tiling them on a base substrate. This tiling increases the yield and facilitates repairs. It also makes it possible to fabricate larger cards. This structure gives the probe substrate a relatively large (up to 10 ppm//spl deg/C) coefficient of thermal expansion, which is similar to that for alumina.
Efficacy of life skills training on general health in students
BACKGROUND
With regard to the importance of life skills, the present study deals with the effect of life skills training on general health of the students.


MATERIALS AND METHODS
This was a one-group, pre-test, post-test, quasi-experimental research. Forty students were selected through purposive sampling method. The data collection tool was Goldberg General Health Questionnaire.


RESULTS
Paired t-test showed a 22 score significant decrease in general health after education compared to before education (P < 0.01).


CONCLUSION
This study showed that life skills education increases general health level of the students.