A Material-Framework-Object Model for Learning Material Management
Following problems have been found in traditional learning material management model based on courseware: common redundancy, the overlapped and desultory construction of the learning materials, and hardly adaptive to the diversity of the learning objectives and teaching methodologies. In the paper, a material-framework-objective model was proposed to improve the efficiency and quality of learning material management in the distance education by separating and recombining the basic materials, courseware, knowledge-points and learning goals. The model can also achieve the unification of the reuse, mobility and pertinence of the learning materials. A prototyping based on this model has been developed and taken into practice in Dongbei University of Financial and Economics.
Computer supported learning. A large-scale, web-based learning and assessment system to support flexible education
With the increase in cost and resources constraints experienced by many tertiary institutions globally, the pressure to find alternative methods to deliver teaching and assessment increases. Whilst mindful of the learning experience of the individual, the need to manage the numbers, resources and assessment provide an administrative overhead and headache to every professor who has ever taught. With this predicament in mind the computer supported learning system (CSL) is a web-based teaching and learning resource and administration system, developed by the Business Education On-Line Unit of the Auckland Business School, at the University of Auckland (New Zealand). We call it Cecil. The paper describes the Cecil structure and discusses the potential benefits that a university wide resource management system may have in terms of the educational flexibility and resource sharing.
Testing digital circuits using a Mixed-Signal Automatic Test Equipment
This paper presents the results of parametric testing of digital ICs using a dedicated Mixed Signal Automatic Testing Equipment. Due to the prohibitive price of the ATE equipment and dedicated Device Interface Board (DIB) for digital Integrated Circuits (ICs), a DIB for analog circuits was used to perform the testing. Despite the challenges presented by the experiments, the results prove to be accurate for the performed tests, according to the data sheet of the digital ICs and production test data provided by the manufacturer.