Study of Arc Mobility and Reignition in a Static Gap Discharge with Magnetic Field
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New contact material for reduction of arc duration for dc application
The phenomenon of arcing is the major cause of electrical contact degradation in electrical switches. Degradation involves contact erosion and/or welding. The use of special contact material and that of specific material processing may permit contact erosion to be reduced, in particular by shortening the arc duration. A short review of these approaches is presented in the first part of this paper. In the second part, the development of a new self-blowing contact material is described. This material has been tested under dc voltages from 14 V to 42 V. A reduction of the arc duration by a factor of 4 approximately was obtained as was a concomitant reduction of the extinction gap to less than 2 mm. This material will contribute to achieving better reliability in high current-high voltages breaking devices, and will aid in their miniaturization, e.g. in relays.
Strategies for glass based photonic system integration
There is a clear tendency to integrate more and more opto-electronic and micro-optical components like optical fibers, laser diodes, modulators, isolators, beam-splitting components and micro lenses in also increasingly dense and complex assemblies. The paper will discuss thin glass as a very promising base material for that kind of photonic packaging on interposer and board level including optical interconnection using fibers.