A Full Factory Transient Simulation Model for the Analysis of Expected Performance in a Transition Period
Intel's Fab-18 is based in Israel, and has transitioned from producing 0.18-micron logic devices to producing 90 nM flash products. During this transition period, the factory has de-ramped in volume of logic while ramping-up flash. AutoSched AP software was utilized for the development of a transient simulation model of the Fab's behavior during this period. It is the first attempt, at Intel, to utilize a full factory simulation in order to analyze and support decisions that pertain to a transient period of parallel de-ramp and ramp-up of technologies. Unlike typical simulation models for the analysis of factory performance and behavior in steady-state, the transient model poses several modeling challenges and requires major adjustments in dealing with these challenges. In this paper, we discuss those aspects. The benefits and contribution of such a model to decision making and the improvement of factory performance are also presented
Managing sunset & closure of a semiconductor technology parallel to aggressive new process ramp
In the current dynamic and volatile environment of semiconductor manufacturing, factories are attempting to retool and aggressively ramp-up new technologies while ramping down existing processes. An Intel factory recently transitioned from producing 180 nm logic devices to producing 90 nm flash products. During this transition period the factory gradually discontinued its logic volume while ramping-up flash. In this paper, we will review the overall set of assumptions that were made towards the logic process ramp down and recommendations for future sunset procedures. Since some of the assumptions were materialized and some assumptions did not match reality, an extensive lessons-learned process was conducted for future technology changes.
DEM generation from new VIR sensors: IKONOS, ASTER and Landsat-7
DEM generation is a living R&D topic since new-launched satellite images can be used to generate stereoscopic images. Using a coplanarity equation model developed at CCRS and an automatic matching method developed at PCI, DEMs are generated with new VIR stereo data. Accuracy of 4.9 m with high-resolution IKONOS images, and 33 m and 101 m with medium-resolution ASTER and Landsat-7 ETM/sup +/ images respectively are obtained. The same matching accuracy of one-pixel is translated into worse results with Landsat due to a small B/H ratio of 0.15.