The beneficial effect of Zn additions on the microstructure of SnCu and SnCuNi solder joints to Cu substrates
The commercial success as Pb-free solders of alloys based on a trace addition of Ni to Sn-0.7Cu and the academic recognition of the metallurgical effects that deliver the excellent performance in soldering processes and in service, means that Sn-Cu-Ni is now well established as one of the main alloy systems on which the electronics industry depends for the assembly of reliable circuitry. One important effect of the Ni addition is the stabilization of the hexagonal form of the Cu6Sn5 phase that forms at the interface between the solder and the Cu substrate. However, with the limited amount of Ni available in a solder joint, growth of the intermetallic layer by reaction with a copper substrate can result in the Ni level in the Cu6Sn5 falling below that required for stabilization. Increasing the Ni in the solder alloy beyond the level required for optimization of properties such as fluidity that are important in soldering processes can result in the appearance of undesirable high melting point Sn-Ni phases, It would therefore be useful if a second stabilizing element could be introduced to the system to support the effect of the Ni. Ni works as a stabilizer by partially substituting for Cu in the Cu6Sn5 so potential additives were considered on the basis of reports of their partially replacing either Cu or Ni in that crystal structure. Zn was selected for this study because it can partially substitute for Sn in the Cu6Sn5 crystal, potentially complementing the role of Ni. The effect of a Zn addition was studied in the basic Sn-0.7Cu and when there was also an addition of Ni. By itself a Zn addition did not promote a eutectic microstructure in the way that a Ni addition does so powerfully but alone or with Ni it substantially reduced undercooling and in the alloy with both Ni and Zn there was an overall refinement in the near completely eutectic microstructure. In combination with the Ni the Zn significantly refined the grain size of the Cu6Sn5 that formed at the solder/Cu interface. By itself the Zn did not suppress the formation of Cu3Sn at the interface between the Cu and the Cu6Sn5 in the way that Ni does but it does not interfere with that beneficial effect of the Ni. Diffraction studies with high energy synchrotron-generated X-rays confirm that as well as stabilizing the hexagonal form of the Cu6Sn5, Zn reduces the anisotropy of this phase and increases the randomness of the crystal orientation in the intermetallic layer. These effects should result in a stronger intermetallic layer that is less likely to degrade during thermal cycling. The combination of all of these effects mean that an addition of Zn to the widely used Sn-Cu-Ni lead free solders should result in an overall increase in reliability of the solder joint, particularly in harsh environments.
The Effect of Thermal Annealing on the Microstructure and Mechanical Properties of Sn-0.7Cu-xZn Solder Joint
The microstructural properties of a Pb-free solder joint significantly affect its mechanical behaviours. This paper details a systematic study of the effect of the annealing process on the microstructure and shear strength of a Zn-added Sn-0.7Cu solder joint. The results indicated that the IMC layer’s thickness at the solder/Cu interface increases with annealing time. The interfacial IMC layer of the Sn-0.7Cu solder joint gradually thickened with increasing annealing time and annealing temperature, while the interfacial IMC layer’s morphology changed from scallop-type to layer-type after the annealing process. However, the addition of 1.0 wt.% and 1.5 wt.% Zn in the Sn-0.7Cu effectively altered the interfacial IMC phase to Cu-Zn and suppressed the growth of Cu3Sn during the annealing process. The single-lap shear tests results confirmed that the addition of Zn decreased the shear strength of Sn-0.7Cu. The interfacial IMC of the Cu6Sn5 phase in Sn-0.7Cu changed to Cu-Zn due to the addition of Zn. The shear fractures in the annealed solder joint were ductile within the bulk solder instead of the interfacial IMC layer. Increased annealing time resulted in the increased presence of the Cu-Zn phase, which decreased the hardness and shear strength of the Sn-0.7Cu solder joint.
Formation and Strength of Magnesia Whiskers
The formation of single-crystal magnesia whiskers during the compressive deformation of single crystals at room temperatures is described. These whiskers can have strengths of the order of millions of pounds per square inch. They are formed during fracture as a result of the discontinuous propagation of cracks which are mechanically relieving internal stresses resulting from plastic flow