Introducing an industry oriented graduate course: Testing of digital systems
According to the International Technology Roadmap for Semiconductors (ITRS), for more than four decades, the semiconductor industry has distinguished itself by the rapid pace of improvements in its products. However, the cost of the increased functionality of components, circuits, and systems, is the requirement of more verification and test of the electronic products. In current projects, verification engineers outnumber designers, with the ratio reaching two or three to one for the most complex designs. Additionally, the present globalization trends and needs are driving the universities worldwide, to find new avenues in the programs that they are offering, to be attractive to their prospective students. Addressing the above mentioned matters, an industry oriented graduate course “Testing of Digital Systems” was created and offered for the first time in the academic year 2009–2010 at Rose Hulman Institute of Technology, Terre Haute, Indiana. The paper presents the rationale, integration of the new course in the ECE curricula, description of the course and laboratory activities developed around an industrial grade Automatic Test Equipment, preliminary assessment plans and conclusions.
Testing digital circuits using a Mixed-Signal Automatic Test Equipment
This paper presents the results of parametric testing of digital ICs using a dedicated Mixed Signal Automatic Testing Equipment. Due to the prohibitive price of the ATE equipment and dedicated Device Interface Board (DIB) for digital Integrated Circuits (ICs), a DIB for analog circuits was used to perform the testing. Despite the challenges presented by the experiments, the results prove to be accurate for the performed tests, according to the data sheet of the digital ICs and production test data provided by the manufacturer.
An Ultrasensitive Analytical Method Based on Chemiluminescence Sensing Electrochemical Parallel Catalytic Reaction Event
An ultrasensitive electrochemiluminescence (ECL) method on the combination of electrochemical parallel catalytic reaction and chemiluminesence signal sensing was proposed for improving ECL analytical characteristics using vanadate(V) as a representative. Vanadate(V) could be electrochemically reduced to generate vanadate(II) which could be chemically oxidized by potassium periodate to regenerate vanadate(V) and give parallel catalytic wave effect. Then, the reduced product of potassium periodate could react with butyl-rhodamine B to emit a sensitive chemiluminescence signal. The chemiluminescence intensity was correlative with vanadate(V) concentration. The investigation on the electrochemical reaction rate constant (k0) confirmed that the speed of electrochemical reaction was faster than that of the subsequent chemiluminescence reaction. The possibility of the combination of electrochemical parallel catalytic reaction with chemiluminescence signal sensing was proved. The similar ECL behaviors could be observed at zirconia nanowires-Nafion modified electrode. Because of the separation and enrichment effect of the modified electrode on vanadate(V), the selectivity and sensitivity was further improved greatly. Based on these findings, a new concept on the combination of electrochemical parallel catalytic reaction and chemiluminesence signal sensing was proposed and an ultrasensitive ECL method for the determination of vanadate(V) was developed at zirconia nanowires-Nafion modified electrode. Under the optimum experimental conditions, the ECL intensity was linear with the concentration of vanadate(V) in the range of 2.0×10−12 mol/L–2.0×10−10 mol/L. The detection limit was 8.0×10−13 mol/L, which was more than 6 orders of magnitude lower than that observed by electrochemical current transduction for electrochemical parallel catalytic reaction at zirconia nanowires-Nafion modified electrode.