Study of the packaging effect on blocking voltage of power devices during durability test
We investigated why the blocking voltages of a power device are lowered during a durability test through a device simulation called Technology Computer Aided Design (TCAD) and measurements using the optical beam induced current (OBIC) method. We found that the spread of the depletion layer caused by the bonding wire is what decreased the blocking voltage.
Increase of the Robustness of the junction terminations of power devices by a lateral variation of the Emitter Efficiency
A new diode technology called Emitter Controlled (EC)-HDR (High Dynamic Robustness) that allows a pronounced enhancement in switching safe-operating area has been developed. For the first time, the concept used for this drastic improvement is presented. The same principle has been applied to the Insulated Gate Bipolar Transistor (IGBT).
Neurology, psychology, and extraordinary religious experiences
Temporal lobe epilepsy and certain personality disorders often result in experiences described as “religious.” TLE research suggests a possible neurological basis for such experiences. Immediately the question arises about the authenticity of these experiences as religious. An experience is authentic if it furthers the authentic growth of the subject, regardless of what triggered it. So pathology may occasion authentic religious experiences, even as history exemplifies. For practical purposes, the further question about God in religious experience is secondary. The exception, miraculous occurrences, should not be granted without sufficient reason. This approach dissolves all conflict between science and faith.