Single Event Effects Characterization of Maxwell 7846B DAC
Heavy ion test results indicate that the Maxwell 7846B 16 Bit DAC is susceptible to SET and SEU in the form of stable level changes at the device output.
Compendia of radiation test results of integrated circuits
Single event effects (SEE), total ionizing dose (TID) and radiation reliability data taken for existing space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.
Radiation testing results of COTS based space microcircuits
We present both heavy ion single event effect (SEE) and total ionizing dose (TID) data collected at Space Electronics Inc. for candidate spacecraft microelectronics.