Radiation-Hardened Performance-Optimized I2L LSI
Experimental data and theoretical calculations are presented on the effects of neutron irradiation on I2L circuits. It is shown that neutron-induced degradation of I2L gate performance can be theoretically predicted with reasonable accuracy. Operation of custom designed I2L 32-bit serial shift registers to a neutron fluence level of 1 × 1014n/cm2 is demonstrated. Shift register data are also given from total dose gamma and transient upset radiation experiments with thresholds exceeding 3 × 106rads(Si) and 2 × 109rads(Si)/s, respectively.
Design Approach to Radiation-Hardened I2L Gate Arrays
Conventional I2L structures are considered for the design of radiation-hardened I2L gate arrays, and design guidelines have been developed for this purpose. It is concluded that the parallel injector design offers the bestperformance in terms of speed, processing simplicity and radiation hardness. Performance data achieved for the gate arrays include a minimum delay time of 7.5 ns for the basic 4-collector inverter of the array, neutron failure threshold of ~3 × 1013 n/cm2, and dose rate upset threshold of ~5 × 109 rads(Si)/s.
Mahler functions and transcendence
Transcendence theory of mahler functions of one variable.- Transcendence theory of mahler functions of several variables.- Algebraic independence of mahler functions and their values.- Applications of elimination theory.- Regular sequences and mahler functions.