A study of GMR read sensor induced by soft ESD using Magnetoresistive Sensitivity Mapping (MSM)
Electrostatic discharge (ESD) can be manifest on giant magnetoresistive (GMR) head either physically (melting of sensor element) or magnetically (degrades in dynamic electrical or quasitest parameters). The latter case is usually suspected as ldquosoftrdquo ESD and known to be a subtle case for study. In this study, we try to differentiate the ldquosoftrdquo ESD from electrical failure, which cause by other means. Ahead with magnetoresistance sensitivity mapping (MSM), which is an additional feature of magnetic force microscope (MFM), the symmetry and sensitivity changes of GMR sensors were further investigated. Advanced analytical tools of atomic force microscope (AFM), MFM and MSM allow unique characterization of head microstructure, and coupled with methodical and systematic failure analysis, may be possible to observe in-situ the previously unknown ESD phenomena unique to GMR head.
Magnetoresistive Sensitivity Mapping (MSM) and dynamic electrical test (DET) correlation study on GMR sensor induced by low threshold ESD stress
In the case of soft ESD damage, the GMR read sensor was magnetically changed caused by ESD stress. With magnetoresistive sens itivity mapping (MSM), which is an additional capability of magnetic force microscope (MFM), it is possible to study the subtle magnetic change due to soft ESD. In this paper, GMR heads were subjected to low voltage HBM model, and the HGAs were characterized by MSM before and after the HBM ESD stress. HGA samples were also subjected to dynamic electrical test (DET) to establish a correlation between MSM analysis and electrical performance of the GMR head.
Magnetic force microscopy: General principles and application to longitudinal recording media
This paper discusses the principles of magnetic force microscopy (MFM) and its application to magnetic recording studies. We use the ac detection method which senses the force gradient acting on a small magnetic tip due to fields emanating from the domain structure in the sample. Tip fabrication procedures are described for two types of magnetic tips: etched tungsten wires with a sputter‐deposited magnetic coating and etched nickel wires. The etched nickel wires are shown to have an apex radius on the order of 30 nm and a taper half‐angle of approximately 3°. Lorentz‐mode transmission electron microscopy of the nickel tips reveals that the final 20 μm is essentially single domain with magnetization approximately parallel with the tip axis. Images of written bit transitions are presented for several types of magnetic media, including CoPtCr, CoSm, and CoCr thin films, as well as γ‐Fe2O3 particulate media. In general, the written magnetization patterns are seen with high contrast and with resolution better ...