Single Event Effects Characterization of Maxwell 7846B DAC
Heavy ion test results indicate that the Maxwell 7846B 16 Bit DAC is susceptible to SET and SEU in the form of stable level changes at the device output.
Compendia of radiation test results of integrated circuits
Single event effects (SEE), total ionizing dose (TID) and radiation reliability data taken for existing space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.
Can Centauros or Chirons BE the First Observations of Evaporating Mini Black Holes
We argue that the signals expected from the evaporation of mini black holes — predicted in TeV-gravity models with large extra dimensions, and possibly produced in ultrahigh energy collisions in the atmosphere — are quite similar to the characteristics of the Centauro events, an old mystery of cosmic-ray physics.