1 Recent Radiation Test Results at JPL
This Bruce E. Pritchard, Member, ZEEE, Bemard G. Rax, and Steven S. McClure paper documents recent TID (including ELDRS) and proton damage test results obtained by JPL. Unusual test results, such as abnormally low or high failure levels or unusual failure or response mechanism, are emphasized.
Total ionizing dose (TID) evaluation results of low dose rate testing for NASA programs
Low dose rate radiation testing in the range of 0.01-0.20 rads(Si)/s has been performed at Goddard Space Flight Center on a wide variety of non-RH (rad-hard) part types in the last few years. This paper reports on recent test results of EEPROMs, Operational Amplifiers, Analog-to-Digital Converters (ADCs) and Digital-to-Analog Converters (DACs), and DC-DC converters. These results have shown that non-RH parts are suitable for many low earth orbiting satellites, where predicted mission total dose requirements may be in the range of 0.5-10 krads(Si). However, a careful characterization of non-RH parts should be performed to verify that the parts meet the requirements of their intended application in the projected mission radiation environment.
Low dose rate radiation testing of advanced CMOS technology (AC/ACT) series parts for space flight applications
The authors describe the low dose radiation test results performed on Advanced CMOS technology (AC/ACT) series parts for a spaceflight project. The parts were procured to Standard Military Drawings (SMD) and MIL-STD-883 specifications. Radiation testing was performed on 32 different part types at dose rates ranging from 0.07 to 1.44 rads(Si)/sec. at steps of 5, 10, 20, 30, 50, 75, 100, 200 and 300 krads(Si). Annealing was performed after the 100 krads(Si) step for 168 hours at 25 degrees C and after the 300 krads(Si) step for 168 hours at 100 degrees C. Most parts passed functional tests up to 100 krads(Si) exposure, but showed increases in quiescent current (I/sub cc/) measurements over the pre-irradiation specification limits in the manufacturer's data sheets. This I/sub cc/ degradation varied for different part types and lot data codes. These test results confirmed the need for lot sample radiation testing of AC/ACT parts for space flight applications.<<ETX>>