An Analog Circuit for Accurate OCVD Measurements
An electronic circuit for making accurate open-circuit voltage decay measurements is presented. The circuit overcomes the main limitations that occur in the standard method when used for carrier lifetime characterization because it realizes the ldquoopen-circuit conditionsrdquo of the device under test with an impedance higher than 100 MOmega and reduces the noise that is inherent in the differential operation of the method.
OCVD carrier lifetime measurements on an inhomogeneous diode structure
This paper investigates the problem of evaluating the lifetime of a carrier measured by the OCVD (open circuit voltage decay) method on structures with a non-uniform carrier lifetime distribution. A simple model of two diodes connected in parallel (lumped charge approximation) has been used for evaluating the measured carrier lifetime. The theoretical analysis was experimentally verified.
The Meaning of Wisdom in James: Examination of a Hypothesis
The following essay is an attempt to examine the manner in which the writer of the Epistle of James uses the concept of Wisdom; and to study the suggestion that the way in which he uses it is more or less interchangeable with that in which other writers of the New Testament use the concept of the Holy Spirit.