Numerical and theoretical analysis on voltage and time domain dynamic range of scaled CMOS circuits
It is believed that the time-domain resolution of a digital signal edge transition is superior to the voltage resolution of an analog signal in advanced CMOS processes[1], [2]. The reasoning behind this is that operating voltage has been reducing, making the signal more vulnerable to noise power due to scaling. On the other hand, in time domain, scaling has resulted to increase in frequency and therefore design of faster circuits, while also contributing to reduction of jitter. However, this is a concept that has not yet been quantitatively examined. This paper aims at verifying the effectiveness of the time-domain circuits over voltage-domain circuits in terms of their dynamic range performances by simulations as well as by theoretical analysis, especially in the scaled nano-meter processes. It has been shown that for a given technology the time domain dynamic range is superior to the voltage domain dynamic range by a factor of (ωT /B)2 where ωT is the unity gain frequency and B is the bandwidth.
Predicting noise and jitter in CMOS inverters
Jitter in CMOS technologies depend on several physical and design parameters, which are expected to change with scaling. Also, some parameters will have to change (by the introduction of enhancement techniques) in order to meet the desired performance goals for each new generation. The impact of each one of these parameters is here evaluated in order to give some insight on the jitter generation, amplification and coupling phenomena in actual and future designs. The work is based on AMS (0.8 um and 0.35 um) and UMC (180 nm and 130 nm) models for high performance, minimum sized transistors. Also, data from ITRS has been used to predict jitter dependency on the various parameters in deep-submicron CMOS generations.
Contractor Failure: Analysis
The possibility exists for any construction contractor to fail to filfill the contract requirements associated with a facility. Contractor failure occurs when a contractor is unable to perform his/her contractual duties, thus requiring the facility owner to invoke the contract's nonperformance clause. This paper provides aggregate contractor business failure statistics and outlines potential causes for failure. A framework to identify and quantify the associated costs is also introduced. Several case studies are presented to examine the cause and cost of failure and the means by which the facilities were completed. Alternatives available for project completion when contractor failure occurs are discussed. Recommendations to identify and monitor contractors at high risk for failure are outlined as well. This paper provides facility owners with a greater awareness of the possibility of contractor failure, how to quantify costs of contractor failure, and avoidance techniques.