Failure analysis on the standby current due to dislocation in STI structure of flash memory
The technology of increasing Internal Vcc without using memory tester is used to enhance the photon emission and the failure range is defined in detail by nano probing. With these methods, we found out that the leakage current was caused by dislocations of STI arranged in a row.
Failure analysis of ULSI circuits using photon emission
A real-time failure analysis technique for ULSI circuits using photon emission is proposed. This technique utilizes a photon detection system combined with a circuit tester. Improved failure detection is achieved because the tester can bias arbitrary blocks in the ULSI chip. Detecting and correct process defects and design errors improves the reliability of the ULSI chip. >
A Rapid Method for the Extraction of Radioiodide from Urine
THE extraction of radioiodide from urine is important in radioiodide therapy, since without it the large quantities of highly radioactive urine which accumulate must be stored until the activity decays sufficiently to allow disposal.