Apply Difference Analysis to Nano-Probing Technique for Reasoning Erratic Defect out in Integrated Circuits
The purpose of this paper is to present a novel deductive methodology, which is accomplished by applying difference analysis to nano-probing technique. This methodology would like to resolve the erratic device with a tailing failure or puzzling feature, but not only to check if the suspect had incorrect characteristic or mismatched transistor parameters
Electrical characterization by sub-micron probing technique on 90 nm CMOS technology for failure analysis
As the failure mechanisms become more complex with IC technology progression, the failure analysis (FA) needs electrical characterization of die internal transistors to fault identification and discrimination of various defect types. The sub-micron probing (SMP) with 4 needles allows all electrical characteristics measurements of a single transistor and leads to accurate results in FA with a best root cause understanding. This paper presents the effectiveness of the 4 needles-SMP technique and reports experimental results during the threshold voltage/BVDSS measurements of the 6 transistors of RAM cell on a 90 nm CMOS technology in the Nice Device Analysis Laboratory (NDAL) of Texas Instruments France.
Complications of motility peg placement for porous hydroxyapatite orbital implants
Aim: To evaluate the complications associated with pegging of porous hydroxyapatite orbital implants. Methods: Complications associated with pegging were retrospectively reviewed from the charts of 100 of 133 patients with hydroxyapatite implantation from 1993 to 2000. Results: 48 (48%) of the 100 hydroxyapatite implanted patients who had undergone pegging were found to have problems with their pegs, including discharge (45.8%), peg falling out (20.8%), pyogenic granulomas (16.7%), popping peg (14.6%), hydroxyapatite visible around peg hole (8.3%), part of peg shaft visible (6.2%), peg drilled off centre (6.2%), peg drilled at an angle (4.2%), and excess movement of peg (4.2%). The standard peg fell out statistically more often than the peg and sleeve system (Yates's corrected χ2, p=0.038). There was a trend towards complications of the peg with use of a standard peg (versus sleeved peg) (p=0.226). Conclusions: There are several potential complications of pegging. Most complications are minor and can be managed successfully.