Enhanced Infrared Absorption of C60 on Thin Evaporated Pd Island Films
Infrared transmission spectra of C 60 * multilayers on thin Pd films deposited onto surface-oxidized Si(100) and hydrogen-terminated Si(111) substrates are reported. In both cases, the spectra in the 1500-1100 cm-' region exhibited bands at 1444, 1429, and 1182 cm-' due, respectively, to the A 8 (2), T 1u (4), and T 1u (3) modes. The appearance of the A 8 (2) mode, which is originally infrared inactive (Raman active), reveals electron transfer from the metal to chemisorbed C 60. Indeed, increasing the thickness of C 60, the A g (2) mode intensity saturated more rapidly than the T 1u (4) and T 1u (3) modes. The originally infrared active T 1u (4) and T 1u (3) modes were enhanced in intensity depending upon the Pd thickness. Actually, while both substrates gave nearly the same magnitude of enhancement, the optimum Pd thickness was smaller on the hydrogen-terminated surface than on the surface-oxidized surface. On the other hand, the A g (2) mode, was less intense on the hydrogen-terminated surface than on the oxidized surface, suggestive of a shortage of chemisorbed C 60 and thus pointing out the importance of the metal film morphology. Indeed, Pd films deposited on the two substrates gave rise to quite different AFM images. We also show that, regardless of the substrate, the A g (2) mode is an order of magnitude smaller than for Ag deposition, though no remarkable intensity differences were observed with respect to the T 1u (4) and T 1u (3) modes.
Morphological, topographical and FTIR characterizations of Pd–C films
The structure, topography and morphology of Pd–C films were studied by AFM (atomic force microscopy), SEM (scanning electron microscopy), Raman and FTIR (Fourier transform infrared spectroscopy) methods. It was found that an increasing content of palladium in films causes a decrease in their roughness and size of nanograins. The topography and morphology of Pd–C films depend on the content of palladium in the film, what was found from the analysis of SEM and AFM images. FTIR and Raman spectra show that the content of fullerene and palladium in the film strongly depends on technological parameters of PVD (physical vapor deposition) process.
Work, Status, and Income: Men in the American Occupational Structure since the Late Nineteenth Century
The historical record rarely presents researchers with precisely the evidence they desire. This is particularly true for social historians and like-minded scholars, whose subjects left precious few signs of their passing. Consequently, certain data have borne a disproportionate evidentiary load in social-historical research. The occupation a person pursued is one key piece of information on which scholars have come to depend. Our understanding of the historical social structure and where people fit into it is bound up with the interpretation of occupations. But this reliance on occupation as the primary social locator in historical research depends on some largely unexamined premises. Whether scholars group occupations or convert them into numerical status measures, they make assumptions about the nature of the occupational structure. When researchers incorporate change over time into their analyses, they suggest that the meaning of occupations remained stable for the purpose of measuring social mobility, class position, or group status-attainment. This assumption has been the subject of little discussion and even less research. For all the use to which historians have put occupation, there has been little effort to assess systematically its stability as a social or economic indicator.