Some observations on the breakage of ultrasonic files driven piezoelectrically.
The incidence of breakage of Piezon-Master ultrasonic K files were evaluated. Three groups of unused files were subjected to three treatments, namely; free vibration in air without irrigation, free vibration in root canal while minimizing contact with the wall of canal in the presence of irrigation and light filing in root canal with free flow of irrigation. Cavitation produced by files in contact and free of contact with a glass surface was examined in order to observe the relationship between cavitation defects and breakage. In addition, the fractured and unfractured files were examined under a scanning electron microscope for the presence of cavitation pits. The results indicated that more files broke in air. In water, a higher incidence of breakage occurred when files were allowed to freely vibrate while no breakage occurred when the files were used in filing. All files generated cavitation which resulted in pitting of their surfaces. However, it was considered unlikely that the pits contributed to fracture. Fatigue cracks which could be the result of the manufacturing process were observed at some of the corners of the cross sections of the fractured files and could be the main contributory factor to fracture.
A comparison of the potential for breakage: the Burns Unifile versus Hedstrom files.
This study evaluated the potential for breakage of five H-type endodontic files. “Resistance to fracture by twisting” ANSI/ADA specification no. 58 served as the standard. The five H-type endodontic files examined consisted of the Burns Unifile and four popular brands of Hedstrom files (Kerr, Star, Union Broach, and Unitek). Compliance with strict interpretation of resistance to fracture by twisting , ANSI/ADA specification no. 58, varied greatly. Manufacturer compliance with regard to brand size was: Star 100%, Union Broach 87.5%, Unitek 75%, the Burns Unifile 62.5%, and Kerr 37.5%. However, the value of resistance to fracture by twisting ANSI/ADA specification no. 58, in its present form as an accurate reflection of the potential for instrument breakage, is questioned. This study suggests that clinical techniques should limit rotation of an engaged H-type file to less than a one-quarter turn.
Monte Carlo Study of the Effect of Backscatter Materail Thickness on 99 mTc Source Response in Single Photon Emission Computed Tomography
Introduction SPECT projections are contaminated by scatter radiation, resulting in reduced image contrast and quantitative errors. Backscatter constitutes a major part of the scatter contamination in lower energy windows. The current study is an evaluation of the effect of backscatter material on FWHM and image quality investigated by Monte Carlo simulation. Materials and Methods SIMIND program was used for simulation of a Siemen’s dual-head variable angle scintillation gamma camera. Planar and SPECT scanning of a 99m Tc source and a Jaszczak phantom for varying thicknesses of Perspex slabs, as a backscatter media, were analyzed using the photopeak and scatter windows. Simulated planar images and reconstructed tomographic images were evaluated qualitatively, by two nuclear medicine specialists, and quantitatively, by Structural Similarity (SSIM) Index. Results In the 99m Tc photopeak window, no significant change in total counts due to backscatter material was measured. In the scatter windows, scattering was overestimated compared with a simulated backscatter free SPECT system. For instance, at a thickness of 10 cm, total counts of a 99m Tc source detected in the 72 keV windows eventually doubled with increasing backscatter material, compared with the situation without backscatter material. The backscatter contribution plateaued when more than 7 cm of scatter material was placed but there were optimized results for a backscatter thickness of 4.5 cm. Better image quality for the thickness was confirmed by the results of eye interpretation and also by SSIM algorithm. Conclusion Backscatter should be taken into account, particularly in model-based scatter correction methods in SPECT for an accurate simulation system optimization.