Improvements in method and apparatus for determining minority carrier diffusion length
The constant-magnitude steady-state surface photovoltage (SPV) method for determining the minority carrier diffusion length L is in principle an excellent technique. It has, however, recevied relatively limited use because of practical difficulties in carrying out the required measurements. This paper describes an improved measurement system that virtually eliminates these difficulties and allows a rapid straightforward determination of L. These measurements in silicon monitor wafers have enabled a routine quality control check on many factory processing steps, particularly those that are carried out at high temperature and have the potential for significantly degrading L.
A Method for the Measurement of Short Minority Carrier Diffusion Lengths in Semiconductors
A method is presented whereby short minority carrier diffusion lengths in semiconductors may be determined by measuring the variation of surface photovoltage as a function of optical absorption coefficient. The method does not depend upon the specific form of the relationship between the surface photovoltage and the density of the excess minority carriers injected at the bulk edge of the surface space charge region. Only capacitive contacts to the sample are needed for the measurement. The method has been used to determine the minority carrier diffusion length in both n and p type gallium arsenide.
Failure analysis for poor solderability of Au surface of PCB
Nonwetting is one of the common problems and is always rejected in electronic assemblies. ENIG pads of a PCBA exhibited nonwetting after lead-free reflow soldering. With the aid of stereomicroscope, SEM&EDS and XRF, a series of analysis was performed. And after visual inspection, surface and cross section analysis, thickness measurement and solderability test, it can be inferred that oxidation of plating surface was the main reason for nonwetting, and corrosion in Ni plating caused an adverse impact on solderalibity.