Progress in the development of high-conversion-efficiency a-Si/μc-Si tandem solar module using μc-Si thin film with high deposition rate on Gen. 5.5 large-area glass substrate
The technology to make high-quality, high-reliability solar modules with a high deposition rate for μc-Si thin-film is a problem for the industrialization of low-cost, high-conversion-efficiency a-Si/μc-Si tandem structure solar modules. Sanyo has solved this problem by developing an original CVD technique called Localized Plasma Confinement CVD and a new evaluation method for μc-Si thin film. A stabilized conversion efficiency of 10.0% was achieved for an a-Si/μc-Si tandem structure solar module, and a deposition rate of 2.4 nm/s for μc-Si thin-film was attained on a Gen. 5.5 full-size glass substrate. To obtain a higher conversion-efficiency a-Si/μc-Si tandem structure solar module, fundamental studies of μc-Si thin-film have been performed, and a stabilized conversion efficiency of 10.5% (Initial solar module conversion efficiency: 12.0%) has been achieved on a large-area glass substrate. Furthermore, in the study of this development, the highest stabilized conversion efficiency of 12.0% (Initial conversion-efficiency: 13.5%) was attained. Module reliability tests confirmed by IEC 61646 Ed. 2 revealed that the performance of the module is adapted. These high-performance a-Si/μc-Si tandem structure solar modules were prepared by using the knowledge of our thin-film and module technologies.
Solar cell of 6.3% efficiency employing high deposition rate (8 nm/s) microcrystalline silicon photovoltaic layer
Abstract Microcrystalline silicon (μc-Si) films deposited at high growth rates up to 8.1 nm/s prepared by very-high-frequency-plasma-enhanced chemical vapor deposition (VHF-PECVD) at 18–24 Torr have been investigated. The relation between the deposition rates and input power revealed the depletion of silane. Under high-pressure deposition (HPD) conditions, the structural properties were improved. Furthermore, applying μc-Si to n–i–p solar cells, short-circuit current density (JSC) was increased in accordance with the improvement of microstructure of i-layer. As a result, a conversion efficiency of 6.30% has been achieved employing the i-layer deposited at 8.1 nm/s under the HPD conditions.
Trouble-shooting dual arch impressions.
Dual arch impression techniques enable the dentist to capture an impression of the prepared tooth, the opposing teeth and the occlusal registration in one procedure. This saves chair time and impression material.