Structural and luminescent properties of terbium doped strontium titanate xerogel
We report on synthesis and photoluminescence of sol-gel derived terbium doped strontium titanate on monocrystalline silicon and in the porous anodic alumina matrix. The microstructure and morphology of the samples are analyzed by X-ray diffraction and scanning electron microscope analyses. The thickness of the spin-on films deposited on silicon is about 115 and 170 nm due to the annealing temperature 750 and 1000 °C respectively. The samples reveal terbium luminescence in the visible range.
Characteristics of post-annealed SrTiO3 thin films prepared by mirror-confinement-type ECR plasma sputtering
Abstract SrTiO3 films were synthesized on Pt/Ti/SiO2/Si multilayer substrates by mirror-confinement-type ECR plasma sputtering without substrate heating. All films were found to be well crystallized at a substrate temperature below 450 K. A low temperature post-annealing of the films by electromagnetic-wave radiation drastically improved the crystallographic and electric properties of Pt/SrTiO3/Pt/Ti/SiO2/Si capacitors. The crystallinity of the films indicated little variation by post-annealing, but irradiation of electromagnetic wave was confirmed to be effective for decreasing the post-annealing time and temperature. The electric properties of films annealed without Pt upper electrodes were better than those with them, and the film dielectric constant reached a value of 260, which is nearly equal to thebulk one, at an annealing temperature of 573 K.
Trouble-shooting dual arch impressions.
Dual arch impression techniques enable the dentist to capture an impression of the prepared tooth, the opposing teeth and the occlusal registration in one procedure. This saves chair time and impression material.