The irradiation effect of DC-DC power converter under x-ray
The irradiation response of DC-DC power converter was studied using X-ray source with whole and local irradiation method. It was indicated that the irradiation response of the different part of circuit was represented different effect. The VDMOSFET of DC-DC power converter was tremendous irradiation affected, and PWM and Shottky diode was exiguous affected, and the trend of DC-DC power converter optical-coupler parameters affected by optical-coupler was reversely with other part of DC-DC circuits.
Total-dose and single-event effects in DC/DC converter control circuitry
Total-dose and single-event effects in the linear control circuitry of DC/DC power converters are examined. Catastrophic failure, induced by error-amplifier total-dose irradiation, is compared for two modes of operation. The use of a more robust restart mechanism to maintain the operation of the converter at a much higher dose level is presented. Single events result in missing pulses at the output of the control circuitry. Hybrid and integrated (SG1525A) pulse width modulators are evaluated to illustrate the missing-pulse results.
Analysis of single-event transients in analog circuits
A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institute from a low-power voltage regulator that uses the LM124 are also used to illustrate the method.