10803383
Power-Efficient Pulse Width Modulation DC/DC Converters with Zero Voltage Switching Control
This paper proposes a power-efficient PWM DC/DC converter design with a novel zero voltage switching (ZVS) control technique. The ZVS control is realized by an inner feedback loop which is implemented by simple digital circuitry between the input and output of the power transistors and achieves real-time zero voltage switching (ZVS) for various loading and device parameters with power efficiencies over 90.0%. In addition, an outer feedback loop is used to ensure that the output precisely tracks a reference voltage level. We have also built the relationship between the output voltage ripple and the speed of the voltage comparators which has shown to introduce new low-frequency signals to the loops and cause significant output voltage ripples. Experiment results show that the output ripple could be reduced by 4times by carefully handling the generation and propagation of these low frequency signals
15140843
Mapping algorithm for large-scale field programmable analog array
Modern advances in reconfigurable analog technologies are allowing field-programmable analog arrays (FPAAs) to dramatically grow in size, flexibility, and usefulness. With these advances, analog circuits and systems can be programmable, reconfigurable, adaptive, implemented on standard CMOS to take advantage of scaled CMOS technology, and at a density comparable to digital memories. Our goal in this paper is to develop the first physical design automation toolset for floating-gate based FPAA with focus on minimization of parasitic effects on FPAA interconnect. We provide graph-based analog circuit and FPAA device modeling suitable for efficient mapping. Our FPAA clustering algorithm constructs Computational Analog Blocks (CAB) from analog circuit elements while improving the utilization of the device and reducing its impact on the total number of routing switches used. Experimental results demonstrate the effectiveness of our approach.
16583629
Placement for large-scale floating-gate field-programable analog arrays
Modern advances in reconfigurable analog technologies are allowing field-programmable analog arrays (FPAAs) to dramatically grow in size, flexibility, and usefulness. Our goal in this paper is to develop the first placement algorithm for large-scale floating-gate-based FPAAs with a focus on the minimization of the parasitic effects on interconnects under various device-related constraints. Our FPAA clustering algorithm first groups analog components into a set of clusters so that the total number of routing switches used is minimized and all IO paths are balanced in terms of routing switches used. Our FPAA placement algorithm then maps each cluster to a computational analog block (CAB) of the target FPAA while focusing on routing switch usage and balance again. Experimental results demonstrate the effectiveness of our approach
18173256
Hierarchical placement for large-scale FPAA
Modern advances in reconfigurable analog technologies are allowing field-programmable analog arrays (FPAAs) to dramatically grow in size, flexibility, and usefulness. Our goal in this paper is to develop the first hierarchical placement algorithm for large-scale floating-gate based FPAAs with a focus on the minimization of the parasitic effects on interconnects under various device-related constraints. In our hierarchical approach, our FPAA clustering algorithm first groups analog components into a set of clusters so that the total number of routing switches used is minimized and all IO paths are balanced in terms of routing switches used. Our FPAA placement algorithm then maps each cluster to a computational analog block (CAB) of the target FPAA while focusing on routing switch usage again. Experimental results demonstrate the effectiveness of our approach.
11514442
A test pattern ordering algorithm for diagnosis with truncated fail data
In this paper, we propose a test pattern ordering algorithm for fault diagnosis. Test pattern ordering is effective in situations where the fail log is truncated and contains a limited number of fail data. In such cases, higher diagnostic resolution can be achieved with the test set appropriately ordered. Test pattern ordering is independent of the diagnosis algorithm used. The higher resolution achieved by test pattern ordering is obtained at no additional cost once the test patterns have been appropriately ordered. Experimental results on two industrial designs are presented to demonstrate the effectiveness of the proposed method
12943655
Scan tests with multiple fault activation cycles for delay faults
In this paper we investigate methods to detect delay faults in circuits that use standard scan design. We demonstrate that delay faults at several sites in a circuit cannot be detected using standard launch off capture and launch off shift tests that use two test cycles. However, faults at these sites are detectable using tests that use more than two test cycles. Experimental results on benchmark and industrial circuits that use standard scan design show that substantial numbers of transition delay faults require tests using more than one fault activation cycles to detect them
37046746
On the detection of delay faults
The class of faults known as gate delay faults are investigated. A taxonomy of the classes of gate delay fault detecting tests is provided. Methods to derive robust and nonrobust tests to detect gate delay faults are proposed. A physically meaningful measure to assess the efficacy of test sequences is introduced, and used to report fault coverages. A nine-valued logic system was proposed and used for deriving these tests. A physically meaningful measure, in the form of the average detection size of a test sequence. An algorithm was devised and implemented to automate the process of test generation, and results of experimentation with the ATPG, as well as with a random-pattern simulator, on four ISCAS-85 circuits were reported.<<ETX>>
899366
Genetic Beam Search For Gate Matrix Layout
The paper presents a novel implementation of the genetic algorithm in combination with beam search for gate matrix layout. This is a permutation problem, for which the traditional genetic crossover operator results in repetition of gates, and therefore the GA is not applicable without modification. However, the GA is a very efficient stochastic optimisation technique, and is easily parallelisable. To adapt it to the gate matrix layout problem, the principles of beam search have been used. The gates are ranked according to their connectivity with each other, and the ranks of the gates to be placed next to each other are picked by the GA. A beam value is used to restrict the ranks of the gates placed next to each other to a low value. This reduces the search space to be explored, and thus results in a more efficient search. The algorithm produces better results compared to a graph-theoretic approach on published netlists.
18103085
Finite memory test response compactors for embedded test applications
This paper introduces a new class of finite memory compaction schemes called convolutional compactors (CCs). They provide compaction ratios of test responses in excess of 100/spl times/, even for a very small number of outputs. This is combined with the capability to detect multiple errors, handling of unknown states, and the ability to diagnose failing scan cells directly from compacted responses. The CCs can also be used to significantly enhance conventional multiple input signature registers. Experimental results presented in the paper demonstrate the efficiency of convolutional compaction for several industrial circuits.