A monochromator for scanning X-ray microscopy beamlines at third-generation synchrotron light sources.
A concept for a plane-grating monochromator for use at scanning X-ray microscopy beamlines at third-generation synchrotron light sources is presented. The design of the monochromator is optimized for a scanning transmission X-ray microscopy beamline at BESSY II. Ray-tracing calculations are presented which include geometric aberrations of the optics used in the beamline.