[Use of cluster analysis for the study of self-stigmatization phenomenon].
Cluster analysis was used in the study of self-stigmatization phenomenon measured with the original self-stigmatization questionnaire in 81 patients with schizophrenia, affective and neurotic disorders. The answers presented by digital codes were analyzed statistically. Six factors of self-stigmatization were as follows: "a victim of stigma", "deidentification from the healthy", "predisposition to identification with mentally ill", "avoidance of mentally ill", "excuse by mental illness" and "generalization of stigma".