Orientational dependence of transient gratings in multiple quantum well structures
Recent experiments measuring transient grating decay in multiple quantum well structures have revealed a strong orientation dependence for the decay rate. The authors argue that this dependence can be explained by a differential cross-well diffusion of electrons and holes leading to charge separation and drift fields enhancing the in-plane diffusion. The analysis suggests that the cross-well diffusion rate mechanism changes at some critical angle of grating orientation.