Surface diffusion in molecular beam epitaxy of Bi/sub 2/Sr/sub 2/Ca/sub n-1/Cu/sub n/O/sub x/
Thin films of Bi/sub 2/Sr/sub 2/CuO/sub 6+x/ (2201) phase have been tilted SrTiO/sub 3/ [001] substrates by co-deposition method, and Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+x/ (2212) phase by interruption technique. The surface diffusion characteristics the molecular beam epitaxy (MBE) of both phases have also been investigated by using in-situ reflection high energy electron diffraction (RHEED). The periodic RHEED intensity oscillations and recovery process been analyzed for 2201 and 2212 phases.<<ETX>>