Electrical parameters degradation law of MOSFET during ageing
A new method to extract the different electrical parameters lifetime of MOS transistors submitted to hot carriers degradation is proposed. This method leads to error on the lifetime below 15%, even if the parameter variation measurement reaches only 8%. The robustness of this method has been tested for various biases of stress and different technologies representative of different ageing mechanisms. Finally this method is a good indicator of the degradation modes occurring during the stress.