A microcomputer based system for frequency dependent impedance/admittance measurements
Abstract A micro, or personal, computer based system for frequency dispersion measurements in solid state ionics is described. This system is capable of measuring the complex admittance or impedance in the frequency range from less than 1 mHz to 100 kHz. Impedances up to 1 G.ohm can be measured. The quality of the system is demonstrated with a complex R-C circuit. The use of the system in conjunction with a powerful non linear least squares fitting program is illustrated with a complex frequency dispersion measurement on a sample of Na 2 SnS 3 .