Enhanced stability of defect-based qubits in quantum wells
Optically addressable paramagnetic point defects in semiconductors are among the most promising systems for quantum-information technologies. However, the fidelities of spin initialization and readout rely on optical cycling, and charge-state instabilities during this cycle have proven to be an important unresolved problem. In this work, we demonstrate that the quantum well of an extended defect can stabilize the charge state of a point defect. In particular, we establish that the PL6 center in silicon carbide is a divacancy within a stacking fault, and that the quantum well deriving from this stacking fault stabilizes the defect's charge state, leading to its extraordinary performance at elevated temperatures and unusual robustness to optical cycling. The generalization of our results provides a material-based solution to the optical instability of color centers in semiconductors that may facilitate the development of a new class of robust single-photon sources and spin qubits.