An improved approach and experimental results of a low-frequency noise measurement technique used for reliability estimation of diode lasers
Abstract In this paper, we give the experimental results of low-frequency noise measurement and reliability forecasting after we have studied the low-frequency noise and electric ageing of 23 GaAs/GaAlAs proton-bombarded heterostructure LDs and 21 V-groove InP/InGaAsP lasers. We discuss the measuring circuits, measuring parameters, and suggest an improvement.