Conductivity in AgI films grown by silver corrosion in a solid-state cell
Abstract The conductivity of AgI thin films grown in a Ag/β-AgI/2I 2 Py cell by solid-state reactions was measured between 10 and 60°C employing a pulse method together with coulometric titration. A triangular voltage pulse method is discussed assuming a simple model of the system impedance which consists of two RC series circuits and an ohmic resistance with a sweep rate range from 1 to 1000 V s −1 . The different circuit elements are separated and agreement with experiment is observed in Z versus pulse duration as well as in the system response curve for a single pulse. The calculated values for each component as well as its modifications with the charge state of the cell are discussed.