Laser Simulation of single event effects in pulse width Modulators
Laser testing assists in identifying the sources of pulse width modulator (PWM) single event effect (SEE) sensitivity and reveals new details of PWM SEE behavior, such as enhanced sensitivity during output switching and delayed onset of latch-up near the single-event latch-up threshold. In combination with analysis to map PWM circuitry in the microchip dies, laser SEE test results provide insights into the mechanisms of the SEE events.