Automatic Generation of Test Cases for Loop Optimizations Based on pCTL
Test for loop optimizations is vital to modern compiler quality.However,test cases coded by hand result in low productivity,and the automatic generation of test cases is lack of accuracy for loop optimizations.Therefore,we suggest an automatic generation of test cases for loop optimization base on parameterized conditional temporal logic(pCTL).Experiments on coverage testing of gcc-4.1.1 show that we can generate test cases with accuracy for specific loop optimizations,and certain coverage is achieved by employing only a few test cases.