Numerical analysis of a double avalanche region IMPATT diode on the basis of nonlinear model
Abstract The analysis of the n+pvnp+ avalanche diode structure has been realized on the basis of the nonlinear model. This type of the diode that was named as double avalanche region (DAR) IMPATT diode includes two avalanche regions inside the diode. The phase delay which was produced by means of the two avalanche regions and the drift region v is sufficient to obtain the negative resistance for the wide frequency band. The numerical model that is used for the analysis of the various diode structures includes all principal features of the physical phenomena inside the semiconductor structure. The admittance characteristics of the DAR diode were analyzed in very wide frequency band. The obtained results contradict to the before performed analysis on basis of the approximate models and show that only diode with a sufficiently short drift region can produce active power in some frequency bands.