Component Burnout Hardness Assurance Safety Margins and Failure Probability Distribution Models
The applicability of currently accepted EMP system hardness assurance practices is investigated using data on semiconductor burnout lot-to-lot variations, and variations in the 10-2 to 10-3 probability burnout levels from the mean. From results of this study, it is concluded that currently accepted safety margins and hardness assurance techniques may be inadequate. Although significantly more data are required to appropriately handle the hardness assurance problem, a review of existing data is sufficient to identify some significant changes that should be considered in component burnout hardness assurance practices. The purpose of this paper is to summarize existing data and present recommended changes.