Characterization method of IGBT comprehensive health index based on online status data
Abstract IGBT has multiple degradation mechanisms. The existing methods using a single characterization parameter cannot characterize the comprehensive health status of the device, but multiple characterization parameters cannot quantify and intuitively reflect the comprehensive health level. Therefore, this paper proposes a characterization method of IGBT comprehensive health index (CHI) based on online status data of aging life experiment. Different parameters contain different degradation information. By extracting and fusing effective information and eliminating overlapping and invalid information from multiple parameters, the obtained CHI is used to characterize the health level. The main steps are as follows: (1) Determining the sensitive degradation parameters; (2) Using the physical model method for feature selection; (3) Using the data-driven method for feature extraction; (4) Performing feature fusion and obtaining the CHI. The online state data of the IGBT aging life experiment provided by NASA were used to verify the algorithm, and the results proved that the method of feature extraction and fusion can more accurately characterize the comprehensive health status of the device. Based on this work, it is proved that extracting and fusing effective information from features is a valuable technique.