Critical Current Oscillations of Josephson Junctions Containing PdFe Nanomagnets
Josephson junctions with ferromagnetic layers are vital elements in a new class of cryogenic memory devices. One style of memory device contains a spin valve with one “hard” magnetic layer and one “soft” layer. To achieve low switching fields, it is advantageous for the soft layer to have low magnetization and low magnetocrystalline anisotropy. A candidate class of materials that fulfills these criteria is the Pd1-xFex alloy system with low Fe concentrations. We present studies of micrometer-scale elliptically-shaped Josephson junctions containing Pd97Fe3 layers of varying thickness. By applying an external magnetic field, the critical current of the junctions are found to follow characteristic Fraunhofer patterns. The maximum value of the critical current, extracted from the Fraunhofer patterns, oscillates as a function of the ferromagnetic barrier thickness, indicating transitions in the phase difference across the junction between values of zero and π.