Reliability of statically controlled drives
Abstract With rapid development in the technology of solid-state devices and high power SCRs, electric drives with solid-state control are becoming increasingly popular. Since solid-state drives employ hundreds of semiconductor and other electronic components, the study of the reliability of these drives has become an important problem. This paper presents the results of a comparative study of reliability of statically controlled drives. Logic diagrams and mathematical models have been used to evaluate the quantitative reliability of the systems.