Structured Illumination Super-Resolution Imaging Achieved by Two Steps based on the Modulation of Background Light Field
Structured illumination microscopy can break diffraction limit by modulating frequency of object. However, to decode spectrum, conventional structured illumination super-resolution imaging technique needs to acquire three images at least with different phases. Not only higher requirement is put forward to phase shift accuracy, but also reconstruction efficiency is badly affected. A method for achieving structured illumination super-resolution imaging by two steps based on background light field modulation is proposed in the paper. By modulating background light field and structured illumination light field without phase shift can extract the high frequency and achieve super-resolution imaging. The method improving construction efficiency as well as reducing system complexity. INTRODUCTION Structured illumination microscopy (SIM) is inspired by moiré effect . The high frequency information of the object is modulated into the low frequency region so as to through the diffraction limited system . SIM can break the 1/2 wavelength diffraction limit and double the system resolution. Since 2000, SIM is proposed by M.G.L, GUSTAFSSON who from the University of San Francisco , this method attracted the researchers’ attention quickly by virtue of its simple device, and the object to be measurement has no special requirements. Dan Dan, who from Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, proposed DMD-based LED-illumination Super-resolution and optical sectioning microscopy in 2012 . All the conventional SIM methods are to modulate high frequency part of the object beyond the diffraction limit into the range of the diffraction limited system by loading the sinusoidal illumination light field on the object. In the process of reconstructing super-resolution images , the spectrum separation algorithm is the key First author, Chu-yi CHEN, The Institute of Optics and Electronics, The Chinese Academy of Sciences, Optical electrical avenue no.1,Shuangliu district, Chengdu, Sichuan, China Second author, Tang YAN, The Institute of Optics and Electronics, The Chinese Academy of Sciences, Chengdu, Sichuan, China.