Investigation of the e0-electron yield from the surface of thin films under bombardment by α and β particles from radioactive sources
The yields of near-zero (e0) electrons from the surface of targets with different Z under their bombardment by α particles from 226Ra decay were measured by the method of eα coincidences. The ratios of the e0-electron yields for α particles with different energies Eα are described well by the dependence Ye (Eα) ∼ υα−1, where υα is the α-particle velocity. The e0-electron yield from the surface of thin films under their bombardment by β particles from radioactive sources with 152Eu, 154Eu, and 226Ra has been investigated by the method of eγ coincidences. It is established that ionization rate of target atoms in this case is inversely proportional to the velocity of incident β particles (υβ−1), i.e., is proportional to the time of atomic electron perturbation induced by a β particle passing near an atom.