EXAFS study of Nd-exchanged Na beta″ alumina crystal and powder
Abstract The Nd L III edge was studied by EXAFS with the x-ray polarization vector parallel to the conduction plane of a 35% exchanged single crystal of Na beta″-alumina. By rotating the crystal along its c-axis, the x-rays probe preferentially in the conduction plane in directions parallel to the polarization axis. An analysis of preliminary data indicates differences in the backscattering of the ejected photoelectrons for the polarization vector at different directions in the conduction plane.