High resolution photoelectron spectrometry of negative ions: Fine-structure transitions in O− and S− photodetachment
The energy spectra of electrons detached from O− and S− ions by 488.0 nm and 514.5 nm photons have been measured with high electron energy resolution (5 meV) in order to determine the branching ratios for the various2P3/2, 1/2 →3P2, 1, 0 fine-structure transitions together with their respective angular distributions. Detailed information on the relative importance of thes- andd-wave continuum is obtained.