A Method for Domain Detection of Polysilicon Based on Threshold Segmentation
Digital image based domain segmentation is one of the key techniques for crystallinity detection of polysilicon.Automatic determination of thresholds is the core task to realize automatic machine detection.Based on histogram information and the characteristics of image,uses bimodal method and wave symmetry analysis to get the number of thresholds and their probable values,then utilizes Otsu' method to obtain the precise values of the thresholds.The experiment shows that this method combines the advantages of bimodal method and Otsu' method.Segmenting polycrystalline image with this algorithm can get well detection results and time consumption of this algorithm and has reduced to 1/3 ～ 1/4 compare with traditional.This method provides a solid foundation for the industrial automatic-line detection.