Enhanced electrical conductivity of two layers AlN TiN coating on SS316L as bipolar plate using plasma focus device
Abstract Two layers of AlN TiN coating were deposited onto SS316L as PEM bipolar plate using plasma focus device for 5, 10 and 20 shots number. The XRD patterns of all coated samples reveal formation of TiN, Ti 2 N and AlTi 3 N crystallite phases on the surface. Using the Scherrer formula the crystallite size of the coating layer is estimated about 20 40 nm. Thickness of the two layers coating obtained from cross sectional SEM of the samples is in the range of 5 15 mm. Through the potentiostatic test considerable decrease of the current density of the 20 shots coated samples is achieved. The ICR of the samples reduced as follows: 20 shots