Quantitative Comparison of Phase Contrast Imaging in Conventional TEM Focal Series and STEM Ptychography
In phase contrast imaging, three dimensional, quantitative information about the specimen is encoded in the object wave function, which results from the scattering of the electron wave with the specimen potential. For weak scattering materials, such as a mono atomic layer of graphene, the phase of the object wave contains all the structural information. However, this phase information is lost in the image recording process. In order to recover the phase, a variety of numerical reconstruction methods are available, including off axis electron holography [1] focal series reconstruction (FSR) [2] and ptychography [3]
Microscopy and Microanalysis