Displacement Damage Testing of Intersil Analog and Power Management Parts
We report the results of displacement damage testing using 1 MeV equivalent neutron irradiation of a range of Intersil power management and analog parts, including an operational amplifier, voltage reference, linear voltage regulators, comparator, power MOSFET driver, pulse width modulators, analog switches and processor supervisory circuit.
2016 IEEE Radiation Effects Data Workshop (REDW)