( ( The ( force microscope ) ) ( ( was ( equipped ( to ( measure ( ( ( topography ( of ( the ( sample surface ) ) ) ) and ) ( ( the ( friction force ) ) ( between ( ( ( the sample ) and ) ( the tip ) ) ) ) ) ) ) ) ) . ) )
(ROOT (S (NP (DT The) (NN force) (NN microscope)) (VP (VBD was) (VP (VBN equipped) (S (VP (TO to) (VP (VB measure) (NP (NP (NP (NN topography)) (PP (IN of) (NP (DT the) (NN sample) (NN surface)))) (CC and) (NP (NP (DT the) (NN friction) (NN force)) (PP (IN between) (NP (NP (DT the) (NN sample)) (CC and) (NP (DT the) (NN tip))))))))))) (. .)))
The force microscope was equipped to measure topography of the sample surface and the friction force between the sample and the tip.
(ROOT (S (NP (NN Friction) (NN force)) (VP (VBZ is) (VP (VBN caused) (PP (IN by) (NP (NP (JJ microscopic) (NNS bumps)) (, ,) (VP (VBZ lumps)) (, ,) (CC and) (NP (NP (NNS imperfections)) (VP (VBG colliding))))))) (. .)))