Visual object recognition under situations in which the direct line-of-sight is blocked, such as when it is occluded around the corner, is of practical importance in a wide range of applications. With coherent illumination, the light scattered from diffusive walls forms speckle patterns that contain information of the hidden object. It is possible to realize non-line-of-sight (NLOS) recognition with these speckle patterns. We introduce a novel approach based on speckle pattern recognition with deep neural network, which is simpler and more robust than other NLOS recognition methods. Simulations and experiments are performed to verify the feasibility and performance of this approach.
 We propose a material classification method using raw time-of-flight (ToF) measurements. ToF cameras capture the correlation between a reference signal and the temporal response of material to incident illumination. Such measurements encode unique signatures of the material, i.e. the degree of subsurface scattering inside a volume. Subsequently, it offers an orthogonal domain of feature representation compared to conventional spatial and angular reflectance-based approaches. We demonstrate the effectiveness, robustness, and efficiency of our method through experiments and comparisons of real-world materials. Global light transport is composed of direct and indirect components. In this paper, we take the first steps toward analyzing light transport using high temporal resolution information via time of flight (ToF) images. The time profile at each pixel encodes complex interactions between the incident light and the scene geometry with spatially-varying material properties. We exploit the time profile to decompose light transport into its constituent direct, subsurface scattering, and interreflection components. We show that the time profile is well modelled using a Gaussian function for the direct and interreflection components, and a decaying exponential function for the subsurface scattering component. We use our direct, subsurface scattering, and interreflection separation algorithm for four computer vision applications: recovering projective depth maps, identifying subsurface scattering objects, measuring parameters of analytical subsurface scattering models, and performing edge detection using ToF images. An important goal in optics is to image objects hidden by turbid media, although line-of-sight techniques fail when the obscuring medium becomes opaque. use ultrafast imaging techniques to recover three-dimensional shapes of non-line-of-sight objects after reflection from diffuse surfaces. Depth cameras are a ubiquitous technology used in a wide range of applications, including robotic and machine vision, human-computer interaction, autonomous vehicles as well as augmented and virtual reality. In this paper, we explore the design and applications of phased multi-camera time-of-flight (ToF) systems. We develop a reproducible hardware system that allows for the exposure times and waveforms of up to three cameras to be synchronized. Using this system, we analyze waveform interference between multiple light sources in ToF applications and propose simple solutions to this problem. Building on the concept of orthogonal frequency design, we demonstrate state-of-the-art results for instantaneous radial velocity capture via Doppler time-of-flight imaging and we explore new directions for optically probing global illumination, for example by de-scattering dynamic scenes and by non-line-of-sight motion detection via frequency gating. Time-of-flight (ToF) imaging has become a widespread technique for depth estimation, allowing affordable off-the-shelf cameras to provide depth maps in real time. However, multipath interference (MPI) resulting from indirect illumination significantly degrades the captured depth. Most previous works have tried to solve this problem by means of complex hardware modifications or costly computations. In this work, we avoid these approaches and propose a new technique to correct errors in depth caused by MPI, which requires no camera modifications and takes just 10 milliseconds per frame. Our observations about the nature of MPI suggest that most of its information is available in image space; this allows us to formulate the depth imaging process as a spatially-varying convolution and use a convolutional neural network to correct MPI errors. Since the input and output data present similar structure, we base our network on an autoencoder, which we train in two stages. First, we use the encoder (convolution filters) to learn a suitable basis to represent MPI-corrupted depth images; then, we train the decoder (deconvolution filters) to correct depth from synthetic scenes, generated by using a physically-based, time-resolved renderer. This approach allows us to tackle a key problem in ToF, the lack of ground-truth data, by using a large-scale captured training set with MPI-corrupted depth to train the encoder, and a smaller synthetic training set with ground truth depth to train the decoder stage of the network. We demonstrate and validate our method on both synthetic and real complex scenarios, using an off-the-shelf ToF camera, and with only the captured, incorrect depth as input. We explore the question of whether phase-based time-of-flight (TOF) range cameras can be used for looking around corners and through scattering diffusers. By connecting TOF measurements with theory from array signal processing, we conclude that performance depends on two primary factors: camera modulation frequency and the width of the specular lobe (“shininess”) of the wall. For purely Lambertian walls, commodity TOF sensors achieve resolution on the order of meters between targets. For seemingly diffuse walls, such as posterboard, the resolution is drastically reduced, to the order of 10cm. In particular, we find that the relationship between reflectance and resolution is nonlinear—a slight amount of shininess can lead to a dramatic improvement in resolution. Since many realistic scenes exhibit a slight amount of shininess, we believe that off-the-shelf TOF cameras can look around corners. Computing the amounts of light arriving from different directions enables a diffusely reflecting surface to play the part of a mirror in a periscope—that is, perform non-line-of-sight imaging around an obstruction. Because computational periscopy has so far depended on light-travel distances being proportional to the times of flight, it has mostly been performed with expensive, specialized ultrafast optical systems1–12. Here we introduce a two-dimensional computational periscopy technique that requires only a single photograph captured with an ordinary digital camera. Our technique recovers the position of an opaque object and the scene behind (but not completely obscured by) the object, when both the object and scene are outside the line of sight of the camera, without requiring controlled or time-varying illumination. Such recovery is based on the visible penumbra of the opaque object having a linear dependence on the hidden scene that can be modelled through ray optics. Non-line-of-sight imaging using inexpensive, ubiquitous equipment may have considerable value in monitoring hazardous environments, navigation and detecting hidden adversaries. Tracking moving targets behind a scattering medium is a challenge, and it has many important applications in various fields. Owing to the multiple scattering, instead of the object image, only a random speckle pattern can be received on the camera when light is passing through highly scattering layers. Significantly, an important feature of a speckle pattern has been found, and it showed the target information can be derived from the speckle correlation. In this work, inspired by the notions used in computer vision and deformation detection, by specific simulations and experiments, we demonstrate a simple object tracking method, in which by using the speckle correlation, the movement of a hidden object can be tracked in the lateral direction and axial direction. In addition, the rotation state of the moving target can also be recognized by utilizing the autocorrelation of a speckle. This work will be beneficial for biomedical applications in the fields of quantitative analysis of the working mechanisms of a micro-object and the acquisition of dynamical information of the micro-object motion. Continuous-wave Time-of-flight (TOF) range imaging has become a commercially viable technology with many applications in computer vision and graphics. However, the depth images obtained from TOF cameras contain scene dependent errors due to multipath interference (MPI). Specifically, MPI occurs when multiple optical reflections return to a single spatial location on the imaging sensor. Many prior approaches to rectifying MPI rely on sparsity in optical reflections, which is an extreme simplification. In this paper, we correct MPI by combining the standard measurements from a TOF camera with information from direct and global light transport. We report results on both simulated experiments and physical experiments (using the Kinect sensor). Our results, evaluated against ground truth, demonstrate a quantitative improvement in depth accuracy. This paper introduces the concept of time-of-flight reflectance estimation, and demonstrates a new technique that allows a camera to rapidly acquire reflectance properties of objects from a single view-point, over relatively long distances and without encircling equipment. We measure material properties by indirectly illuminating an object by a laser source, and observing its reflected light indirectly using a time-of-flight camera. The configuration collectively acquires dense angular, but low spatial sampling, within a limited solid angle range - all from a single viewpoint. Our ultra-fast imaging approach captures space-time "streak images" that can separate out different bounces of light based on path length. Entanglements arise in the streak images mixing signals from multiple paths if they have the same total path length. We show how reflectances can be recovered by solving for a linear system of equations and assuming parametric material models; fitting to lower dimensional reflectance models enables us to disentangle measurements. We demonstrate proof-of-concept results of parametric reflectance models for homogeneous and discretized heterogeneous patches, both using simulation and experimental hardware. As compared to lengthy or highly calibrated BRDF acquisition techniques, we demonstrate a device that can rapidly, on the order of seconds, capture meaningful reflectance information. We expect hardware advances to improve the portability and speed of this device. We propose to measure intensity transmission matrices or point-spread-function (PSF) of diffusers via spatial-correlation, with no scanning or interferometric detection required. With the measured PSF, we report optical imaging based on the memory effect that allows tracking of moving objects through a scattering medium. Our technique enlarges the limited effective range of traditional imaging techniques based on the memory effect, and substitutes time-consuming iterative algorithms by a fast cross-correlation deconvolution method to greatly reduce time consumption for image reconstruction.