In this paper, we address the problem of hand-drawn sketch recognition. Inspired by the Bayesian decision theory, we present a deep metric learning loss with the objective to minimize the Bayesian risk of misclassification. We estimate this risk for every mini-batch during training, and learn robust deep embeddings by backpropagating it to a deep neural network in an end-to-end trainable paradigm. Our learnt embeddings are discriminative and robust despite of intra-class variations and inter-class similarities naturally present in hand-drawn sketch images. Outperforming the state of the art on sketch recognition, our method achieves 82.2 and 88.7 on TU-Berlin-250 and TU-Berlin-160 benchmarks respectively.
 Learning the distance metric between pairs of examples is of great importance for learning and visual recognition. With the remarkable success from the state of the art convolutional neural networks, recent works have shown promising results on discriminatively training the networks to learn semantic feature embeddings where similar examples are mapped close to each other and dissimilar examples are mapped farther apart. In this paper, we describe an algorithm for taking full advantage of the training batches in the neural network training by lifting the vector of pairwise distances within the batch to the matrix of pairwise distances. This step enables the algorithm to learn the state of the art feature embedding by optimizing a novel structured prediction objective on the lifted problem. Additionally, we collected Online Products dataset: 120k images of 23k classes of online products for metric learning. Our experiments on the CUB-200-2011, CARS196, and Online Products datasets demonstrate significant improvement over existing deep feature embedding methods on all experimented embedding sizes with the GoogLeNet network. We suggest a new loss for learning deep embeddings. The key characteristics of the new loss is the absence of tunable parameters and very good results obtained across a range of datasets and problems. The loss is computed by estimating two distribution of similarities for positive (matching) and negative (non-matching) point pairs, and then computing the probability of a positive pair to have a lower similarity score than a negative pair based on these probability estimates. We show that these operations can be performed in a simple and piecewise-differentiable manner using 1D histograms with soft assignment operations. This makes the proposed loss suitable for learning deep embeddings using stochastic optimization. The experiments reveal favourable results compared to recently proposed loss functions. Despite significant recent advances in the field of face recognition [10, 14, 15, 17], implementing face verification and recognition efficiently at scale presents serious challenges to current approaches. In this paper we present a system, called FaceNet, that directly learns a mapping from face images to a compact Euclidean space where distances directly correspond to a measure of face similarity. Once this space has been produced, tasks such as face recognition, verification and clustering can be easily implemented using standard techniques with FaceNet embeddings as feature vectors. The need for appropriate ways to measure the distance or similarity between data is ubiquitous in machine learning, pattern recognition and data mining, but handcrafting such good metrics for specific problems is generally difficult. This has led to the emergence of metric learning, which aims at automatically learning a metric from data and has attracted a lot of interest in machine learning and related fields for the past ten years. This survey paper proposes a systematic review of the metric learning literature, highlighting the pros and cons of each approach. We pay particular attention to Mahalanobis distance metric learning, a well-studied and successful framework, but additionally present a wide range of methods that have recently emerged as powerful alternatives, including nonlinear metric learning, similarity learning and local metric learning. Recent trends and extensions, such as semi-supervised metric learning, metric learning for histogram data and the derivation of generalization guarantees, are also covered. Finally, this survey addresses metric learning for structured data, in particular edit distance learning, and attempts to give an overview of the remaining challenges in metric learning for the years to come. Dimensionality reduction involves mapping a set of high dimensional input points onto a low dimensional manifold so that 'similar" points in input space are mapped to nearby points on the manifold. We present a method - called Dimensionality Reduction by Learning an Invariant Mapping (DrLIM) - for learning a globally coherent nonlinear function that maps the data evenly to the output manifold. The learning relies solely on neighborhood relationships and does not require any distancemeasure in the input space. The method can learn mappings that are invariant to certain transformations of the inputs, as is demonstrated with a number of experiments. Comparisons are made to other techniques, in particular LLE. Deep metric learning has gained much popularity in recent years, following the success of deep learning. However, existing frameworks of deep metric learning based on contrastive loss and triplet loss often suffer from slow convergence, partially because they employ only one negative example while not interacting with the other negative classes in each update. In this paper, we propose to address this problem with a new metric learning objective called multi-class N-pair loss. The proposed objective function firstly generalizes triplet loss by allowing joint comparison among more than one negative examples - more specifically, N-1 negative examples - and secondly reduces the computational burden of evaluating deep embedding vectors via an efficient batch construction strategy using only N pairs of examples, instead of (N+1) x N. We demonstrate the superiority of our proposed loss to the triplet loss as well as other competing loss functions for a variety of tasks on several visual recognition benchmark, including fine-grained object recognition and verification, image clustering and retrieval, and face verification and identification.