Deep Learning (DL) systems are rapidly being adopted in safety and security critical domains, urgently calling for ways to test their correctness and robustness. Testing of DL systems has traditionally relied on manual collection and labelling of data. Recently, a number of coverage criteria based on neuron activation values have been proposed. These criteria essentially count the number of neurons whose activation during the execution of a DL system satisfied certain properties, such as being above predefined thresholds. However, existing coverage criteria are not sufficiently fine grained to capture subtle behaviours exhibited by DL systems. Moreover, evaluations have focused on showing correlation between adversarial examples and proposed criteria rather than evaluating and guiding their use for actual testing of DL systems. We propose a novel test adequacy criterion for testing of DL systems, called Surprise Adequacy for Deep Learning Systems (SADL), which is based on the behaviour of DL systems with respect to their training data. We measure the surprise of an input as the difference in DL system's behaviour between the input and the training data (i.e., what was learnt during training), and subsequently develop this as an adequacy criterion: a good test input should be sufficiently but not overtly surprising compared to training data. Empirical evaluation using a range of DL systems from simple image classifiers to autonomous driving car platforms shows that systematic sampling of inputs based on their surprise can improve classification accuracy of DL systems against adversarial examples by up to 77.5 via retraining.
Deep learning (DL) has achieved remarkable progress over the past decade and been widely applied to many safety-critical applications. However, the robustness of DL systems recently receives great concerns, such as adversarial examples against computer vision systems, which could potentially result in severe consequences. Adopting testing techniques could help to evaluate the robustness of a DL system and therefore detect vulnerabilities at an early stage. The main challenge of testing such systems is that its runtime state space is too large: if we view each neuron as a runtime state for DL, then a DL system often contains massive states, rendering testing each state almost impossible. For traditional software, combinatorial testing (CT) is an effective testing technique to reduce the testing space while obtaining relatively high defect detection abilities. In this paper, we perform an exploratory study of CT on DL systems. We adapt the concept in CT and propose a set of coverage criteria for DL systems, as well as a CT coverage guided test generation technique. Our evaluation demonstrates that CT provides a promising avenue for testing DL systems. We further pose several open questions and interesting directions for combinatorial testing of DL systems. Deep learning (DL) defines a new data-driven programming paradigm where the internal system logic is largely shaped by the training data. The standard way of evaluating DL models is to examine their performance on a test dataset. The quality of the test dataset is of great importance to gain confidence of the trained models. Using an inadequate test dataset, DL models that have achieved high test accuracy may still lack generality and robustness. In traditional software testing, mutation testing is a well-established technique for quality evaluation of test suites, which analyzes to what extent a test suite detects the injected faults. However, due to the fundamental difference between traditional software and deep learning-based software, traditional mutation testing techniques cannot be directly applied to DL systems. In this paper, we propose a mutation testing framework specialized for DL systems to measure the quality of test data. To do this, by sharing the same spirit of mutation testing in traditional software, we first define a set of source-level mutation operators to inject faults to the source of DL (i.e., training data and training programs). Then we design a set of model-level mutation operators that directly inject faults into DL models without a training process. Eventually, the quality of test data could be evaluated from the analysis on to what extent the injected faults could be detected. The usefulness of the proposed mutation testing techniques is demonstrated on two public datasets, namely MNIST and CIFAR-10, with three DL models.