several exemplary embodiments for systems and methods for reducing clock jitter will now be described . it will be apparent to those skilled in the art that the present invention may be practiced without some or all of the specific details set forth herein . one embodiment uses a higher frequency reference clock 122 ′ to reduce jitter in the vco clock output signal 152 . the higher frequency of the reference clock 122 ′ is limited only by the highest frequency that the pll circuit can tolerate . in addition to reducing jitter , the higher frequency reference clock 122 ′ also provides a higher frequency refresh rate of the pll , improved noise filtering and a simpler frequency divider . the pll will have a higher frequency refresh rate because the pll will be refreshed or updated at the same higher frequency of the reference clock 122 ′. as a result , the corrections are applied to the pll circuit more often . the noise filtering is improved because the pll acts as a low - pass filter to filter out phase noise and the jitter resulting therefrom that may be a result of the reference clock 122 . therefore , for a given bandwidth , the noise produced by a higher frequency reference clock 122 ′ will be better filtered by the low - pass filter action of the pll . the frequency divider 110 can be simpler because the pll 100 performs a simpler frequency multiplication with a higher frequency reference clock 122 ′. more specifically , once the pll 100 is locked on a frequency , the frequency of the vco clock 152 is n times the frequency of the reference clock 122 ′, where n is the division ratio of the divider 110 . therefore , for a selected output frequency of the vco clock 152 the division ratio n of the divider 110 will be smaller for a higher frequency reference clock 122 ′ than for a typical frequency reference clock 122 . by way of example if a desired output frequency of the vco clock 152 is 10 ghz , and the reference clock 122 is 1 ghz , then n must be equal to 10 to achieve the output frequency of 10 ghz . alternatively , if the higher frequency reference clock 122 ′ is 5 ghz , then n must only be equal to 2 to achieve the output frequency of 10 ghz . a lower division ratio ( n ) requires a simpler frequency divider 110 than a higher division ratio . the simpler frequency divider 110 can require fewer components . therefore , the simpler frequency divider 110 can be smaller , more reliable and consume less power . noise injected at the vco causes phase shifts in the vco clock output 152 . a loop with a higher bandwidth will correct for such phase shifts more quickly than a loop with smaller bandwidth . filtering is achieved for the same bandwidth but if the amount of filtering was already acceptable for the lower frequency reference clock 122 then by increasing the frequency of the reference clock to the higher frequency reference clock 122 ′ the frequency of the noise injection caused by the reference clock also increases , therefore the loop bandwidth can be increased without compromising the filtering action on the injection while at the same time making the loop more agile to clean vco noise . as a result , the overall causes of jitter within the vco are reduced . further bandwidth increase is possible given the fact that phase degradation in the loop caused by the delay through the divider is smaller for a given bandwidth , due to the smaller division ratio . as a result , the same phase margin could be achieved at a higher bandwidth . fig1 b and 1c are schematic diagrams of two of the most common topologies of linear pfds 102 ′ and 102 ″ that can be used to perform the function of the pfd 102 . the pfd 102 ′ in fig1 b is based on nand gates 160 a - 160 j and inverters 161 a - 161 f with reset 168 . the pfd 102 ″ in fig1 c is based on d flip - flops 170 a and 170 b , inverter 172 , nand gate 174 , with reset 168 ′. fig1 d and 1e are graphical representations of the corresponding waveforms for the reference clock 122 leading the feedback clock 124 in a pfd . the rising edge of the reference clock 122 initiates the pump - up output 132 and the rising edge of the feedback clock 124 initiates the rising edge of the pump - down output 134 . the reset signal 180 a ( and / or reset_not signal 180 b ) are initiated at a time delay after both the reference clock 122 and the feedback clock 124 are high . the reset signal ( and / or reset_not signal 180 b ) reset the pump - up output 132 and the pump - down output 134 . referring now to fig1 d , if the rising edge of the reference clock 122 leads the rising edge of the feedback clock 124 , then the pulse width of the pump up signal 132 is wider than the pulse width of the pump down signal 134 resulting in a net pump - up shown as the i - out signal 136 . referring now to fig1 e , if the rising edge of the feedback clock 124 leads the rising edge of the reference clock 122 , then the pulse width of the pump down signal 134 is wider than the pulse width of the pump up signal 132 resulting in a net pump - down shown as the i - out signal 136 . if the rising edge of the feedback clock 124 and the rising edge of the reference clock 122 occur simultaneously , then the pulse width of the pump down signal 134 is the same as the pulse width of the pump up signal 132 resulting in a zero net pump - up or pump - down ( i . e ., i - out signal 136 = 0 ). referring now to fig1 a , 1 d and 1 e , the i - out signal 136 is produced by the charge - pump 104 in response to the pump up signal 132 and the pump down signal 134 . more specifically , the pump up signal 132 causes the current to be sourced by the current source 135 a . the current provided by the current source 135 a is applied to the loop filter 106 , if the current sink 135 b is not sinking the current ( i . e ., current sink 135 b is disabled because pump - down signal 134 is not applied to the current sink 135 b ). the current provided by the current source 135 a is applied to the current sink 135 b when the pump - down signal 134 is applied to the current sink 135 b . similarly , the current sink 135 b sinks current from the loop filter 106 , unless the current source 135 a is enabled ( i . e ., when pump up signal 132 enables the current source 135 a . sourcing current to or sinking current from the loop filter 106 increases or decreases the voltage on the vco 108 , which correspondingly varies the frequency of the vco . fig2 is a schematic diagram of an improved pfd 200 , in accordance with an embodiment of the present invention . one of the limits imposed on the maximum frequency of the reference clock 122 ′ is the circuit structure and operation of the typical pfd 102 shown in fig1 a above . the improved pfd 200 provides a maximum frequency of operation that is substantially higher than the frequency of operation of the traditional pfd 102 . the improved pfd 200 enables the use of the higher frequency reference clock 122 ′. the improved pfd 200 is pre - charged to enable the use of the higher frequency reference clock 122 ′. the pre - charged pfd 200 has a fast response time . fig3 a - c are schematic diagrams of pfds 200 ′, 200 ″ and 200 ′″ in accordance with additional embodiments of the present invention . the pre - charged pfds 200 - 200 ′″ are faster because the nodes u 1 , u 2 , d 1 and d 2 are pre - charged . when the nodes u 1 , u 2 , d 1 and d 2 are pulled - down or pulled - up ( depending on their respective polarity and type of device e . g ., pmos / nmos ), a respective input transistor will drive each of the nodes in the respective pulled - up or pulled - down state . before the state of each of the nodes u 1 , u 2 , d 1 and d 2 can be changed , the respective input transistor must first be disabled . if the respective input transistor is not first disabled , then the input transistor will initially fight switching the state of the respective nodes . as a result , if driven too fast , an excess ( or bleeding ) current can be produced in a transitional state of the input as in traditional cmos logic . this bleeding current can cause jitter in the vco clock output signal 152 . by way of example , in a typical inverter including a pmos transistor and a nmos transistor , both pmos and nmos transistors conduct when the input passes through a middle value . when both the pmos and nmos transistors conduct , a current spikes results due to the current passing from supply to ground during that time . referring again to the pre - charged pfds 200 - 200 ′″, to reduce the fighting the changing of the states of the nodes u 1 , u 2 , d 1 and d 2 , each one of the respective input transistors are disabled before the state of the nodes are switched . as a result , the nodes u 1 , u 2 , d 1 and d 2 are temporarily placed in a floating state before trying to switch their respective states . the nodes u 1 , u 2 , d 1 and d 2 can temporarily store their last set value in their respective parasitic capacitance until their respective input transistors instruct them to change their state . fig4 is a flowchart of the method operations 400 performed by the pfds 200 - 200 ′″, in accordance with an embodiment of the present invention . fig5 a and 5b are graphical representations of the corresponding waveforms compared to time for the reference clock 122 leading the feedback clock 124 in a pfd 200 - 200 ′″, in accordance with various embodiments of the present invention . fig5 a illustrates the states of the various nod in the pfd 200 - 200 ′″ in a pump - up condition . fig5 b illustrates the states of the various nodes in the pfd 200 - 200 ′″ in a pump - down condition . referring now to fig2 , 4 and 5 a , the rising edge of the reference clock 122 ′ leads the rising edge of the feedback clock 124 . starting with the reset signal 210 a in a low state , which disables ( stops conducting ) current sinking semiconductor switch nmos 202 b and thereby allowing an easy pull - up of first input node ul by input semiconductor switch pmos 202 a . since the reset signal 210 a is in a low state , then reset_not 210 b is in a high state , which disables pmos 202 g and thereby allowing first output node u 2 to float because the current source semiconductor switch pmos 202 g no longer couples the applied current source 201 a to the first output node u 2 . the rising edge of the reference clock 122 ′ enables ( e . g ., starts conducting ) current sinking semiconductor switch nmos 202 h , which pulls first output node u 2 low . the rising edge of the reference clock 122 ′ also enables current sinking semiconductor switch nmos 202 c and disables input semiconductor switch pmos 202 a . first output node u 2 is low because current sinking semiconductor switches nmos 202 h and nmos 202 j are sinking any current available at first output node u 2 to ground ( e . g ., series coupled current sinking semiconductor switches nmos 202 h and nmos 202 j are a current sink for first output node u 2 by coupling first output node u 2 to ground 201 b ). an inverter 208 a inverts the low state of the first output node u 2 to produce a high pump - up signal 132 . starting with the reset signal 210 a in a low state , which disables current sinking semiconductor switch nmos 202 e and thereby allowing an easy pull - up of second input node d 1 by input semiconductor switch pmos 202 d . since the reset signal 210 a is in a low state , then reset_not 210 b is in a high state , which disables current source semiconductor switch pmos 202 k causing the applied current source 201 a to no longer be coupled across current source semiconductor switch pmos 202 k to the second output node d 2 and thereby allowing the second output node d 2 to float . the rising edge of the feedback clock 124 enables current sinking semiconductor switch nmos 202 l , which pulls the second node d 2 low . the rising edge of the feedback clock 124 also enables current sinking semiconductor switch nmos 202 f and disables input semiconductor switch pmos 202 d . the second node d 2 is low because current sinking semiconductor switches nmos 202 l and nmos 202 m are sinking any current available at the second output node d 2 by coupling output node d 2 to ground 201 b . an inverter 208 b inverts the low state of the second output node d 2 to produce a high pump - down signal 134 . in an operation 405 of fig4 , a first output node ( e . g ., node u 2 or d 2 ) is placed in a floating state . node u 2 can be placed in a floating state by disabling the current sinking through nmos 202 h and / or nmos 202 j . similarly , node d 2 can be placed in a floating state by disabling the current sinking through nmos 202 l and / or nmos 202 m . referring again to fig2 and 5a , the nor gate 206 produces a reset signal 210 a . the inverter 204 inverts the reset signal 210 a to produce a reset_not signal 210 b . the reset signal 210 a is high only when both of output nodes u 2 and d 2 are low . conversely , the reset_not signal 210 b is low only when both of output nodes u 2 and d 2 are low . when both of output nodes u 2 and d 2 are low ( e . g ., when a high pump - up signal 132 and a high pump - down signal 134 are being produced ), the reset signal 210 a is high and enables current sinking semiconductor switches nmos 202 b and nmos 202 e . as a result , current sinking semiconductor switches nmos 202 b and nmos 202 c sink the current to input node u 1 by coupling input node u 1 to ground 201 b and current source semiconductor switches nmos 202 e and nmos 202 f sink the current to input node d 1 by coupling input node d 1 to ground 201 b . as a result input nodes u 1 and d 1 are driven low . when input nodes u 1 and d 1 are driven low , then current sinking semiconductor switches nmos 202 j and 202 m , respectively are disabled which decouples ground 201 b to output nodes u 2 and d 2 causing output nodes u 2 and d 2 , respectively to begin to float . a short time delay after the reset signal 210 a goes high , the reset_not signal 210 b goes low . the low reset_not signal 210 b enables current source semiconductor switches pmos 202 g and pmos 202 k . enabling current source semiconductor switches pmos 202 g and pmos 202 k couples current source 201 a to the output nodes u 2 and d 2 and drives respective output nodes u 2 and d 2 to a high state . since the output nodes u 2 and d 2 were floating before the current source semiconductor switches pmos 202 g and pmos 202 k were enabled , then the current source semiconductor switches pmos 202 g and pmos 202 k were required to provide less current to drive the respective output nodes u 2 and d 2 to the high state . when the output nodes u 2 and d 2 are at a high state , the respective pump - up signal 132 and pump - down signal 134 go to a low state . as the output nodes u 2 and d 2 are at a high state and the next incoming rising edges of the reference clock 122 ′ and the feedback clock 124 are due , it would be beneficial to have the output nodes u 2 and d 2 in a floating state before the rising edges of the reference clock 122 ′ and the feedback clock 124 arrive at the inputs . as the output nodes u 2 and d 2 are at a high state , the reset signal 210 a switches to a low state , which disables current sinking semiconductor switches nmos 202 b and nmos 202 e . when current sinking semiconductor switches nmos 202 b and nmos 202 e are disabled , then nodes u 1 and d 1 are left floating waiting to be pulled up when the reference clock 122 ′ and the feedback clock 124 go to a low state . input nodes u 1 and d 1 are pulled high in preparation for when the reference clock 122 ′ and the feedback clock 124 go to a high state . the reset signal 210 a switching to a low state also causes the reset_not signal 210 b to switch to a high state . the reset_not signal 210 b high state disables current source semiconductor switches pmos 202 g and pmos 202 k causing output nodes u 2 and d 2 to float . referring again to fig4 , in an operation 410 , a first edge of the first signal is detected on a first input node at a time after the first output node is placed in the floating state . as described above , the output nodes u 2 and d 2 are placed in a floating state shortly after causing the respective pump - up signal 132 and pump - down signal 134 to go to a low state . in an operation 415 , the first edge of the first signal is coupled to the first output node as described above . in an operation 420 , the first output node is reset to the floating state after the first edge of the first signal is coupled to the first output node . fig5 a and 5b are graphical representation of the waveforms of the pre - charged pfds 200 - 200 ′″ of fig4 , in accordance with an embodiment of the present invention . fig5 a and 5b illustrate the cases where , ( a ) reset 210 a and reset - not 210 b occur during reference clock 122 ′ high and ( b ) reset 210 a and reset_not 210 b occur when reference clock 122 ′ is low . the time when the pump - up signal 132 and the pump - down signal 134 overlap ( t_ovrlap ) is equal to the sum of the several propagation delays as follows , t_ovrlap = tpd — i 3 + tpd — i 4 + tpd — p 2 u t_ovrlap = tpd — i 3 + tpd — i 4 + tpd — p 2 d for the proposed pfd to operate properly two conditions must be met , condition 1 will ensure that output nodes u 2 and d 2 are fully discharged by the rising of the respective reference clock 122 ′ and feedback clock 124 before input nodes u 1 and d 1 are discharged by the rising of reset signal 210 a . the last output node , either u 2 or d 2 , that was the last to go to a low state will trigger the reset signal 210 a to go to a high state . condition 2 will ensure that output nodes u 1 and d 1 are fully discharged by the reset signal 210 a going high before pmos 202 g and pmos 202 k , respectively , are commanded to pull - up by the reset_not signal 210 b going to a low state . otherwise if the respective reference clock 122 ′ and / or the feedback clock 124 is high nmos 202 j and nmos 202 m will fight with pmos 202 g and pmos 202 k , respectively , attempting to pull - up the output nodes u 2 and d 2 at the same time . this conflict would slow down the charging of the output nodes u 2 and d 2 and produce a spike of current flowing through the pmos 202 g to the nmos 202 h and nmos 202 j to ground and pmos 202 k through nmos 202 l and nmos 202 m to ground . the proposed pre - charged pfd 200 - 200 ′″ has a maximum frequency of operation which is substantially higher than that of existing topologies such as those in fig1 a . the higher frequency capability will enable the use of a higher frequency reference clock 122 ′. while not described in detail , the operation of the pfds 200 ′, 200 ″ and 200 ′″ shown in fig3 a - 3c , respectively , operate in a similar manner to that described above for pfd 200 . specifically , the output nodes of pfds 200 ′, 200 ″ and 200 ′″ are allowed to float before being switching states so that they output nodes can switch states more easily , more quickly and more power efficiently . it should be understood that while nmos and pmos devices are described above , nmos devices and pmos are merely exemplary devices and that any type of switching circuit device or semiconductor switching device including transistors and other switching devices can be used interchangeably to perform the same functions with respective relatively minor adjustments to voltage polarity and circuit structure . it will be further appreciated that the instructions represented by the operations in the above fig5 are not required to be performed in the order illustrated , and that all the processing represented by the operations may not be necessary to practice the invention . further , the processes described in any of the above figures can also be implemented in software stored in any one of or combinations of the ram , the rom , or the hard disk drive . although the foregoing invention has been described in some detail for purposes of clarity of understanding , it will be apparent that certain changes and modifications may be practiced within the scope of the appended claims . accordingly , the present embodiments are to be considered as illustrative and not restrictive , and the invention is not to be limited to the details given herein , but may be modified within the scope and equivalents of the appended claims .