referring now to fig1 a trailing portion of a head 22 is shown in operation on a spinning disk 25 . the head 22 includes a substrate die 27 and a trailing end 28 , between which a write element 30 and a read element 33 are formed . the read element is an mr sensor , which as noted above is defined to be an amr , sv , gmr or cmr sensor . a disk - facing surface 35 of the head 22 has a protrusion 37 encompassing the write element 30 and a recess 40 adjacent to the read element 33 . the disk is spinning relative to the head in a direction shown by arrow 41 , typically at several thousand rpm . the protrusion 37 causes the writing element 30 to be in virtual contact with the disk 25 for writing sharp magnetic bits while most of the disk - facing surface 35 is removed from the disk , thereby reducing lift from the air or gas layer that accompanies the rapidly spinning disk , so that low inertial and load forces are applied for reducing wear and avoiding head crash from dynamic contact . the high write field gradients provided by contact or near contact operation allow the mr sensor 33 to be removed from the disk 25 for avoiding noise and harm , yet still receive sufficient signal from the disk without the need for a flux guide . the write element 30 is formed as a terminal of two magnetically permeable layers 42 and 44 which surround a section of an electrically conductive coil layer 46 . the layers 42 and 44 taper together adjacent to the disk 25 to form a pair of poletips 48 and 50 which are separated by a submicron amagnetic gap 52 . although not shown , the layers 42 and 44 are pinched together distal to the disk to form a magnetic circuit around which magnetic flux flows when induced by an electrical current in the coil 46 . the amagnetic gap 52 between poletips 48 and 50 cause some flux to travel through and thereby magnetize a media layer 55 of the disk 25 . note that the horizontal and vertical components of fig1 are dramatically out of scale in order to facilitate appreciation of the difference in elevation between the write and read elements that is characteristic of the present invention . due to the close proximity between the poletips 48 and 50 and the media layer 55 , strong and sharply defined magnetic fields emanating from the poletips magnetize the media with similarly strong and sharp magnetic bits . the poletips 48 and 50 are preferably close enough to the media that perpendicular write fields predominate . in keeping with this preference for perpendicular recording , the media layer 55 in this embodiment has an easy axis of magnetization substantially perpendicular to a surface 57 of the disk 25 , with a hard carbon - based overcoat 58 separating the head from the media . in order for perpendicular fields to predominate , the distance between the poletips and the media must generally be a small fraction of the spacing between poletips , which is accomplished in the embodiment shown with a gap 52 of about 2 , 000 å and an overcoat 58 and media layer 55 each about 100 å in thickness . the media layer 55 may be composed of a stack of thin films alternating between primarily cobalt - chrome films and noble metal such as platinum films , with a crystalline grains transcending the films for reduced intermagnetic coupling , as disclosed in co - pending u . s . patent application ser . no . 08 / 607 , 003 , which is hereby incorporated by reference . the mr sensor 33 in simplest ( amr ) form is a thin ( 100 å - 300 å thick ) layer formed of permalloy ( ni0 . 8 fe0 . 2 ) or other known magnetoresistive materials sandwiched between a pair of magnetic shield layers 60 and 62 . note that the mr sensor 33 as well as the shield layers 60 and 62 are exposed on the disk - facing surface 35 , but are guaranteed not to contact the disk and damage the sensor and signal reception , due to the spacing provided by the protrusion 37 . the sensor 33 is separated from the shield layers 60 and 62 in this embodiment by a pair of nonconductive , amagnetic layers such as alumina , silicon , silicon dioxide or carbon that combine to form spacer layer 64 . alternatively , the shields 60 and 62 may optionally contact the sensor 33 to provide electrical leads for the situation in which the sensor is of the sv , gmr or cmr variety . surrounding the yoke layers 42 and 44 are layers 66 and 68 of diamond - like carbon ( dlc ), a solid mixture of carbon , nitrocarbon and hydrocarbon molecules , which extend to form the protrusion 37 , encasing the write element 30 with durable material for contacting the disk . a thermally insulative alumina layer 67 is interposed between the dlc layer 66 and the shield 60 to further protect the sensor 33 from thermal asperities generated in the protrusion 37 . fig2 depicts the disk - facing surface 35 of the head 22 of fig1 . note that the disk - facing surface 35 includes a pair of pads 18 and 20 for contacting the disk in addition to protrusion 37 . the pads 18 and 20 are formed of dlc which is formed on an opposite side of the wafer substrate from the read and write elements 33 and 30 . after the head 22 has been diced from the wafer , the topography of the disk - facing surface is formed by removal by ion beam etching ( ibe ) or other like technique , since the dlc is generally impervious to chemical or chemical / mechanical etching , while the protrusion 37 and pads 18 and 20 are protected from removal by masks or the like . one should note that the head 22 of this embodiment may be operated with the read and write elements 33 and 30 located at a leading rather than trailing end , relative to the spinning disk , so that pads 18 and 20 are adjacent to a trailing end 16 . fig3 shows a head 69 much like that shown in fig1 except for having a read element 70 closer to a substrate die 72 than a write element 75 . as before , a pair of magnetic shields 77 and 80 are located on both sides of the read element 70 , which is an mr sensor electrically isolated from the shields . although isolated from the shields 70 and 80 , the mr layer 70 is connected to an electrical circuit , not shown in this crosssection , that measures a change in resistance of the layer 70 in response to a change in magnetic field of the layer which , due to the shields 77 and 80 , must emanate from a direction generally aligned with the layer 70 . note that for the case in which the sensor is an sv , gmr or cmr type , the shields 77 and 80 may contact the sensor and serve as electrical leads as well as magnetic shields for the sensor . also as before , the write element is formed of a pair of poletips 82 and 84 which are separated by an amagnetic gap 86 , the poletips acting as terminals of magnetically permeable yoke layers 88 and 90 which form a write circuit which is activated by an electrical current in coil layer 93 . a very thin ( 50å - 500å ) layer 95 of dlc is optionally deposited on the head 69 to form a disk - facing surface 96 and protect the read element 70 . note that in keeping with the major theme of the present invention , the write element 75 is disposed adjacent to a first area 97 of the surface 96 and the read element is disposed adjacent to a second area 99 of the surface , with the second area recessed relative to the first area . the first area 99 can be seen to be located at an end of a protrusion 100 containing the write element 75 . layer 95 does not cover write element 75 either due to masking during formation of the layer 95 or due to wear during operation . note that a similar thin dlc layer may cover the disk - facing surface 35 of the embodiment shown in fig1 . fig4 offers a view of the disk - facing surface 96 of the head 69 that shows an air - bearing rail 105 which has been coated with the dlc layer 95 shown in fig3 . the rail 105 is designed to keep a leading end 108 of the head spaced slightly from a disk during operation , while adjacent to a trailing end 110 , the protrusion 100 containing the write element 75 is in ultralight dynamic contact with the disk . note that the read and write elements 33 and 30 of the head of fig1 may have an air bearing design such as shown in fig4 instead of the tripad design of fig2 . in the head 111 shown in fig5 a write element 112 is located in a trailing end of a mostly air - bearing rail 113 , with a read element 115 disposed in a notch 117 between the rail and the trailing end of the head . note that similar write and read elements may be disposed adjacent to a trailing end of rail 1 18 for use with an opposite disk surface . the head 111 also has an air bearing front rail 119 which helps the head to operate at a slight tilt to the disk surface so that the trailing ends of rails 113 and 118 are closest to the disk surface , maintaining a height generally of about one microinch or less . due to the primarily flying nature of this head 111 , the write element 112 may protrude as little as 50 å compared to the read element , although the slight wear experienced by the trailing end of rail 113 makes it preferable for the elevation difference to be at least 100 å in order to ensure that an appreciable elevation difference exists over the life of the drive . fig6 and fig7 show some initial steps in the formation of a protruding - write , recessed - read head of the current invention , beginning with the formation of a first permalloy shield layer 120 on a wafer substrate 122 composed of altic , alumina or other known materials . although not shown , several thousand such heads may be formed simultaneously on a wafer . the wafer should be polished flat or have an initial layer , not shown , which is deposited and polished . atop the permalloy shield 120 a thin ( 50 å - 1000 å ) layer 125 of alumina is deposited , upon which a similarly thin mr layer 128 is formed , which is masked and ion beam etched to form a generally rectangular mr stripe . with most of the stripe 128 masked , a pair of conductive leads 130 and 133 are formed which in operation will provide electrical current through the stripe 128 in a direction shown by arrow 135 , as the leads are much more electrically conductive than mr stripe 128 . the mr stripe has been formed with a magnetization shown by arrow 137 , however , so that a magnetic signal from the media will rotate that magnetization to be either parallel or perpendicular to the electric current , providing a maximum or minimum resistance for distinguishing the signal . atop the leads 130 and 133 and stripe 128 another amagnetic layer 138 of alumina is formed to isolate those leads and stripe from a second permalloy shield 140 . in fig7 construction of a writing element atop the read structure of fig5 and 6 is depicted . a thick dlc layer 142 is first formed on the second shield 140 , the dlc layer then being polished . a first yoke section 145 is formed by window frame plating or other known techniques . a gap layer 147 of silicon , silicon dioxide , nonconductive silicon carbide , or other known amagnetic materials is then formed to a thickness which will determine that of a gap between poletips of the write element . an amagnetic layer 149 of alumina may then optionally be formed , atop of which a coil layer 150 is then formed by through plating or other common techniques . a layer of alumina 152 is then formed on and about the coil layer 150 , the alumina layer then being planarized by lapping . a mask , not shown , is then patterned to cover the portion of the alumina layer 152 above the coils , so that an isotropic etch then creates the sloping side 153 of layer 152 . on top of the etched alumina layer 152 a second yoke section 155 is formed , and then another thick dlc layer 158 is formed so that the yoke sections 145 and 155 are encased in dlc . another dlc layer is formed on an opposite side of the wafer substrate for the embodiments having small contact pads spaced near opposite ends of the disk - facing surface from the read and write elements , provided that this step hasn &# 39 ; t occurred prior to the formation of those elements . the wafer 122 is then diced into individual heads and the disk - facing surface of the heads are lapped to determine the throat height of the write element . the heads may be individually lapped or grouped into rows or stacked in an array on a palate for this throat height step , with care taken to avoid recession of the poletips relative to the surrounding material . with the heads stacked in a planar array on a palate , the topography of the disk - facing surface is then formed by ibe with the dlc layers 142 and 153 , yoke layers 145 and 155 , and gap layer 147 masked to form the write protrusion , along with any other desired protrusions such as pads 18 and 20 of fig2 or rail 105 of fig4 . note that traditional etching or chemical / mechanical polishing is not suited for defining the disk - facing surface since differential etch or wear rates of these processes do not typically result in having the write element generally coplanar with the highest elevation while the read element is substantially recessed . at this point the disk - facing surface is coated with a thin dlc layer to protect the mr stripe 128 from corrosion , the protrusions being masked during this coating except for any air - bearing rails such as rail 105 of fig4 . the difference in the disk - facing surface elevation between the write area and the read area is between 50 å and 1000 å , and is preferably less than about 500 å , although one should note that the read area may include a sloping surface . testing of the differing elevations of the write and read areas can be accomplished with a dimension metrology scanner as disclosed by k . babcock and p . hopkins in the article entitled , &# 34 ; measuring poletip recession with atomic force microscopy ,&# 34 ; idema insight , january / february 1997 , which is hereby incorporated by reference . referring now to fig8 the formation of a spin - valve , gmr - effect read element is shown . atop a wafer substrate 160 , a first permalloy shield 162 is formed , atop of which a pinning layer 164 of an antiferromagnetic material such as femn is formed to a thickness of about 100 å . a very thin ( approximately 22 å thick ) ferromagnetic layer 166 of hard magnetic material such as cobalt is then formed , after which a similarly thin ( approximately 25 å thick ) conductive spacer layer 168 of a material such as copper is formed . a thicker ( approximately 100 å thick ) layer 170 of permalloy is then formed with a magnetization similar to that shown for mr stripe 128 of fig6 . a pair of conductive leads are formed , of which only lead 172 is shown in fig8 but which are similar to those shown in fig5 as leads 130 and 133 . at this point an ibe is used to make layers 164 , 166 , 168 , 170 and 172 into stripes having a disk - facing length generally equal to that of a track - width of a disk . an alumina spacer layer 175 is then formed , followed by a second permalloy shield 177 , to complete the wafer - level construction of the read element . the construction of the write element encased in dlc proceeds as described above and so will not be repeated for the sake of brevity . one should note , however , that the read element can be constructed after rather than before the write element , so that the read element is closer to an end of the head .