Method and apparatus for determining linking addresses for microinstructions to be executed in a control memory of a data-processing system
BACKGROUND OF THE INVENTION 
     The present invention relates to a method of and apparatus for linking microinstructions to be executed in a control memory of a microprogrammed computer. In particular, the invention relates to microinstruction linking control arrangements including a provision for overlap between the execution of a current microinstruction and the phase of preparing for the next microinstruction to be executed. The invention is applicable to systems for processing or transmitting data and is of particular utility in large computer systems where tests relating to linking microinstructions together take significant time and often are completed too late in a microinstruction execution cycle to be considered. In computers which operate in the overlap mode, this delay in preparing for a microinstruction results in missed execution of the microinstruction. 
     BRIEF DESCRIPTION OF THE INVENTION 
     In accordance with the invention, the address of a microinstruction contained in a control memory is either: (1) transmitted as an initial address for carrying out the microprogram directly from an address register to the control memory, or (2) produced by a logic unit that links the microinstructions in the control memory together. The latter case is termed the current linking address in the control memory and points to addresses of the microinstructions in the microprogram subsequent to the first address. 
     One object of the invention is to provide an apparatus and method which enables microinstructions to be prepared and executed in three modes which are: a prepared linking mode, a direct linking mode and a mixed linking mode. 
     In the prepared linking mode, a linking modification indicated by a microinstruction field is prepared for during the preceding microinstructions by loading modification bits into special flip-flops or registers. These loading operations may be the result of: a specific setting order; a modification of the former flip-flop contents, as dictated by the test results; a transfer of the contents of another flip-flop or another register; or the result of a calculation. The prepared linking mode is particularly suitable for cases where it is possible, without involving non-working cycle time, to delay the linking action indicated by the results of currently executed microoperations, by means of a previous storage operation. Linking is determined at a later stage, as dictated by this storage operation, so there is no danger of an undesired microinstruction being read, in view of an overlap between execution of microinstruction n and the preparation for the next microinstruction n+1. 
     In certain cases, a penalty may have to be paid in terms of execution time and in the number of microinstruction words if the result of a test on a microinstruction field is stored in a flip-flop before the linkage indicated by this test result is ordered. This is particularly the case with floating execution microprograms in which it is often desired to give linking up orders in a microinstruction as a function of the results obtained at the end of the same microinstruction. An obstacle to such a linking is that there is an overlap in the same cycle between reading microinstruction n+1 and carrying out microinstruction n. Direct linking involves optimizing the case where the tests on the microinstruction fields which have a direct effect on linking are not successful. During execution of microinstruction n, microinstruction n+1, which is to be executed after microinstruction n, if the tests are unsuccessful, is read. It is most probable that the tests on the microinstruction fields will be unsuccessful. If, however, the tests are successful, an unwanted microinstruction will have been read at the end of the cycle. No microinstruction will be executed during the next cycle and the microinstruction actually required for linkage will be read. 
     In direct linking, a machine cycle will be lost in execution if tests on the test fields of the microinstruction have a direct effect on the microinstruction linking orders. Such orders are of great benefit for tests to determine: errors, abnormal format, or anomalies of any kind. The benefit occurs because the orders enable tests to be performed immediately, without employing linking flip-flops, and with virtually no time penalty; there is only a penalty in the unlikely event of anomalies. Similarly, the orders enable the probable penalty to be reduced whenever, in a microinstruction, linking is ordered as a function of the results of executing the same microinstruction, presuming equal probability for all the results of execution. Finally, the mixed linking mode enables prepared linking orders and direct linking orders to be combined. 
     The object of the invention which has just been set forth is achieved by providing a microinstruction with two fields which define a link which is to be made to the next microinstruction; the fields are: 
     field AE that indicates the linking address, and 
     field ME that indicates the linking mode; there are additional fields, namely: 
     test order fields CM 1  and CM 2 , and 
     fields B 1 , B 2 , B 3 , B 4 , respectively ordering inputs to four flip-flops (designated BB 1 , BB 2 , BB 3 , BB 4 ). 
     If the field ME for the linking mode is all zeros, the address of the next microinstruction is actually indicated by the linking address AE. 
     If linking mode field ME indicates a linkage modification (field ME≠0), the address of the next instruction is determined by the linking address AE, as modified by the effect of field ME on a pair of test result flip-flops (designated F 1 , F 2 ), on the four flip-flops designated BB 1  to BB 4 , and on a register designated R 7  containing the linkage modifying bits. 
     The above and still further objects, features and advantages of the present invention will become apparent upon consideration of the following detailed description of one specific embodiment thereof, especially when taken in conjunction with the accompanying drawing. 
    
    
     BRIEF DESCRIPTION OF THE DRAWING 
     FIG. 1 shows the format of a microinstruction, 
     FIG. 2 shows, in simplified form, a control memory associated with control circuits and linkage modification circuits, 
     FIG. 3 is a block diagram showing the overall linkage apparatus, 
     FIGS. 4A and 4B together, are a block diagram of the address calculating unit of FIG. 3; 
     FIG. 5 is a block diagram of flip-flops F 1  and F 2  and the portion of the logic test unit (FIG. 3) associated with them; 
     FIGS. 6 and 7 together, are a block diagram of flip-flops BB 1  -BB 4  and the portion of the logic test unit associated with them; 
     FIG. 8 is a circuit diagram of the decoder illustrated in FIG. 6; and 
     FIG. 9 is a circuit diagram of comparison circuitry included in FIG. 5. 
    
    
     DETAILED DESCRIPTION OF THE INVENTION 
     The format of the microinstruction shown in FIG. 1 is 144 bits long. The invention can be used used with any suitable microprogrammed data processor of the type broadly described on pages 318-320 of Condensed Computer Encyclopedia (1969) McGraw-Hill. It is to be understood that the length and format of the illustrated microinstructions are merely exemplary and that the microinstruction can have any suitable length and format, depending upon the computer with which it is used. Only the areas necessary for an understanding of the invention are shown. The test order fields CM 1  and CM 2  are each four bits long. Field CM 1  begins at bit 108 and field CM 2  begins at bit 112. They enable a test to be selectively performed on the output of an arithmetic logic unit which processes data in octets, i.e., eight bit bytes, or on the output of an arithmetic logic unit which processes double data words. The tests involve, for example, performing nullity tests, positive or zero tests, negative tests, and tests on the carry output of the two arithmetic logic units. 
     Field B 1  is three bits long and begins at bit 116. Its function is to control the loading of a modification flip-flop BB 1 , FIGS. 3 and 6. This field may have the following meanings: 
     (1) Unconditional complementing of the former contents of flip-flop BB 1 . 
     (2) Complementing of flip-flop BB 1  if the test performed on CM 1  is satisfied. 
     (3) Complementing of flip-flop BB 1  if the test performed on CM 2  is satisfied. 
     (4) Resetting of flip-flop BB 1  to zero. 
     (5) Feeding into flip-flop BB 1  the result of the test ordered by field CM 1 . 
     (6) Feeding into flip-flop BB 1  the result of the test ordered by field CM 2 . 
     Field B 2  is two bits long and begins at bit 119. Its function is to control the loading of the linkage modification flip-flop BB 2 , FIGS. 3 and 7. This field may have the following meanings: 
     (1) Feeding into flip-flop BB 2  the result of the test ordered by field CM 1 . 
     (2) Feeding into flip-flop BB 2  the result of the test ordered by field CM 2 . 
     (3) Feeding into flip-flop BB 2  the result of a logic OR correlation between the former content of flip-flop BB 2  and the result of the test ordered by field CM 2 . 
     Two bit field B 3 , which begins at bit 121, controls the loading of a linkage modification flip-flop BB 3 , FIGS. 3 and 7. Field B 3  may have the following meanings: 
     (1) Input into flip-flop BB 3 , as dictated by two secondary orders CSIO and CSPR, whose specific action bears no direct relation to the process of linking the microinstructions and which are respectively derived from instruction and program control registers of a prior art data processor, not shown, 
     if there are no secondary orders the operation does not take place (NOP), 
     if secondary order CSIO is present, bit 12 of instruction register ISR is to be transferred to flip-flop BB 3 , 
     if secondary order CSPR is present, bit 7 of program control register PCR is to be transferred to flip-flop BB 3 . 
     (2) Input into flip-flop BB 3  of the result of the test ordered by field CM 1 . 
     (3) Input into flip-flop BB 3  of the result of a logic OR correlation between the former content of flip-flop BB 3  and the result of the test ordered by field CM 1 . 
     (4) Input into flip-flop BB 3  of the former content of flip-flop BB 2 . 
     Two bit field B 4 , which begins at bit 123, controls the loading of linkage modification flip-flop BB 4 , FIGS. 3 and 6. This field may have the following meanings: 
     (1) Input into flip-flop BB 4  depending upon whether the secondary order CSPR is present, 
     if the secondary order is not present, the operation is not performed (NφP), 
     if there is a secondary order CSPR, bit 7 of register PCR is transferred to flip-flop BB 4 . 
     (2) Input into flip-flop BB 4  of the former contents of flip-flop BB 1 . 
     (3) Input into flip-flop BB 4  the former contents of flip-flop BB 2 . 
     (4) Input into flip-flop BB 4  the former contents of flip-flop BB 3 . 
     The two remaining areas ME and AE indicate linkage to the next microinstruction to be executed. 
     14 Bit long field AE begins at bit 132 and indicates the linking address before a linking address is modified by the linking mode ordering field ME, FIG. 2. The 12 least significant bits (indicated by AE 0  -AE 11 , FIG. 2) of field AE contain the address for linking to the next microinstruction the least and most significant bits are respectively AE 11  and AE 0 . The two most significant bits (x, x) of the 14 bit address, indicated by field AE remain the same as those given for the initial execution address. 
     Seven bit long field ME begins at bit 125 and indicates the linking mode; each of the bits ECM, ECM 2 , EB 1 , EB 2 , EB 3 , EB 4  and EBR 7  (FIG. 2) in control field ME has a specific modifying action on the linking address AE. Bits ECM 1  and ECM 2  define the direct linking mode as a function of tests respectively ordered by fields CM 1  and CM 2  ; the test results are stored in the storage elements flip-flops F 1  and F 2 . Bits EB 1 , EB 2 , EB 3 , EB 4  and EBR 7  define the prepared linkage mode and permit address field AE to be modified by the contents of flip-flops BB 1 , BB 2 , BB 3 , BB 4  (which indicate if there is to be a linkage modification) and of octet (eight bit) register BR 7 , FIG. 3. Thus the microinstruction of cycle n illustrated in FIG. 1 can be considered as including, inter alia, first, second and third bit fields. Field AE, the first field, designates a linking address to the microinstruction of cycle (n+1), unless modified during the preparation phase of cycle n. Field ME, the second field, selectively designates which of storage elements F 1 , F 2 , BB 1  -BB 4 , and BR 7  contain signals that can alter selected bits of field AE. The third field can be considered as being divided into six subfields, viz: CM 1 , CM 2  and B 1  -B 4 . The value of the third field enables changes to be selectively made in certain of the storage elements, namely flip-flops F 1 , F 2 , BB 1  -BB 4 . The changes in flip-flops F 1  and F 2  are made in response to predetermined conditions in the values derived from a pair of arithmetic logic units, i.e., units 3 and 13 (FIG. 3), while fields CM 1  and CM 2  respectively have predetermined values. The value of a first predetermined bit position (bit AE 11 ) in the first field stored in address register 42 (FIG. 4A), included in address calculating unit 9, is thus controlled in response to the value in one of the storage elements (element F 1 ) in response to a first bit of the second field having a predetermined value, i.e., in response to bit ECM 1  of field ME having a binary one value. The value of bit AE 11  in the field stored in register 42 is also controlled in response to the value in the storage element formed by flip-flop BB 1  in response to bit EB 1  of field ME having a binary one value. The value of a second predetermined bit position AE 4  in address register 42 is controlled in response to the value in a further storage element, bit zero of register BR 7 , and a predetermined value of a second bit of the second field, i.e., bit EBR 7  of field ME having a binary one value. p FIG. 2 also indicates the general linking principle. 
     In the prepared linking mode, a linking change indicated by field AE of a microinstruction may have been prepared for in the course of the preceding microinstructions by loading any of the storage elements in flip-flops BB 1 , BB 2 , BB 3 , BB 4  or register BR 7 . These loading operations may be the result of: (1) a setting order, (2) a need to modify former contents, as dictated by the results of tests CM 1  and/or CM 2 , (3) a transfer of the contents of another flip-flop or another register, or (4) a result of a calculation. Orders EB 1 , EB 2 , EB 3 , EB 4  and EBR 7  for prepared linkage modifications which are given in a microinstruction, shown by reference numeral 21 in FIG. 2, modify the linking address by the contents of flip-flops BB 1 , BB 2 , BB 3 , BB 4  or register BR 7 , at the end of the preceding microinstruction. Generally, the binary locations in field AE (shown by reference numeral 20 in FIG. 2) which are capable of being modified by the contents of flip-flops BB 1  -BB 4  or register BR 7  contain zeros to prevent the &#34;logic OR&#34; effect of the change from being masked. 
     The following example shows the effect of an order EBR 7  alone: 
     
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AE X           X X X X φ φ φ φ                            
BR.sub.7       φ φ φ φ A B C D                            
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     (In this and the following examples, the least significant bit position AE 11  of field AE is at the right most position, and the adjacent bit positions AE 10 , AE 9 , etc. progress to the left. Similar nomenclature is used for fields in register BR 7 , and flip-flops BB 1  -BB 4 , F 1  and F 2 , FIGS. 3 and 5.) 
     The effective address of the next microinstruction will be: 
     
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X             X X X X A B C D                                             
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     The following example shows the effect of an order EB 1  and an order EB 3  : 
     
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        AE X        X φ  X φ                                      
        BB.sub.1    Y                                                     
        BB.sub.3    Z                                                     
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     The effective address of the next microinstruction will be: 
     
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        X       X Z X Y.                                                  
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     In the direct linking mode, the implementing logic is such as to take as an optimum the case where the tests CM 1  and/or CM 2 , respectively on flip-flops F 1  and F 2 , which have a direct effect on the linking, are unsuccessful; that is, the direct linking mode is executed if: 
     
         F.sub.1 +F.sub.2 =Σ.sub.i F.sub.i =0. 
    
     While the microinstruction n is being executed, the microinstruction n+1 to which the link should have been made is read if Σ i  F i  =0. The expectation is that tests CM 1  and/or CM 2  will be unsuccessful so that the direct linking mode will not be implemented. 
     However, if the direct linking mode test is successful, i.e., if 
     
         F.sub.1 =1 and/or F.sub.2 =1, whereby Σ.sub.i F.sub.i =1, 
    
     the microinstruction n+1 will be read at the end of cycle n but will not be carried out in the next cycle, during which the microinstruction actually required for the linkage is read. One machine cycle is thus lost if either or both of tests CM 1  and CM 2  are successful, if these tests act directly on the linking in response to orders ECM 1  and ECM 2 . 
     The following example is an example of orders ECM 1  and ECM 2  : 
     
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  AE X                 X φ φ                                      
Result of test CM.sub.1                                                   
                       F.sub.1                                            
Result of test CM.sub.2                                                   
                       F.sub.2                                            
Effective address of next                                                 
microinstruction X     X F.sub.2 F.sub.1.                                 
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     The mixed linking mode enables the effects resulting from prepared linking orders and direct linking orders to be combined. For example, if 
     
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  AE X                X φ X φ φ                               
Result of test CM.sub.2                                                   
                      F.sub.2                                             
BB.sub.1              Y                                                   
BB.sub.4              Z                                                   
Effective address of the next                                             
microinstruction X    X Z X F.sub.2 Y                                     
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     From the above and from what is shown in FIG. 2, it is seen that the modification to the least significant bit AE 11  in field AE corresponds to the logic equation: 
     
         AE.sub.11 +(BR.sub.7).sub.7 ·EBR.sub.7 +BB.sub.1 ·EB.sub.1 +F.sub.1 ·ECM.sub.1. 
    
     The modification to bit AE 10  in field AE corresponds to the logic equation: 
     
         AE.sub.10 +(BR.sub.7).sub.6 ·EBR.sub.7 +BB.sub.2 ·EB.sub.2 +F.sub.2 ·ECM.sub.2. 
    
     The modification to bit AE 9  in field AE corresponds to the logic equation: 
     
         AE.sub.9 +(BR.sub.7).sub.5 ·EBR.sub.7 +BB.sub.3 ·EB.sub.3. 
    
     The modification to bit AE 8  in field AE corresponds to the logic equation: 
     
         AE.sub.8 +(BR.sub.7).sub.4 ·EBR.sub.7 +BB.sub.4 ·EB.sub.4. 
    
     The modification to bit AE 7  in field AE corresponds to the logic equation: 
     
         AE.sub.7 +(BR.sub.7).sub.3 ·EBR.sub.7. 
    
     The modification to bit AE 6  in field AE corresponds to the logic equation: 
     
         AE.sub.6 +(BR.sub.7).sub.2 ·EBR.sub.7. 
    
     The modification to bit AE 5  in field AE corresponds to the logic equation: 
     
         AE.sub.5 +(BR.sub.7).sub.1 ·EBR.sub.7. 
    
     The modification to bit AE 4  in field AE corresponds to the logic equation: 
     
         AE.sub.4 +(BR.sub.7).sub.φ ·EBR.sub.7. 
    
     In these equations the sign · represents the logic &#34;AND&#34; operator and the sign + represents the logic &#34;OR&#34; operator. 
     The components to implement the operators which have just been stated are shown in the block diagram of FIG. 3, the details of which are illustrated in FIGS. 4-9. In FIG. 3, flip-flops F 1  and F 2  (FIG. 5) are included in a two flip-flop register 5, while flip-flops BB 1  -BB 4  (FIGS. 6 and 7) are included in a four flip-flop register 6. The inputs of registers 5 and 6 are controlled from a logic test unit 4 responsive to the fields CM 1 , CM 2 , and B 1  -B 4  of a microinstruction stored in a control register 11, after having been read from control memory 10. The outputs of registers 5 and 6 feed the inputs of address calculating unit 9 with signals indicating the states of flip-flops F 1 , F 2  and BB 1  to BB 4  ; these signals modify the address field AE in the address calculating unit 9, illustrated in detail in FIGS. 4A and 4B. Via a register AIX, address calculating unit 9 receives an address derived by a source external to the arrangement of the invention, which address may point directly to a first control memory microinstruction, which may be the initial address of a microprogram in the control memory 10. Address calculating unit 9 also receives the contents of an eight-bit register BR 7  contained in a bank 1 of 7 registers (BR 1  to BR 7 ), each having eight bits; registers BR 1  -BR 7  are used in calculating the change in linking address; unit 9 also receives instructions from memory unit 10. The outputs of address calculating unit 9 are directly connected to the address selecting inputs of the control memory 10. 
     The inputs of arithmetic logic unit 3 are responsive to outputs of register bank 1, containing the seven octal registers BR 1  to BR 7 , and to an arithmetic unit 13 so unit 3 receives at the beginning of a cycle, an 8-bit byte produced from the data contained in double-word working registers W 0 , W 1 , W 2 , W 3  which form a register bank 2. The register bank 2 contains double-word data and may be loaded either from a local memory 12 from a source external to the arrangement of the invention. The contents of register bank 2 are transferred either to an external device or to the input of the arithmetic logic unit 13. An input of arithmetic logic unit 13 is responsive to the contents of control register 11 to receive an operand for a microinstruction read from the local memory. 
     FIGS. 4A and 4B, together, are a block diagram of the address calculating unit 9 including the linking logic according to the invention. Unit 9 includes an instruction decoder 41 having inputs controlled by the outputs of an address selecting register SAR 42. In the example shown in FIG. 4, register SAR 42 contains flip-flips for storing address digits X 0  X 1  AE 0  to AE 11 . The inputs of each of flip-flops AE 4  to AE 11  are respectively responsive to the outputs of &#34;OR/AND&#34; circuits 43 to 50. The inputs of flip-flops X 0 , X 1 , AE 0 , AE 1 , AE 2 , AE 3  are connected directly to corresponding outputs (not shown) of control memory 10; these flip-flops store the most significant bits from the field AE which is read from the control memory 10 of FIG. 3. 
     Circuit 43 includes an OR circuit having two inputs connected to the outputs of a pair of two-input AND gates. The first AND gate has a first input always responsive to a logic 1 signal and a second input responsive to bit AE 4  of field AE of the microinstruction which is read from control memory 10. The second AND gate has one input responsive to bit (BR 7 ).sub.φ from register BR 7  of the register bank 1 and a second input responsive to bit EBR 7  from field EM of the microinstruction read from the control memory 10. 
     Circuit 44 includes an OR circuit having a pair of inputs responsive to the outputs of a pair of two input AND gates, one of which is always responsible to a binary one signal and to bit AE 5  of field AE of the microinstruction which is read from control memory 10. The inputs of the second AND gate are respectively responsive to bit (BR 7 ) 1  from register BR 7  in register bank 1, FIG. 3, and bit EBR 7  from field EM of the microinstruction read from control memory 10. 
     Circuit 45 includes an OR circuit having a pair of inputs responsive to the outputs of a pair of two input AND gates, one of which is always responsive to a binary one signal and bit AE 6  of field AE of the microinstruction which is read from the control memory 10. The inputs of the second AND gate are respectively responsive to bits (BR 7 ) 2  and EBR 7 . 
     Circuit 46 similarly includes an OR circuit having a pair of inputs responsive to the outputs of a pair of two input AND gates, one of which is always responsive to a binary one signal and to bit AE 7  of field AE of the microinstruction read from the control memory 10. The inputs of the second AND gate are respectively responsive to bits (BR 7 ) 3  from register BR 7  and EBR 7 . 
     Circuit 47 includes an OR circuit having three inputs which are responsive to the outputs of three two-input AND gates, one of which is always responsive to a binary one signal and to bit AE 8  from field AE of the microinstruction read from control memory 10. The two inputs of the second AND gate are respectively responsive to bits (BR 7 ) 4  and EBR 7 . The two inputs of the third AND gate respond to a signal indicative of the state of flip-flop BB 4 , in register 6, FIG. 3, and bit EB 4  from field EM of the microinstruction read from control memory 10. 
     Circuit 48 includes an OR circuit having three inputs connected to the outputs of three two-input AND gates, one of which is always responsive to a binary one signal and to bit AE 9  from field AE. The second AND gate is responsive to bit (BR 7 ) 5  from register BR 7  and at bit EBR 7  from field EM. The third AND gate is responsive to a signal indicative of the state of flip-flop BB 3  in register 6, and to bit EB 3  from field EM. 
     Circuit 49 includes an OR circuit having four inputs connected to the outputs of four two-input AND gates, one of which is always responsive to a binary one signal and bit AE 10  from field AE. The second AND gate is responsive to one input bit (BR 7 ) 6  from register BR 7  and bit EBR 7  from field EM. The third AND gate is responsive to a signal indicative of the state of the flip-flop BB 2 , in register 6, and to bit EB 2  from field EM. The fourth AND gate is responsive to a signal indicative of the state of the flip-flop F 2 , in register 5 of FIG. 3, and to bit ECM 2  from field EM. 
     Circuit 50 includes an OR circuit having four inputs connected to the output of four two-input AND gates, one of which is always responsive to a binary one signal and to bit AE 11  from field AE. The second AND gate is responsive to bits (BR 7 ) 7  from register BR 7  and EBR 7  from field EM. The third AND gate is responsive to bits EB 1  from field EM and a signal indicative of the state of flip-flop BB 1 . The fourth AND gate is responsive to a signal indicative of the state of flip-flop F 1 , in register 5, and bit ECM 1  from field EM. 
     The constituent parts of logic test unit 4 are illustrated schematically in FIG. 5. The bits to be tested come either from (1) the output of arithmetic logic unit 3, along BUS A 1 , in which case the test is performed on eight bits; or (2) from arithmetic logic unit 13 along BUS A 2 , in which case the test is performed on sixty-four bits. In FIG. 5, the tests shown are only those which enable negative, zero or positive values to be detected at the outputs of the two arithmetic logic units. It is to be understood that the number and particular character of these tests are not limiting and that other tests are envisaged. The tests on the 8-bit word (octets) on bus 41 are performed by circuits 57, 58 and 59. Circuit 57 detects a negative octet value, circuit 58 indicates that all the bits of the octet are zero and circuit 59 detects a positive octet value. 
     Details of circuits 57-58 are shown in FIG. 9, a circuit diagram of the apparatus for testing one octent. It is assumed that the octet is negative if the value of bit 8 is 1; bit 8 is processed by amplifier 95, which derives a binary one output if the octet is less than zero. The zero test is performed by an OR gate 96 having seven inputs which is followed by an inverter 97. When all the bits at the inputs of OR gate 95 are zeros, the output of inverter 97 goes to the 1 level. The positive test is performed by OR gate 96, responsive to the value indicating bits 1-7, and a two-input AND gate 99. Output 8 of OR gate 96 is connected to input 1 of AND gate 99, while input 2 of AND gate 99 is connected to the output 2 of an inverter 98, having an input 1 responsive to polarity indicating bit 8. Thus, when bit 8 is zero, and at least one value indicating bit is at the 1 level, causing output 8 of OR gate 96 to be a one, the output of AND gate 99 goes to the 1 level to indicate a positive value on BUS A 1 . 
     Returning to FIG. 5, output terminals 2 of circuits 57, 58 and 59 are connected to respective ones of the input terminals 1 of three AND gates 55, 54, 53, each of which has two inputs. A carry signal RA 1  derived by arithmetic unit 3 on bus A 1  is transmitted to input terminal 1 of AND gate 52. Input terminals 2 of AND gates 52-55 are respectively connected to output terminals 1-4 of a decoder 56, having input terminals 5, 6, 7 and 8 responsive to bits from field CM 1 , as read from the control register 11. In this arrangement, a value of: 
     CM 1  =0001 enables a test on the carry RA 1  by operating input terminal 2 of AND gate 52, 
     CM 1  =0010 enables a test on the output of member 59 by operating input terminal 2 of AND gate 53, 
     CM 1  =0011 enables a test on the output of circuit 58 by operating input terminal 2 of AND gate 54, 
     CM 1  =0100 enables a test on the output of circuit 57 by operating input terminal 2 of AND gate 55. 
     Output signals of AND gates 52 to 55 are fed to the inputs of four input terminal OR circuit 51 having an output terminal 3 for deriving a signal TCM 1  that reflects the results of the tests on the outputs of circuits 57 to 59 and indicates whether or not a carry is present. 
     Testing the outputs of arithmetic logic unit 13 is performed with similar circuits to those described supra for the output of unit 3; however, for unit 13, the tests are on a field of sixty-four bits. Bus A 2  is connected to the inputs of test circuits 66 to 68. Signals at output terminals 2 of test circuits 66 to 68 are fed to input terminals 1 of two-input AND gates 61 to 64, respectively. The carry bit RA 2  derived from arithmetic logic unit 13 on BUS A 2  is supplied to input terminal 1 of AND gate 61. Input terminals 2 of AND gates 61-64 are respectively responsive to signals at output terminals 1-4 of decoder 65, having input terminals 5-8 responsive to bits from field CM 2 , as read from control register 11. With a value CM 2  =0001 supplied to register 11 to decoder 65, the value of the carry bit RA 2  is transmitted through AND gate 61. With CM 2  =0010, the value of the output of member 66 is transmitted through AND gate 62. With CM 2  =0011,  the output signal of test circuit 67 is transmitted through AND gate 63. When CM 2  =0100, the output signal of circuit 68 is transmitted through AND gate 64. The output signals of AND gates 61 to 64 are fed to the inputs of a four-input OR gate 60 having an output terminal 3 on which is derived a signal TCM 2  indicative of the outputs of circuits 66 to 68 and whether or not a carry is present. The structure of circuits 66 to 68 is similar to that shown in FIG. 9 except that the test takes place on 64 bits. 
     The tests results, indicated by signals TCM 1  and TCM 2 , are stored in JK flip-flops F 1  100 and F 2  102. Flip-flop F 1  includes a K input responsive to a TCM 1  signal at output terminal 2 of inverter 99, having an input terminal 1 responsive to signal TCM 1  ; a J input of flip-flop F 1 , is directly responsive to signal TCM 1 . Thus, when flip-flop F 1  receives a control signal C 1  at its CK input, the result of the test ordered by field CM 1  is transferred to flip-flop F 1 . Similarly, flip-flop F 2  includes J and K inputs respectively responsive to signals TCM 2  and TCM 2 , as derived from OR gate 60 and output terminal 2 of inverter 101, having an input terminal 1 also responsive to the output of OR gate 60. Flip-flops F 1  and F 2  include clock input terminals DC, respectively responsive to control signals C 1  and C 2  from a suitable source, such as a clock, which enable the results of the tests ordered by fields CM 1  and CM 2  to be respectively transferred to flip-flops F 1  and F 2 . 
     Circuits in logic test unit 4 for controlling J-K flip-flops BB 1  to BB 4  are now described with reference to FIGS. 6 and 7. Flip-flop BB 1  is controlled in response to the three-bit field B 1 , as well as the test indicating signals TCM 1  and TCM 2 . In general, the circuitry for controlling the J and K inputs of flip-flop BB 1  69 includes decoder 78, as well as multiplexers 79 and 80, all of which have inputs responsive to field B 1 . Decoder 78, as well as multiplexers 79 and 80, drive logic circuitry including OR gate 70, AND gates 71 and 73, OR gate 74, AND gates 75 and 76, as well as inverter 77. Decoder 78 responds to field B 1  to selectively complement flip-flop BB 1  69, or to return the flip-flop to zero, depending upon the values of signals TCM 1  and TCM 2 . The circuitry and operation of decoder 78, multiplexers 79 and 80, as well as gates 70-76 and inverter 77 is now described in detail. 
     Three-bit field B 1  (that controls flip-flop BB 1 ) of the microinstruction read from control register 11 is applied in parallel as inputs to terminals 8, 9 and 10 of multiplexer 79, terminals 1,2,3 of decoder 78, and terminals 8, 9, 10 of multiplexer 80. Decoder 78, illustrated in detail in FIG. 8, responds to field B 1  to generate a complementing signal command, COMP, for flip-flop BB 1 , a zero-reset signal command, RAZ, for flip-flop BB 1 , and an input signal for flip-flop BB 1 . Bits B 10 , B 11  and B 12  of field B 1  are respectively applied to input terminals 1 of inverters 98, 99 and 100, having output bits B 10 , B 11 , B 12  that are combined in AND gates with bits B 10 , B 11  and B 12 . The signal to complement flip-flop BB 1  is generated at output terminal 4 of OR gate 107, having input terminals 1, 2 and 3 responsive to the signals at output terminals 4 of each of three input AND gates 101 to 103. Complementing signal COMP is derived by OR gate 107 in response to the bits derived from and supplied to inverters 98-100 in accordance with the logic equation: 
     
         B.sub.10 ·B.sub.11 ·B.sub.12 +B.sub.10 ·B.sub.11 ·B.sub.12 +B.sub.10 ·B.sub.11 ·B.sub.12. 
    
     Zero reset order RAZ is derived from output terminal 4 of AND gate 104 when the combination of signals supplied to and derived from inverters 98-100 is: 
     
         B.sub.10 ·B.sub.11 ·B.sub.12. 
    
     The instruction for supplying an input to flip-flop BB 1  is derived at output terminal 3 of OR gate 108, having one input terminal responsive to the output signal from AND gate 105 and another input terminal responsive to the output signal from AND gate 106. Gates 105 and 106 respond to the input and output bits of inverters 98-100 so the output signal of gate 108 is represented by: 
     
         B.sub.10 ·B.sub.11 ·B.sub.12 +B.sub.10 ·B.sub.11 ·B.sub.12. 
    
     Returning to FIG. 6, complementing signal COMP, derived at output terminal 4 of decoder 78, is applied to input terminals 2 and 1 of AND gates 72 and 75 respectively. Zero reset signal, RAZ, derived from output terminal 5 of decoder 78, is applied to input terminal 1 of an AND gate 73. The input signal to flip-flop BB 1  is derived at output terminal 6 of decoder 78 and is applied to input terminals 1 and 2 of AND gates 71 and 76. Output signals of AND gates 71, 72 and 73 are applied to the inputs of a three-input OR gate 70, having an output terminal 3 connected to the K input of flip-flop BB 1  69. Output signals of AND gates 75 and 76 are applied to the inputs of a two-input OR gate 74, having an output terminal 3 connected to the J input of flip-flop BB 1  69. 
     When the value of field B 1  is (000) (i.e., B 10  =B 11  =B 12  =0) input terminal 1 of multiplexer 80 is fed through the multiplexer in parallel to inputs 1 and 2 of AND gates 72 and 75, respectively, which are enabled by the &#34;COMP&#34; signal derived at terminal 4 of decoder 78. The outputs of gates 74 and 75 thereby supply binary ones to the J and K inputs of flip-flop BB 1 , whereby the next clock signal (from a suitable source, not shown) applied to the flip-flop CK input causes the former contents of flip-flop BB 1  to be complemented. When the value of field B 1  is 001 (i.e., B 10  =1, B 11  =B 12  =0), test results signal TCM 1  at input terminal 2 of multiplexer 80 is fed through the multiplexer to inputs 1 and 2 respectively of gates 72 and 75; gates 72 and 75 are at this time enabled by signal COMP derived by decoder 78. If the test commanded by field CM 1  is satisfied, signal TCM 1  is set to the 1 level, whereby binary ones are applied to the J and K inputs of flip-flop BB 1  69 so that the next clock signal applied to the CK input of flip-flop BB 1  69 complements the flip-flop. When the value of field B 1  is 010 (i.e., B 10  =B 11  =0, B 12  =1), the TCM 2  test result signal at input terminal 3 of multiplexer 80 is fed through the multiplexer to inputs 1 and 2 respectively of gates 72 and 75; gates 72 and 75 are at this time enabled in response to signal COMP, derived by decoder 78, being at their other inputs. If the test commanded by CM 2  is satisfied, signal TCM 2  is set to the 1 level, causing the J and K inputs of flip-flop BB 1  69 to be also at the one level, again causing complementing of flip-flop BB 1 . 
     If the value of field B 1  is 011 (i.e., B 10  =B 11  =1, B 12  =0), signal TCM 1  at input terminal 5 of multiplexer 79 is fed through the multiplexer to input terminal 1 of inverter 77 and to input terminal 1 of AND gate 76. When signal TCM 1  =0 (test commanded by CM 1  unsuccessful) a logic 1 is supplied by output terminal 2 of inverter 77 to input terminal 2 of AND gate 71. When signal TCM 1  =1 (test on CM 1  successful) a logic 1 is supplied by output terminal 7 of multiplexer 79 to input terminal 1 of AND gate 76. The value of field B 1   being 011 also sets output 6 of decoder 78 to the 1 state and sets inputs 1 and 2 respectively of gates 71 and 76 to the 1 state. Thus, when signal TCM 1  =0 the K input of flip-flop BB 1  69 is set to logic 1 via AND gate 71 and OR gate 70, while when signal TCM 1  =1 the J input of flip-flop BB 1  69 is set to logic 1, via AND gate 76 and OR gate 74. Thus, with TCM 1  =0, flip-flop BB 1  69 is reset to zero in response to the next clock signal CK and with TCM 1  =1 flip-flop BB 1  69 will be set to 1 in response to the next clock signal CK. Finally, when the value of field B 1  is 100, the TCM 2  signal at input terminal 6 of multiplexer 79 is fed through the multiplexer to input terminal 1 of inverter 77 and to input 1 of AND gate 76. At the same time, a signal at the logic 1 level is derived at output terminal 6 of decoder 78. The same process as is described for the case where field B 1  =011 is applicable, whereby signal TCM 2  =0, causes flip-flop BB 1  69 to assume the 0 state and signal TCM 2  =1 causes the flip-flop to assume the 1 state. 
     Flip-flop BB 2  is controlled in response to two-bit field B 2 , as well as test indicating signals TCM 1  and TCM 2 . The circuitry for controlling flip-flop BB 2  81 includes inverter 82, multiplexer 83 and OR gate 84. Multiplexer 83 responds to the command signal comprising field B 2 , to control feeding of test indicating signals TCM 1  and TCM 2  to the input of flip-flop BB 2  81. In addition, multiplexer 83 feeds the contents of flip-flop BB 2  81 back to the flip-flop or the test signal TCM 2  to the flip-flop, under the control of field B 2 . 
     The operation of the flip-flop BB 2  81 shown in FIG. 7 is as follows. To enter a test result TCM 1  into flip-flop BB 2 , multiplexer 83 responds to: the bits in field B 2 , supplied to multiplexer terminals 5 and 6; and signal TCM 1 , supplied to multiplexer input terminal 1 to the multiplexer output terminal 4. From terminal 4, signal TCM 1  is fed directly to the J input of flip-flop BB 2  81; and the TCM 1  signal is also fed to the K input of flip-flop BB 2  81 via inverter 82. In response to the next clock signal CK, signal TCM 1  is transferred to flip-flop BB 2  81. To enter a test result TCM 2  into flip-flop BB 2 , field B 2  activates multiplexer 83 so signal TCM 2 , present at multiplexer input terminal 2, is fed directly to the J input of flip-flop BB 2  ; after inversion, signal TCM 2  is fed to the K input of the flip-flop. In response to the next clock signal CK, signal TCM 1  is transferred to flip-flop BB 2  81. 
     OR gate 84 has a first input terminal responsive to the state of flip-flop BB 2 , as derived from the flip-flop Q output terminal, and another input terminal responsive to the state of test CM 2 , as indicated by signal TCM 2 . Output terminal 3 of gate 84 is connected to input terminal 3 of multiplexer 83. Field B 2  activates multiplexer 83 so the signal at input terminal 3, the result of the logic OR correlation between the former contents of flip-flop BB 2  and the result of the test ordered by TCM 2 , is transferred to flip-flop BB 2  in response to the next clock signal Ck. 
     Flip-flop BB 3  90 responds to a number of signals derived from a prior art data processor (not shown) with which the microinstruction linking address calculating apparatus of the invention is associated. These previously alluded to signals, the derivation of which forms no part of the present invention, are: secondary order CSIO, bit 7 of the data processor program control register PCR, secondary order CSPR, bit 12 from the data processor instruction register ISR, and NOP, as well as NOP, respectively indicative of a secondary order being and not being present. The two-bit field B 3  of the microinstruction read from the control register 11 is applied to inputs 6 and 7 of multiplexer 89 to enable the signals at multiplexer input terminals 1-4 to be selectively fed to the multiplexer output terminal 5. Multiplexer 89 input terminal 1 is responsive to the signal at output terminal 3 of OR circuit 85, in turn responsive to the outputs of AND gates 86 and 87. Input terminals 1 and 2 of gate 87 respectively respond to order CSPR and bit 7 from register PCR. Input terminals 1 and 2 of gate 86 respectively respond to: (a) signal TCM 1 , (b) the signal at output terminal 3 of OR gate 88 that indicates the result of a logic OR correlation between signal TCM 1  and the state BB 3  of flip-flop BB 3 , and (c) a signal indicating the state of flip-flop BB 2 . The signal at output terminal 5 of multiplexer 89 is applied on the one hand to the J input of flip-flop BB 3  90 and to input terminal 1 of inverter 90&#39;, having an output terminal 2 connected to the K input of flip-flop BB 3 . The signals at the J and K inputs to flip-flop BB 3  are coupled to a trigger input of the flip-flop to control its state in response to the signal at output terminal 3 of AND gate 90 having input terminals 1 and 2 respectively responsive to the clock signal H and the order signal NOP. If the order NOP is present, no transfer operation takes place to flip-flop BB 3 . 
     Thus, when input terminal 1 of multiplexer 89 is selected by a first combination of two-bit field B 3 , the value of bit 7 from register PCR or the value of bit 12 from register ISR is transferred to flip-flop BB 3  90, depending upon which of the orders CSPR or CSIO is present. When a second combination of the bits of field B 3  selects input terminal 2 of multiplexer 89, the test value TCM 1  is transferred to flip-flop BB 3 . If field B 3  selects input terminal 3 of multiplexer 89, the result of the logic OR correlation between test result TCM 1  and the state of flip-flop BB 3  is transferred to flip-flop BB 3 . When input 4 of multiplexer 89 is selected by field B 3 , the state of flip-flop BB 2  is transferred to flip-flop BB 3 . 
     The control of flip-flop BB 4  91 is in response to two-bit field B 4  of the microinstruction read from control register 11 that is applied to input terminals 6 and 7 of multiplexer 93 to selectively enable the signals at input terminals 1, 2, 3 and 4 of the multiplexer to be supplied to its output terminal 4. Input terminal 1 of multiplexer 93 is responsive to the output signal of AND gate 94, having input terminals 1 and 2 respectively responsive to bit 7 from register PCR and order CSPR. Input terminals 2, 3 and 4 of multiplexer 93 are respectively responsive to signals indicative of the contents of flip-flops BB 1 , BB 2  and BB 3 . 
     To enable the selective transfer of signals from the inputs of multiplexer 93 to flip-flop BB 4  91, output terminal 5 of multiplexer 93 is connected to the K input of flip-flop BB 4  via an inverter 92, and is connected directly to the J input of the flip-flop. A trigger input to flip-flop BB 4  is controlled by the signal at output terminal 3 of AND gate 91 having first and second input terminals respectively responsive to clock signal H and signal NOP. If signal NOP is present, no transfer takes place to flip-flop BB 4 . 
     All the apparatus employed by the invention which has just been described may be produced with logic circuits described in the book entitled &#34;Supplement to the TTL Data Book for Design Engineers&#34; reference CC416, published by Texas Instrument Company, or in the book issued by the same company entitled &#34;The TTL Data Book for Design Engineers&#34;, reference CC411. 
     While there has been described and illustrated one specific embodiment of the invention, it will be clear that variations in the details of the embodiment specifically illustrated and described may be made without departing from the true spirit and scope of the invention as defined in the appended claims.