although the present invention and its advantages have been described in detail , it should be understood that various changes , substitutions and alterations can be made herein without departing from the spirit and scope of the invention as defined by the appended claims . moreover , the scope of the present application is not intended to be limited to the particular embodiments of the process , machine , manufacture , composition of matter , means , methods and steps described in the specification . as one of ordinary skill in the art will readily appreciate from the disclosure of the present invention , processes , machines , manufacture , compositions of matter , means , methods , or steps , presently existing or later to be developed that perform substantially the same function or achieve substantially the same result as the corresponding embodiments described herein may be utilized according to the present invention . accordingly , the appended claims are intended to include within their scope such processes , machines , manufacture , compositions of matter , means , methods , or steps . referring now to fig1 , a schematic view of one embodiment of an aplanation lens position and alignment system according to the present invention is depicted . the major components of the system 10 are a laser system 12 and an aplanation lens 14 . to accomplish laser ophthalmic surgery , the laser system 12 includes a laser source 16 which is mounted on the system housing ( not shown ). this laser source 16 generates a laser beam 20 from an origination point 22 , as shown in fig1 . in one embodiment of the invention , the laser beam 20 has a pulse duration less than three hundred picoseconds (& lt ; 300 ps ) and a wavelength of between approximately 400 - 3000 nm . preferably , the laser operates at 1053 nm , with a pulse duration of approximately 600 - 800 femtoseconds , and a repetition rate of 10 khz . fig1 shows that the laser beam 20 is used to define a z - axis 24 that is parallel to the path of the laser beam . as discussed herein , the inventive system and method are shown through the use of an aplanation lens . however , the position and alignment of other objects may be determined . thus , the inventive system and method should be construed to cover any other object for which one wants to determine its position and alignment in relation to a laser beam . referring to fig2 , a schematic view of a laser beam 20 and tilted aplanation lens 14 is shown . to determine the position and alignment of the aplanation lens 14 in relation to the z - axis 24 of the laser beam , the focal point of the laser beam is first directed to a point on the z - axis 24 that is below the aplanation lens 14 . this first point is referred to as z 0 26 . the focal point of the laser beam is then moved along a closed pattern . the closed pattern is a shape where the laser beam focal point will travel . as the laser beam focal point travels along the closed pattern , the laser beam is fired . a spot distance of the laser beam may be set by the laser system such that the laser beam is fired on the closed pattern for a particular distance . for example , in one embodiment , the spot distance may be set to 1 μm - 30 μm . for a particular object and laser source being utilized , the spot distance may be different than the aforementioned example . in a preferred embodiment , the closed pattern is a circular shape having a diameter (“ d ”) 28 . the closed pattern is made in a plane perpendicular to the z - axis 24 . for an ophthalmic procedure using the aplanation lens , the closed pattern should have a diameter sufficiently wide , such that after the position of the aplanation lens and alignment determination is completed , a cornea then pressed against the aplanation lens does not contact an area of the closed pattern . in certain tests using an aplanation lens , a 7 - 9 . 5 mm diameter was utilized for the closed pattern and was found sufficiently wide . other diameters of course may be utilized depending on the type of procedure and the particular object for which alignment is being determined . after the first closed pattern is completed , the focal point of the laser beam is then adjusted up the z - axis 24 a set distance z x 30 to another starting point z 1 32 where z 1 = z 0 + z x . the value for the z x distance between each successive closed pattern is also referred as a separation layer distance . for each pass of the closed pattern , the laser beam focal point will move a distance along the z - axis based on the separation layer setting . the focal point of the laser beam is then again moved along a similar closed pattern in a plane perpendicular to the z - axis 24 and then adjusted up the z - axis to z 2 34 where z 2 = z 1 + z x . the steps of moving the focal point along the closed pattern and adjusting the starting point of the focal point of the laser beam up the z - axis 24 are repeated n times , until the focal point of the laser along the closed pattern makes contact with the aplanation lens 14 , causing a first plasma spark , at z n 36 , which may be detected . the particular manner in which the plasma sparks are detected is described below . a cpu utilizing software preferably instructs the movement of the focal point of the laser beam . while moving the laser beam , the software may record the coordinates of the focal point . for example , as the closed pattern is followed , the specific x -, y - and z - coordinates of the laser beam focal point will be known . this is true because it is the software instructing the movement of the focal point through the closed pattern at particular coordinates . thus , the laser system software may be configured or programmed to record the x , y , and / or z - coordinates based on certain defined events . the particular z n when the first plasma spark occurs is recorded . the steps of moving the focal point along the closed pattern and adjusting the starting point of the focal point of the laser beam up the z - axis 24 are repeated m times , until the focal point of the laser contacts the aplanation lens 14 along the entire closed pattern , causing a plasma spark along the entire closed pattern , at z j 38 , where j = m + n , which is detected . the point z j is recorded . the particular manner in which detection of the completion of the closed pattern occurs is later described below . for a better understanding of the inventive method , fig3 sets out in flowchart form certain steps of the present invention . in step 201 , the focal point of the laser beam is set at a point on the z - axis below the aplanation lens , z 0 . next in step 202 , the focal point of the laser beam is moved along a pattern , preferably in the shape of a circle having a diameter d , in a plane perpendicular to the z - axis . during the movement of the laser beam along the pattern , a check is made for the occurrence of a plasma spark . if a plasma spark is detected , then in step 204 , the z n location is recorded . likewise , the x n and y n coordinates may also be recorded . if no spark is detected , when the pattern is complete , then in step 203 the focal point of the laser beam is moved up the z - axis a determined distance , z x . step 202 is repeated until a plasma spark is detected . in step 205 , the focal point of the laser beam is moved up the z - axis a determined distance , z x . then in step 206 , the focal point of the laser beam is moved along a predetermined pattern , preferably in the shape of a circle having a diameter d , in a plane perpendicular to the z - axis . during the movement of the laser beam along the pattern , a check is made for the occurrence of a completion of a plasma spark for the circumference of the circle . if a completion of the entire circle is detected , then in step 207 , the z j location is record . also , the location of the x n and y n coordinates may also be recorded . if the completion of the plasma spark for the circumference of the circle is not completed , then step 205 repeats . lastly , in step 208 , the tilt of the aplanation lens can be determined . the plasma spark may be visually detected by the operator . for example , a foot switch operated by the user of the laser system may identify when the plasma spark occurs . the movement of the focal point along the closed pattern is performed as discussed above . when the user first detects the plasma spark , a foot switch may be activated . the activation of the switch signals the computer to record the z - axis coordinate of the first plasma spark . when the user detects completion of the closed pattern by watching a complete plasma spark along the closed pattern , the user activates the foot switch again . thus , the second z - axis coordinate is obtained . with both coordinates the tilt of the lens may then be determined . in another embodiment , a photodetector connected with the laser system may be utilized to detect the occurrence of plasma sparks . the photodetector can be any device capable of determining such an event . for example , a photodetector may include a photodiode , ccd , photomultiplier , phototransistor , or any device suited for detecting the occurrence of a plasma spark . the photodetector can be utilized to determine a first occurrence of the plasma spark and the completion of the closed pattern , thereby giving first and second z - axis coordinates which then may be used to calculate the tilt of the aplanation lens . in one embodiment , a photodetector is connected with the laser system . the photodetector is placed in a position on , adjacent to , or near the laser system where the photodetector can detect the plasma spark . the photodetector generates a voltage or signal when the laser beam creates a plasma spark in the aplanation lens . when the photodetector first detects a plasma spark , then the laser system software records the first z - axis coordinate . for the second z - axis position at the completion of the plasma spark along all of the closed pattern , the identification of the completion may be determined in different ways . one way to determine the completion of the closed pattern is to evaluate the voltage or signal from the photodetector and compare it with a known time for completion of the closed pattern . the laser system software may be configured to calculate the duration of time necessary to complete a given closed pattern . at the completion of the closed pattern , the voltage or signal of the photodetector can be evaluated . if the voltage or signal of the photodetector indicates that a plasma spark is occurring at the end of the closed pattern , then we know that a plasma spark has occurred at the end of the closed pattern . with this known completion point , then the second z - axis position can be determined . information about the orientation of tilt can be obtained by determining the x - y coordinate where the most intense plasma spark is detected within the object . the strongest signals from the plasma spark correspond to the deepest position within the object . in an alternative embodiment , a video camera is utilized to capture images of the aplanation lens as plasma sparks are being generated . by comparing sequences of captured images , it is then possible to use the image information to determine the tilt of the aplanation lens . in one embodiment , an ntsc camera with a rate of 30 frames per second was utilized . however , other video cameras with different frame rates may be utilized . in general , video images are searched for plasma spark as the laser beam focal point is scanned upwards toward the bottom surface of the aplanation lens . similar to the visual / manual and photodetector methods described above , the laser beam focal point is set at a beginning point such that the focal point of the laser beam does not create a plasma spark . the laser beam focal point is then moved through successive closed patterns whilst first and second z - axis coordinates are determined . in one embodiment , 8 - bit grey scale images are captured and evaluated . a grey scale image has pixels with a grey scale value between 0 ( black ) and 255 ( white ). the grey scale values ranging between 0 - 255 indicates the brightness for a particular pixel . for example , if an area of certain pixels of an image had a value of zero or near zero , this would indicate that portion of the image was dark . if an area of certain pixels had a value of 255 or near 255 , this would indicate that portion of the image was very light . thus the higher the number for the pixels of a certain area of an image , the brighter ( or whiter ) that area would be . based on this pixel valuation model , the occurrence of a plasma spark can be detected . when a plasma spark occurs and an image is taken , more higher - ranging pixels would exist than would exist if the plasma spark was not occurring . this is because the plasma spark creates a very bright light that would be noted in the image . referring now to fig4 , a graph is shown illustrating an aplanation lens tilt determination utilizing the iterative image comparison method . the frequency of image frames to be captured is set at a periodic time interval . the x - axis on the graph represents the frame number of a captured video image . in the illustrated example , a focal point of the laser beam was set in a circular pattern with a diameter of 7 . 8 mm . the spot distance of the laser was set at 3 μm . an energy level of 3 μj energy for the laser source was utilized . the y - axis on the graph represents the total compared image value , for those pixels above a certain threshold number . in the experiment , the threshold number was set at a value of 20 . the plasma spark line 60 shows the processing of several frames of images before , during and after the occurrence of plasma sparks . the video image process begins with the capture of a first video image . after a preset time interval , the next image is captured . the first video image and the second video image are then compared to one another . each pixel value ( 0 - 255 ) from the first image is added together to obtain a first image value . also , each pixel value ( 0 - 255 ) from the second image is added together to obtain a second image value . if a threshold value is set , then only those pixel values having a value higher than the threshold value would be added together . utilizing a threshold value reduces the light noise dramatically and allows the process to run at full room light and high illumination of the aplanation lens . the first image value is subtracted from the second image value giving a total compared image value . the total compared image value , which is stored in memory of the cpu , may be plotted on a graph . although not shown on the graph , for a total compared image value , the laser system software would also know or have stored the x -, y -, and z - coordinates for the particular image frame . thus , for a particular total compared image value , the x -, y -, and z - coordinates may be associated with the particular total compared image value . as illustrated in fig4 , prior to about frame 860 , no plasma spark has occurred . on the y - axis , the plasma spark line is shown as a linear line having a total compared image value of zero . during the process the ambient light is preferably maintained at a consistent level . as shown in fig4 , literally no noise signal exists before the plasma starts , even at full room light . as the plasma spark starts , from about frame 860 , the increasing mountains of signals occur as is shown on plasma spark line 60 . the spacing between each side of a mountain on the plasma spark line 60 represents the completion of one full circle . the first mountain 64 indicates the first occurrence of a plasma spark . the exact x - y coordinates at any mountain top gives the tilt axis . the first time the mountain does not go down to 0 ( or some low threshold ), the plasma circle is completed ( second or final contact ). to more easily detect the first and the second contact , the plasma spark line 60 is further processed in the following way . a binary signal ( or plasma spark state ) may be created with the following process . the binary signal or plasma spark state is set to one 1 if the total compared image value is over a certain value . if for a particular image frame , the total compared image value is greater than the set value ( in the example it was set to 1 ), then for that frame the plasma spark state would be set to 1 or true . if the total compared image value is below the set value , then the plasma spark state would be set to 0 or false . in this manner , as shown on the graphed plasma spark state line 62 , the state of the plasma spark for a particular image frame and time would be known . the distance between two consecutive mountain peaks is equivalent to the layer separation parameter defined by the laser software . this is usually in the order of 2 - 10 micrometers but may vary according to the desired accuracy . for each mountain peak , the closed pattern makes one revolution and for each revolution , the focus position moves upward in the z - direction in the amount of the layer separation . the amount of peaks contained between the first plasma spark 64 and the full closure of the pattern 61 determines the following δz =| z ( 1st plasma ) − z ( full closure ) |. the determination of the tilt axis is dependent on the position of the x - y coordinate at the time the mountain peak is present . an axis line can be drawn 180 ° from the x - y position of the mountain peak , relative to the center of the circular pattern . the determination of tilt is as follows θ = tan − 1 ( δz / d ) where δz is the difference of z position between the first plasma spark 64 and the full closure of the pattern 61 as detected by the ccd camera and d is the diameter of the circular pattern . the alignment of the aplanation lens 14 in relation to the z - axis 24 is then calculated by using the following equation : θ = tan − 1 ( δz / d ); where θ 40 is the angle between the aplanation lens 14 and a plane perpendicular to the z - axis 24 , and wherein δz is the difference between the first z - axis location and the second z - axis location , and d is the diameter of the predetermined pattern . the angle φ42 between the z - axis 24 and the aplanation lens 14 is 90 − θ . although the methods above discuss obtaining a second z - axis location by electronic or manual means , the second z - axis may be calculated . after the first z - axis location is found , then the second z - axis is calculated . the second z - axis location would be the point on a circular predetermined pattern opposite the first z - axis location . this holds true since , by using a circular predetermined pattern , the first z - axis location is the lowest point of the tilt ( if scanning the laser from the below the aplanation lens upwards ) and the highest point would always be the point on the predetermined pattern opposite the first z - axis location . thus , the first z - axis location may be determined ( along with the x -, y - coordinates ) and then using the known diameter of the circular pattern , the second z - axis location may be determined . utilizing the circular predetermined pattern , by finding the first and second z - axis location , the plane of the contact surface of the aplanation lens can be determined along with the orientation of the plane about the z - axis . determining the tilt of the aplanation lens 14 in relation to the laser beam is very useful . in the field of ophthalmic surgery , a more precise photodisruption of tissue of the eye can be achieved . for example , it is important in ophthalmic laser surgery procedures that photodisruption be very precise . whilst utilizing an aplanation lens , a patient &# 39 ; s cornea is pressed against the lens , thereby flattening the cornea against the glass surface of the lens . with a perfectly calibrated laser system , using a perfectly formed aplanation lens , the contact surface ( the contact plane ) of the aplanation lens would be perpendicular to the laser beam . this would allow the focusing of the laser beam at a z - coordinate in the cornea in one x - y location to be the same z - coordinate if the laser focus was moved to another x - y location . but if the aplanation lens were tilted , this would cause the focus of the laser at one x - y location in the tissue of eye to actually be different than another x - y location in the tissue of the eye . but if the tilt of the aplanation lens were known , then the z - coordinate ( or focal depth ) for a particular x - y location could be offset or compensated for to take into consideration the lens tilt . an alternative way to determine the tilt of a surface of an object in relation to a z - axis of a laser beam is to determine three points of an object . a laser beam may be focused at a z - axis point such that the focal point of the laser beam does not contact the object . this may be at any x -, y - coordinate . the laser beam z - axis focal point is incrementally moved a specified distance and the laser fired . the focal point is moved again a set distance and fired . this continues until a first plasma spark is detected . the detection may be by any manner , including the method described above , manually , via photodetector , and video image comparison . the first point ( its x -, y -, and z - coordinates ) is recorded or saved in memory or storage by the laser system . the laser system then directs the laser beam to a second x , y - coordinate . the focal point of the laser is then moved to a z - axis point such that the focal point of the laser beam does not contact the object . then again , the laser beam z - axis focal point is incrementally moved a specified distance and the laser fired . this continues until a second plasma spark is detected . the second point ( its x -, y -, and z - coordinates ) is recorded or saved in memory or storage by the laser system . the laser system then directs the laser beam to a third x , y - coordinate . the focal point of the laser beam is then moved to a z - axis point such that the focal point of the laser beam does not contact the object . then again , the laser beam z - axis focal point is incrementally moved a specified distance and the laser fired . this continues until third plasma spark is detected . the third point ( its x -, y -, and z - coordinates ) is recorded or saved in memory or storage by the laser system . having now determined three surface points of a surface of the object , a plane of the surface in relation to a z - axis of the laser be would be known . knowing the plane of the object , then subsequent procedures can use the plane as a reference plane for z - offset . also , the distance between two points may be calculated by detecting a first plasma spark at the surface of a first object , and detecting a second plasma spark at the surface of a second object . the detection of the first and second plasma spark may be detected by the methods described above . the z - axis coordinate of each plasma spark is then used the determined the distance between the surface of each object where the plasma spark is detected . by determining the alignment ( or tilt ) of a surface of an object in relation to a laser beam ( or z - axis of the laser beam ), a z - offset value may be utilized for subsequent laser system operations . for a particular x -, y - coordinate , the z - coordinate may be offset a particular distance to allow the focus of the laser beam to be at a plane parallel to the plane of the tilt of the object . in one embodiment , a software program commands a displacement of a focusing assembly of a laser system by writing a voltage to a digital / analog card . a z - galvo will in turn move the focusing assembly to the desired focal depth position based upon the commanded voltage by directing a current to the motor - driven focusing assembly . a linear encoder positioned within the laser system senses the linear movement of the focusing assembly . an intelligent controller interoperating with the host computer and software program utilizes a sensor to read an encoder strip attached to the focusing assembly . as the lens is moved into position , encoder feedback is provided by an intelligent controller and an actual focusing assembly position is obtained . to measure the z - gain , a second point needs to be measured . measurement of the z - gain may be achieved by utilizing a second object , such as glass that has a substantially planar top and bottom surface that are substantially parallel to one another . in one experiment , a 160 μm thick microscope slide was mounted against the contact glass of the aplanation lens contact plane . the slide was made out of borosilicate glass ( corning 0211 ) with a refractive index of 1 . 521 at 1060 nm . the flatness of the slide was measured . it had parallel top and bottom planar surface within ± 1 μm over the whole slide ( 22 × 22 mm ). the slide is pressed against the contact glass by slightly pushing from below with a rod and a round plastic screw head on top of it . this results in an air gap below the slide at the circle diameter of the closed pattern . the circular closed patterns are now cut like in the z - offset procedure except that the starting depth is set at 200 μm . this simulates focusing the laser beam into the corneal tissue . to correct for the human cornea ( n = 1 . 377 ), the 160 μm thick borosilicate glass corresponds to a 146 μm thick cornea layer . this was simulated with the winlase ™ 3 . 0 pro software using a gaussian beam with an f #= 1 . 48 focusing number of the objective lens . with the correction in place , the software is expected to report an offset of 146 μm if the z - offset was zeroed before a procedure . if the number is off , then the z - scale factor ( z - gain ) is off by the following amount : new z - scale factor =( 146 μm / measured offset )* old z - scale factor after correcting the z - scale factor in the laser system settings , the z - offset needs to be redone because it might not fall together with a o - voltage on the z - scanner and therefore can be affected by a gain change . another way to measure the position of a surface of an object relative to a laser beam is utilizing an interferometer . after measurement , the laser system may then account for variances of height dimensions of the object and set offset parameters for the focal depth . offset parameters in software allow canceling the effect of variances of height dimensions of the aplanation lens , thereby delivering consistent surgical depths . this method utilizes the curvature of the wave front of a laser reflected back from the glass surface of the aplanation lens . the curvature of the wave front is measured by an interferometer . there are two ways to relate fringe curvatures to focal depth . first , by knowing the geometry of the optics and the interferometer , the fringe patterns can be exactly calculated and related to focal depths . however this method would require a precise knowledge of the beam geometry . a second , more practical method is to calibrate the machine to measurable focal positions . this is the approach we followed with our implementation . in one implementation the machine is set to cut patterns in a glass sample at different depths while the interference patterns are simultaneously recorded . then the cutting depths in the sample are measured with the help of a microscope and related to the curvatures of the fringes as previously recorded . the interferometer utilizes a reference beam , which is split directly from the laser beam before entering the delivery system , and a measured beam , which passes through the delivery system . the reference beam is essentially a parallel beam . the measured beam is part of the laser beam that reflects back from the optical surface of the aplanation lens . the reflected beam retraces the optical path through the laser focusing optics and the scanner system in a backward direction . if the reflecting surface is at the focal point , then the back - reflected beam retraces the same path all the way through the delivery system and leaves it as a parallel beam . this beam can be interfered with a reference beam . in this case , both beams are parallel and they make an interference pattern with straight fringes . on the other hand , if the aplanation lens is out of focus , then the back - reflected beam does not trace the very same path backwards , and it leaves the delivery system as a convergent or divergent beam . convergent or divergent beams combined with parallel beams produce curved fringe patterns . the position information of the focus can be extracted from the interference pattern , essentially from the sign and magnitude of the curvature of the fringes . in one embodiment an image processing method is followed . a raw image is first captured then filtered and enhanced by convoluting the image with a spatially periodic kernel . this process smoothes imperfections of the image which are of random nature for example due to dust particles on the optics . at the same time the spatial periodicity of the kernel enhances the contrast of the interference pattern with the right periodicity . the next step of the image processing is edge detection by canny edge detection algorithm . ( canny , a . ( 1986 ) a computational approach to edge detection . ieee trans . pami , 8 : 769 - 698 .) the edge fragments are then analyzed . fragments shorter than a given length are discarded . the longer fragments are fitted with a polynomial curve . the second order coefficient of the polynomial gives the curvatures of the individual fringes . finally curvatures from individual fringes are averaged . in one embodiment , the interference pattern is captured by a video camera and frame capture software described above . the pattern may be analyzed by computer software . the curvature of the fringe pattern is extracted and the focal position calculated . to determine the focal position , when the fringe pattern has parallel beams , then the laser beam is focused . one way to determine how much the laser beam is out of focus , is the mass calibrate various curvatures of the fringe pattern and measure the focal distance . for example , a micrometer may be used to determine the various focal distance for a particular fringe curvature . for a particular fringe curvature , a focal depth value may be stored in a table . then for subsequent uses of the laser system , a particular fringe pattern curvature , may be determined and then looked up in the table to determine the focal position . alternatively , for the curvature behavior could be evaluated to determine an algorithm , such that for a particular fringe curve a focal position could be derived . various experiments were performed to determine the fringe patterns and the relation to the focus of the laser beam . in one experiment , the measured interference fringe pattern curved downwards . this is shown in fig5 a . the focus of the laser beam was found to be 20 μm above the contact plane of the aplanation lens . in another experiment , the measured interference fringe pattern formed straight lines . this is shown in fig5 b . the focus of the laser beam was found to be on the glass surface of the aplanation lens . in a third experiment , the measured fringe pattern curved upwards . this is shown in fig5 c . the focus of the laser beam was found to be 10 μm below the contact plane of the aplanation lens . measuring one point at the optical center of the field of view of the aplanation lens provides a z - offset number . this method may be used to measure three point measurements of the contact plane of the aplanation lens to determine the tilt of the focal plane . this interferometric method not only has the advantage of determining the focal point of a plane of an aplanation lens , but also may be used to detect laser beam distortions . some of these distortions may be i ) inherent to the design of the laser system optics , such as spherical and chromatic aberrations , ii ) coming from the laser , such as spatial chirp , iii ) distortions from component level aberrations , such as out of spec mirror flatness , or iv ) distortions due to system misalignment . if the measured focal position of the laser is outside of a pre - determined acceptable range , the laser system software may be configured to instruct the servo system to modify offset values for the z - axis focal position and then bring the laser system into an acceptable range . also , the software parameters for a surgical pattern may be configured to accommodate hardware offset and tilt of the laser focal plane relative to a surgical plane . another method to determine the depth of focus of a laser beam is utilizing a photo multiplier with band pass filter to monitor the nonlinear frequency signal generated by laser beam . the laser system computer monitors the dependence of the signal on depth of focal point . change in the signal indicates the interface between the lower surfaces of the aplanation glass and the cornea . nonlinear frequency conversion method is noninvasive . the depth calibration can be performed while the aplanation lens is docked on a patient &# 39 ; s eye thus reducing the error introduced by mechanical backlashes . this method is based on usage of different nonlinear effects in glass and the cornea to generate light at frequencies other than the frequency of the laser beam . the effects can include , but not be limited to , second harmonic generation , third harmonic generation , stimulated raman , white light generation and others . at laser beam intensities close to photodisruption threshold , conversion efficiencies of mentioned nonlinear processes are high enough to generate a detectable signal . these signals have quadratic or higher order dependence on input intensity and will be confined in space to the beam waist and will therefore increase the accuracy of interface detection . a photo multiplier with a band pass filter is attached to the laser system . the computer of the laser system monitors the dependence of the signal on focal point depth . a change in the signal indicates the interface between the lower surface of the aplanation lens and cornea . accuracy of better than 5 microns may be achieved . referring to fig6 , the method may be further described . fig6 is a graph illustrating dependence of second harmonic signal on beam waist position in pig eye where the positive sign on the depth axis corresponds to the position inside the cornea and the zero position corresponds to the cornea - glass interface . to determine the focal point of the laser beam at the interface of the aplanation lens and the cornea , one takes half the max of the signal . this is shown on the graph on at the point of 0 microns . if the focal spot moves out into the aplanation lens , then the signal decreases , if the focal point goes into the cornea , then the signal increases . this can be done because , with certain laser beams , such as a femtosecond mode - locked laser beam can be described by its confocal parameter . in other words , the laser beam has a focal point with a particular length range . it is when half the length of the focal point range is inside the cornea that the signal would be at the half max of the signal . in one experiment , the method was tested with an aplanation lens in contact with a pig eye . the energy level of laser was reduced to 0 . 2 □ j so that the fluence is below the optical damage threshold of the glass or pig eye , but high enough to generate second harmonic in cornea . while scanning the depth of the focal point , the intensity of second harmonic decreases by factor of 50 from cornea to glass interface . this enabled localization of the focal point at the cornea - glass interface with accuracy of better than +/− 5 . 0 microns . results are presented on fig6 in another experiment , the method was tested with an aplanation lens having a piece of plastic attached to the lens . the piece of plastic was used to simulate a cornea being in contact with the aplanation lens . the energy level of the laser system was reduced to 0 . 7 μj so that the fluence is below the optical damage of the glass , but high enough to generate white light . while scanning the depth of the focal point , the intensity of while light changes by factor of two from glass to plastic . this enable the localization of the focal spot position at the glass - plastic interference with an accuracy of 5 micron . the inventive systems and methods described above are well adapted for a system to determine the position and alignment of an aplanation lens in relation to a laser system . however , it shall be noted that the foregoing description is presented for purposes of illustration and description , and is not intended to limit the invention to the form disclosed herein . consequently , variations and modifications to the systems and processes commensurate with the above teachings and teaching of the relevant art are within the scope of the invention . these variations will readily suggest themselves to those skilled in the relevant art and are encompassed within the spirit of the invention and the scope of the following claims . moreover , the embodiments described are further intended to explain the best modes for practicing the invention , and to enable others skilled in the art to utilize the invention in such , or other , embodiments and with various modifications required by the particular applications or uses of the present invention . it is intended that the appending claims be construed to included alternative embodiments to the extent that it is permitted by the prior art .
the present invention generally relates to a method and system for determining the position and alignment of a plane in relation to an intersecting axis and using that known position and alignment to allow for corrections to be made when using the plane as a reference plane . more particularly , the invention relates to a method and system for determining the angle of tilt of a planar surface in relation to a laser beam , and using the determined angle of tilt to calculate a correction factor to be applied to the laser beam . briefly stated , the method and system ultimately calculates a correction factor , z - offset , that is applied when using the laser beam in a procedure .