[ 키워드 : " Rei - Fu Huang "] 
 random access memory ( 16 ) 
 circuit faults ( 15 ) 
 circuit testing ( 14 ) 
 built - in self - test ( 12 ) 
 redundancy ( 7 ) 
 system - on - a - chip ( 6 ) 
 circuit simulation ( 5 ) 
 computer storage devices ( 5 ) 
 memory testing ( 4 ) 
 read - write memory ( 4 ) 
 system testing ( 4 ) 
 built - in self - repair ( bisr ) ( 3 ) 
 electrical fault detection ( 3 ) 
 integrated circuit testing ( 3 ) 
 sram chips ( 3 ) 
 built - in self - test ( bist ) ( 2 ) 
 electronic equipment testing ( 2 ) 
 embedded dram ( 2 ) 
 mim capacitors ( 2 ) 
 semiconductor device testing ( 2 ) 
 semiconductor memory ( 2 ) 
 ieee transactions on very large scale integration ( vlsi ) systems , very large scale integration ( vlsi ) systems , ieee transactions on , ieee trans . vlsi syst . ( 3 ) 
 13 th asian test symposium ( 2 ) 
 13 th asian test symposium , test symposium , 2004 . 13 th asian , asian test symposium ( 2 ) 
 2003 test symposium , test symposium , 2003 . ats 2003 . 12 th asian , twelfth asian symposium ( 2 ) 
 test symposium , 2003 . ats 2003 . 12 th asian ( 2 ) 
 2004 international conferce on test , test conference , 2004 . proceedings . itc 2004 . international , international test conference ( 1 ) 
 2004 international conference on test ( 1 ) 
 2005 ieee vlsi - tsa international symposium on vlsi design , automation & test , 2005 . ( vlsi - tsa - dat ) ( 1 ) 
 2005 ieee vlsi - tsa international symposium on vlsi design , automation and test , 2005 . ( vlsi - tsa - dat ) . , vlsi design , automation and test , 2005 . ( vlsi - tsa - dat ) . 2005 ieee vlsi - tsa international symposium on , vlsi design , automation & test ( 1 ) 
 2008 ieee international test conference ( 1 ) 
 2008 ieee international test conference , test conference , 2008 . itc 2008 . ieee international ( 1 ) 
 asp - dac 2004 : asia & south pacific design automation conference 2004 ( ieee cat . no . 04 ex 753 ) ( 1 ) 
 asp - dac 2004 : asia and south pacific design automation conference 2004 ( ieee cat . no . 04 ex 753 ) , design automation conference , 2004 . proceedings of the asp - dac 2004 . asia and south pacific , design automation ( 1 ) 
 ieee design & test of computers , design & test of computers , ieee , ieee des . test . comput . ( 1 ) 
 international test conference , 2003 . proceedings itc 2003 ( 1 ) 
 international test conference , 2003 . proceedings . itc 2003 . , test conference , 2003 . proceedings . itc 2003 . international , international test conference ( 1 ) 
 proceedings 2004 ieee international workshop on current & defect based testing ( ieee cat . no . 04 ex 1004 ) ( 1 ) 
 proceedings of the 2002 ieee international workshop on memory technology , design & testing ( mtdt 2002 ) ( 1 ) 
 proceedings of the 2002 ieee international workshop on memory technology , design and testing ( mtdt 2002 ) , memory technology , design and testing , 2002 . ( mtdt 2002 ) . proceedings of the 2002 ieee international workshop on , memory technology design and testing ( 1 ) 
 proceedings of the eighth ieee international on - line testing workshop ( ioltw 2002 ) ( 1 ) 
 proceedings of the eighth ieee international on - line testing workshop ( ioltw 2002 ) , on - line testing workshop , 2002 . proceedings of the eighth ieee international , on - line testing workshop ( 1 ) 
 proceedings . 2004 ieee international workshop on current and defect based testing ( ieee cat . no . 04 ex 1004 ) , current and defect based testing , 2004 . dbt 2004 . proceedings . 2004 ieee international workshop on , current and defect based testing ( 1 ) 
 records of the 2003 international workshop on memory technology , design & testing ( 1 ) 
 records of the 2003 international workshop on memory technology , design and testing , memory technology , design and testing , 2003 . records of the 2003 international workshop on , memory technology , design and testing ( 1 ) 
 records of the 2004 international workshop on memory technology , design & testing ( 1 ) 
 records of the 2004 international workshop on memory technology , design and testing , 2004 . , memory technology , design and testing , 2004 . records of the 2004 international workshop on , memory technology , design and testing ( 1 ) 
 IEEE Transactions on Computers IEEE Trans . Comput . Computers , IEEE Transactions on . 62 ( 3 ) : 468 - 481 Mar , 2013 
 IEEE Transactions on Very Large Scale Integration ( VLSI ) Systems IEEE Trans . VLSI Syst . Very Large Scale Integration ( VLSI ) Systems , IEEE Transactions on . 20 ( 9 ) : 1715 - 1728 Sep , 2012 
 Components , Circuits , Devices and Systems / Testing / Random access memory / Algorithm design and analysis / Mathematical model / Error correction codes / error - correction - code / Embedded - DRAM ( eDRAM ) / fault model / retention 
 2010 IEEE International Test Conference Test Conference ( ITC ) , 2010 IEEE International . : 1 - 10 Nov , 2010 
 Random access memory / MOSFETs / Resistance / Stress / Stability analysis / Circuit faults 
 IEEE Transactions on Very Large Scale Integration ( VLSI ) Systems IEEE Trans . VLSI Syst . Very Large Scale Integration ( VLSI ) Systems , IEEE Transactions on . 19 ( 12 ) : 2184 - 2194 Dec , 2011 
 Components , Circuits , Devices and Systems / Circuit faults / Design for testability / Redundancy / Built - in self - test / Algorithm design and analysis / Semiconductor memory / Built - in self - repair ( BISR ) / design - for - testability ( DFT ) / memory diagnostics / memory repair / memory testing / semiconductor memory / yield enhancement 
 2005 IEEE VLSI - TSA International Symposium on VLSI Design , Automation and Test , 2005 . ( VLSI - TSA - DAT ) . VLSI design , automation & test VLSI Design , Automation and Test , 2005 . ( VLSI - TSA - DAT ) . 2005 IEEE VLSI - TSA International Symposium on . : 20 - 23 2005 
 Components , Circuits , Devices and Systems / Engineered Materials , Dielectrics and Plasmas / Computing and Processing / Signal Processing and Analysis / Data compression / Automatic testing / Circuit faults / Circuit testing / Hardware / Built - in self - test / Costs / Fault diagnosis / Laboratories / Embedded computing 
 Records of the 2004 International Workshop on Memory Technology , Design and Testing , 2004 . Memory technology , design and testing Memory Technology , Design and Testing , 2004 . Records of the 2004 International Workshop on . : 65 - 69 2004 
 Computing and Processing / Components , Circuits , Devices and Systems / Circuit testing / Built - in self - test / System testing / System - on - a - chip / Sequential diagnosis / Memory architecture / Constraint optimization / Geometry / Test pattern generators / Production 
 13 th Asian Test Symposium Asian test symposium Test Symposium , 2004 . 13 th Asian . : 366 - 371 2004 
 Components , Circuits , Devices and Systems / Signal Processing and Analysis / Power , Energy and Industry Applications / Circuit faults / Redundancy / System - on - a - chip / Algorithm design and analysis / Partitioning algorithms / Hardware / Fault diagnosis / Design methodology / Logic / Costs 
 13 th Asian Test Symposium Asian test symposium Test Symposium , 2004 . 13 th Asian . : 260 - 265 2004 
 Components , Circuits , Devices and Systems / Signal Processing and Analysis / Power , Energy and Industry Applications / Flash memory / Nonvolatile memory / Automatic testing / System testing / Costs / Built - in self - test / System - on - a - chip / Random access memory / Algorithm design and analysis / Manufacturing