A FEGSEM (Field Emission Gun Scanning Electron Microscope) is an indispensable analytical tool for research and solving industrial problems where optical microscopes will not provide the required resolution.
All our FEGSEM instruments have auxiliary Energy Dispersive Spectroscopy (EDS) detectors and Electron backscatter diffraction (EBSD) cameras.
Electron Backscattered Diffraction (EBSD) is a scanning electron microscopy (SEM) technique applicable to crystalline materials which provides crystallographic information.
Energy Dispersive X-Ray Spectroscopy (EDS) is an analytical technique which provides elemental analysis or chemical characterisation of a sample. When an electron beam interacts with a specimen characteristic x-rays are produced. The energy and number of the X-rays emitted can be measured using an EDS detector.