• Negative interactions between the tip and sample ( e.g. , tip shielding and tip sweeping effects ) should be carefully considered when analyzing data obtained by AFM and related SPM techniques . For small samples and features , tip convolution , that is , imaging artefacts due to the tip radius being larger than the feature being imaged , can cause particular problems . This can also occur when the tip size / shape subtly changes during electrochemical cycling . As studies of nanoscale battery materials , materials with important nanoscale changes , or those examined during charge / discharge processes that produce detachable products become more common , it is important that authors carefully examine their data for these effects before drawing more complex conclusions .