Surface roughness interpretation of 730 kg days CRESST-II results
  The analysis presented in the recent publication of the CRESST-II results
finds a statistically significant excess of registered events over known
background contributions in the acceptance region and attributes the excess to
a possible Dark Matter signal, caused by scattering of relatively light WIMPs.
We propose a mechanism which explains the excess events with ion sputtering
caused by 206Pb recoils and alpha particles from 210Po decay, combined with
realistic surface roughness effects.
