  Metal films grown on Si wafer perforated with a periodic array ofsubwavelength holes have been fabricated and anomalous enhanced transmission inthe mid-infrared regime has been observed. High order transmission peaks up toSi(2,2) are clearly revealed due to the large dielectric constant contrast ofthe dielectrics at the opposite interfaces. Si(1,1) peak splits at obliqueincidence both in TE and TM polarization, which confirms that anomalousenhanced transmission is a surface plasmon polaritons (SPPs) assisteddiffraction phenomenon. Theoretical transmission spectra agree excellently withthe experimental results and confirm the role of SPPs diffraction by thelattice.
Metal films grown on Si wafer perforated with a periodic array of subwavelength holes have been fabricated