  A simple optical method is presented for identifying and measuring theeffective optical properties of nanometer-thick, graphene-based materials,based on the use of substrates consisting of a thin dielectric layer onsilicon. High contrast between the graphene-based materials and the substrateis obtained by choosing appropriate optical properties and thickness of thedielectric layer. The effective refractive index and optical absorptioncoefficient of graphene oxide, thermally reduced graphene oxide, and grapheneare obtained by comparing the predicted and measured contrasts.
High contrast between the graphene-based materials and the substrate is obtained by choosing appropriate optical properties and thickness of the dielectric layer. The effective refractive index and optical absorption coefficient of graphene oxide, thermally reduced graphene oxide, and graphene are obtained by comparing the predicted and measured contrasts.