  We investigated structure and morphology of PTFE layers deposited by vacuumprocess in dependence on deposition parameters: deposition rate, depositiontemperature, electron activation energy and activation current. Pentacene (PnC)layers deposited on top of those PTFE films are used as a tool to demonstratethe orienting ability of the PTFE layers. The molecular structure of the PTFEfilms was investigated by use of infrared spectroscopy. By means ofellipsometry, values of refractive index between 1.33 and 1.36 have beenobtained for PTFE films in dependence on deposition conditions. Using the coldfriction technique orienting PTFE layers with unidirectional grooves areobtained. On top of these PTFE films oriented PnC layers were grown. Theobtained order depends both on the PTFE layer thickness and on PnC growthtemperature.
The molecular structure of the PTFE films was investigated by use of infrared spectroscopy. By means of ellipsometry, values of refractive index between 1.33 and 1.36 have been obtained for PTFE films in dependence on deposition conditions. Using the cold friction technique orienting PTFE layers with unidirectional grooves are obtained.