  The wetting behavior of thin films of 4'-n-octyl-4-cyanobiphenyl (8CB) on Siis investigated via optical and x-ray reflectivity measurement. An experimentalphase diagram is obtained showing a broad thick-thin coexistence regionspanning the bulk isotropic-to-nematic ($T_{IN}$) and the nematic-to-smectic-A($T_{NA}$) temperatures. For Si surfaces with coverages between 47 and $72\pm3$nm, reentrant wetting behavior is observed twice as we increase thetemperature, with separate coexistence behaviors near $T_{IN}$ and $T_{NA}$.For coverages less than 47 nm, however, the two coexistence behaviors mergeinto a single coexistence region. The observed thin-thick coexistence near thesecond-order NA transition is not anticipated by any previous theory orexperiment. Nevertheless, the behavior of the thin and thick phases within thecoexistence regions is consistent with this being an equilibrium phenomenon.
The wetting behavior of thin films of 4'-n-octyl-4-cyanobiphenyl (8CB) on Si is investigated via optical and x-ray reflectivity measurement.