Quantitative analysis of molecularly stacked layer structures in supported organic thin films by synchrotron grazing-incidence X-ray scattering
In this study, we derive a grazing-incidence X-ray scattering (GIXS) formula to analyze quantitatively GIXS patterns for molecularly stacked layer structures in substrate-supported nanoscale thin films. We apply this formula in the quantitative analysis of GIXS patterns obtained for S-docosanylcysteine thin films on silicon substrates with native oxide layers. This analysis successfully provides information on the structural parameters and orientation of the molecular layer stack developed in S-docosanylcysteine thin films.
Refrigeration of the volatile oil of Nigella sativa L. seeds eventuates in a crystalline substance. The chemical structure of the compound was drawn from its chemical behaviour, as well as from its UV, IR, PMR and mass spectral data. The compound was found to be thymohydroquinone: confirmation of the structure was established via the preparation of its corresponding diacetate ester. The compound was found to have high antimicrobial effect against gram positive microorganisms