Computer simulation for warp knitted towel fabric
In order to improve the simulation effect of warp knitted towel fabric during computer-aided designing,the article puts forward a new simulation method-filling pile loop model,which is based on analysis of the pile loop model data and the factors influencing the configuration of the pile loop.The fundamental pile loop model is established by studying the relationship between the data of single pile loop model and weave structure.Having analyzed the relationship between individual factors that influence the configuration of pile loop,how to get the simulation pile loop model in different shapes and how to establish the pile loop model database are discussed,realizing the simulation of warp knitted towel fabrics by use of computer technology.
In this paper, we have presented an effective yield improvement methodology that can help both manufacturing ::: foundries, fabless and fab-lite companies to identify systematic failures. It uses the physical addresses of failing bits ::: from wafer sort results to overlay to inline wafer defect inspection locations. The inline defect patterns or the design ::: patterns where overlay results showed matches were extracted and grouped by feature similarity or cell names. The potentially problematic design patterns can be obtained and used for design debug and process improvement.