Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester
This paper proposes a test methodology for dynamic specification testing of high-speed A/D converters on a low cost tester using the alternate test approach. In the proposed approach, regression-based mapping functions are generated, using specification data of the device from bench testing. During production testing, the dynamic specifications of the device are estimated on a low cost ATE using an alternate test set-up and the pre-developed mapping functions. As opposed to the conventional method of dynamic specification testing of A/D converters, the proposed approach does not require a spectrally pure sinusoidal input signal and estimates device SNR in presence of sampling clock jitter. Simulation results indicate specification estimation error of less than 4% using the proposed test methodology.
The performance of Differential Evolution (DE) algorithm is significantly affected by its parameter setting. But the choice of parameters is heavily dependent on the problem characteristics. Therefore, recently a couple of adaptation schemes that automatically adjust DE parameters have been proposed. The current work presents another adaptation scheme for DE parameters namely amplification factor and crossover rate. We systematically analyze the effectiveness of the proposed adaptation scheme for DE parameters using a standard benchmark suite consisting of ten functions. The undertaken empirical study shows that the proposed adaptive DE (aDE) algorithm exhibits an overall better performance compared to other prominent adaptive DE algorithms as well as canonical DE.