Three-dimensional imaging of direct-written photonic structures
Third-harmonic generation microscopy has been used to analyze the morphology of photonic structures created using the femtosecond laser direct-write technique. Three-dimensional waveguide arrays and waveguide-Bragg gratings written in fused-silica and doped phosphate glass were investigated. A sensorless adaptive-optical system was used to correct the optical aberrations occurring in the sample and microscope system, which had a lateral resolution of less than 500 nm. This nondestructive testing method creates volume reconstructions of photonic devices and reveals details invisible to other linear microscopy and index profilometry techniques.
Solution phase driven deposition methods such as casting or micro-molding are not much explored in amorphous chalcogenide glasses for Infrared (IR) optical component fabrication, which could be a simple and low cost alternative unlike conventional thin film deposition techniques such as vapor phase deposition methods. To use such deposition technique optimization of solution preparation conditions in order to retain the optical properties of the solute is the key factor. In this present study, we report on the dissolution kinematics of (As2S3)100-xGex (x=0, 20, 40) glasses in ethylenediamine solvent. Dynamic Light Scattering (DLS) result indicates particle size of the solution is <30nm, which is an essential requirement for the fabrication of low surface roughness films in these materials. Optical properties of the solution are discussed.