1. An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented, the X-ray analysis apparatus having: a measurement system configured to implement a plurality of measurement methods; measurement software for implementing, in a selective manner, each of the measurement methods; memory means for storing information relating to a material to be measured, and at least one evaluation type identifier identifying of an evaluation suitable to be performed on the material; input means for inputting the information relating to the material; evaluation type computation means for performing a computation for selecting the at least one evaluation type identifier identifying an evaluation suitable to be performed on the material, wherein the computation is performed on the basis of the information relating to the material inputted using the input means; and measurement method selection means for selecting a corresponding measurement method on the basis of the selected at least one evaluation type identifier.