1. A method for automatically processing manufacturing hotspot information, the method comprising: receiving a pattern clip associated with a manufacturing hotspot in a layout, wherein the pattern clip comprises a set of polygons in proximity to the manufacturing hotspot's location; determining if the pattern clip matches a known manufacturing hotspot configuration; if the pattern clip does not match a known manufacturing hotspot configuration, performing a perturbation process on the pattern clip to: determine a set of correction recommendations to eliminate the manufacturing hotspot; and determine ranges of perturbation to the set of polygons wherein the perturbed pattern clip does not eliminate the manufacturing hotspot; and storing the set of correction recommendations and the ranges of perturbation into a manufacturing hotspot database.