1. A method of qualifying and sorting semiconductor devices, comprising: grouping a plurality of semiconductor devices into a test lot; selecting a plurality of device grades and a downgrade path for each selected device grade; selecting a test sequence including a plurality of tests, each test corresponding to at least one device grade of the plurality of device grades; defining an initial selected device grade of the plurality of device grades for the test lot; sorting each semiconductor device in the test lot to a final device grade of the plurality of device grades, said sorting comprising: executing substantially each test in the test sequence on each semiconductor device; and after each test executed, sequentially sorting each semiconductor device through the plurality of selected device grades along a selected downgrade path; and separating the plurality of semiconductor devices from the test lot according to the final device grade of each semiconductor device.