1. A temperature regulation system for a device under test (DUT), said temperature regulation system comprising: a pretrigger generator for generating a signal in advance of an occurrence of an expected condition of said DUT due to test execution thereon, wherein said expected condition causes thermal variations of said DUT; a profile selector, comprising a plurality of selectable control profiles, a subset of which are based on previously measured values and said profile selector triggered by said pretrigger generator, for providing a selected control profile that a-priori models said thermal variations of said DUT caused by said expected condition; a circuit responsive to said selected control profile for determining thermal countermeasures to alleviate said thermal variations; and an automatic thermal control system coupled to said circuit for applying said thermal countermeasures to said DUT in advance of said occurrence of said expected condition.