1 / A method of picking out an integrated circuit element, the method being characterized in that it comprises the steps consisting in: a) from a model of the circuit, determining a set of vectors each corresponding to an instant in the theoretical operation of the circuit while a predetermined test sequence is being applied, the coefficients of each vector being representative of the state of a given set of circuit elements including the element that is to be picked out; b) comparing vectors to define a composite of logic operators applied to said vectors, the composite enabling the coefficient corresponding to said element that is to be picked out; c) taking images of the circuit in operation at instants corresponding to the vectors to which said composite of logic operators is applied; and d) graphically combining the taken images by applying a composite of graphics operators corresponding to said composite of logic operators.