1. A method of measuring a constraint parameter of a component in an integrated circuit represented in digital form, said method comprising: measuring a first delay between two nodes forming a portion of a path from an input terminal to an output terminal of said component; determining an approximate value of said constraint parameter based on said first delay; formulating an optimal range around said approximate value for said constraint parameter; applying an input signal to said component based on a possible value for said constraint parameter, wherein said possible value is contained in said optimal range; and examining an output signal generated by said component to determine whether said component would be operational with said possible value for said constraint parameter.