1. A computer implemented method of analyzing leakage power in an electronic design, comprising: using at least one processor that is programmed for performing a process comprising: identifying an electronic design that comprises a plurality of devices to analyze; and analyzing the leakage power for the electronic design by at least performing an action of identifying or determining process variations for the electronic design, in which the process variations relate to manufacturing of the electronic design and comprise a first set of random process variation components, wherein the leakage power is analyzed with respect to state correlation for at least some of the plurality of devices within the electronic design, and the state correlation is used to characterize one or more differences between a plurality of states that affect the leakage power.