1. A method for generating a test plan, wherein the method is performed by a processor, the method comprising: obtaining a first test plan comprising a plurality of test requirements in respect to functional attributes of at least one test; determining a coverage model based on the first test plan; determining at least one uncovered characteristic based on the coverage model; based on the at least one uncovered characteristic, determining at least one restriction in respect to the coverage model; determining a second test plan in accordance with the coverage model and based on the at least one restriction, wherein the second test plan is determined without executing tests in accordance with the first test plan, and whereby the first test plan is transformed to the second test plan.