1. A method for optimizing operational throughput for a semiconductor device handler, the method comprising: receiving semiconductor devices for testing at a binned semiconductor device handler input carrier buffer; operating the semiconductor device handler in the testing of semiconductor devices for a predetermined period of time; recording, in an electronic memory, operational throughput characteristics for each operational stage of the semiconductor device handler; analyzing, by a computer, recorded operational throughput characteristics for each operational stage of the semiconductor device handler; determining, by the computer, which operational stage of the semiconductor device handler has the most limiting constraint causing a lowest operational drumbeat; adjusting operational parameters of the operational stage of the semiconductor device handler that has the lowest operational drumbeat to increase the operational drumbeat; and repeating the method until an operational state is achieved such that further adjustments to operational parameters result in a decrease in the operational throughput for the semiconductor device handler.