1. A software program for analyzing transistors in a material, the software program comprising: a first module for producing a plurality of graphs based on a collection of parameters and associated parameter values, the parameters representing characteristics of the transistors, each graph having a plurality of data points, the plurality of graphs further comprising a first graph having an adjustable variable and a second graph having an input variable; a second module for producing a linked graphs document, wherein the second module links the second graph to the first graph; wherein a user inspecting the linked graphs document modifies the adjustable variable of the first graph and the software program automatically modifies the input variable of the second graph.