1. A method for thermal inspection of a sample of material, said method comprising the steps of: pointing an infrared detector having a lens at a surface of said sample to acquire background data; covering said lens with a first shutter; firing a lamp having a reflector pointed at said sample to heat said sample above an ambient temperature; covering said lamp with a second shutter; and opening said first shutter from said lens to enable said detector to acquire temperature measurements of said sample over time as said sample cools down.