1. An SS-OCT interferometer apparatus for measuring a sample or an eye, the apparatus comprising: a measurement radiation source emitting measurement radiation that is adapted to interferometrically generate a measurement signal and to generate a depth-resolved contrast signal of the sample from the measurement signal by spectral tuning of a central wavelength of the measurement radiation; a control device; a sample-motion detector that provides a motion signal to the control device, the motion signal indicating movement of the sample or movement within the sample in the form of sample correction radiation; wherein before or during the generation of the depth-resolved contrast signal, the control device corrects the measurement signal with relation to measurement errors that are caused by movements of the sample or movements within the sample that occurred during the tuning of the central wavelength by utilizing the motion signal wherein the apparatus further comprises: a sample beam path, through which a part of the measurement radiation emitted from the measurement radiation source illuminates the sample; a detection beam path, which receives sample measurement radiation that is formed by the measurement radiation reflected or scattered back from the sample; and a detector device that detects the sample measurement radiation and provides a measurement signal; and wherein the sample-motion detector comprises a correction radiation source which emits correction radiation, and at least a part of the correction radiation is coupled into the sample beam path and illuminates the sample, and the detection beam path receives the sample correction radiation that is formed by the correction radiation reflected or scattered back from the sample in the form of the sample correction radiation and further comprising a correction radiation detector device adapted to detect the sample correction radiation separately from the sample measurement radiation, and the control device is adapted to generate a correction signal from the detection of the sample correction radiation by being adapted to remove a phase function of the correction signal from a phase function of the measurement signal.