1. A method for detecting scintillator hysteresis artifacts in an image from an x-ray detector, said method including: examining an image from an x-ray detector to measure a first signal level for a first area of interest and a second signal level for a second area of interest, wherein said first area of interest includes a first image area and said second area includes a second image area; using a data acquisition system to determine a difference in said first signal level and said second signal level; and using the data acquisition system to compare said difference to a threshold to detect a shape artifact from a prior image due to scintillator hysteresis, wherein said shape artifact results from an area of trapped electrical charge in a scintillator.