1. A system for inspecting a surface, comprising: a. an electromagnetic radiation incident on said surface to generate scattered radiation, having a plurality of scattering angles, from features of said surface; b. two or more imaging modules positioned to collect said scattered radiation from said surface, with each imaging module forming an image of a plurality of points on said surface by collecting a portion of said scattered radiation propagating in a subset of said scattering angles; c. two or more image sensors positioned to detect images of surface formed by said imaging modules; and d. a processor configured to combine information from two or more said images of surface to generate a global information set, having information from a plurality of said scattering angles collected by two or more said imaging modules, e. whereby said features of said surface are detected in said images of surface and in said global information set.