1. A computer-implemented method, comprising: with a computer, processing a transmission electron micrograph image of a specimen to determine a complex spectrum of the image so as to obtain at least partial geometrical and structure factor fingerprint information associated with the specimen; comparing partial specimen geometrical and structure factor fingerprint phase information with corresponding geometrical and structure factor fingerprint phase information associated with at least one candidate structure; selecting at least one candidate structure from a set of one or more predetermined reference structures based on a comparison of specimen lattice-fringe fingerprint phase information with lattice-fringe fingerprint phase information associated with related structural information associated with the one or more predetermined reference structures; and based on the comparison, communicating an assessment as to whether a specimen structure corresponds to the at least one selected candidate structure.