1. A method of generating a simulated voltage contrast image comprising steps for: (a) receiving as input design information for an integrated circuit die; (b) selecting a net of the integrated circuit from the design information; (c) generating a trace outline of the selected net from the image; (d) analyzing the design information to calculate an interaction between a charged particle beam and the selected net; (e) selecting a shading representative of the calculated interaction; and (f) filling the trace outline of the selected net with the shading to generate the simulated voltage contrast image.