1. A method for reducing artifacts produced by x-ray radiation directly striking a measuring pixel of a CMOS detector after crossing a scintillator, comprising: extracting artifact image points from an x-ray image profile recorded using the CMOS detector by performing an iterative process including one or more executions of the following steps: applying a local, edge-obtaining smoothing operator that evaluates image data of neighboring image points located in the vicinity of a considered image point to generate a smoothed image profile, calculating a differential image by subtracting the smoothed image profile from the x-ray image profile to which the smoothing operator was applied, comparing the calculated differential image to a threshold value, identifying artifact image points based on the results of the comparison of the calculated differential image to the threshold value, and for each identified artifact image point, adjusting but not deleting the image data associated with that artifact image point based on the threshold value to generate a correction image, wherein the adjustment of the image data comprises reducing a magnitude of a peak associated with the artifact image point to a reduced magnitude that corresponds with the threshold value used for identifying the artifact image point; and using the correction image including the adjusted but not deleted image data associated with the identified artifact image points to correct the x-ray image profile.