1. A diagnosis system for diagnosing a failure in an electronic device, comprising: a computing device having a combination of hardware and software comprising: a defect table that associates previously studied features with known failures; and a fault isolation system that cross-references an inputted set of suspected faulty device features with the previously studied features listed in the defect table to generate a set of possible failures, and then compares the set of possible failures with a fault signature of an existing failure in order to identify causes of the existing failure, wherein the inputted set of suspected faulty device features is generated from a simulation program that programmatically simulates operation of the electronic device in a virtual environment.