1. A bump inspection apparatus for IC components, comprising: a housing-member holding device for holding a component housing member which houses a plurality of the IC components each having a plurality of bumps formed thereon, in a state of being arranged in array with respective bump-formation surfaces facing up; an image-pickup device for picking up images of the respective IC components which are housed in the component housing member held by the housing-member holding device; and a control device for controlling an image-pickup operation by the image-pickup device, a holding operation by the housing-member holding device, and inspection processing of the respective bumps by using the picked up images, wherein the image-pickup device comprises: an image-pickup camera unit for separately picking up an overall image of the IC component on the bump-formation surface along an optical axis disposed in a direction almost orthogonal to directions approximately along the bump-formation surface; and an image-pickup optical-axis positioning unit for aligning the optical axis of the image-pickup camera unit and an almost center position on the bump-formation surface of the IC component which is an image-pickup target, the control device comprises: a component position recognition portion for recognizing a position of the IC component aligned by the image pickup optical axis alignment portion on a basis of the overall image picked up by the image-pickup camera unit; a bump inspection region setting portion for setting inspection regions of the respective bumps, whose arrangement is preset on a basis of formation positions of the respective bumps on the IC component, by positioning the inspection regions on the overall image on a basis of a recognition result by the component position recognition portion, and thereby acquiring bump inspection images of the respective bumps from the overall image; and an inspection processing portion for performing inspection processing for the formation positions of the respective bumps on a basis of the respective bump inspection images and performing inspection processing for degrees of crush of vertex portions of the respective bumps.