1. A semiconductor inspection equipment comprising: a movable stage for holding a semiconductor sample; a sample image acquisition unit for irradiating the semiconductor sample held on the stage with a charged particle beam and obtaining a sample image through a sample signal discharged from the sample due to irradiation of the charged particle beam; a memory unit for storing CAD data concerning the semiconductor sample; and a display unit capable of displaying the CAD data such that it is superimposed on the sample image obtained by the sample image acquisition unit, wherein the equipment has a grid creation means of generating a grid composed of vertical and horizontal lines having a constant distance and displaying the grid superimposed on the sample image displayed on the display unit, and a means of generating systematic numbers indicating vertical and horizontal positions of a plurality of rectangular areas contained in the grid created by the grid creation means and displaying the numbers in relevant areas in the grid displayed on the display unit.