1. A method for defect detection, the method comprising: retrieving a second pixel of a second image of an object that corresponds to a tested pixel of a first image of the object; wherein the first and second images were obtained using different acquisition methods; searching a third pixel of the second image such that a neighborhood of the second pixel is similar to a neighborhood of the third pixel; retrieving a fourth pixel of the first image that corresponds to the third pixel; comparing between the tested pixel and the fourth pixel; and identifying defects in the object based on the comparison.