1. A method comprising: supplying current to at least one photovoltaic device via a current source; detecting emitted photon radiations from the at least one photovoltaic device via a radiation detector, outputting a signal corresponding to the detected emitted photon radiations from the radiation detector to a processor device; processing the signal corresponding to the detected emitted photon radiations via the processor device to generate one or more two-dimensional photon images; and analyzing the one or more two-dimensional photon images to determine at least one defect in the at least one photovoltaic device.