1. A computer-implemented method of determining a position of a substrate, the method comprising: receiving, by a processor, image data of a substrate, wherein the image data is generated by imaging the substrate; generating, by the processor, projection data based on the image data; evaluating, by the processor, the projection data for a known landmark pattern of the substrate, wherein the known landmark pattern is stored in a memory; determining, by the processor, positions of the known landmark pattern of the substrate in the image data based on the evaluating; determining a pedestal based on the projection data, wherein the pedestal baseline is determined by fitting a curve to local minimum values of the projection data; and processing image data to remove the pedestal, wherein the pedestal is removed by subtracting the pedestal baseline to remove the pedestal from the projection curve.