1. A method for evaluating whether an image of an item may be suitable for computing accurate dimension measurements, the method comprising the steps of: capturing a first image of the item at a first time, the first image comprising a view of two or more surfaces of the item and of one or more surface features; computing a first measurement of at least one dimension of at least one of the surface features based on the first captured image; capturing a second image of the item at a second time, which is subsequent to the first time, the second image comprising a view of at least one of the two or more surfaces and of at least one of the one or more surface features; computing a second measurement of the at least one dimension of the at least one of the surface features based on the second captured image; comparing the computed second measurement to the computed first measurement; evaluating whether the computed first measurement and/or the computed second measurement may be suitable for computing accurate dimension measurements; capturing at least a third image of the item at a corresponding time, which occurs between the first time and the second time, the at least a third image comprising a view of the at least one of the two or more surfaces; computing at least a third measurement of at least one dimension of at least one of the two or more surfaces based on the captured at least a third image; comparing the at least a third measurement computed in relation to the captured at least a third image to the computed first measurement and/or to the computed second measurement; approving the at least a third measurement, computed in relation to the captured at least a third image, based on the comparison to the computed first measurement and/or the computed second measurement; and computing a mean value based on the computed first measurement, and/or the computed second measurement, and the approved at least a third measurement.