1. A system to generate a test database, the system comprising: an external database interface to access an external database, the external database including a plurality of categories of time-value data collected from an electrical device; an importer for converting one of a plurality of categories of time-value data to a corresponding topic of a common data format; a device profiler coupled to the importer to create a device profile including the converted topic; and a database profiler to create a database profile representing a system including a device defined by the device profile and including the category of time-value data.