1. A method of misalignment correction in a structured light device, the method comprising: extracting features from a first captured image of a scene, wherein the first captured image is captured by an imaging sensor component of the structured light device, and wherein the first captured image comprises a pattern projected into the scene by a projector component of the structured light device; matching the features of the first captured image to predetermined features of a pattern image corresponding to the projected pattern to generate a dataset of matching features; determining values of alignment correction parameters of an image alignment transformation model using the dataset of matching features; and applying the image alignment transformation model to a second captured image using the determined alignment correction parameter values.