1. A method for localization and resolvability of an integrated circuit comprising: selecting one or more electrical stimuli to be applied to a device under test such that the electrical stimuli are chosen to provide a baseline image and a distinguishing image effect as a result of the chosen stimuli when applied to the device under test; applying the one or more electrical stimuli to the device under test; measuring emissions from the device under test to provide a measurement data set from the one or more electrical stimuli using one or more measurement tools for collecting the baseline image and the distinguishing image effect; and analyzing the measurement data set to localize and evaluate circuit structures by comparing the baseline image and the distinguishing image effect.