1. A method for evaluating a parameter of a real feature having nano-metric dimensions, the method comprising: obtaining, by an image obtaining module of an electronic microscope, an image of a measurement site that includes the real feature; processing, by an image processor, the image of the measurement site to provide an artificial image of a continuous undivided artificial feature, the artificial feature representing an unknown dimension and from the real feature in shape; measuring a parameter of the artificial feature to provide a measurement result by applying a measurement algorithm that is inadequate for directly measuring the parameter of the real feature; and determining a value of the parameter of the real feature in response to the measurement result.