1. A method for use in a high resolution electron microscope for reconstructing an electron wave image of an object, comprising: (i) forming an electron hologram of said object at an exit plane thereof and which is recorded in a Fourier spatial frequency space, said hologram having a central frequency domain and two sidebands, the sidebands comprising high resolution linear information relating to said electron wave image and the central frequency domain comprising high resolution non-linear information relating to said electron wave image; (ii) performing a reconstruction of said electron wave image from the linear information present in said sidebands; and (iii) supplementing the reconstruction performed in step (ii) with a reconstruction of said electron wave image from the non-linear information present in said central frequency domain.