1. An X-ray microscopic inspection apparatus having X-ray generating means for generating X-rays by allowing an electron beam from an electron source to impinge on a target for X-ray generation, for inspecting an object to be inspected by utilizing said X-ray, the apparatus comprising a magnetic superposition lens having a magnetic field generating portion disposed in the vicinity of an electron generating portion of an electron gun; reflected electron detecting means having a detecting portion disposed above said target for X-ray generation, for detecting a reflected electron from said target; and electron image generating means for performing imaging of a target surface utilizing the signals from said reflected electron detecting means, wherein the apparatus is arranged so that alignment including focus adjustment to said target for X-ray generation and astigmatism correction may be performed based on image information of said electron image.