1. A method of identifying defects, comprising: producing, with an imaging system, an original image of a fabricated article having a feature thereon, the feature having an intended height; extracting a contour image from the original image, the contour image having an outline of those portions of the feature having a height approximate to the intended height; producing a simulated image of the article based upon the contour image; and creating a defect image based on the differences between the simulated image and the original image, the defect image including any portions of the feature having a height less than the intended height.