1. A method of recognizing a pattern in a test object, said method comprising the steps of: specifying properties characteristic of said pattern; specifying discrete ranges of values of said properties; measuring the values of said properties in said test object; arranging the measured values in at least one test histogram; determining a reference set of values of said properties and arranging said set as at least a first reference histogram; and comparing said test and reference histograms by determination of the value of a function which provides a measure of the amount of information necessary to express said at least one test histogram in terms of the optimum code for describing at least said first reference histogram.