1. A flexible computer-implemented method for classifying defects, comprising: applying a sequence of rules for defects to inspection data generated by inspection of a semiconductor specimen, wherein the sequence of rules comprises statistical rules, deterministic rules, hybrid statistical and deterministic rules, or some combination thereof, wherein a portion of the sequence of rules is applied as the defects are found during the inspection, and wherein another portion of the sequence of rules is applied at the end of the inspection; classifying the defects based on results of said applying, wherein results of said classifying comprise multiple output classifications for the defects; and illustrating the results of said classifying in an interactive user interface.