1. A scanning probe microscopy system comprising: at least two scanning probes, each probe supported by cantilever to an atomic force microscope (AFM) having a special reference frame; means for generating a motion control signal for a first one of the AFMs; means for determining an offset motion control signal for a second one of the AFMs said offset motion control signal responsive to the first motion control signal and the special reference frames of the first one of the AFMs and the second one of the AFMs for non-interfering scanning of a probe supported by the second one of the AFMS to a probe supported by the first one of the AFMs; control means in the first one of the AFMs adapted to receive the motion control signal; and, control means in the second one of the AFMs adapted to receive the offset motion control signal.