1. A method for performing materials analysis of an object using an X-ray system, said method comprising: generating an X-ray beam using an X-ray source having an anode; acquiring a scatter spectrum from Compton scatter produced when the X-ray beam interacts with the object, the scatter spectrum acquired using an energy resolving detector; extracting a Compton profile from the scatter spectrum by processing the scatter spectrum using a control system of the X-ray system, the Compton profile including peaks at characteristic lines of the anode; identifying a characteristic of a material of the object using the Compton profile; and outputting an indication of the characteristic of the material.