1. A method for controlling a plasma system based on an event, comprising: accessing a computer-generated model of one or more parts of the plasma system, the one or more parts include a plurality of circuit components that are connected with each other via a plurality of connections, wherein the one or more parts include a radio frequency (RF) cable that is coupled to an input of an impedance matching circuit and to an output of an RF generator, the plasma system including a plasma chamber, the RF generator, the RF cable, the impedance matching circuit, and a transmission line between the plasma chamber and the impedance matching circuit, wherein the computer-generated model has a plurality of elements that are connected logically with each other via a plurality of connections, wherein the plurality of connections between the elements are generated based on the connections between the plurality of circuit components, wherein the computer-generated model includes a model of the RF cable, wherein at least one of the one or more elements are located within the model of the RF cable; receiving data regarding a supply of RF power to the plasma chamber, wherein the data is received from a sensor within the RF generator, the RF power supplied via the impedance matching circuit and the transmission line to the plasma chamber using a configuration that includes one or more states, the one or more states repeat continuously during the supply of RF power to the plasma chamber; propagating the data via the computer-generated model to produce model data at an output of the computer-generated model during the supply of RF power to the plasma chamber, the model data being associated with one of the one or more states; examining the model data during the one of the one or more states, the examining being of one or more variables that characterize performance of a plasma process of the plasma system; identifying a potential fault for the one or more variables during the one of the one or more states; determining that the potential fault has occurred for a pre-determined period of time during the one of the one or more states, such that the potential fault is identified as an event; classifying the event to generate a classification; and controlling the one or more parts of the plasma system based on the classification of the event.