1. A method for performing dynamic fault detection of a device, the method comprising: storing in a database a plurality of measured indicators representative of at least one dynamic condition of the device; binarizing by a processor the plurality of measured indicators; and performing several iterations for analyzing iteratively the plurality of binarized measured indicators using a machine learning data tool for extracting at least one pattern from the binarized measured indicators by adding at least one different constraint to each iteration, the pattern being indicative of whether the device has a fault or not.