1. A profiling apparatus configured to generate a surface topology map of a surface, comprising: a computing system associated with the profiling device, the computing system comprising: a first input configured to receive profile information, the computing system configured to generate a plurality of profile sample points from the received profile information as the profiling device roves across the surface to be mapped; a second input configured to receive information related to a plurality of survey sample points of the surface; and a processor configured to: correlate the profile sample points with the survey sample points in the Z direction; merge the plurality of survey sample points and the correlated profile sample points; and generate the surface topology map of the surface from the merged plurality of survey sample points and the correlated profile sample points.