1. A method for inspecting a specimen, the method performed using a processing device and comprising: performing a transmitted energy inspection of at least one specimen; performing a reflected energy inspection of the at least one specimen; computing a map representing results from the transmitted energy inspection and the reflected energy inspection of the at least one specimen; and assessing differences between the map and known data, said known data comprising a training set representing previously scanned reference specimen attributes within at least one expected defect region.