1. A method for locating a defect in a defect review process, comprising: acquiring one or more images and data from an inspection tool, wherein the one or more images illustrate an area on a specimen in which a defect to be reviewed is located, and wherein the data indicates a position and features of the defect within the area; acquiring one or more additional images of the specimen proximate the position of the defect indicated in the data using an imaging subsystem of a defect review tool; identifying a portion of the one or more additional images that corresponds to the one or more images; and determining a position of the defect within the portion of the one or more additional images using the data.