1. Method for processing data derived from a semiconductor detector of electromagnetic or ionizing radiation, said detector having at least two polarization electrodes producing electric signals under the effect of an interaction of said radiation in said detector, each interaction able to be characterized by at least one parameter on the basis of measurements of the electric signals so as to determine a histogram of events, comprising the determination of a set of acceptance probabilities and the histogram of events being corrected according to the acceptance probabilities, characterized in that the set of acceptance probabilities is obtained by double calibration in which the detector is irradiated with radiations differing with respect to an acceptance criterion of events.