1. A measurement device comprising: a coordinate measuring machine (CMM); and an inspection probe comprising an ultrasound (UT) probe and an eddy current (EC) probe, wherein said inspection probe is integrated with said CMM, such that said CMM is configured to measure one or more external boundaries of a component while substantially simultaneously performing one or more UT and/or EC measurements on the component using respective ones of the UT and/or EC probes, wherein said measurement device is configured to determine a location and/or an orientation of the inspection probe using the CMM.