1. A defect inspecting method, comprising: a defect inspecting step of detecting a plurality of defects of a sample, and selecting desired defects from among said defects, and selecting, from among said defects, indicator defects that are easily detectable from among said plurality of defects in accordance with luminances detected by an observing apparatus, and a defect observing step of detecting said indicator defects by said observing apparatus in accordance with said luminances of said indicator defects, and detecting said desired defects in accordance with coordinates of said indicator defects.