1. A high level testbench method for operating upon analog integrated circuit designs, the method comprising: creating one or more unit testbenches for one or more analog integrated circuit designs, wherein each unit testbench is represented as a test object that contains test object properties for test object operations including test object simulation; each test object being defined and/or instantiated in a user application program; in the user application program, making changes in the test object properties by passing values to the test object properties, separate from the definition of the test objects, wherein the definitions/instantiations, the step of passing values to the test object properties, and initiation of test object operations are prescribed in the user application program, and wherein the user application program is executed on a platform according to the user application program.