1. An information processing apparatus comprising: an accepting unit that accepts pattern information, which is information indicating a pattern figure that is a figure that is to be drawn by an electron beam writer, and actually observed contour information, which is information acquired using an image obtained by capturing an image of a figure drawn according to the pattern figure by the electron beam writer, and indicating an actually observed contour that is a contour of the figure; a transforming information acquiring unit that acquires, using the pattern information and the actually observed contour information, transforming information, which is information for correcting three or more actually observed contour points that are points on the actually observed contour respectively into three or more corrected contour points that are points obtained by correcting the three or more actually observed points, and is information that minimizes the sum of squares of differences between convolution values corresponding to the three or more corrected contour points of a given point spread function in a region indicated by the pattern figure and a threshold regarding the convolution values; a corrected contour point acquiring unit that acquires the three or more corrected contour points respectively corresponding to the three or more actually observed contour points, using the actually observed contour information and the transforming information, and acquires corrected contour point information, which is information indicating the acquired three or more corrected contour points; and an output unit that outputs the corrected contour point information.