1. A method for identifying a repair cut location for a defect in a liquid crystal device comprising: (a) receiving an input image of a portion of said liquid crystal device; (b) receiving a defect mask image; (c) receiving a landmark structure image; (d) determining said repair cut location, based upon said input image, said defect mask image, and said landmark structure image, for said liquid crystal device proximate said defect based upon; (1) a type of said defect, (2) a cause of said defect, (3) a position of said defect, and (4) a spatial relationship of said defect and a structure of said landmark image.