1. A method of determining the location of an interaction of radiation with a photon detector, comprising the steps of: collecting a signal in an affected pixel of the photon detector, the signal being dependent on the level of radiation to which the affected pixel is subjected, selecting the affected pixel of the photon detector for comparison if the collected signal is greater than a threshold, aggregating a comparison group of pixels for the affected pixel, allocating a signal value representative of collected signals of the affected pixel comparison group using a processing circuit associated with the photon detector, selecting at least one adjacent pixel of the affected pixel, and, for the at least one adjacent pixel: aggregating a comparison group of pixels associated with each of said at least one adjacent pixel, said at least one adjacent pixel comparison group comprising a plurality of pixels, and, there being no pixel in common among said affected pixel comparison group and said at least one adjacent pixel comparison group, and allocating a signal value representative of collected signals of the plurality of pixels for the at least one adjacent pixel comparison group using the processing circuit associated with the photon detector, comparing the allocated signal values of the affected pixel comparison group and the at least one adjacent pixel comparison group, so as to determine the comparison group that has the highest allocated signal value, and identifying the affected pixel as the most probable position of the interaction of the radiation with the photon detector if the affected pixel comparison group exhibits an allocated signal value greater than the allocated signal value for the at least one adjacent pixel comparison group to determine the special resolution of the interaction of the radiation with the photon detector.