1. A method for height measurement of an object using structured illumination sectioning microscopy, comprising: moving the object along an optical axis of a microscope configured for structured illumination sectioning microscopy for a long distance; obtaining a plurality of optically sectioned images as the object is moved along the optical axis of the microscope; recording the positions of the object along the optical axis as each lateral position in the images of the object arrives at a maximum intensity, wherein the maximum intensity corresponds to a position at which a surface of the object overlaps with a focal plane of an objective lens of the microscope along the optical axis; and obtaining relative heights of the surface of the object in the plane of the surface of the object.