1. A method for defect detection, the method comprising: retrieving a second pixel of a second image of an object that corresponds to a tested pixel of a first image of the object; wherein the first and second images were obtained using different acquisition methods; searching a golden matching pixel of a second golden image such that a neighborhood of the golden matching pixel is similar to a neighborhood of the second pixel; retrieving a corresponding golden pixel of a first golden image that corresponds to the golden matching pixel; comparing between the tested pixel and the corresponding golden pixel; and identifying defects in the object based on the comparison, wherein each respective golden matching pixel and golden pixel of a golden image is a pixel of an image representing a defect-free object.