1. A method for analyzing a functional deviation of one or more products, the method including: manufacturing a first product and a second product by using similar manufacturing steps; collecting first measurements associated with the first manufactured product; collecting second measurements associated with the second manufactured product; detecting a deviation in functionality in the first manufactured product, the second manufactured product or both the first and second manufactured products, based on the first collected measurements and the second collected measurements; determining a cause of the detected deviation; identifying at least one manufacturing tool associated with the determined cause of the detected deviation; and wherein a processor coupled to a memory device performs the collecting the first measurements, the collecting the second measurements, the detecting, the determining, and the identifying.