1. A tool for performing fault detection of a device, the tool comprising: a database for storing a plurality of measured indicators representative of at least one dynamic condition of the device; a binarization module for binarizing the measured indicators; a machine learning data mining module for analyzing the binarized measured indicators and extracting patterns indicative of whether the device has a fault or not, and a processor for computing a discriminate function using the extracted patterns to detect at least one fault of the device.