1. An apparatus of segmenting sensor data output from a semiconductor manufacturing facility, comprising: a sensor operative to collect sensor data corresponding to at least one process of the semiconductor manufacturing facility; a first segmentation unit operative to extract at least one variation point of the sensor data to perform an abnormal difference (AD) segmentation on the sensor data based on the at least one variation point, and to generate first segments; a continuity evaluation unit operative to evaluate a continuity ratio of the sensor data; a second segmentation unit operative to perform a free-knot spline (FS) segmentation on the sensor data when the continuity ratio exceeds a reference ratio and to generate second segments; and a segmentation determination unit operative to compare a result of performing the AD segmentation with a result of performing the FS segmentation and to select either the first segments or the second segments based on the comparison result.