1. A system comprising: a memory; and a processor device operatively coupled to the memory to: obtain an inspected noise-indicative value representative of an analyzed pixel of an inspected image of an inspected object, and a reference noise-indicative value representative for each of a plurality of reference pixels of the inspected image; compute a representative noise-indicative value based on the inspected noise-indicative value and a plurality of reference noise-indicative values; calculate a defect-indicative value based on an inspected value representative of the analyzed pixel; and determine a presence of a defect in the analyzed pixel based on the representative noise-indicative value and the defect-indicative value.