1. An inspection system with radiation-induced false count mitigation, comprising: an illumination source configured to illuminate a sample; a detector assembly comprising: an illumination sensor configured to detect illumination from the sample, and one or more radiation sensors configured to detect particle radiation; and one or more controllers communicatively coupled to the illumination sensor and the one or more radiation sensors, wherein the one or more controllers are configured to: identify a set of illumination detection events based on an illumination signal received from the illumination sensor, identify a set of radiation detection events based on one or more radiation signals received from the one or more radiation sensors, compare the set of radiation detection events to the set of illumination detection events to identify a set of coincidence events, wherein the set of coincidence events corresponds to simultaneous occurrences of radiation detection events and illumination detection events, and exclude the set of coincidence events from the set of illumination detection events to generate a set of identified features on the sample.