1. A run-by-run controller for controlling output variability in a manufacturing process run comprising: a wavelet modulator module to generate a wavelet reconstructed signal (f t ) from the process output (y t ) for a run t; a process model module to generate a predicted model output (ŷ t ) for a run t, an error predictor module to predict a forecast offset (a t ) using the input E t =f t −ŷ t ; and a recipe generator module to generate a control recipe (u t+1 ) by applying the forecast error (a t ), wherein the control recipe is passed to a PID controller as a set-point for the next run and to the process model module to predict the next process output at run t+1.