1. A microscope for imaging an object, the microscope having a light source, at least one illumination beam path and at least one detection beam path, wherein the at least one illumination beam path is provided with a focusing arrangement for producing a two-dimensional object illumination pattern at the object, which extends in the direction of an illumination axis of the at least one illumination beam path and in a transverse direction substantially transverse to the illumination axis, a detection direction of the at least one detection beam path is substantially orthogonal to the two-dimensional object illumination pattern at the object, wherein the two-dimensional object illumination pattern is formed by Bessel beams.