1. A method for decomposing a target pattern containing features to be printed on a wafer, into multiple patterns, comprising the steps of: (a) defining a kernel representing a function having positive values within an inner radius and negative values in an outer radius; (b) defining said features utilizing a plurality of pixels; (c) disposing said kernel over a first pixel of said plurality of pixels; (d) determining the value of the kernel at location of each of said plurality of pixels, storing said value for each of said plurality of pixels so as to define a pixel value for each of said plurality of pixels; (e) adding a previously stored value associated with a given pixel of said plurality of pixels with said pixel value of the given pixel determined in step (d); (f) disposing said kernel over another pixel of said plurality of pixels, and repeating steps (d)-(f) until each of said plurality of pixels has been processed; and (g) determining placement of each of said plurality of pixels in a first pattern or a second pattern based on the pixel value of the given pixel.