1. A defect reviewing apparatus comprising: a scanning electron microscope; classifier means made by connecting at least one rule-based classifier to at least one example-based classifier, said rule-based classifier classifying arbitrary image of a defect based upon at least one preset rule, and said example-based classifier classifying an image of a defect based upon information of examples of images; connecting status correcting means for correcting a status of connection of said rule-based classifier and said example-based classifier based upon the classified result of the rule-based classifier and attribute information of examples of the images.