1. A method for 3-dimensional vision inspection of objects, including microelectronic components, having protrusions as features to be inspected, wherein said protrusions having surfaces that are non-planar and/or curvatures, said method comprising the steps of: (a) providing at least a pair of image capturing means with similar interior parameters arranged in a stereovision configuration; (b) calibrating each of said image capturing means to determine the interior and exterior parameters of said image capturing means; (c) forming a rectified coordinate system from the parameters of both image capturing means determined above with a relative pose of second image capturing means with respect to the first image capturing means; (d) capturing an image of an object to be inspected using each of said image-capturing means, wherein said object having a plurality of co-planar protrusions and said image captured is of at least one surface curvature of each of said protrusion; (e) rectifying coordinates of each image to produce a pair of rectified images in the said rectified coordinate system; (f) determining a conjugate point for the centre of each protrusion on each of the pair of images captured; and (g) measuring the distance of each protrusion from at least one of the image capturing means within the rectified coordinate system and the co-planarity of the protrusions.