1. A method for analyzing an object using a charged particle beam device having a first charged particle beam generator for generating a first charged particle beam having first charged particles, a first objective lens for focusing the first charged particle beam onto the object, a second charged particle beam generator for generating a second charged particle beam having second charged particles, a second objective lens for focusing the second charged particle beam onto the object, a first detection unit and a second detection unit, the method comprising: guiding the first charged particle beam over the object, removing material from the object using the first charged particle beam, exposing a first surface of the object when removing the material from the object, guiding the second charged particle beam over the first surface of the object, detecting first interaction particles using the first detection unit, the first interaction particles arising when the second charged particle beam impinges on the first surface, generating a first detection signal using the first detection unit and generating a first image of the first surface of the object using the first detection signal, the first image comprising first image pixels, each pixel of the first image pixels comprising first image data; guiding the first charged particle beam over the object, removing material comprising the first surface from the object using the first charged particle beam, exposing a second surface of the object when removing the material from the object, guiding the second charged particle beam over the second surface of the object, detecting second interaction particles using the first detection unit, the second interaction particles arising when the second charged particle beam impinges on the second surface, generating a second detection signal using the first detection unit and generating a second image of the second surface of the object using the second detection signal, the second image comprising second image pixels, each pixel of the second image pixels comprising second image data, wherein an opening is generated when removing the material from the object so as to expose the first surface and the second surface of the object, wherein the opening comprises a first side comprising the second surface and a second side extending from the second surface of the object in a direction away from the second surface; generating a first lamella comprising the first side of the opening having the second surface as an outer surface, and generating a second lamella comprising the second side of the opening; guiding the second charged particle beam over the second side of the object, detecting third interaction particles using the first detection unit, the third interaction particles arising when the second charged particle beam impinges on the second side of the object, generating a third detection signal using the first detection unit and generating a third image of the second side of the object using the third detection signal, the third image comprising third image pixels, each pixel of the third image pixels comprising third image data; analyzing the first lamella by identifying first material characteristics of the first lamella associated to each pixel of the second image pixels using at least one of: the first charged particle beam and the second charged particle beam, and detecting at least one of: fourth interaction particles and first interaction radiation using the second detection unit; analyzing the second lamella by identifying second material characteristics of the second lamella associated to each pixel of the third image pixels using at least one of: the first charged particle beam and the second charged particle beam and detecting at least one of: fifth interaction particles and second interaction radiation using the second detection unit; generating first filtered data for each pixel of the second image pixels using at least one first image filter for processing the second image data for each pixel of the second image pixels, and generating second filtered data for each pixel of the third image pixels using at least one second image filter for processing the third image data for each pixel of the third image pixels; identifying data identical or similar to the first image data for each pixel of the first image pixels of the first image from among the following: the second image data of each pixel of the second image pixels, the third image data of each pixel of the third image pixels, the first filtered data for each pixel of the second image pixels and the second filtered data for each pixel of the third image pixels; and assigning material characteristics to at least one pixel of the first image pixels of the first image, wherein the first material characteristics are assigned if at least one of: the identified second image data of a pixel of the second image pixels and the identified first filtered data for a pixel of the second image pixels is identical or similar to the first image data of the at least one pixel of the first image pixels and wherein the second material characteristics are assigned if at least one of: the identified third image data of a pixel of the third image pixels and the identified second filtered data for a pixel of the third image pixels is identical or similar to the first image data of the at least one pixel of the first image pixels.