1. A system for optically scanning and measuring an object in an environment, the system comprising: a scanner device that includes a projector, a first camera, and a second camera positioned in a predetermined geometrical arrangement; the projector projecting during operation a first pattern of light that is comprised of a first regular pattern of identical light points in a grid, the projector having a projector optical axis; the first camera records in operation, in a first time instance, a first image of the first pattern of light projected on the object, the first camera having a first camera optical axis; the second camera records in operation, in the first time instance, a second image of the first pattern of light projected onto the object, the second camera having a second camera optical axis; each of the illuminated light points corresponding to and lying on an epipolar lines in each of two of an image or a projector plane associated with the first camera, the second camera and the projector, the correspondence among epipolar lines and the illuminated light points on the image or projector planes being based on geometrical epipolar relations between the image or projector planes; and a processor operably coupled to the projector, the first camera and the second camera, the processor determines in operation a correspondence among each of the illuminated light points on the image or projector planes based at least in part by the epipolar relations, the processor further determining in operation three-dimensional coordinates of each of the illuminated light points on the object based at least in part on a density of the illuminated light points in the first pattern of light, the first image of the first pattern of light on the object, the second image of the first pattern of light on the object, and the geometrical arrangement of the projector, the first camera, and the second camera.