1. A system for evaluating multi-crystalline wafers comprising: an imaging apparatus; and a computing device coupled to the imaging apparatus, the computing device comprising a processor and a non-transitory computer readable medium coupled in communication with the processor and containing instructions that, when executed by the processor, cause the processor to: capture a plurality of images of a multi-crystalline wafer in the imaging apparatus, at least two of the plurality of images illuminated in the imaging apparatus in accordance with different lighting parameters; stack and project the plurality of images to generate a composite image; analyze the composite image to identify one or more grains of the multi-crystalline wafer; and generate a report based on the analysis of the composite image.