1. A method for optically controlling an atomic force microscope (AFM), the method comprising: acquiring an optical image of a sample using an optical imaging device; identifying a feature of interest on the sample using an automatic feature recognition technique on the optical image; acquiring a high resolution AFM image of the sample using an AFM imaging device, the AFM imaging device comprising a cantilever having a tip; overlaying the AFM image with the optical image at the feature of interest; and positioning the tip over the feature of interest using the optical image.