1. A method for selecting samples of reticle design data patterns the method comprising the steps of: applying local binary pattern (LBP) analysis to a plurality of design data samples to obtain a p-dimensional vector output for each of the plurality of samples; clustering the plurality of samples based on respective p-dimensional vector outputs of the plurality of samples into M number of groups; selecting one sample from each clustered group; calculating an evaluation score for the for each of the samples selected; and, selecting a portion of the M number of groups based on a representativeness score and a diversity score; wherein the portion of the M number of groups is selected in order to calibrate at least one parameter used to render a reference image used in a die-to-database reticle inspection method.