1. An X-ray analysis apparatus possessing: a radiation source irradiating a radiant ray to a sample, a radiant ray adjustment mechanism capable of adjusting an intensity of the radiant ray, an X-ray detector detecting a characteristic X-ray and a scattered X-ray, which are radiated from the sample, and outputting a signal including energy informations of the characteristic X-ray and the scattered X-ray, an analyzer analyzing the signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and adjusting a total intensity of the characteristic X-ray and the scattered X-ray, which are entered to the X-ray detector.