1. An inspection device comprising: a microscope configured to obtain a primary image by capturing an inspection target; a storage device storing a function defining a relationship between a low-resolution image and a high-resolution image of a calibration sample, the high-resolution image having smaller pixel resolution than the low-resolution image; and a processor configured to generate a secondary image based on the primary image by using the function, the secondary image having smaller pixel resolution than the primary image and configured to inspect the inspection target using the secondary image, wherein the inspection target is used as the calibration sample.