1. An electron microscope for picking up an observation image of a specimen based on an image observation condition, said electron microscope comprising: a first setting section for setting at least characteristics of the specimen as an image observation condition on a first image observation mode screen; a first display section for displaying an observation image of the specimen based on the condition set through said first setting section; a second display section for displaying at least one observation image of the specimen including at least one secondary electron image or at least one reflection electron image under at least two types of image observation conditions based on the condition set through said first setting section; and a selection section for selecting a desired observation image from among the observation images displayed on said second display section.