1. A method for estimating an optimal threshold, comprising: using a processor to determine a bit flip count for each bin in a plurality of bins, including by: (1) performing a first read on a group of solid state storage cells at a first threshold that corresponds to a lower bound for a given bin and (2) performing a second read on the group of solid state storage cells at a second threshold that corresponds to an upper bound for the given bin; determining a minimum using the bit flip counts corresponding to the plurality of bins; and to using the minimum to estimate an optimal threshold.