1. A test pattern generating apparatus adapted to generate test patterns of a circuit, said apparatus comprising: a circuit data read in section that reads in circuit data and divides the circuit data into a plurality of functional blocks; a correspondence setting up section that sorts the plurality of functional blocks into test pattern generating object blocks that are objects of the operation of generating a test pattern and test pattern copying object blocks other than the test pattern generating object blocks that are configurationally identical with the test pattern generating object blocks and sets up correspondence of the test pattern generating object blocks to the test pattern copying object blocks; a test pattern generating section that generates a test pattern of each of the test pattern generating object blocks; and a test pattern copying section that copies the test pattern of each of the test pattern generating object blocks whose correspondence to the test pattern copying object blocks are set up and uses it as test pattern of the test pattern copying object block.