1. An improved system for conducting a three-dimensional thermal characterization of a device, said system comprising: a thermoreflectance detection device for detecting light energy reflected from the surface of the device; an analyzer coupled to the thermoreflectance detection device for analyzing the thermoreflectance detection device output, the analyzer output representing the surface temperature distribution over a two-dimensional grid of the surface of the device; and a computer for predicting the three-dimensional thermal profile of the device based on the two-dimensional surface temperature distribution.