1. A striped pattern image examination support device comprising: a memory; and a processor coupled to said memory, wherein the processor is configured to calculate coordinates of first points at intersections of stripes and a line segment which connects two charting points in a first striped pattern image; and display a second striped pattern image and a figure on the second striped pattern image representing an intersecting second point at a position in the second striped pattern image, the position corresponding to the coordinates of one of the first points, the coordinates being calculated based on the first striped pattern image.