1. A method for inspecting a semiconductor device comprising the steps of: providing a semiconductor device having a characteristic to be inspected; providing an inspection station having a magnification lens, a monitor, and a camera coupled to the magnification lens and the monitor for transmitting magnified images created by the magnification lens to the monitor; creating a template which represents an acceptable range of values for the characteristic; storing the template in a computer readable memory; placing the semiconductor device under the magnification lens; displaying a magnified image of the semiconductor device on the monitor using the camera; retrieving the template from the computer readable memory; displaying an image of the template on the monitor, superimposed with the magnified image of the semiconductor device; and comparing the magnified image of the semiconductor device with the template to see if the characteristic of the semiconductor device falls within the acceptable range of values.