1. A system comprising: a processor; a memory coupled to said processor; and wherein the memory stores an image defect visibility predictor that, when executed by the processor, compares an original image with a defect image and outputs a predicted defect visibility image (PDVI) that accounts for defect masking by the original image, wherein the PDVI is based on a masking potential value that provides information about how content of the original image masks a defect in the defect image, wherein the image defect visibility predictor employs a look-up table (LUT) to select the PDVI based on a masking potential index image, a lightness index image, and a banding visibility index image, wherein the image defect visibility predictor determines the masking potential index image by quantizing a masking potential image that results from application of a local standard deviation to the original image.