1. A method of testing an electronic device, said method comprising: applying to the electronic device an input test signal having at least one of an analog component, a digital component, and a differential component; monitoring the response of the electronic device on a differential monitoring device to obtain analog data; monitoring the response of the electronic device on a tester receiver to obtain digital data; processing the analog data, processing the digital data; comparing the processed analog data and the processed digital data; evaluating the compared data; and evaluating the electronic device based on the evaluted data.