1. An optical inspection system for inspecting a workpiece including a feature to be inspected, the system comprising: a workpiece transport configured to transport the workpiece in a nonstop manner; and an illuminator configured to provide a first strobed illumination field type and a second strobed illumination field type, the illuminator including a light pipe configured to expand incident light rays in azimuth, but maintain incident light rays in elevation, the light pipe having a first end proximate the feature, and a second end opposite the first end and spaced from the first end, the light pipe also having at least one reflective sidewall, and wherein the first end has an exit aperture and the second end has at least one second end aperture to provide a view of the feature therethrough; an array of cameras configured to digitally image the feature, wherein the array of cameras is configured to generate a first plurality of images of the feature with the first illumination field and a second plurality of images of the feature with the second illumination field; and a processing device operably coupled to the illuminator and the array of cameras, the processing device being configured to store at least some of the first and second plurality of images and provide the first and second pluralities to an other device.