1. A system for crystal analysis, comprising: a scanning electron microscope (SEM) configured to scan a crystalline region of a device using a beam; a stage configured to mount the device and to step the device through a plurality of imaging positions on the crystalline region; and a memory device including imaging software configured to: store whole images taken at each of the plurality of imaging positions on the crystalline region; extract portions of a full electronic channeling pattern for identifying crystal structure and orientation from the whole images; and stitch the portions of the electronic channeling pattern together to form a composite map of the crystalline region, wherein the full electronic channeling pattern provided in the composite map increases accuracy of the identification of the crystal s and orientation due to an increase in effective angular range between the beam and the surface of the crystalline region.