1. A system for measuring retroreflectivity of materials, comprising: a light source; a sensor array; a first optical pathway to direct an illumination beam from the light source to a retroreflective surface; a second optical pathway to direct a retroreflected beam from the retroreflective surface to the sensor array; a local interface electrically coupled to the sensor array; a processor electrically coupled to the local interface; a memory electrically coupled to the local interface; and operating logic stored in the memory and executable by a processor to determine an intensity distribution of the retroreflected beam incident to the sensor array.