1. A method of analyzing an object, comprising the steps of: acquiring an image of the object, the object having an oriented structured pattern and at least one probe mark; transforming the image into a frequency domain to provide a transformed image of the object; using a processor to filter the transformed image by employing an image processing filter to filter out the oriented structured pattern of the object so as to provide a filtered image of the object that includes the at least one probe mark; and wherein the image processing filter is selected based upon parameters associated with the transformed image of the object.