1. A processor configured to control the acquisition and analysis of cross-sectional images of an object in an x-ray inspection system, each cross-sectional image corresponding to a Z-axis position, the processor programmed to perform the steps of: receiving a current Z-axis position of a current cross-section of an object to be inspected, the current Z-axis position defining a Z-axis variance relative to a reference Z-axis position of a reference cross-section of the object; based on the Z-axis variance, generating a current cross-sectional image of the object at the current Z-axis position; and based on the Z-axis variance, modifying design data that models the reference cross-section of the object.