1. A measurement device, comprising: an image sensor configured to obtain a first digital image, wherein the first digital image is obtained with a line of sight of the image sensor oriented in a first face, and wherein the first digital image comprises a first plurality of pixels representing a characteristic area; an alignment device configured to orient the line of sight of the image sensor in a second face, wherein the image sensor is further configured to obtain a second digital image, wherein the second digital image is obtained with the line of sight of the image sensor oriented in the second face, and wherein the second digital image comprises a second plurality of pixels representing the characteristic area rotated by 180 degrees with respect to the characteristic area as represented in the first image; an image processor configured to rotate one of the first and the second plurality of pixels by 180 degrees, wherein the image processor, after the rotation of the first or second plurality of pixels, is further configured to determine positions of the first plurality of pixels, to determine positions of the second plurality of pixels, and to determine an offset between the pixel positions of the first plurality of pixels and the pixel positions of the second plurality of pixels as a measurement error.