1. A method for detecting a specular surface flaw on a coated substrate, comprising: impinging visible non-integrated light from a linear electromagnetic radiation source onto a coated substrate; reflecting the visible non-integrated light off the coated substrate into a first photosensitive device to form a high frequency surface flaw image; impinging visible coherent light from a coherent electromagnetic radiation source onto the coated substrate at an oblique angle, wherein the non-integrated visible light and the visible coherent light on the coated substrate are collocated but not combined on the substrate; reflecting the visible coherent light off the coated substrate onto a screen material to form a low frequency surface flaw image, and; recording the low frequency surface flaw image off the screen material with a recorder to form a recorded low frequency surface flaw image.