1. A device for an analysis of at least two material samples disposed on a sample plate, the device including: a carrier for the sample plate; a contacting mechanism for electrical contacting of the at least two material samples; a housing carrier; a measuring head inserted into the housing carrier and connected to a gas supply unit, wherein the measuring head includes a gas chamber formed by a substantially bell-shaped distributing device for applying gas to the sample plate, wherein the bell-shaped distributing device is connected to the gas supply unit, wherein the measuring head includes two measuring wires per each material sample for achieving electrical connection to the contacting mechanism, wherein the measuring wires lie against contact surfaces of the sample plate with prestressing, and wherein the measuring wires are connected to a measuring and evaluation unit.