1. A defect and contamination inspection system comprising: a rotating object; a plurality of peripheral image collecting mirrors directed to the object; a central collecting mirror, the peripheral mirrors directing a reflected image of the object to the central collecting mirror; the central collecting mirror comprising a prism-shaped polyhedron having multiple faces so that each of the faces is directed to one of the image collecting mirrors; no more than one camera, the central collecting mirror directing the reflected images to the camera; a processor receiving the images from the camera and producing a concatenated surface image of the object; wherein the inspection system is structured so that the object is retained or rejected based on the image data.