1. An automated method of locating at least one defect on an object of interest, wherein the object includes at least one defect region corresponding to the defect and a defect-free region absent the defect, the method comprising: a. acquiring an image of the object, the image including image data spatially correlated to the object, the image data including: i. defect data spatially correlated to the defect region; and ii. defect-artifact data spatially correlated to portions of the defect-free region; and b. analyzing the defect-artifact data.