1. A method for evaluating a model, comprising: accepting at least one measured device parameter pertaining to at least one device, wherein said at least one device is comprised in a circuit instance, wherein said circuit instance has properties, wherein said model comprises input parameters, and wherein said model is characterized as being a computer executable device and circuit simulator; adjusting at least one of said input parameters pertaining to said at least one device by using said at least one measured device parameter; executing said model using said at least one adjusted input parameter to generate at least one simulated value for at least one of said properties of said circuit instance; and comparing said at least one simulated value with a respective measured value of at least one of said properties of said circuit instance.