1. A metrology system, comprising: a fixture for supporting a workpiece; a sensor operable for obtaining line scans which include sections of the workpiece; control logic for coordinating the sensor and the fixture to cause line scans to be obtained at approximately equal intervals during scanning operations; image logic for assembling an image from image data generated during each scanning operation; edge detection logic for detecting at least one edge shape in each assembled image; and slope calculation logic for calculating a slope of each of the at least one detected edge shape.