1. A transmission electron microscope comprising: an electronic gun for generating an electron beam; a focused optical system for focusing the electron beam generated; a sample stage for placing a sample thereon; a driving part for driving the sample stage; a magnification optical system for magnifying an electron beam image having passed through the sample; an image capturing device for capturing the magnified electron beam images; and a controller for controlling each part of the device, and for recording and processing the captured electron beam image, wherein the controller causes the sample stage to sequentially move in units of predetermined regions so that the magnified electron beam image is captured as a plurality of continuous field-of-view images, the predetermined region being a part of a field of view of the electron beam image, the part having an amount of aberration equal to or less than a predetermined value.