1. A method of automatically imaging in a transmission electron microscope (TEM) features in a region of interest on a lamella window without requiring knowledge of the features to be imaged, comprising: providing a lamella having a known geometry on a TEM grid in a TEM; directing an electron beam toward the TEM grid to form images comprising the lamella window; determining a perimeter of the lamella window within the images; determining an orientation of the region of interest, wherein the orientation of the region of interest defines a stepping direction; obtaining a first image of a portion of the region of interest to identify a portion of the region of interest; and obtaining multiple images by stepping from a position of the first image along the stepping direction to obtain multiple images of portions of the region of interest, where the multiple images are obtained without using image recognition of the individual features to be examined in the region of interest.