1. A method for monitoring a component, the component having an exterior surface, the method comprising: performing a first analysis of a first image of a surface feature configured on the exterior surface of the component, the first image obtained by an imaging device; adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied; performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device; adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied; and performing a second analysis of a third image, the third image obtained by the imaging device.