1. A method for identifying and measuring a feature on tessellated geometry, comprising: providing, by a processor, an image of a part on a display using an electronic representation of the part, the part comprising a tessellated geometry and the tessellated geometry, in the electronic representation, comprising a collection of triangles defined by vertices of each triangle; receiving, by the processor, selection of a feature of the part, the feature being on the tessellated geometry of the part; choosing, by the processor, a first triangle of the collection of triangles of the tessellated geometry that is associated with the selected feature; determining, by the processor, at least a first vertex and a second vertex of the first triangle; determining, by the processor, a predefined normal to at least each of the first vertex and the second vertex of the first triangle; using, by the processor, the predefined normals from at least the first vertex and the second vertex to identify and measure the feature of the part, wherein using the predefined normals provides a faster mechanism to identify and measure the feature than using point fitting of the vertices alone to identify and measure the feature and wherein the tessellated geometry comprises a curved surface, the method further comprising: using the first vertex and its predefined normal to define a first line; using the second vertex and its predefined normal to define a second line; determining a third vertex of the first triangle; using the third vertex of the first triangle and its predefined normal to define a third line; and determining a dimension of the feature based on a point on the first line that comes closest to the second line or the third line.