1. A method comprising: in a data storage device including a non-volatile memory and a controller, wherein the non-volatile memory includes a word line coupled to a plurality of storage elements, performing by the controller: detecting a condition associated with a defect in the word line; determining a first subset of the plurality of storage elements and a second subset of the plurality of storage elements based on an estimated location of the defect; and determining a first read threshold for the first subset and a second read threshold for the second subset.