1. A method for suppressing edge effects in magnetic microscopy, comprising the steps of: providing a data processor; scanning a magnetic field sensor over an object under study having a magnetic field produced by currents running in said object under study; acquiring values of the magnetic field sensed by said sensor to create a first data set having N data points; adding N padding data points at an end of said first data set, each said padding data point having a zero value, thereby creating a second data set having 2N data points, applying a Fast Fourier Transform (FFT) to said second data set to obtain k-space having b(k) values, each b(k) value corresponding to a respective data point in said second data set; averaging said b(k) values of said k-space; filtering off the averaged b(k) values corresponding to a k-value exceeding a predetermined k w value; obtaining a set of current density representations i(k) in the k-space, each said i(k) in the k-space being a representation of a respective density I(x,y) of currents flowing in said object under study; and applying an inverse FFT to said set of i(k) to obtain a map of said current densities I(x,y) of said object under the study.