1. A method for process variation analysis of an integrated circuit, the method comprising: generating a netlist describing electronic devices of an integrated circuit in terms of device parameters and process parameters, wherein the process parameters include local process parameters individual to the electronic devices and global process parameters common to the electronic devices; identifying critical electronic devices having device parameters with greatest contributions to a performance parameter of a design specification of the integrated circuit; determining sensitivity values for the global process parameters and local process parameters of the critical electronic devices, wherein the sensitivity values represent how sensitive the one or more performance parameters are to variations in the global and local process parameters of the critical electronic devices; and sorting Monte Carlo (MC) samples based on the sensitivity values.