1. A method for measuring and correcting sample drift distortion in a scanning microscopy system, the method comprising: obtaining an image series of a sample acquired using a scanning microscope by rotating scan coordinates of the microscope between successive image frames; determining at least one measurement of an angle or distance associated with an image feature as a function of rotation angle from the series of rotated images; using the at least one measurement to determine a model for drift distortion in the series of images; and using the drift distortion model to generate a drift corrected image from the series of images.