1. A bevel inspection module for capturing images of a substrate, comprising: a substrate chuck for supporting said substrate; a rotational motor, said substrate chuck being attached to said rotational motor, said rotational motor being configured to rotate said substrate chuck thereby allowing said substrate to revolve; a camera; an optics enclosure, said optics enclosure being attached to said camera, said optic enclosure being configured to rotate, enabling light to be directed toward said substrate; a camera mount, said camera being installed onto said camera mount, said camera mount being configured to enable said camera to rotate on a 180 degree plane allowing said camera to capture said images, said images including at least one of a top view, a bottom view, and a side view of said substrate; and a backlight arrangement, said backlight arrangement being configured to provide illumination to said substrate, thereby enabling said camera to capture said images, said images showing contrast between said substrate and a background.