1. A method for obtaining sample specific signatures, the method comprising: irradiating a sample at a predefined location with an electromagnetic radiation of a specific wavelength to cause electromagnetic radiation to be scattered from the sample; selectively capturing, a certain component of scattered electromagnetic radiation from at least one of a-various locations around the sample to obtain from a cross section of said radiation a plurality of profiles; and filtering the profiles to obtain a sample specific signature; wherein said various locations around the sample include an incident direction of said electromagnetic radiation of a specific wavelength; wherein each particle in the sample is excited by both said electromagnetic radiation and a resultant field scattered by all other particles in the sample; and wherein a signal observed at any point of observation is dependent on a cross section of the resultant field and a number density of particles.