1. A method for interferometric analysis, comprising: generating first and second light beams from a light source; interacting the first light beam with an object under inspection; forming, from light emanating from the object under inspection in response to the interacting, an image of the light source on an image sensor; projecting the second light beam on the image on the image sensor, the combination of the light emanating from the object under inspection and the second light beam forming a collective image on the image sensor; applying a Fourier transform to the collective image formed on the image sensor, thereby forming a phase image; and isolating a wavefront map of the object under inspection from within the phase image.