1. A method for detecting and classifying defects on a reticle, comprising: acquiring images of the reticle at first and second conditions during inspection of the reticle, wherein the first condition is different than the second condition; detecting the defects on the reticle using one or more of the images acquired at the first condition; and classifying an importance of the defects detected on the reticle using one or more of the images acquired at the second condition, wherein said detecting and said classifying are performed substantially simultaneously during the inspection.