1. A system for measuring an object, the system comprising: a chamber sized to receive and contain an object; an x-ray source within the chamber, the x-ray source being movable relative to the object within the chamber, the x-ray source being configured to project a plurality of x-ray images of an object, at least two of the plurality of x-ray images being projected from different directions relative to the object, the object having at least two edges; an edge detector configured for locating the at least two edges in the x-ray images; a ray tracer operatively coupled with the edge detector, the ray tracer being configured to ray trace a plurality of lines, each ray traced line being tangent to at least one point on at least one located edge; a reconstruction module operatively coupled with the ray tracer, the reconstruction module being configured to reconstruct at least a partial wireframe model of the object from the tangent points of the ray traced lines, the wireframe model including the at least two edges; and a ruler operatively coupled with the reconstruction module to receive the at least partial wireframe model, the ruler being configured to measure between the at least two edges of the at least partial wireframe model.