1. A system for sensing a three-dimensional topology of a test surface, the system comprising: a first illumination source configured to generate first patterned illumination from a first point of view; a second illumination source configured to generate second patterned illumination from a second point of view, the second point of view differing from the first point of view; an area array image detector configured to simultaneously acquire at least first and second fringe images relative to the first and second patterned illuminations; and a controller coupled to the first and second sources and to the detector, the controller being configured to generate a height topology of the test surface based on images acquired while the first and second patterned illuminators are energized.