1. A measurement device comprising: a setting unit configured to set illumination light having a pattern light characteristic to be projected onto a measurement object; a reflected light measurement unit configured to measure reflected light when the measurement object is irradiated with the illumination light; an extraction unit configured to extract from the measured reflected light an image feature based on a physical characteristic of the measurement object; a calculation unit configured to calculate a distribution characteristic for each local region of the image feature; and a control unit configured to control the pattern light characteristic of the illumination light, which includes a pattern light characteristic for distance measurement and a pattern light characteristic for image feature extraction, based on the calculated distribution characteristic for each local region.