1. A microscope imaging apparatus comprising: a stage that holds an object under examination; an illumination unit that illuminates the object under examination; an image-acquisition unit that acquires images of the object under examination; a motion unit that moves the stage and the image-acquisition unit relative to each other; and a control unit that controls the image-acquisition unit and the motion unit, wherein the image-acquisition unit includes an imaging device that is capable of image acquisition using two methods; the control unit includes: an examination-object-parameter input unit for inputting information about the object under examination as an examination-object parameter; a calculation unit that calculates a time required for the relative motion on the basis of the examination-object parameter which has been input; and a switching unit that changes the image-acquisition method of the imaging device on the basis of the calculation result; and the two image-acquisition methods are a time delay integration method and a two-dimensional imaging method in which accumulated charge is produced by a single exposure.