1. A method for estimating at least one component placement position on a substrate at which a component is to be placed, wherein the component placement position is estimated on the basis of the position of at least one mark on the substrate, the method comprising the steps of: determining statistical measurement inaccuracies of the at least one mark; estimating, on the basis of the measurement inaccuracies of the at least one mark, the positional accuracy of the component placement position on the substrate; comparing the estimated positional accuracy of the component placement position with a desired positional accuracy; and determining whether the component is to be placed on the substrate with the estimated positional accuracy of the component placement position.