1. A measurement system comprising: a projector for illuminating a pattern on respective surfaces of instances of an object, the instances of the object sharing a specification; at least two imaging devices for obtaining images of a respective portion of each instance of the object, wherein at least some of the images include representations of one or more illuminated reference markers; an instrument for identifying a predetermined feature at least a portion of which is common to each instance of the object; and at least one processor configured for: determining, for each instance of the object, respective first position information associated with at least one of the illuminated reference markers represented in the images, determining second position information associated with the instrument, and assigning, for each instance of the object, a common predetermined object coordinate system, the assigning based on the determined first position information for that instance of the object and the determined second position information, predetermined object coordinate system having i) an origin defined by a predetermined position shared among the instances of the object and ii) a coordinate system orientation defined with respect to an orientation of each respective instance of the object, at least one instance of the object having an orientation relative to the projector that is different from the orientation relative to the projector of at least one other instance of the object, and the origin and coordinate system orientation of the predetermined object coordinate system being consistent among the instances of the object with respect to the respective instances of the object.