1. A method for reviewing a defect in a sample, comprising: imaging a surface of the sample using an arbitrary image acquisition condition selected from a plurality of image acquisition conditions and obtaining an image; calculating a defect position of the surface of the sample using a defect image; determining a defect detection accuracy of the calculated defect position; and determining whether the defect detection accuracy meets predetermined requirement, wherein until it is determined that the defect detection accuracy meets the predetermined requirement, the preceding steps are repeated, and in calculating the defect position of the surface of the sample, when the image of a predetermined frame is imaged, images prior to the predetermined frame are added and averaged to obtain frame addition amounts.