1. An inspection device comprising: a microscope configured to obtain a primary image by capturing an inspection target; a storage section storing a function defining a relationship between a low-resolution image and a high-resolution image of a calibration sample, the high-resolution image having smaller pixel size than the low-resolution image; an image processing section configured to generate a secondary image based on the primary image by using the function, the secondary image having smaller pixel size than the primary image; and an inspection section configured to inspect the inspection target using the secondary image.