1. A scanning projective lensless microscope device, comprising: a specimen surface; a scanning illumination source comprising a light element, the scanning illumination source configured to scan the light element to a plurality of scanning locations to provide illumination to a specimen on the specimen surface; a light detector outside the specimen surface, the light detector configured to sample a sequence of sub-pixel shifted projection images corresponding to the plurality of scanning locations; and a processor configured to construct a high resolution image of the specimen based on the sequence of sub-pixel shifted projection images and a motion vector.