1. A method for diagnosing defects in a circuit, the method comprising: receiving failure log data from a test of the circuit; identifying truncated failure data in the failure log data, the truncated failure data being associated with test results captured in one or more scan chains or observed at one or more primary outputs after application of a test pattern during the test; applying a per-pin based diagnosis technique to the truncated failure data to identify one or more fault candidates in the circuit; and storing a list of the fault candidates.