1. A method for detecting “sugar end” defects in potatoes, comprising: irradiating potatoes with at least one light source, for a plurality of locus points on each potato, wherein locus points lie on both end regions of the potato and other locus points lie in a central region of the potato, selectively projecting the light reflected from and/or transmitted through the respective locus points onto at least one photo sensor, generating, by means of the at least one photo sensor, light measurement signals for each locus point from the received light and intermediately storing such light measurement signals generated for each locus point, characterized by determining at least one classification feature from the light measurement signals and classifying potatoes as having “sugar end” defects if at least one classification feature corresponds to a predefined “sugar end” criterion.