1. A method for determining functional coverage of a device under test (DUT) in a test environment during a test verification process, the coverage metric being constructed from a plurality of coverage items, the method comprising: obtaining a coverage group for examining during the test verification process, said coverage group including at least one functional coverage item; providing a set of input values to the test verification process; performing the test verification process with said set of input test values to obtain a value for each coverage item; examining coverage obtained with said coverage group according to said value obtained from each coverage item; and automatically altering said set of input test values.