1. A method of improving defect detection accuracy of an electrode array testing system, wherein the electrode array defines a plurality of pixels and wherein the electrode array testing system determines if a pixel is defective based on at least one thresholding parameter, comprising: defining a critical number of defects; comparing a number of defects reported by the electrode array testing system (reported defects) to the critical number of defects; and adjusting the at least one thresholding parameter if the number of reported defects is greater than the critical number of defects.