1. A method for the inspection of surfaces of an examined object, comprising the steps of: calibrating an area image sensor three-dimensionally onto a selected coordinate system; calibrating an illuminating unit three-dimensionally onto the selected coordinate system; illuminating a surface of an object using the calibrated illuminating unit; capturing images of the illuminated surface using the calibrated area image sensor while the surface is moved relative the calibrated area image sensor; and forwarding the captured images to an image analysis unit configured to ascertain surface anomalies as defect areas in a detection as well as to delimit, if required, the defect areas in a segmentation relative to other defect areas or against an image background, to summarize defect areas belonging together in a regional analysis, to derive characteristic defects from defect areas or defect regions in a feature extraction, or both; wherein the step of illuminating includes projecting a pattern onto an area of the surface of the object, which area is captured by the calibrated area image sensor in the step of capturing; wherein a position of defined pattern portions of the projected pattern on the surface of the object is determined in the selected coordinate system; wherein data comprising the captured projected pattern and the captured illuminated surface is supplemented based on a simultaneous capture and analysis of two-dimensional images representing reflection properties of the surface of the object and three-dimensional images representing a three-dimensional geometry of the surface of the object, as surface topography; and wherein the projected pattern and the illuminated surface in the captured image comprise different respective brightnesses in an area of the surface of the object surrounding the projected pattern and wherein neither the projected pattern, nor the illuminated surface lay on a boundary of a contrast resolvable by the area image sensor.