1. A method for producing an image using a probe system having an imager and an inspection light source, and executed with a processor, the method comprising: operating the probe system in an inspection mode and a measurement mode; enabling the inspection light source during inspection mode and disabling the light source during measurement mode; enabling a light emitter drive during measurement mode; projecting a structured-light pattern using the light emitter drive during measurement mode; capturing, during inspection mode, at least one inspection mode image; capturing, during measurement mode, at least one measurement mode image wherein the structured-light pattern is projected onto an object; inserting a measurement point; and utilizing pixel values from the at least one measurement mode image and the measurement point to determine at least one geometric dimension of the object.