1. An inspection system, comprising: a collimated light source defining a source optical path, said collimated light source being operable to cause a collimated light beam to propagate along said source optical path; a sensing device defining a sensor optical path, said sensor optical path being substantially perpendicular to said source optical path; a positioning device including a positioning device stage; a reflecting device, wherein said reflecting device is disposed on said positioning device to be within said source optical path to receive said collimated light beam, said reflecting device causing a reflected collimated light beam to propagate along said sensor optical path to said sensing device; a retention mount, where a portion of said retention mount is disposed within said sensor optical path such that when a component is retained within said retention mount, said component blocks at least a portion of said reflected collimated light beam such a silhouette is generated and incident upon said sensing device, wherein said sensing device generates data responsive to said silhouette; and at least one processing device, wherein said at least one processing device is communicated with said sensing device to receive at least a portion of said data, wherein said processing device is configured to process said data responsive to at least one of a smoothing algorithm, a functional size algorithm and a centering algorithm.