1. A charged particle beam apparatus that scans two-dimensionally a sample in a first direction with a charged particle beam so as to display an image of the scanned region with a signal based on a charged particle beam from the sample detected by the scanning, the charged particle beam apparatus employing a partitioning and interlacing method in which a plurality of partitioned regions are defined by partitioning a region to be scanned in a second direction different from the first direction, and scanning in the first direction is performed for every partitioned regions sequentially in a skipping manner, the charged particle beam apparatus comprising: an image processing section for carrying out an image processing to remove an artifact generated attributable to a scanning method of a scan line.