1. A pattern inspection method for inspecting a circuit pattern of an electronic device, comprising: a step of acquiring a reflection electron image and a secondary electron image of the electron device; a division step of dividing a region in the reflection electron image based on brightness values of pixels of the reflection electron image; an association step of associating the region in the reflection electron image divided in the division step and a region in the secondary electron image; and an inspection step of inspecting a circuit pattern in the secondary electron image using a result in the association step.