1. A method for locating flaws on a three-dimensional object ( 2 ), particularly on its surface, the flaws being detected and located with an optical picture-taking device ( 3 , 4 ), wherein the design data related to the object ( 2 ), the optical imaging properties of the picture-taking device ( 3 , 4 ), and the position of the optical picture-taking device ( 3 , 4 ) and the object ( 2 ) are known when the picture is taken, the location of the flaw on the object ( 2 ) being determined therefrom.