1. A computerized method for orienting an image of an integrated circuit device under test (DUT) using a computing system, comprising: obtaining an optical image of the DUT from an optical system; obtaining a computer aided design (CAD) data having a plurality of CAD layers of the DUT; operating on each of the CAD layers to generate a synthetic image simulating an optical image of the CAD layer; constructing a CAD image of the DUT by overlaying the synthetic images of the CAD layers; generating a difference image by comparing the optical image to the synthetic image; varying parameters of each CAD layer of the synthetic image so as to minimize the difference image by, for each of the plurality of CAD layers: aligning each layer to the optical image in translation, rotation, and image magnification; adjusting brightness, emissivity and transmittance values of each layer; and, indicating edges of transparent layers.