1. An inspection system with radiation-induced false count mitigation, comprising: an illumination source configured to illuminate a sample; a detector assembly comprising: an illumination sensor configured to detect illumination from the sample positioned on a first side of the illumination sensor; and one or more radiation sensors configured to detect particle radiation, wherein the one or more radiation sensors are positioned on a second side of the illumination sensor opposite of the first side of the illumination sensor; and one or more controllers communicatively coupled to the illumination sensor and the one or more radiation sensors, wherein the one or more controllers are configured to: identify a set of illumination detection events based on an illumination signal received from the illumination sensor; identify a set of radiation detection events based on one or more radiation signals received from the one or more radiation sensors; compare the set of radiation detection events to the set of illumination detection events to identify a set of coincidence events, wherein the set of coincidence events corresponds to simultaneous occurrences of radiation detection events and illumination detection events; and exclude the set of coincidence events from the set of illumination detection events to generate a set of identified features on the sample.