1. A microscope, comprising: a measurement light source section emitting a measurement light to an analysis position of a sample; a visible light source section emitting a visible light to an area comprising the analysis position of the sample; a detection section detecting the measurement light from the analysis position of the sample; a first image acquisition section emitting the visible light from the area comprising the analysis position of the sample onto a detection surface to obtain an optical image; and a beam dividing means disposed on a light path that guides the measurement light from the analysis position of the sample to the detection section and guiding the visible light from the area comprising the analysis position of the sample to the detection surface of the first image acquisition section by switching or splitting the light path, wherein the sample is moved with respect to the detection section and the first image acquisition section, and the microscope further comprises a second image acquisition section disposed in a position apart from the light path that leads to the detection section and obtaining an optical image of a large area comprising the analysis position of the sample by guiding the visible light to the detection section, wherein the optical image of the large area is larger than an optical image of the area comprising the analysis position of the sample obtained by the first image acquisition section.