1. A method for measuring a structure on a substrate, comprising: forming a Support Vector Machine (SVM) machine learning model that correlates a transmitted X-ray signal through the structure and at least one parameter of the structure; irradiating the structure with X-ray radiation from an X-ray source; acquiring a transmitted X-ray radiation signal from an X-ray detector; and calculating the at least one parameter of the measured structure by applying the Support Vector Machine (SVM) machine learning model to the acquired transmitted X-ray radiation signal.