1. A system for optically scanning and measuring an object in an environment, the system comprising: a scanner device that includes a projector, a first camera, and a second camera, the projector configured to project a first pattern of light from a projector plane, the first pattern of light being a first multivalued uncoded structured light pattern, the first pattern of light including a collection of illuminated points, the projector having a projector optical axis, each of the illuminated points having an identical shape, the first camera configured to record in a first time instance a first image of the first multivalued pattern of light projected onto the object, the first image being recorded on a first image plane of the first camera, the first camera having a first camera optical axis, the second camera configured to record in the first time instance a second image of the first multivalued pattern of light projected onto the object, the second image being recorded on a second image plane of the second camera, the second camera having a second camera optical axis, the projector optical axis, the first camera optical axis, and the second camera optical axis are oriented in a non-collinear triangular arrangement, each of the illuminated points on the projector plane, the first image plane, and the second image plane corresponding to and lying on an epipolar line in each of the other two of the projector plane, the first image plane, and the second image plane, the correspondence among epipolar lines and the illuminated points of the first pattern of light on the three planes determined by geometrical epipolar relations among the projector plane, the first image plane, and the second image plane; and a processor configured to determine the correspondence among each of the illuminated points on the projector plane, the first image plane, and the second image plane, the correspondence determined at least in part by the geometrical epipolar relations among the three planes, the processor further configured to determine three-dimensional coordinates of each of the illuminated points on the object at the first time instance based at least in part on the illuminated points in the first multivalued pattern of light, the first image of the first multivalued pattern of light on the object, the second image of the first multivalued pattern of light on the object, and the geometry of the triangle.