1. A method for generating a pattern-clip-based hotspot database for performing automatic pattern-clip-based layout verification, the method comprising: receiving a list of pattern clips which specify manufacturing hotspots to be avoided in a layout, wherein each pattern clip comprises a set of geometries in proximity to each other; for each pattern clip, perturbing the pattern clip to determine a first range of variations for the constituent set of geometries wherein the perturbed pattern clip no longer causes a manufacturing hotspot; extracting a set of correction guidance descriptions from the first range of variations for correcting the pattern clip; and storing the pattern clip and the set of correction guidance descriptions in the pattern-clip-based hotspot database.