1. An electronic device, comprising: a digital logic circuit; and test circuitry configured to: receive one or more test parameters from a remote test management device; generate one or more test patterns based on the one or more test parameters; apply the one or more test patterns to the digital logic circuit; receive one or more test responses from the digital logic circuit; compact the one or more test responses into a test signature; and transmit the test signature to the remote test management device.