1. A method for evaluating an electronic circuit, the method comprising: receiving at least one time-varying output characteristic output signal of said electronic circuit, said at least one time-varying output characteristic comprising a plurality of raw data points representing a plurality of measurements at a plurality of times; partitioning said plurality of raw data points into a plurality of segments; calculating a plurality of estimated data points based on a plurality of mathematical expressions, wherein at least one of said plurality of mathematical expressions are associated with each of said plurality of segments; and characterizing said electronic circuit based on at least one figure of merit (FOM) computed from said plurality of estimated data points.