1. A scanning electron microscope device comprising: charged particle beam irradiating optical system means for irradiating and scanning a specimen having a pattern with a focused charged particle beam; charged particle detecting optical system means for detecting the charged particles of the kind identical to or different from the charged particles emitted from said specimen, which was irradiated and scanned with the charged particle beam by said charged particle beam irradiating optical system means; image acquiring means for acquiring a charged particle image of said specimen by processing a signal detected by said charged particle detecting optical system means; and image processing means for processing the charged particle image of said specimen acquired by said image acquiring means, wherein said image processing means determines a restored image of the image, which is acquired by said image acquiring means, by using a point spread function calculated by using imaging information containing at least one of the image acquiring condition of the image acquired by said image acquiring means and the information of said taken specimen.