1. A system comprising: a detecting component detecting incident electromagnetic radiation at a number of pixels; a number of electromagnetic radiation sources; each electromagnetic radiation source emitting at substantially one wavelengths from a number of wavelengths; at least some of the number of wavelengths substantially coinciding with wavelengths in an absorption spectrum of predetermined materials; each one of the number of the electromagnetic radiation sources sequentially illuminating an area of interest; the number of electromagnetic radiation sources emitting substantially from one location; the detecting component receiving reflected/scattered electromagnetic radiation from the area of interest; a modulating component modulating, with respect to time, emission from said each one of the number of electromagnetic radiation sources; and an analysis component configured to: process a number of pixelated images, the number of pixelated images obtained by sequentially illuminating an area of interest; the number of pixelated images, after processing, constituting a vector of processed data at each pixel from a number of pixels; and compare, at each pixel, the vector of processed data to a predetermined vector corresponding to a predetermined material; presence of the predetermined material being determined by comparing.