1. A computer-implemented method for modeling Spatially Correlated Variation (SCV) in a design of an Integrated Circuit (IC) using an Across Chip Length Variation (ACLV) function, the method comprising: generating a set of coefficient values for the ACLV function, the set of coefficient values being selected from a set of random variables; determining whether an extracted netlist for the IC has been obtained; obtaining a set of coordinates defining a position of each of a plurality of devices in a defined field in the IC from the extracted netlist in response to determining that the extracted netlist has been obtained; randomly generating the set of coordinates defining the position of each of the plurality of devices in the defined field in the IC in response to determining that the extracted netlist has not been obtained; evaluating the ACLV function to determine a device attribute variation for each of the plurality of devices based upon the coordinates of each of the plurality of devices and the set of coefficient values; modifying at least one model parameter based upon the evaluation of the ACLV function; and running a circuit simulation using the at least one modified model parameter.