1. A method for acquiring a plurality of images in a machine vision inspection system to be utilized for performing measurement operations on a workpiece, the method comprising: providing an optical system in the machine vision inspection system which provides a magnification M; providing a camera in the machine vision inspection system which includes a first pixel pitch P and which includes a fast multiple image acquisition mode of operation; providing sub-pixel offset image sampling operations comprising: providing a first image acquisition motion comprising moving one of the workpiece and the camera relative to one another at a first speed S along a first direction; acquiring a plurality of images of a region of interest during the image acquisition motion using the fast multiple image acquisition mode of operation, the plurality of images comprising: a first image of the region of interest acquired at a first time t1; and a second image of the region of interest acquired at a second time t2 after the first time t1; wherein an offset O between the first and second images is approximately equal to M*S*(t2−t1) and the machine vision inspection system is configured such that O does not equal nP, where n is an integer.