1. A three-dimensional measuring device comprising: an irradiation means capable of irradiating light for three-dimensional measurement onto a measurement object having a first area formed by objects under inspection and a second area forming a standard for measurement of height of the first area, an imaging means capable of imaging light reflected from the measurement object irradiated by the light, and an image processing means for three-dimensional measurement of the measurement object based on image data imaged by the imaging means; wherein the three-dimensional measuring device: performs three-dimensional measurement based on the image data for three-dimensional measurement. performs first image processing by imaging for a first exposure time such that brightness of a location corresponding to a bright part as either the first area or the second area is not saturated; performs first data transmission of image data obtained by the first data image processing; performs second image processing by imaging for a second exposure time corresponding to a time insufficiency, the insufficiency being between the first exposure time and a certain exposure time appropriate for measurement of a dark part of the first area or the second area; performs second data transmission of image data obtained by the second image processing; and performs image preparation processing by combining a location of brightness non-saturation of imaging data obtained by the first image processing and a location of brightness non-saturation of imaging data obtained by the second image processing to prepare image data for three-dimensional measurement having no brightness saturation in the first area and the second area; performs three-dimensional measurement based on a surface image formed by the image data for three-dimensional measurement; wherein, during the image preparation processing for preparation of the image data for three-dimensional measurement, the value of data only obtained by the first image processing is used for the location corresponding to the bright part, and a summed value obtained by adding of the value of the image data obtained by the first image processing and the value of the image data obtained by the second image processing is used for the location: i corresponding to the dark part; wherein three-dimensional measurement is performed by the phase shift method based on a multiplicity of the image data for three-dimensional measurement, each image data for three-dimensional measurement being obtained using a respective irradiation of light, and each irradiation having a respective phase differing from the phase of other irradiations.