1. An inspection apparatus for inspecting a substrate, the inspection apparatus comprising: an illumination unit which illuminates the substrate with light, the substrate including a first area having only part of a first pattern thereon and a second area having at least part of a second pattern thereon, the first and second areas constituting portions of a third area, wherein the first area is missing a portion corresponding to another part of the first pattern such that the first pattern is only partially formed on the substrate; a detection unit which detects light from the illuminated substrate and generates a signal of an image based on the detected light, the image including the first and second areas; a memory which stores arrangement information of the first, second and third areas; and a processing unit which uses the arrangement information to recognize imperfection of at least one of the first and second areas.