1. A method, executed by at least one processor of a computer, comprising: determining local minimal light intensity values for a plurality of sample points in boundary regions of an aerial image of a feature of an electronic design to be printed on a resist coating, wherein each of the local minimal light intensity values represents a minimum light intensity value for an area surrounding one of the plurality of sample points; determining horizontal development bias values for the plurality of sample points based on the local minimal light intensity values; and computing, as part of a process for verifying printability of the feature or for modifying the feature, resist contour data of the feature based at least on the horizontal development bias values.