1. A method of extracting fail data on a device under test (DUT) by applying multiple applications of test patterns under different environmental test conditions the method comprising: a) applying said test patterns to said DUT under a plurality of said different environmental test conditions and collecting fail data resulting thereof; b) loading said collected fail data and performing diagnostic simulations based on said plurality of different environmental test conditions, said diagnostic simulations being executed on a computer; c) compiling environmental fault callouts thereof at a predetermined resolution; and d) performing a physical failure analysis on selected ones of said environmental fault callouts, wherein said environmental test conditions are selected from a group consisting of device design parameters and models, process parameters and variations thereof, physical data, logic model, and fault models included in said diagnostic simulations and fault callouts.