1. A system for inspecting a sample, the system comprising: first and second illumination relays respectively configured to direct light generated by an illumination source onto the sample; image relay optics configured to direct first light outputs from the sample to a first channel image mode relay when the first light outputs correspond to said light directed by the first channel illumination relay, and configured to direct second light outputs from the sample to a second channel image mode relay when the second light outputs correspond to said light directed by the second channel illumination relay; and an image sensor configured to receive said first light outputs from the first channel image mode relay and said second light outputs from the second channel image mode relay, the sensor including: an image region including pixels disposed in a two-dimensional array on an epitaxial silicon membrane, the epitaxial silicon membrane including circuit elements formed on a first surface of the epitaxial silicon membrane and a pure boron layer disposed on an opposing second surface of the epitaxial silicon membrane, first readout circuits disposed on a first side of said image region, and second readout circuits disposed on a second side of said image region, wherein the system is configured such that the first readout circuit reads out charges from the pixels that correspond to the first light outputs directed onto the image region by the first channel image mode relay, and such that the second readout circuit reads out charges from the pixels that correspond to the second light outputs directed onto the image region by the second channel image mode relay.