1. A method of manufacturing an integrated circuit according to a first process designed for processing masks within a first specification using a first mask within the first specification, the first process having at least one of a first set of lithographic parameters, a first set of resist parameters, and a first set of etch parameters, the method comprising: generating a first mask map for the first mask using a computer system and a simulation performed using at least the first set of lithographic parameters; determining, using the first mask map, whether the first set of lithographic parameters are acceptable; generating a second set of lithographic parameters and a second mask map responsive to the determining such that the second set of lithographic parameters are acceptable, the second set of lithographic parameters distinct from the first set of lithographic parameters; identifying the first mask on a stepper; configuring the stepper according to the second set of lithographic parameters; and exposing a wafer to electromagnetic radiation according to the second set of lithographic parameters.