1. A method of detecting substantially parallel thin lines in an image implemented on a device comprising: a. generating a profile using a processor; b. analyzing the profile using the processor to determine whether the thin lines exist, wherein the profile is generated for each of a pre-defined plurality of directions and multiple projection lines are used for each direction of the plurality of directions; and c. determining a sum of pixel values along a projection line and averaging the sum to generate a result for each projection line of the multiple projection lines.