1. A transmission electron microscope comprising: a source for an electron beam; a condenser optical system that irradiates a specimen with an electron beam emitted from the source; a specimen holding unit that holds the specimen to be irradiated by the electron beam; an imaging lens system that focuses an image of the specimen; at least one detecting unit that obtains the image of the specimen formed by the imaging lens system; a first electron biprism disposed on the upstream side of the location where the specimen is placed in the electron beam traveling direction on the optical axis of an electron optical system of the transmission electron microscope; and a second electron biprism disposed on the downstream side of the location where the specimen is placed in the electron beam traveling direction on the optical axis of the electron optical system and set in a space at the shadow of the electron beam produced by the first electron biprism, wherein the first electron biprism deflects the electron beam emitted from the source and separates the electron beam into a first electron beam and a second electron beam for irradiating a prescribed region of the specimen from different angles, wherein the second electron biprism deflects the first electron beam and the second electron beam having transmitted the specimen and spatially separates a first image of the specimen produced by the first electron beam with a second image of the specimen produced by the second electron beam, and wherein the detecting unit obtains the first image and the second image.