1. A three-dimensional (3D) coordinate measuring system including: a six degree-of-freedom (six-DOF) unit having a unit frame of reference, the unit including a structure, a retroreflector, a triangulation scanner, and an augmented reality (AR) camera, the retroreflector, the triangulation scanner, and the AR camera attached to the structure, the triangulation scanner including a first camera and a projector, the projector configured to project a pattern of light onto an object, the first camera configured to form a first image of the pattern of light on the object, the projector and the first camera configured to cooperate to determine first 3D coordinates of a point on the object in the unit frame of reference, the determination based at least in part on the projected pattern of light and the first image, the AR camera being a color camera configured to obtain a color two-dimensional image in the unit frame of reference; a laser tracker device having a device frame of reference, the device including a means to measure a pose of the retroreflector in the device frame of reference, wherein the measured pose includes measurements of six degrees-of-freedom of the retroreflector; and one or more processors configured in a first instance to receive a first AR image from the AR camera and to receive from the device a first measured pose, the one or more processors further configured in a second instance to receive a second AR image from the AR camera and to receive from the device a second measured pose, the one or more processors further configured to determine a first cardinal point common to the first AR image and the second AR image, the one or more processors further configured to determine second 3D coordinates of the first cardinal point in the device frame of reference, wherein the one or more processors are further configured to combine the first 3D coordinates, the second 3D coordinates, the first AR image, and the second AR image in a common frame of reference into a composite 3D image based at least in part on the first measured pose of the retroreflector and the second measured pose of the retroreflector.