1. An electron beam interference device, comprising: a light source of an electron beam; an irradiation optical system for irradiating an electron beam emitted from the light source to a specimen; an imaging lens system having an objective lens that images an image of the specimen; an electron biprism disposed on an optical axis of the electron beam; an image recording device recording a plurality of phase distribution images in the specimen; and an image operation processing device operating the phase distribution images of the specimen, wherein the specimen includes a first observation region that an electron beam through which interferes with an electron beam transmitted through a reference wave region by the electron biprism is transmitted and a second observation region that an electron beam which interferes with the electron beam transmitted through the first observation region by the electron biprism is transmitted, the image recording device records a second interference image based on the electron beam transmitted through the first observation region and the electron beam transmitted through the second observation region while recording a first interference image based on the electron beam transmitted through the reference wave region and the electron beam transmitted through the first observation region, and the image operation processing device operates phase distribution images of the electron beam transmitted through the reference wave region and the electron beam transmitted through the second observation region based on the second interference image recorded in the image recording device and the first interference image recorded in the image recording device.