1. A method of locally in-order strobing, comprising: receiving at least one device-under-test (DUT) output signal, wherein the DUT output signal has a repeating pattern; sampling the DUT output signal using an asynchronous sampling clock, wherein each period of the repeating pattern is sampled at least twice; wherein a sampling frequency of the asynchronous sampling clock is based on one or more user inputs; wherein sampling the DUT output signal comprises capturing logical state information representing each edge of a single period of the DUT output signal at least once; separating the samples into subsets, a first subset comprising a first sample from each period of the repeating pattern and a second subset comprising a second sample from each period of the repeating pattern; mapping the samples onto a single period of the repeating pattern, wherein the first subset maps to a first portion of the single period and the second subset maps to a second portion of the single period, wherein the samples within a particular subset are mapped to a set of times which are in the same order as in which the samples were obtained; processing the samples within each subset independently of samples in other subsets; combining results of the processed subsets; and processing the combined results of the subsets.