1. A method for identifying an integrated circuit having a latent defect, the method comprising the steps of: obtaining test data corresponding to a set of integrated circuits that were processed on a single substrate, selecting for analysis a subject integrated circuit from within the set of integrated circuits, identifying a subset of integrated circuits from within the set of integrated circuits, where the subset of integrated circuits includes integrated circuits that were located in close proximity on the substrate to the subject integrated circuit, analyzing the test data for the subset of integrated circuits to determine a defect parameter for the subset of integrated circuits, comparing the defect parameter for the subset of integrated circuits to a threshold, classifying the subject integrated circuit as having a latent defect when the defect parameter for the subset of integrated circuits violates the threshold, and classifying the subject integrated circuit as not having a latent defect when the defect parameter for the subset of integrated circuits does not violate the threshold.