1. An image measuring apparatus comprising: a sample stage having a placement surface on which an object to be measured is to be placed; an imager facing the placement surface of the sample stage and configured to capture an image of the object to be measured; a pattern projector configured to project a predetermined pattern onto the sample stage, the predetermined pattern providing a reference for at least one of a placement position and a direction of the object to be measured on the placement surface, wherein the pattern projector comprises: a mask configured to display the predetermined pattern, the mask including a shield and a transparent section; a light source configured to emit light onto the mask such that the emitted light does not pass through the shield, and such that that the emitted light can pass through the transparent section; and a projection optical system configured to project the emitted light through the mask onto the sample stage; and an adjuster that provides for the adjustment of at least one of the color and intensity of the light projected from the pattern projector, according to reflectance of the measured object.