1. A method of using an ultra-high-speed 3-dimensional (3D) refractive index tomography and structured illumination microscopy system that utilizes a wavefront shaper, the method comprising: adjusting an irradiation angle of a plane wave incident on a sample by using the wavefront shaper; measuring a 2-dimensional (2D) optical field, which passes through the sample, based on the irradiation angle of the plane wave; and obtaining a 3D refractive index image from information of the measured 2D optical field by using an optical diffraction tomography or a filtered back projection algorithm, wherein the adjusting of the irradiation angle comprises: adjusting a progression direction of one plane wave by adjusting the irradiation angle of the plane wave such that a diffraction light is incident on the sample and the rest thereof is shielded; and adjusting a pattern of a digital micromirror device to obtain phase information.