1. A method for inspecting a component, said method comprising: generating an image of the component reflected RF sound wave signals; generating a signal indication mask of the image by: dividing the image into sub-images; calculating a local threshold value for each of the sub-images; smoothing and interpolating to obtain pixel by pixel threshold values that substantially eliminates the occurrence of large differences the threshold levels between adjacent pixels at the boundaries of the sub-images; and segmenting the signals by applying a threshold mask and based on a comparison between the pixel data values and the pixel-by-pixel threshold values; generating a noise mask using a signal within the signal indication mask, wherein the noise mask facilitates reducing a quantity of prospective signals contained in the signal indication mask; and utilizing the signal indication mask and the generated noise mask to calculate the signal-to-noise ratio of at least one potential flaw indication that may be present in the image.