1. A method for color inspection of a device present on a surface, the method comprising: computing spatial feature data related to first, second and third components of light in a first color space and received from at least one associated device present on a second surface; computing only data related to the first component of light in the first color space and received from the device if the values of the second and third components of the light in the first color space and received from the at least one associated device are respectively smaller than first and second predefined values; and reporting a defect if the value of the first component of the light in the first color space and received from the device is smaller than a threshold value defined by the value of the first component of the light in the first color space and received from the at least one associated device.