1. A three-dimensional shape measuring apparatus comprising: a stage transferring a target board to a measurement position; at least one projector illuminating pattern light onto an inspection area of the target board; a two-dimensional lighting section illuminating light for two-dimensional measurement onto the inspection area of the target board; a camera section photographing a pattern image and a two-dimensional image reflected from the target board; and a control section reading feature information of the inspection area from a database, wherein the control section realigns the inspection area by comparing the feature information with at least one of the photographed pattern image and the photographed two-dimensional image to inspect distortion of the inspection area.