1. A device, comprising: a memory configured to store a digital image of a reflected portion of a projected structured light pattern that is comprised of a repeating structure of a plurality of unique feature types; a processor configured to identify and locate feature types appearing in the image and using known locations of each one of a plurality of distinguishable epipolar lines on a sensor's plane and a constraint that any feature type appears at most once along any one of the plurality of distinguishable epipolar lines, wherein a distance between the distinguishable epipolar lines is less than YC, where C is a size of a feature type in the image in the shortest dimension of the repeating structure, and Y is a number of feature types in the shortest dimension of the repeating structure; and the processor is configured to extract depth information based on locations of the feature types along respective distinguishable epipolar lines.