1. A system comprising: a handheld measurement device including: a first imaging device configured to acquire image data of a surface of an object located in a measurement region relative to the handheld measurement device; a second imaging device configured to acquire image data of the surface of the object located in the measurement region relative to the handheld measurement device, wherein the image data acquired by the first imaging device has a field of view at least partially overlapping the image data acquired by the second imaging device when the surface of the object is located in the measurement region relative to the handheld measurement device; a projected pattern generator configured to generate a divergent pattern of structured light, wherein the divergent pattern of structured light impacts the surface of the object within a field of view of the first imaging device when the object is located in the measurement region; and a computer system configured to measure a set of attributes of the surface of the object by performing a measurement method including: concurrently activating the first and second imaging devices to acquire image data; processing the image data acquired by the first and second imaging devices in response to the activating, wherein the processing includes determining whether the measurement device was located within a range of measurement locations when the image data was acquired, wherein the range of measurement locations includes a range of distances from the object and a range of orientations with respect to the object, for which the handheld measuring device is configured; and determining a measurement of at least one attribute of the surface of the object using the image data in response to the processing determining the measurement device was located within the range of measurement locations when the image data was acquired.