1. A method for evaluating the quality of a directed self-assembling method used for generating directed self-assembling patterns, the method comprising: obtaining at least one set of parameter values for a parameterized set of processing steps and material properties characterizing the directed self-assembling method, thus characterizing a specific directed self-assembling method used for generating a directed self-assembled layer; obtaining a scattered radiation pattern on the directed self-assembled layer obtained using the directed self-assembling method characterized by the set of parameter values, thus obtaining scattered radiation pattern results for the directed self-assembled pattern; and determining, using a computing device and based on the scattered radiation pattern results, a qualification score and correlating the qualification score with the set of parameter values.