1. A method in an apparatus for measuring optical anisotropic properties of a material, comprising: measuring one of: (1) a Mueller matrix of the material, (2) diattenuation orientation of the material, and (3) retardance magnitude of the material; and determining a value proportional to anisotropic magnitude of the material based on the measured one of: (1) the Mueller matrix of the material, (2) the diattenuation orientation of the material, and (3) the retardance magnitude of the material.