1. A method of modeling a non-uniform gate of a circuit device, the method comprising: identifying a gate of a circuit device to be modeled, wherein the gate has a thickness in a gate length direction that varies along a gate width direction; defining a set of gate slices corresponding to the gate, wherein each slice of the set of gate slices has a thickness in the gate length direction that corresponds to the thickness of the gate in the gate length direction at a corresponding location; using a computing system, identifying a set of weighting parameters to apply to the set of gate slices, wherein each weighting parameter of the set of weighting parameters is based on a location of a respective slice of the set of gate slices within the gate, and wherein each weighting parameter of the set of weighting parameters is further based on an impact of a narrow width related edge effect; determining a set of performance parameters using the set of gate slices; applying the set of weighting parameters to the set of performance parameters; and summing the set of performance parameters having the set of weighting parameters applied thereto to determine a performance parameter of the gate.