1. A test device for characterizing point flaws of an optical filter under test including pinholes and point defects, the test device comprising: a passband illumination source configured to illuminate the optical filter under test with passband illumination whose spectral range at least overlaps a passband of the optical filter under test; a stopband illumination source configured to illuminate the optical filter under test with stopband illumination whose spectral range lies entirely outside of the passband of the optical filter under test; a two-dimensional array of photodetectors arranged to detect the passband illumination after passing through the optical filter under test and to detect the stopband illumination after passing through the optical filter under test; and an electronic controller configured to operate in conjunction with the passband illumination source, the stopband illumination source, and the two-dimensional array of photodetectors to: perform a passband test including acquiring a passband map of the optical filter under test using the two-dimensional array of photodetectors while illuminating the optical filter under test with the passband illumination and not illuminating the optical filter under test with the stopband illumination, and perform a stopband test including acquiring a stopband map of the optical filter under test using the two-dimensional array of photodetectors while illuminating the optical filter under test with the stopband illumination and not illuminating the optical filter under test with the passband illumination.