1. A sample inspection system comprising: a sample stage holding a sample to be inspected corresponding to a selected file; electron beam optics so as to radiate an electron beam to the sample; a detector unit that detects a secondly generated signal attributable to the electron beam; storage means for storing a plurality of images obtained from the secondly generated signal and information for classifying the plurality of images by a type of defect in the sample; and an image processing unit that retrieves any of the plurality of images and classifies the retrieved image depending on the type of defect including an electrical defect and a defect in the figure.