1. A pattern generating apparatus that generates a reference pattern used to evaluate a shape of a circuit pattern of an electronic device, the pattern generating apparatus comprising: an arithmetic unit for generating, from contour data sets of at least two circuit patterns, a reference pattern used for pattern evaluation, wherein the arithmetic unit generates a contour composite image by overlaying the contour data sets of at least two circuit patterns and generates the reference pattern by identifying a position for overlaying the contour data sets on one another.