1. A method for controlling a structured illumination pattern generating portion used to illuminate a workpiece with a structured illumination pattern during an image acquisition by a camera portion in a precision machine vision inspection system, wherein: the structured illumination pattern (SIP) generating portion comprises: a SIP controller; a controllable spatial light modulator (SLM) that is controlled for generating the structured illumination pattern; and a light generator that emits radiation to the SLM; and the method comprises: acquiring an image during an image integration period of the camera portion; increasing the overall exposure during the image integration period by a first exposure increment by generating a first complete structured illumination pattern iteration including gray level variations; and increasing the overall exposure during the image integration period by at least a second exposure increment by generating at least a second complete structured illumination pattern iteration including gray level variations.