1. A light probe microscope comprising: a probe capable of generating a light field locally existing in a tip portion; probe position detecting means for controlling a distance between a tip of the probe and a sample to an adjoining distance, tremor means and control means; scan means for two-dimensionally scanning the probe on a sample surface; a light source for generating the locally existing light field; a converging optical system for converging a light radiated from the sample surface adjoining the probe tip; and data collecting means, wherein a two-dimensional image of the sample surface is obtained in real time by a two-dimensional image sensor, and a two-dimensional light image is obtained simultaneously with a shape image by the data collecting means by means of obtaining a signal intensity of an optional detection region in the two-dimensional image by picture signal processing means.