1. A method for identifying a defect in a liquid crystal device comprising: (a) receiving an input image of a portion of said liquid crystal device; (b) receiving a defect-free model image of said liquid crystal device, said defect free model image including manually appended landmark labels that identify respective types of landmark structures of said model image; and (c) identifying a defect, a defect position and a defect size based on identification of a color of an irregularly-shaped region associated with said defect, using said defect-free model image, said landmark labels, and input image.