The dielectric functions were reconstructed by using Kramers-Kronig-consistent Tauc-Lorentz [1]} and Cody-Lorentz [2]} models. Both models fit the data with comparable mean squared error, and yielded consistent results. We then obtained the complex refractive index of the as-deposited thin films from the best-fit dielectric functions. The Cody-Lorentz model provided a slightly better fit in the region of the absorption edge and included also the Urbach tail absorption, which may be correlated to coating mechanical loss [3]}. However, data quality for energies higher than the energy gap (\(E > 4\)  eV) was degraded and resulted in a large uncertainty for the Urbach energy \(E_U = 130 \pm 30\)  eV.
