In dark-field electron microscopy (DFTEM), simulating images with dynamical diffraction effects is done routinely. Although superficially similar to DFXM, the methods cannot be transferred from one technique to the other. The most common methods in DFTEM are either Bloch wave methods that rely on the column approximation which cannot be applied to DFXM where the scattering angles often exceed 10 degrees, or multi-slice methods that require the atomic structure of the sample to be well sampled, which is not feasible for DFXM where sample sizes often exceed 100 m.[1]}
