2D materials have garnered huge attention since the first isolation of graphene [1]} thanks to the unusual properties that have emerged from their single atomic or a single unit cell thickness. These properties justify them as promising candidates for electronic and optoelectronic applications, energy storage devices, ultra-sensitive detectors and many other applications [2]}, [3]}. However, they depend upon the precise 3D arrangement of their constituent atoms.
For example, the long-range ripples in graphene have been shown to be important to its stability using electron diffraction [4]}. Dopants in 2D materials also buckle the local environment, drastically changing their electronic properties [5]}, [6]}, [7]}, [8]}, [9]}.
However, 3D structure determination using conventional electron tomography [10]}, [11]} can be difficult to apply to 2D materials which typically undergo structural changes during the large electron doses required for lengthy tilt series [12]}, [13]}, [14]}.
