The work [1]} from the company MVTec presents a CAE based defect segmentation method. The authors compare several reconstruction loss metrics and structure similarity (SSIM) as L2 metric together with variational AE and feature matching AE architectures. The SSIM metric is concerned to bring the best results. The main advantage of this method is that not only the single pixel values are compared, but also the luminance, contrast and other parameters are reflected. The authors also provide an overview of the state-of-the-art CAE based anomaly detection methods and a description of the metrics mentioned above.
