Scanning transmission electron microscopes (STEM) achieve high resolution imaging by raster scanning a focused beam of electrons over the sample and measuring the transmission to form an image. Raster scanning is a simple approach to creating an image in the absence of complicated detector arrays. An alternative approach that has been pioneered in the optical regime has been measuring the transmission of the sample when illuminated with more complicated spatial patterns. This approach, often referred to as classical computational ghost imaging, inverts knowledge of the known patterns and their measured transmission to reveal the image. Furthermore, the inversion can be constrained using known image properties (e.g. sparsity of spatial frequencies) such that the image can be estimated from fewer measurements than would have been required by a raster scan; a form of compressed sensing [1]}, [2]}.
