What Soviet-born Dutch-British physicist wrote a paper that described devices that contained just one, two, or three atomic layers?
Andre Geim Andre Konstantin Geim, FRS, HonFRSC, HonFInstP (born 21 October 1958) is a Soviet-born Dutch-British physicist working in the School of Physics and Astronomy at the University of Manchester.
Neutron depth profiling Neutron depth profiling (NDP) is a near-surface analysis technique that is commonly used to obtain profiles of concentration as a function of depth for certain technologically important light elements in nearly any substrate. The technique was first proposed by Ziegler "et al." to determine the concentration profiles of boron impurities in silicon substrates, and later improved by Biersack and coworkers to much of its existing capabilities.