Integrated circuits interface with their surrounding by input/output (IO) pads that can exchange IO signals. The testing of IO signals and especially their alternate current (AC) characterization is complex. The design of accurate tests and testers for measuring the AC characteristics of IO signals can last months and even years. Setup/hold/skew time between different I/O signals is not simple for measuring on the tester and requires complicated functional tests with strict synchronization solutions.
There is a need to provide a tester and method for testing integrated circuits.