A socket is used when inspecting a PCBA (Printed Circuit Board Assembly) mounted with electronic components, and this socket has inspection probes that make electrical connections to the PCBA. For example, it is possible to use a socket that is capable of contacting the probes to connection terminals provided on a lower surface of the PCBA, from under the lower surface of the PCBA, as proposed in Japanese Laid-Open Patent Publication No. 2011-123015, for example.
However, in a case in which the PCBA has a structure such that the probes cannot contact the connection terminals provided on the lower surface of the PCBA, from under the lower surface of the PCBA, a special structure for enabling inspection needs to be provided on the PCBA. For example, the special structure for enabling inspection may be an inspection pattern that is provided on the lower surface of the PCBA and contactable by the probes upon inspection, or an inspection pattern that is provided in an extended region of the PCBA extended in a horizontal direction of the PCBA and contactable by the probes upon inspection. But the special structure for enabling inspection increases a size of the PCBA, increases a cost of the PCBA, or increases both the size and the cost of the PCBA.