1. Field of the Invention
The present invention concerns a cooler for electrical and/ or electronic components, more particularly a cooler used in a testing system for semiconductors.
2. Discussion of the Background Art
The lifetime and proper functioning of electric and/or electronic components, in particular microprocessors, depends heavily on their thermal strain. In order to increase the lifetime and to ensure optimum functioning, coolers of the above-mentioned type are used for cooling such thermally strained components.
Coolers for the most varied applications and in different embodiments are known from, among others, JP-A-07038025, DE-A-19600166, JP-A-2000323636, DE-A-19800166, and DE-U-9201158.