Various physical parameters are monitored and/or measured during operation of an aircraft. Various methods of monitoring and/or measuring these physical parameters can be used. For example, sensors and/or transducers can measure position and/or relative locations of members of an aircraft. Some sensors and/or transducers can be affixed to an aircraft at specific locations so as to produce signals indicative of various physical phenomena experienced at those specific locations. These signals can then be transmitted to an analyzer that receives and interprets the signals. Some specific locations where it would be desirable to affix a sensor and/or transducer might be locations that have harsh environments. For example, some such locations might expose an affixed sensor to high temperatures, high pressures, high levels of exposure to electromagnetic interference, etc.
In many of these harsh environment locations, optical transducers have found use. Optical sensors and/or transducers can produce optical signals indicative of various physical phenomena. For example, optical sensors and/or transducers can produce optical signals indicative of stress, strain, temperature, tilt, rotation, vibration, pressure, etc. Various sensors and/or transducers employ various types of technologies. For example, some sensors use Fabry-Pérot Interferometry (FPI). Some sensors use Fiber Bragg Grating (FBG) technologies. Some sensors use intensity modulation techniques. Some sensors use various optical diffraction gratings to generate an output signal. Some of these technologies and techniques produce optical signals having a narrow-band spectrum or a specific wavelength that is indicative of the measured parameter. Spectrum analysis and/or spectral measurement of such signals can be performed to determine a measure of the physical phenomena indicated by the narrow-band spectrum or specific wavelength of the optical signal.
Photodetectors used in the determination of wavelength detection required precise temperature characterization. Such precise temperature characterization both increased the complexity of wavelength measurement systems and ultimately limited the fidelity of such systems. The fidelity of the spectral measurement can correlate to the precision and/or accuracy of the measured physical parameter. The frequency rate at which such spectral measurements can be performed can limit the frequency that measurements of such physical parameters can be provided. Thus, the present disclosure is directed to methods and systems for fast determination of the narrow-band spectrum or specific wavelength of such optical signals, thereby obtaining fast determination of the physical parameters measured by the various optical sensors.