1. Field of the Invention
The present invention relates to a learning-type classifying apparatus and a learning-type classifying method.
2. Description of the Related Art
As a learning-type classifying apparatus, the configuration of an apparatus is shown in Jpn. Pat. Appln. KOKAI Publication No. 8-21803 wherein a neural network is so constructed that characteristic values of the defective portion extracted from within an image is input as an input pattern, and the kind of defect is output by learning, thereby classifying the defect.
Furthermore, Jpn. Pat. Appln. KOKAI Publication No. 11-344450 shows a configuration which assists a teacher data creating operation, a configuration which uses statistical discrimination analysis to classify defective images on the basis of the created teacher data, etc. It is to be noted that the teacher data is a set of characteristic value information calculated from image information on or an image of a classification target and information on a correct class (=correct category) of the target (see FIG. 4 in the above-mentioned publication).