1. Field of the Disclosure
The present disclosure relates generally to accessing system portions and more particularly to secure access of system portions.
2. Description of the Related Art
The ability to observe internal portions of a semiconductor device under test allows for efficient robust testing, thereby reducing manufacturing costs. Scan testing techniques are widely known and used to facilitate robust testing of semiconductor devices. One disadvantage of scan techniques is realized when systems being tested contain sensitive information, whether design related or data related, that as a result of scan logic becomes readily observable by end users. One technique has been proposed whereby sensitive data can be written, but not read by scan techniques. This, however, reduces the ability to test the device. Therefore, a method and system overcoming this problem would be useful.
The use of the same reference numeral in different drawings indicates similar or identical items.