1. Technical Field
The present disclosure relates to detecting technologies, and particularly, to a detecting method and a detecting device applied to an array substrate of a liquid crystal panel.
2. Description of Related Art
The array substrate is one of the important components of a liquid crystal panel. In the manufacturing process of the array substrate, an AOI (Automatic Optic Inspection) system is used for detecting the array substrate. The AOI system detects the array substrate based on optical principles. The AOI system uses an optical scanning device to automatically scan the array substrate and collects images to detect a defect on the array substrate, and displays the defect on a display or labels the defect automatically such that the defect can be repaired by a maintainer. Generally, a usual detecting device includes a scanning lens having a single magnification. In the detection, the scanning lens is used for scanning and capturing an image of the array substrate. If the size of the defect is too large, the defect may go beyond the field of vision of the scanning lens and the image of the defect cannot be completely and clearly displayed; if the size of the detect is too small, the displayed image of the defect may be unclear and the type of the defect cannot be determined correctly.