Characterization of Surface Generation of Optical Microstructures Using a Pattern and Feature Parametric Analysis Method
X. Q. Jiang, L. Blunt, P. Scott, L. B. Kong, C. F. Cheung, W. B. Lee, S. To
Centre for Precision Technologies
Optical microstructures have a small scale topography classified as micro-grooves, microlens arrays, pyramids, lenticulations, etc. They are widely applied in optical components such as light guide panels for electronic displays. Most previous research work focuses on either the characterization of individual scale topography, or the optical performance of optical microstructures. There is a lack of surface characterization methods which are capable of characterizing the surface generation in terms of the form errors and the lattice relationships in the small scale topography of optical microstructures with sub-micrometer accuracy. This paper presents a pattern and feature parametric analysis method (PFPAM) for the characterization of the surface generation of optical microstructures. The method includes data acquisition, data processing and pattern analysis, exploration of and analysis of feature parameters, etc. Digital image processing technology has been employed and a series of lattice dislocation parameters have been developed to characterize the features of the distribution and the dislocation of optical microstructures. To verify the PFPAM, a prototype surface characterization system has been built. A series of cutting and measurement experiments have been conducted on microlens arrays and titled flats using a two-axis ultra-precision machining system equipped with Fast Tool Servo (FTS) and examined by a non-contact micro-surface profiler system. The results demonstrate that the PFPAM provides an adequate basis for good form characterization of optical microstructures, with form accuracy down to below sub-micrometer range. The proposed lattice dislocation parameters are shown to be useful for the characterization of the distribution and dislocation features in the small scale topography of the optical microstructures. This is not possible using traditional methods. Potential applications of the PFPAM for quality control and evaluation of optical microstructures are discussed.
https://doi.org/10.1016/j.precisioneng.2010.04.005
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Characterization (materials science) Engineering & Materials Science 100%
Microstructure Engineering & Materials Science 76%
Topography Engineering & Materials Science 64%
Quality control Engineering & Materials Science 13%
Data acquisition Engineering & Materials Science 12%
Machining Engineering & Materials Science 11%
Display devices Engineering & Materials Science 10%
Jiang, X. Q., Blunt, L., Scott, P., Kong, L. B., Cheung, C. F., Lee, W. B., & To, S. (2010). Characterization of Surface Generation of Optical Microstructures Using a Pattern and Feature Parametric Analysis Method. Precision Engineering, 34(4), 755-766. https://doi.org/10.1016/j.precisioneng.2010.04.005
Jiang, X. Q. ; Blunt, L. ; Scott, P. ; Kong, L. B. ; Cheung, C. F. ; Lee, W. B. ; To, S. / Characterization of Surface Generation of Optical Microstructures Using a Pattern and Feature Parametric Analysis Method. In: Precision Engineering. 2010 ; Vol. 34, No. 4. pp. 755-766.
@article{60b208e8b3294129b174ccf6eb98af22,
title = "Characterization of Surface Generation of Optical Microstructures Using a Pattern and Feature Parametric Analysis Method",
abstract = "Optical microstructures have a small scale topography classified as micro-grooves, microlens arrays, pyramids, lenticulations, etc. They are widely applied in optical components such as light guide panels for electronic displays. Most previous research work focuses on either the characterization of individual scale topography, or the optical performance of optical microstructures. There is a lack of surface characterization methods which are capable of characterizing the surface generation in terms of the form errors and the lattice relationships in the small scale topography of optical microstructures with sub-micrometer accuracy. This paper presents a pattern and feature parametric analysis method (PFPAM) for the characterization of the surface generation of optical microstructures. The method includes data acquisition, data processing and pattern analysis, exploration of and analysis of feature parameters, etc. Digital image processing technology has been employed and a series of lattice dislocation parameters have been developed to characterize the features of the distribution and the dislocation of optical microstructures. To verify the PFPAM, a prototype surface characterization system has been built. A series of cutting and measurement experiments have been conducted on microlens arrays and titled flats using a two-axis ultra-precision machining system equipped with Fast Tool Servo (FTS) and examined by a non-contact micro-surface profiler system. The results demonstrate that the PFPAM provides an adequate basis for good form characterization of optical microstructures, with form accuracy down to below sub-micrometer range. The proposed lattice dislocation parameters are shown to be useful for the characterization of the distribution and dislocation features in the small scale topography of the optical microstructures. This is not possible using traditional methods. Potential applications of the PFPAM for quality control and evaluation of optical microstructures are discussed.",
keywords = "Fast Tool Servo Machining, Feature Parametric Analysis, Microlens Array, Optical Microstructures, Optics, Pattern Analysis, Surface Characterization, Surface Generation, Surface Measurement, Ultra-Precision Machining",
author = "Jiang, {X. Q.} and L. Blunt and P. Scott and Kong, {L. B.} and Cheung, {C. F.} and Lee, {W. B.} and S. To",
doi = "10.1016/j.precisioneng.2010.04.005",
journal = "Precision Engineering",
Jiang, XQ, Blunt, L, Scott, P, Kong, LB, Cheung, CF, Lee, WB & To, S 2010, 'Characterization of Surface Generation of Optical Microstructures Using a Pattern and Feature Parametric Analysis Method', Precision Engineering, vol. 34, no. 4, pp. 755-766. https://doi.org/10.1016/j.precisioneng.2010.04.005
Characterization of Surface Generation of Optical Microstructures Using a Pattern and Feature Parametric Analysis Method. / Jiang, X. Q.; Blunt, L.; Scott, P.; Kong, L. B.; Cheung, C. F.; Lee, W. B.; To, S.
In: Precision Engineering, Vol. 34, No. 4, 10.2010, p. 755-766.
T1 - Characterization of Surface Generation of Optical Microstructures Using a Pattern and Feature Parametric Analysis Method
AU - Jiang, X. Q.
AU - Blunt, L.
AU - Scott, P.
AU - Kong, L. B.
AU - Cheung, C. F.
AU - Lee, W. B.
AU - To, S.
N2 - Optical microstructures have a small scale topography classified as micro-grooves, microlens arrays, pyramids, lenticulations, etc. They are widely applied in optical components such as light guide panels for electronic displays. Most previous research work focuses on either the characterization of individual scale topography, or the optical performance of optical microstructures. There is a lack of surface characterization methods which are capable of characterizing the surface generation in terms of the form errors and the lattice relationships in the small scale topography of optical microstructures with sub-micrometer accuracy. This paper presents a pattern and feature parametric analysis method (PFPAM) for the characterization of the surface generation of optical microstructures. The method includes data acquisition, data processing and pattern analysis, exploration of and analysis of feature parameters, etc. Digital image processing technology has been employed and a series of lattice dislocation parameters have been developed to characterize the features of the distribution and the dislocation of optical microstructures. To verify the PFPAM, a prototype surface characterization system has been built. A series of cutting and measurement experiments have been conducted on microlens arrays and titled flats using a two-axis ultra-precision machining system equipped with Fast Tool Servo (FTS) and examined by a non-contact micro-surface profiler system. The results demonstrate that the PFPAM provides an adequate basis for good form characterization of optical microstructures, with form accuracy down to below sub-micrometer range. The proposed lattice dislocation parameters are shown to be useful for the characterization of the distribution and dislocation features in the small scale topography of the optical microstructures. This is not possible using traditional methods. Potential applications of the PFPAM for quality control and evaluation of optical microstructures are discussed.
AB - Optical microstructures have a small scale topography classified as micro-grooves, microlens arrays, pyramids, lenticulations, etc. They are widely applied in optical components such as light guide panels for electronic displays. Most previous research work focuses on either the characterization of individual scale topography, or the optical performance of optical microstructures. There is a lack of surface characterization methods which are capable of characterizing the surface generation in terms of the form errors and the lattice relationships in the small scale topography of optical microstructures with sub-micrometer accuracy. This paper presents a pattern and feature parametric analysis method (PFPAM) for the characterization of the surface generation of optical microstructures. The method includes data acquisition, data processing and pattern analysis, exploration of and analysis of feature parameters, etc. Digital image processing technology has been employed and a series of lattice dislocation parameters have been developed to characterize the features of the distribution and the dislocation of optical microstructures. To verify the PFPAM, a prototype surface characterization system has been built. A series of cutting and measurement experiments have been conducted on microlens arrays and titled flats using a two-axis ultra-precision machining system equipped with Fast Tool Servo (FTS) and examined by a non-contact micro-surface profiler system. The results demonstrate that the PFPAM provides an adequate basis for good form characterization of optical microstructures, with form accuracy down to below sub-micrometer range. The proposed lattice dislocation parameters are shown to be useful for the characterization of the distribution and dislocation features in the small scale topography of the optical microstructures. This is not possible using traditional methods. Potential applications of the PFPAM for quality control and evaluation of optical microstructures are discussed.
KW - Fast Tool Servo Machining
KW - Feature Parametric Analysis
KW - Microlens Array
KW - Optical Microstructures
KW - Optics
KW - Pattern Analysis
KW - Surface Characterization
KW - Surface Generation
KW - Surface Measurement
KW - Ultra-Precision Machining
U2 - 10.1016/j.precisioneng.2010.04.005
DO - 10.1016/j.precisioneng.2010.04.005
JO - Precision Engineering
JF - Precision Engineering
Jiang XQ, Blunt L, Scott P, Kong LB, Cheung CF, Lee WB et al. Characterization of Surface Generation of Optical Microstructures Using a Pattern and Feature Parametric Analysis Method. Precision Engineering. 2010 Oct;34(4):755-766. https://doi.org/10.1016/j.precisioneng.2010.04.005