In situ analysis of passive films on alloy 600 by modulated UV-visible reflection spectroscopy
Izumi Muto, Nobuyoshi Hara, Katsuhisa Sugimoto
ENG - Materials Science
Modulated reflection spectra of passive films have been measured in 1 kmol·m-3 Na2SO4 (pH 2.0 and 6.0), 0.15 kmol·m-3 H3BO3+0.0375 kmol·m-3 Na2B4O7 (pH 8.45) and 0.1 kmol·m-3LiOH (ph 12.8) solutions, respectively. Quantitative relations between the characteristic of spectra and the composition of the films have been derived from the spectra for thin composite films of NiO-Cr2O3-Fe2O3 prepared on Pt by MO-CVD. From these relations, cationic mass fractions of Ni2+, Cr3 and Fe3+ ions, XNi, XCr and XFe of passive films were determined. The cationic mass fractions changed with potential; for the films formed at pH 2.0, the value of XCr decreased from 0.7 at 0.0V to 0.1 at 1.0V and at the same time, the value of XFe increased from 0.05 to 0.3 with increasing potential. This indicates that Cr3+ ions are substantially enriched in the passive films and Fe3+ ions are in the transpassive films. The value of XCr for the passive films gradually decreased with increasing pH, while that of XFe was almost independent of pH.
Boshoku Gijutsu
https://doi.org/10.3323/jcorr1974.37.11_664
10.3323/jcorr1974.37.11_664
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Spectroscopy Engineering & Materials Science
Ions Engineering & Materials Science
Composite films Engineering & Materials Science
Chemical vapor deposition Engineering & Materials Science
Thin films Engineering & Materials Science
Chemical analysis Engineering & Materials Science
Muto, I., Hara, N., & Sugimoto, K. (1988). In situ analysis of passive films on alloy 600 by modulated UV-visible reflection spectroscopy. Boshoku Gijutsu, 37(11), 664-671. https://doi.org/10.3323/jcorr1974.37.11_664
In situ analysis of passive films on alloy 600 by modulated UV-visible reflection spectroscopy. / Muto, Izumi; Hara, Nobuyoshi; Sugimoto, Katsuhisa.
In: Boshoku Gijutsu, Vol. 37, No. 11, 1988, p. 664-671.
Muto, I, Hara, N & Sugimoto, K 1988, 'In situ analysis of passive films on alloy 600 by modulated UV-visible reflection spectroscopy', Boshoku Gijutsu, vol. 37, no. 11, pp. 664-671. https://doi.org/10.3323/jcorr1974.37.11_664
Muto I, Hara N, Sugimoto K. In situ analysis of passive films on alloy 600 by modulated UV-visible reflection spectroscopy. Boshoku Gijutsu. 1988;37(11):664-671. https://doi.org/10.3323/jcorr1974.37.11_664
Muto, Izumi ; Hara, Nobuyoshi ; Sugimoto, Katsuhisa. / In situ analysis of passive films on alloy 600 by modulated UV-visible reflection spectroscopy. In: Boshoku Gijutsu. 1988 ; Vol. 37, No. 11. pp. 664-671.
@article{164375264e9b4bbdb22916925cefea85,
title = "In situ analysis of passive films on alloy 600 by modulated UV-visible reflection spectroscopy",
abstract = "Modulated reflection spectra of passive films have been measured in 1 kmol·m-3 Na2SO4 (pH 2.0 and 6.0), 0.15 kmol·m-3 H3BO3+0.0375 kmol·m-3 Na2B4O7 (pH 8.45) and 0.1 kmol·m-3LiOH (ph 12.8) solutions, respectively. Quantitative relations between the characteristic of spectra and the composition of the films have been derived from the spectra for thin composite films of NiO-Cr2O3-Fe2O3 prepared on Pt by MO-CVD. From these relations, cationic mass fractions of Ni2+, Cr3 and Fe3+ ions, XNi, XCr and XFe of passive films were determined. The cationic mass fractions changed with potential; for the films formed at pH 2.0, the value of XCr decreased from 0.7 at 0.0V to 0.1 at 1.0V and at the same time, the value of XFe increased from 0.05 to 0.3 with increasing potential. This indicates that Cr3+ ions are substantially enriched in the passive films and Fe3+ ions are in the transpassive films. The value of XCr for the passive films gradually decreased with increasing pH, while that of XFe was almost independent of pH.",
author = "Izumi Muto and Nobuyoshi Hara and Katsuhisa Sugimoto",
doi = "10.3323/jcorr1974.37.11_664",
journal = "Corrosion Engineering",
publisher = "Allerton Press Inc.",
T1 - In situ analysis of passive films on alloy 600 by modulated UV-visible reflection spectroscopy
AU - Muto, Izumi
AU - Hara, Nobuyoshi
AU - Sugimoto, Katsuhisa
N2 - Modulated reflection spectra of passive films have been measured in 1 kmol·m-3 Na2SO4 (pH 2.0 and 6.0), 0.15 kmol·m-3 H3BO3+0.0375 kmol·m-3 Na2B4O7 (pH 8.45) and 0.1 kmol·m-3LiOH (ph 12.8) solutions, respectively. Quantitative relations between the characteristic of spectra and the composition of the films have been derived from the spectra for thin composite films of NiO-Cr2O3-Fe2O3 prepared on Pt by MO-CVD. From these relations, cationic mass fractions of Ni2+, Cr3 and Fe3+ ions, XNi, XCr and XFe of passive films were determined. The cationic mass fractions changed with potential; for the films formed at pH 2.0, the value of XCr decreased from 0.7 at 0.0V to 0.1 at 1.0V and at the same time, the value of XFe increased from 0.05 to 0.3 with increasing potential. This indicates that Cr3+ ions are substantially enriched in the passive films and Fe3+ ions are in the transpassive films. The value of XCr for the passive films gradually decreased with increasing pH, while that of XFe was almost independent of pH.
AB - Modulated reflection spectra of passive films have been measured in 1 kmol·m-3 Na2SO4 (pH 2.0 and 6.0), 0.15 kmol·m-3 H3BO3+0.0375 kmol·m-3 Na2B4O7 (pH 8.45) and 0.1 kmol·m-3LiOH (ph 12.8) solutions, respectively. Quantitative relations between the characteristic of spectra and the composition of the films have been derived from the spectra for thin composite films of NiO-Cr2O3-Fe2O3 prepared on Pt by MO-CVD. From these relations, cationic mass fractions of Ni2+, Cr3 and Fe3+ ions, XNi, XCr and XFe of passive films were determined. The cationic mass fractions changed with potential; for the films formed at pH 2.0, the value of XCr decreased from 0.7 at 0.0V to 0.1 at 1.0V and at the same time, the value of XFe increased from 0.05 to 0.3 with increasing potential. This indicates that Cr3+ ions are substantially enriched in the passive films and Fe3+ ions are in the transpassive films. The value of XCr for the passive films gradually decreased with increasing pH, while that of XFe was almost independent of pH.
U2 - 10.3323/jcorr1974.37.11_664
DO - 10.3323/jcorr1974.37.11_664
JO - Corrosion Engineering
JF - Corrosion Engineering